SnAgCu系钎料合金对表面贴装元件润湿特性研究

采用润湿平衡法,研究了水溶性钎剂条件下SnAgCu系钎料合金对表面贴装元件的润湿特性.试验结果表明,钎焊温度对润湿力作用显著.Sn2.5Ag0.7Cu钎料合金的最大润湿力为1.265 mN,其最佳工艺参数分别为:预热时间15 s,钎焊温度255℃和钎焊时间5 s.该润湿力高于目前商用的Sn3.0Ag0.5Cu钎料,与Sn3.8Ag0.7Cu钎料润湿力相当,完全能够满足表面组装行业对无铅钎料润湿性能的要求.     

低银焊料超声雾化制粉及焊膏性能研究

在Sn-0.7Cu-0.1Ag低银焊料基础上进行微合金化,研究了Ag和Ni对钎料润湿性以及元素X对钎料润湿抗氧化性的影响,比较了超声波雾化法与气体雾化法制备焊锡粉的区别.结果表明:随着Ag含量增加,钎料合金的润湿力提高并且润湿时间减少.添加Ni元素,钎料润湿力并没有明显变化,润湿时间略有减小.高活性焊剂可以显著提高钎料润湿力,同时缩短润湿时间.在低银钎料中添加微量元素X,质量分数超过0.003%时,可以显著改善钎料抗氧化性能.采用超声波雾化法较气体雾化法制得的低银焊锡粉,异形粉比例明显下降.     

In对Sn9Zn钎料润湿性能的影响

为了提高Sn9Zn共晶钎料的钎焊性能,通过合金化的方法添加了少量元素In,制备了Sn9Zn-xIn钎料。从钎料合金的熔化特性、润湿特性、界面显微结构和母材粗糙度这四个方面评价了不同In含量对Sn9Zn钎料润湿性能的影响。试验结果表明:少量元素In的添加可以降低钎料的熔点;随着In含量的增加,钎料的润湿力增大,润湿时间缩短,润湿性有明显提高;In含量增加,润湿界面层中Cu5Zn8化合物层厚度增加;对母材表面进行毛化处理,通过改变母材表面的微观几何结构,增大钎料与母材的相对接触面积,从而改善钎料的润湿性能。     

Sn-0.3Ag-0.7Cu-xBi低银无铅钎料的润湿性

以Bi为添加剂对低银型Sn-0.3Ag-0.7Cu无铅钎料进行改性,应用SAT—5100型润湿平衡仪对Sn-0.3Ag-0.7Cu-xBi(x=0,1,3和4.5)钎料的润湿性能作了对比分析。结果表明:适量Bi元素的加入可以改善Sn-0.3Ag-0.7Cu钎料合金的润湿性能,且在240℃下Sn-0.3Ag-0.7Cu-3.0Bi无铅钎料具有最佳的润湿性能,在250℃其润湿力达到最大值3.2×10–3N/cm。     

汽相钎焊时钎料的润湿和铺展

本文讨论汽相再流钎焊时针料的润湿和铺展。以润湿测力法和铺展面积法首次研究了“FC70—松香—6OSn/40Ph钎料—铜”润湿系统中钎料的润湿过程,FC70对钎料润湿速度、程度的影响,并直接研究了松香排开FC70润湿铜的过程。研究认为FC70在一定程度上妨碍钎剂和钎料的润湿铺展,并分析而由此造成的利弊。文中还以氧化膜颜色法和测量润湿力检查了FC70汽相气氛的不氧化特性。     

新型低银钎料SAC0307X的研究

研究了一种新型低银无铅钎料SAC0307X的合金组织结构、熔化特性、力学性能、润湿性、熔铜性和抗氧化特性,并与SAC0307和SAC305进行了对比,结果显示SAC0307X抗拉强度55 MPa,延伸率48%,与SAC305相当;熔点为212.4~227.5℃,固相线相比SAC0307有所下降;最大润湿力0.54 m N,润湿时间0.79 s,均优于SAC305;另外在熔铜率、抗氧化性等方面均优于钎料SAC305。     

合金元素对Sn-Zn基无铅钎料高温抗氧化性的影响

研究了不同微量合金元素对Sn-Zn基无铅钎料高温抗氧化性的影响。钎料在液态下的表面颜色变化以及热重分析表明,Al、Cr能明显改善Sn-Zn基钎料的抗氧化性能。通过俄歇能谱深度剖析和X射线衍射分析探讨了合金元素的抗氧化机理:Al和Cr在钎料表面或亚表面富集,形成阻挡层,抑制了钎料的氧化。比较了合金元素对Sn-Zn基钎料润湿性能的影响,结果表明Al的加入不利于钎料的铺展。通过实验得出结论:Cr是一种比Al更具有吸引力的Sn-Zn基钎料的高温抗氧化合金元素。     

Sn基钎料与Cu和Al基板的润湿性比较研究

采用润湿平衡法测量了四种Sn基钎料(Sn-37Pb、Sn-3.OAg-0.5Cu、Sn-0.7Cu与Sn-9Zn)分别在250,260和270℃与Cu、Al两种基板的润湿性能.结果表明:钎料与Al基板的润湿时间均比Cu基板长,除Sn-9Zn外,其他三种钎料与Cu基板的润湿力比Al基板大,并且随着温度升高,润湿性能提高,...     

