激光等离子体X射线椭圆弯晶谱仪的设计

为了诊断0．2～2nm的激光等离子体X射线．研制了一种新型的基于时间分辨和空间分辨的聚焦型椭圆弯晶谱仪．采用两个完全相同且对称分布的通道可以同时获得谱线的空间和时间分辨率。给出了弯品谱仪的设计参数，采用了新颖的瞄准对中技术．并对光源偏离椭圆轴线造成的误差进行了分析。在“神光Ⅱ”靶室上进行打靶实验对该谱仪进行标定，利用X射线CCD相机成功地获取了谱线的图像．实验结果表明实测谱线波长与理论值吻合。     

激光等离子体X射线成像诊断研究

为了诊断激光等离 子体X射线二维空间信息,基于Bragg衍射原理建立了等离子体X射线背光成像系统,其核心 元件为石英球面弯曲晶 体,弯曲半径为143mm。在中国工程物理研究院神光III原型激光装 置上,利用建立的系统,进行了单色X射线背光成像实验,激光聚焦到平面 Mg靶中心聚爆产生高温等离子体X射线为背光源,成像物体为15μm ×15μm网格阵列,X射线CCD得到了清晰的Mg靶 单色X射线二维网格图像。通过对背光图像分析,在7.8mm×2.6mm的视场范围,成像系统得到空间分辨率为5μm。实验 结果表明,基于石英球面弯曲晶体的X射线背光成像系统可以用于等离子体X射线诊断研究。     

实现激光等离子体X射线诊断的椭圆弯晶谱仪研究

按照布拉格衍射的基本原理,利用从一个焦点发出的光线经过椭圆面反射后汇聚于另一个焦点的特点,研制了双通道椭圆弯晶谱仪,分析出其测量的波长范围为0.2nm至2nm,布拉格角的覆盖范围是30°至67.5°。并阐明弯晶分析器的制作过程。在＂星光-Ⅱ＂激光装置上对分别使用LiF、PET、KAP和Mica四种弯晶分析器的双通道椭圆弯晶谱仪进行激光打靶实验,得到了铝、钛和金激光等离子体X射线的发射谱。     

激光产生MgIX等离子体软X射线谱的识别

用掠入射光栅光谱仪拍摄了4～12nm波段范围内镁的激光等离子体软X射线发射光谱。利用等电子数序列离子光谱的规律性,对镁的类铍电离级离子跃迁的软X光谱线进行了识别。     

基于级联卷积神经网络的疲劳检测

为了诊断热核聚变等离子体状态,研制了用于热 斑区等离子体诊断用的新型X射线光谱仪,能够同 时探测X射线光谱与聚爆靶图像信息。光谱检测功能由4块椭圆晶体分析器实现,材料分别 为α-石英(1010)、 α-石英(2023)、α-石英(1011)和Si(111),几乎能够覆盖2~20 keV能带范围内的X射线特 征光谱。光谱检测 结构为光源位于椭圆的一个焦点,其辐射光谱经过椭圆反射聚焦于椭圆另一焦点,由X射线 成像板(IP)接收。图 像检测功能由分幅相机匹配小孔阵列成像完成,理想状态能够得到20 幅不同时间的聚爆靶图像。在谱仪与 聚爆靶之间的调整台上设置厚为60μm的Be膜,以保护针孔与晶体避 免聚爆溅射碎片破坏。在中物院“神光- Ⅱ”升级装置上进行了打靶实验,获取了X射线光谱与聚爆靶图像信号。分析了光谱及图像 信息,并针对光谱 仪漏光问题改进了光谱仪结构,最后在神光-Ⅲ原型装置上进行了验证实验并获得比较理想 的图像信号,信噪比(SNR)数据达到15dB。     

激光等离子体X射线背光源诊断研究

为诊断激光驱动金属靶产生X射线背光源的性能,利用椭圆聚焦特性,研制了一种背光椭圆晶体谱仪。谱仪的色散分析元件为云母(002)晶体,椭圆弯晶的焦距为1350mm,离心率为0.9586。激光束以30°角斜入射背光薄靶,且与椭圆弯晶长轴方向垂直。背光椭圆弯晶谱仪的布拉格入射角为50°~67°,衍射探测角为100°~120°,探测的波长为0.14~0.16nm,采用X射线CCD相机接收信号。利用神光Ⅱ激光装置7#和8#激光器同时聚焦轰击10μm厚的Cu平面背光薄靶,CCD成功获取了Cu等离子体X射线的类氦和Kα谱线。经解谱发现谱线有明显基底,用最小二乘法差值去噪处理后,实测谱线分辨率(λ/Δλ)大于700。     

Z箍缩等离子体X射线椭圆弯晶谱仪

为了测量Z箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪.以Si(111)椭圆弯晶作为色散分析元件,椭圆的离心率为0.9480,焦距为1348 mm,布拉格角范围为30°～54°,谱线探测角范围为54°～103°,探测的波长范围为0.31～0.51 nm.设计了半径为50 mm的半圆型胶片暗盒,内装胶片接收光谱信号.分析了椭圆的弥散度对光谱分辨率的影响.在"阳"加速器装置上进行摄谱实验,胶片成功获取了氩喷气等离子体X射线的跃迁光谱,实测谱线分辨率(λ/Δλ)达300～500,波长与理论值吻合.     

