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国际标准的推广实施,使企业计量工作的运作观念发生重大的变化,同时也给计量工作如何实效服务生产经营提出新的课题。本文结合质量体系认证、计量检测体系合格确认工作中的实践,分析、探讨了企业建立完善计量检测体系过程中,对分共方测量工作进行控制、管理的有关方法、难点。 相似文献
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Features are considered of measurement result traceability at different levels of metrological work, that are based on existing
international guides, standards and recommendations for metrology. 相似文献
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The extent to which technical barriers to international trade caused by non-acceptance of chemical measurement results can
be removed, largely depends on the success in building up national and international traceability structures also in metrology
in chemistry. Achieving metrological comparability of measurement results requires the definition of metrological calibration
hierarchies providing metrological traceability chains which enable the establishment of metrological traceability of measured
quantity values to a common metrological reference [1]. For pH, over the last decade, work has been carried out in a number
of countries to build up meteorological calibration hierarchies within a national framework. An overview on the metrological
traceability chain for pH is given with focus on the primary measurement procedure of pH. 相似文献
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Suggestions are considered on harmonizing the terms in the terminological subsystem “Standards for units of physical quantities.”
Proposals are made on upgrading intergovernmental terminological documents. Definitions are given of terms proposed for use.
Editor's note. Terminology is extremely important for metrology, so this paper is useful. However, it has become customary
to use the term “means of measurement,” so it is hardly desirable to introduce a new definition for “means of measurement
engineering.” As regards the suggestion on the direct introduction of the international dictionary of basic and general terms
in metrology, the Publishing House for Standards in 1998 published this dictionary in Russian with equivalents for the terms
in English, French, German, and Spanish (see Izmeritel'naya Tekhnika, No. 12, p. 62, 1998).
Translated from Izmeritel'naya Tekhnika, No. 4, pp. 40–42, April, 1999. 相似文献
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On the basis of experience the institute demonstrates the possibility of effective use of international cooperation in solving many problems including improvement of the standard base, an increase in specialist qualifications, and introduction of scientific achievements. Particular attention is devoted to fulfilling obligations connected with participation in the Metric Agreement and Convention “Mutual recognition of national measurement standards and certificates for calibration and measurement issued by national metrology institutes.”__________Translated from Izmeritel’naya Tekhnika, No. 6, pp. 66–69, June, 2005. 相似文献
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Michael A. Lombardi Andrew N. Novick J. Mauricio Lopez R Francisco Jimenez Eduardo de Carlos Lopez Jean-Simon Boulanger Raymond Pelletier Ricardo J. de Carvalho Raul Solis Harold Sanchez Carlos Andres Quevedo Gregory Pascoe Daniel Perez Eduardo Bances Leonardo Trigo Victor Masi Henry Postigo Anthony Questelles Anselm Gittens 《Journal of research of the National Institute of Standards and Technology》2011,116(2):557-572
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Randolph E. Elmquist Marvin E. Cage Yi-hua Tang Anne-Marie Jeffery Joseph R. Kinard Jr. Ronald F. Dziuba Nile M. Oldham Edwin R. Williams 《Journal of research of the National Institute of Standards and Technology》2001,106(1):65-103
This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of the six original divisions of the National Bureau of Standards. The Electricity Division provides dc and low-frequency calibrations for industrial, scientific, and research organizations, and conducts research on topics related to electrical metrology and fundamental constants. The early work of the Electricity Division staff included the development of precision standards, such as Rosa and Thomas standard resistors and the ac-dc thermal converter. Research contributions helped define the early international system of measurement units and bring about the transition to absolute units based on fundamental principles and physical and dimensional measurements. NIST research has helped to develop and refine electrical standards using the quantum Hall effect and the Josephson effect, which are both based on quantum physics. Four projects covering a number of voltage and impedance measurements are described in detail. Several other areas of current research at NIST are described, including the use of the Internet for international compatibility in metrology, determination of the fine-structure and Planck constants, and construction of the electronic kilogram. 相似文献
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Herbert S. Bennett 《Journal of research of the National Institute of Standards and Technology》2007,112(1):25-38
We discuss the ability of the nation’s measurement system to meet future metrology needs of the semiconductor industry. Lacking an acceptable metric for assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of needs may serve as proxy for the galaxy of semiconductor measurement needs, we examine it from the perspective of what will be required to continue the semiconductor industry’s powerful impact in the world’s macro-economy and maintain its exceptional record of numerous technological innovations. This paper concludes with suggestions about ways to strengthen the measurement system for the semiconductor industry. 相似文献
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Janik D. Ascroft J.T. Clark R.F. 《IEEE transactions on instrumentation and measurement》1999,48(2):166-168
The methods and results of an international comparison are presented for measurements of RF power in a 3.5 mm coaxial line at seven frequencies up to 26 GHz. Three national laboratories of metrology having different measurement techniques participated in the comparison. The agreement between the mean values of the calibration factor of the traveling standard reported by the participants is well within their reported uncertainties (k=2), which are between 0.5% and 3.1% 相似文献
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ManfredKochsiek 《中国计量学院学报》2004,15(4):259-263,276
回顾了计量学及国际计量组织的发展历史,讨论了现代科学、社会和工业中的计量学的作用与发展,并通过若干例子阐述了准确的计量是工业、社会和科学进步的保证. 相似文献
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The pressure and vacuum metrology group of National Physical Laboratory (NPL) has a strong role in metrological research and development in India because of its importance to the nation’s economy as well as the constitutional obligation following NPL charter of developing and maintaining national standards of pressure and vacuum measurements. Although, the group is successfully fulfilling its national duties, providing national calibration and measurement services since last 35 years, admittedly still there is lack of awareness, misinformation, and penetration of Calibration and Measurement Capabilities (CMCs) to the end users, grass root level industries, academician and Govt. laboratories. Occasionally, we are receiving feedbacks of such grey areas of awareness. Therefore, it was considered appropriate to compile the information of all these CMCs, expertise, training potential and available developed technologies in this article. The present paper also describes the summary of some of the results obtained in recent international key comparison exercises which have helped us to improve the quality in pressure metrology with a measure of technical efficiency. 相似文献
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为更好的解决计量与测量二者的统一与矛盾,通过释义计量与测量,解答计量的重要意义与价值,并基于计量技术的基本任务与特征,浅析计量技术在生产测量中的应用与服务作用,力图利用两者相辅相成的关系,不断推动工作的进步与发展。 相似文献
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The European nanometrology landscape 总被引:1,自引:0,他引:1
Leach RK Boyd R Burke T Danzebrink HU Dirscherl K Dziomba T Gee M Koenders L Morazzani V Pidduck A Roy D Unger WE Yacoot A 《Nanotechnology》2011,22(6):062001
This review paper summarizes the European nanometrology landscape from a technical perspective. Dimensional and chemical nanometrology are discussed first as they underpin many of the developments in other areas of nanometrology. Applications for the measurement of thin film parameters are followed by two of the most widely relevant families of functional properties: measurement of mechanical and electrical properties at the nanoscale. Nanostructured materials and surfaces, which are seen as key materials areas having specific metrology challenges, are covered next. The final section describes biological nanometrology, which is perhaps the most interdisciplinary applications area, and presents unique challenges. Within each area, a review is provided of current status, the capabilities and limitations of current techniques and instruments, and future directions being driven by emerging industrial measurement requirements. Issues of traceability, standardization, national and international programmes, regulation and skills development will be discussed in a future paper. 相似文献