三种高Sn无铅钎料的表面张力和润湿性能研究

采用悬滴法测量了3种无铅钎料合金(Sn-3.0Ag-0.5Cu、Sn-0.7Cu与Sn-9.0Zn)在260℃时的表面张力,分别为525.5,534.8和595.4 mN/m;同时采用座滴法测量了其在260℃熔融状态下与Cu基板的接触角,分别为24.5°、28.0°和102.5°,并且与传统Sn-37.0Pb钎料进行了比较研究。结果表明,无铅钎料合金的表面张力与接触角均大于Sn-37.0Pb钎料。结合Young-Dupre公式讨论了钎料合金表面张力与其润湿性能的相关性,认为Sn基钎料合金在Cu基板上的润湿性能主要取决于其表面张力。     

La对Sn-Ag-Cu无铅钎料组织与性能的影响

研究了微量稀土La对Sn-3.0Ag-0.5Cu无铅钎料显微组织、力学性能、断口形貌、润湿性能和熔点的影响.结果表明:La的质量分数为0.1%可使钎料合金晶粒细化,并显著提高钎料合金力学性能和润湿性能;添加La的质量分数为0.4%将形成粗大LaSn3初生枝晶相,降低力学性能和润湿性能;微量La使钎料合金的熔点轻微增加.     

Solder wetting in a wafer-level flip chip assembly

Wafer-level flip chips provide an innovative solution in establishing flip chip as a standard surface mount process. In this paper, the wetting of solder bumps within confining underfill during the reflow of a wafer-level flip chip assembly is addressed. For real time monitoring of an assembly during the reflow process, a system using a high-speed camera is utilized. The collapse of solder bumps on the chip in the vertical direction is found to be a prerequisite of solder wetting. Underfill voids and outgassing are found to cause chip drift and tilt during the reflow process. In addition, symmetry of the underfill flow and fillet formation is identified as a critical factor in maintaining chip to substrate alignment. During solder wetting of the metallization pads on the substrate, the underfill needs to maintain a low viscosity. With the selection of a thermally stable underfill and corresponding process development, wafer-level flip chip assemblies with good solder interconnects are demonstrated     

Characterization of the melting and wetting of Sn-Ag-X solders

There is tremendous interest at present with Pb-free solder assembly in the surface mount assembly industry in response to recent Japanese and European initiatives and proposed governmental restrictions regarding Pb usage and disposal. Many different solder alloys have been proposed as potential Pb-free solder replacements and the most promising of these fall into the general alloy families of tin-silver (Sn-Ag), tin-silver-copper (Sn-Ag-Cu) and tin-silver-bismuth (Sn-Ag-Bi). Published melting point data on some of these alloys indicates that they should be capable of reduced reflow temperatures relative to the commonly available Sn-3.5Ag alloy, which melts at 221°C. Differential scanning calorimetry (DSC) and reflow visualization was used to characterize the melting and wetting of the Pb-free alloys and generate the practical reflow temperature requirements. This was compared to the DSC data to gain insight on the meaning of the DSC melting data for surface mount applications. The results show that, in general, the wetting performance of the Sn-Ag-Bi alloys are more similar to Sn-Ag and Sn-Ag-Cu than would be predicted by the major onset melting temperature data as measured by the DSC     

无铅SAC0307焊料润湿性与漫流性集成测试

为节省测试时间并降低测试成本,通过测量SAC0307焊料对铜管的润湿力、爬升高度及焊料对铜片的润湿力和铺展率,建立润湿性和漫流性的对应关系,集成测试获得焊料对铜片的润湿性能和铺展能力。结果表明,松香助焊剂作用下焊料对铜片的润湿力为铜管的1.1倍,丁二酸助焊剂作用下焊料对铜片的润湿力是铜管的1.3倍,松香和丁二酸两种助焊剂作用下焊料在铜管内爬升高度与铜片上铺展率的关系都为指数关系。     

BGA器件焊接合格率的预测模型

在表面贴装技术(SMT)大规模生产过程中,如果能够对焊接合格率进行预测,无疑对提高SMT产品的生产率、产品可靠性及成本控制具有重要意义.以球栅阵列(BGA)器件为例,研究SMT焊接合格率的预测方法.通过统计分析,结合焊点成形软件的方法,建立了BGA器件焊接合格率的预测模型,运用该模型可以找出影响焊接合格率的制约因素.结合仿真技术模拟焊点形态,发现引起焊接缺陷各参数之间的关系,并提出相应的解决方案.     