X射线平晶谱仪色散曲线和波长的确定

本文给出了X射线平晶谱仪色散曲线几种解析表达式,它们形式不同,但完全等价。提出了几种独立测定激光等离子体X射线波长的方法,这些方法无需任何参考谱线或谱仪参数。     

弯晶谱仪在X射线探测中的应用

为了对激光等离子体进行诊断,研制了聚焦型椭圆弯晶谱仪用来探测等离子体辐射的X射线.谱仪利用从椭圆一个焦点发射出的光线经椭圆面反射必汇聚于另一焦点的性质而研制,椭圆的离心率和焦距分别为0.9586mm及1350mm.在此采用氟化锂(200)(2d=0.4027nm)作为晶体分析器,其布拉格衍射角变化范围为30～67.5°,可探测波长范嗣为0.2～O.37nm.在"神光-Ⅱ"激光装置上进行了打靶实验,利用软X射线CCD相机作为摄谱器件,该谱仪获得了钛的类He共振线(w)、磁四级M2跃迁x线、互组合跃迁y线、禁戒谱线(z)以及类Li谱线(q).实验结果表明该谱仪的最高光谱分辨率(λ/△λ)可以达到1000以上,能够用于激光等离子体X射线光谱学研究.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

机载高光通量双波段成像光谱仪的设计

分析了成像光谱仪常见结构的优缺点并给出了分析过程,对望远镜系统和光谱成像系统结构进行了合理选择,实现了单一成像光谱仪同时覆盖可见近红外(VNIR)和中波红外(MWIR)双波段。根据研究目标要求设计了一个大F数(VNIR波段F/3,MWIR波段F/2)机载双波段成像光谱仪。该光谱仪双通道共用一个同轴平场无遮挡Schwarzschild望远镜,用二向色分束器分开。双通道光谱成像系统均采用同心共轴的Dyson结构,VNIR波段和MWIR波段光谱分辨率分别达到5 nm和15 nm。为使设计的系统结构合理,介绍了光束分离结构和光谱仪的光束折叠方法。设计结果表明:该系统结构简单,效果良好,谱线弯曲分别小于1.2μm和0.5μm,谱带弯曲均小于0.5μm,偏振灵敏度小于4%,适用高光谱分辨率机载双波段成像光谱仪。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas,a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas.The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface.The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586,respectively.The spectrometer can be used to measure the X-ray lines in the wavelength range of 0.2-0.37 nm,and a LiF crystal(200)(2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°.The spectrometer was tested on Shenguang-Ⅱwhich can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm.Photographs of spectra including the 1s2p 1P1-1s2 1S0 resonance line(w),the 1s2p 3P2-1s2 1S0 magnetic quadrupole line(x),the 1s2p 3P1-1s2 1S0 intercombination lines(y),the 1s2p 3S1-1s2 1S0 forbid-den line(z) in helium-like TiⅩⅪ and the 1s2s2p 2P3/2-1s22s 2S1/2 line(q) in lithium-like TiⅩⅩ have been recorded with a X-ray CCD camera.The experimental result shows that the wavelength resolution(λ/Δλ) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

球面弯晶实现X射线单能成像的研究

基于Bragg衍射原理,研制了一种对激光等离子体进行二维成像的球面晶体分析器。采用球面弯曲石英晶体作为分析器,X射线IP板作为成像器件。采用Cr靶X射线辐射金属网格（目标）,网格的网孔尺寸为200μm×200μm。通过球面弯晶对Cr靶Kα谱线的衍射,得到网格的二维单色衍射图像。实验结果表明,球面弯晶分析器具有较高的光谱...     

一种针对使用背照减薄型CCD器件色散型成像光谱仪的星上光谱定标方法

使用背照减薄型CCD器件的色散型成像光谱仪在近红外波段会出现呈条带状干涉条纹现象,该干涉条纹对入射光波长分布敏感,空间频率稳定,特别适用于微小光谱偏差的测量与校准.针对一台光栅色散型推扫式成像光谱仪样机,先估计出条纹分布的规律,再以此为基础,采用频域滤波、最小二乘拟合等方法提取干涉条纹中包含的相位信息,以此作为光谱定标的辅助参数.实验表明,当入射光强变化达到130％以上时,拟合谱线位置的不确定度最大为0.007 3 nm,模拟光谱位置改变后,以汞灯谱线作为基准光谱位置曲线,测得拟合算法的最大误差为0.135 8 nm,该结果证明,干涉条纹拟合定标方法可有效减少定标系统对光源稳定性的依赖,提高对光谱维微小偏移量的检测精度.     

Oxygen-doped ZnTe phosphors for synchrotron X-ray imaging detectors

ZnTe:O powder phosphors were successfully prepared by a dry synthesis process using gaseous doping and etching media. It was found that dry doping by O₂ through ball-milling was an effective way to synthesize ZnTe:O powder phosphors and produced a red emission centered at 680 nm with a decay time of 1.1 μs. The emission intensity of dry O₂-doped samples was three times more intense than from ZnO-doped samples, possibly due to a more uniform distribution of oxygen substitution on tellurium sites. The samples annealed in a 95% N₂/5% H₂ forming gas atmosphere exhibited a x-ray luminescent efficiency five times higher than did powders annealed in vacuum or N₂ atmosphere. This enhancement was attributed to the removal of surface tellurium oxides. ZnTe:O phosphor screens were prepared with x-ray luminescence efficiencies equivalent to 56% of ZnSe:Cu,Ce,Cl and 76% of Gd₂O₂S:Tb screens under 17-keV radiation. An x-ray imaging resolution of 2.5 lines/mm was resolved, the same as that measured for commercial ZnSe:Cu,Ce,Cl and Gd₂O₂S:Tb screens. These results indicate that ZnTe:O is a promising phosphor candidate for synchrotron x-ray imaging applications.