The analysis of the withdrawal force curve of the wetting curve using 63Sn-37Pb and 96.5Sn-3.5Ag eutectic solders

To analyze the withdrawal force curve in the wetting balance curve, wetting balance tests using the 63Sn-37Pb and 96.5Sn-3.6Ag eutectic solders were conducted by varying the immersion speed, sample perimeter, and solder temperature. The mechanism of the withdrawal force curve was reviewed and a new method for calculating the surface tension of solders using the withdrawal force curve was introduced. The results showed that the maximum point of the withdrawal force curve is generated when the sliding solder meets the bottom corners of a sample and the contact angle is reduced to zero. The maximum withdrawal force subtracted by end force can be expressed using force balance equation as F=pγ. Therefore, the surface tension of the solder can be calculated by dividing the maximum withdrawal force by the sample parameter.     

Solder flow on narrow copper strips

Various solderability tests have been developed over the years to quantify the wetting behavior of solder on metallic surfaces. None offer an exact measure of capillary flow normally associated with conventional plated-through-hole and surface mount soldering. With shrinking package designs, increasing reliability requirements, and the emergence of new soldering technologies, there is a growing need to better understand and predict the flow of solder on printed wiring board (PWB) surfaces. Sandia National Laboratories has developed a capillary flow solderability test, through a joint effort with the National Center for Manufacturing Sciences, that considers this fundamental wetting issue for surface mount technology. The test geometry consists of a metal strip (width, 8) connected to a circular metal pad (radius, r_c). Solder flow from the pad onto the strip depends on the geometric relationship between 8 and r_c. Test methodology, experimental results, and validation of a flow model are presented in this paper.     

Sn-Zn-Bi无铅焊料表面张力及润湿性研究

采用气泡最大压力法对Sn-9Zn-XBi焊料进行了表面张力测试,用平衡法测试焊料的润湿性。结果表明:Bi的添加大大降低了Sn-Zn系焊料熔体的表面张力;然而焊料暴露在空气环境下1min后,表面形成ZnO导致其表面张力增大;Bi的增加提高了焊料在铜片上的润湿力,缩短了润湿时间;Sn-9Zn-XBi焊料润湿力仍低于Sn-40Pb,其原因是焊料–铜界面能偏高。     

Fluxless wetting propeities of one-side-coated under bump metallurgy and top surface metallurgy

The wetting balance test was performed in an attempt to estimate the fluxless wetting properties of under bump metallurgy (UBM)-coated Si-wafer and top surface metallurgy (TSM)-coated glass substrate to SnPb solder. The wetting curves of the single-and double-side-coated UBM had a similar shape and the parameters characterizing the curve shape showed a similar tendency as a function of temperature. Wetting property estimation was possible with the new wettability indices from the wetting curves of one side-coated specimens; F_min, F_s, and t_s. Au/Cu/Cr UBM was better than Au/Ni/Ti UBM from the point of wetting time. For TSM, it was more effective to use Cu as a wetting layer with Au as a protection layer than to use Au as a wetting layer alone. The contact angle of one-side-coated Si-plate to SnPb solder can be calculated from the force balance equation by measuring static state force and tilt angle. The contact angles of Au/Cu/Cr and Au/Ni/Ti UBM of Si-wafer to SnPb solder were 59.9° and 63.9°, respectively. The contact angles of Au/Cu/Cr and Au/Cr TSM of glass to SnPb were 78.9 and 76.1°, respectively.     

全息干涉法在表面封装组件质量检测中的应用

利用二次曝光全息干涉技术对表面封装组件(SMA)在功率循环中的离面变形场进行了测试.为解决从器件边缘到印制电路板(PCB)间干涉条纹级次的不连续问题,实验中采用了"搭桥"技术来处理表面封装器件(SMD)和PCB的变形失配;此外,全息干涉技术还被用于一个实际产品(硬盘驱动器)的无损在线检测.结果表明:模塑J引线封装体(PLCC)和PCB由于中心热源及材料的热膨胀系数差而导致离面弯曲变形;沿器件边缘,引线和焊点经历了非共面的离面变形;通过正常硬盘驱动电路板和失效板的干涉条纹数量的对比,能快速简捷地检测板的质量.全息干涉测量法在微电子技术可靠性分析领域有广泛的应用前景.     

全息干涉法在表面封装组件质量检测中的应用

利用二次曝光全息干涉技术对表面封装组件(SMA)在功率循环中的离面变形场进行了测试.为解决从器件边缘到印制电路板(PCB)间干涉条纹级次的不连续问题,实验中采用了"搭桥"技术来处理表面封装器件(SMD)和PCB的变形失配;此外,全息干涉技术还被用于一个实际产品(硬盘驱动器)的无损在线检测.结果表明:模塑J引线封装体(PLCC)和PCB由于中心热源及材料的热膨胀系数差而导致离面弯曲变形;沿器件边缘,引线和焊点经历了非共面的离面变形;通过正常硬盘驱动电路板和失效板的干涉条纹数量的对比,能快速简捷地检测板的质量.全息干涉测量法在微电子技术可靠性分析领域有广泛的应用前景.