微量Co对低银无铅焊料润湿及界面反应的影响

利用润湿测量仪研究了加入微量Co对低银无铅焊料Sn1.00Ag0.70Cu和Sn0.50Ag0.70Cu润湿性能的影响,并与共晶无铅焊料Sn3.00Ag0.50Cu的润湿性能进行对比。结果发现,焊料Sn3.00Ag0.50Cu、Sn1.00Ag0.70Cu0.07Co和Sn0.50Ag0.70Cu0.03Co的润湿平衡力F分别为3.0850,3.0600和3.0275mN,润湿时间分别为0.64,0.88和1.01s。低银微钴无铅焊料显示了与共晶无铅焊料类似的润湿力,只是润湿时间略有增加。     

Sn—Ag—Cu无铅焊料性能研究

环保和微电子器件高度集成化的发展驱动了高性能无铅焊料的研究和开发,Sn—Ag－Cu系无铅焊料由于具有良好的焊接性能和使用性能,已逐渐成为一种通用电子无铅焊料。文章通过实验的方法,研究了8种不同配比的Sn—Ag—Cu焊料中银、铜含量对合金性能（包括熔点、润湿性和剪切强度）的影响,并对焊料的显微组织进行对比与分析,得出低银焊料的可靠性比高银焊料好,同时Sn－2．9Ag—1．2Cu的合金具有较低的熔点且铺展性好,为确定综合性能最佳的该系焊料合金提供了依据。     

低银Sn—Ag—Cu无铅钎料的性能研究

使用银含量较低的Sn-Ag-Cu无铅钎料是降低焊料成本最直接有效的手段之一,但银含量降低后对钎料性能的影响尚缺乏系统报导。通过向Sn-Cu二元体系中加入不同比例的纯银,制备了一系列低银合金。研究了银含量对钎料的熔点、可焊性及溶铜性能的影响。通过拉伸试验研究了合金的强度及杨氏模量。综合考虑上述各项性能指标,Sn-0.5Ag-0.7Cu是具有最佳性价比的合金成分。     

稀土元素对Sn-Ag-Cu基低银钎料接头可靠性的影响

传统含银无铅焊料已经被证明是最有潜力替代Sn-Pb合金的焊料并被广泛应用.可观的Ag含量也意味着焊料成本增加.因此,低银合金的研发开始受到科研机构和工业界广泛关注.但是低银产品的服役性能都低于主流的SAC系合金.采用引入微量元素Ce的方法提高接头可靠性.结果表明,Ce元素的添加提高了钎料的可焊性、抗拉强度以及热循环下的服役性能.此外,稀土元素的添加并未引发Sn晶须的生长.     

低银无铅焊料的研制动态

分析了低银无铅焊料(w(Ag)≤1.0％)在成本、抗跌落性能、Ag3Sn化合物的形成等方面与高银焊料相比的优势,综述了低银焊料在应用过程中面临的问题,如高熔点与氧化、热疲劳性能、返修缺陷等,并列举了实例,提出了一些有针对性的解决方案.最后展望了低银无铅焊料的发展趋势.     

新型低银钎料SAC0307X的研究

研究了一种新型低银无铅钎料SAC0307X的合金组织结构、熔化特性、力学性能、润湿性、熔铜性和抗氧化特性,并与SAC0307和SAC305进行了对比,结果显示SAC0307X抗拉强度55 MPa,延伸率48%,与SAC305相当;熔点为212.4~227.5℃,固相线相比SAC0307有所下降;最大润湿力0.54 m N,润湿时间0.79 s,均优于SAC305;另外在熔铜率、抗氧化性等方面均优于钎料SAC305。     

无铅的锡-银-铜焊料的发展——第二代低银含量SnAgCu体系

概要地评述了无铅焊料中低银含量的锡-银-铜（SnAgCu）体系的发展方向。由于高银含量的锡-银-铜（SnAgCu）体系存在着成本高和耐跌落（摔）性差的问题,它将被低银含量的锡-银-铜（SnAgCu）体系所取代。在低银含量的锡-银-铜（SnAgCu）体系中加入某些微量添加剂可以达到锡-铅焊料的性能水平。     

锡铜无铅焊料在电路板组装中的应用

在无铅组装工艺中,大多数电路板组装厂优先采用低成本焊料合金。没有添加剂的锡铜无铅焊料本身存在局限性,可是添加某种成份后,就能克服锡铜焊料通常所遇到的不足之处。文章分析了几种锡铜焊料相对于SAC焊料的特点,并叙述了它们在波峰焊和手工焊接工艺中的应用情况。     

Sn-Zn系无铅焊料抗氧化性和润湿性研究现状

Sn-Zn无铅焊料由于熔点接近Sn-Pb,价格低廉、无毒性、力学性能优良等特点,倍受人们的关注。然而由于Zn的表面活性高,在钎焊过程中焊料容易氧化,导致了润湿性能下降。本文综述合金元素对Sn-Zn无铅焊料氧化性能、润湿性的影响。并对Sn-Zn焊料今后的研究方向进行了简要分析。     

开发高性能的无铅波峰焊料合金

无铅波峰焊已经发展为两个主要的合金体系:SnAgCu锡/银/铜体系通常含银量达3至4%和基于SnCu锡铜共晶体系。如果按照用户的价值方程式来衡量,二者都存在固有的缺陷。含银3%至4%的SnAgCu体系可提供良好的可靠性和工艺良率,但原材料的成本昂贵。作为替代品的SnCu共晶体系及其改性合金SnCuNi的原材料成本较低,但其工艺良率和焊接可靠性存在问题。为了克服现有焊料体系的缺点,确信电子开发出新型焊料合金SACX0307。研究SAC305、Sn99.3Cu0.7、改性Sn99.3Cu0.7SnCuNi和SACX0307四种合金系的测试结果,评估无铅焊接工艺的4个主要特性:工艺良率、铜浸出率、浮渣形成和热机械可靠性。波峰焊实验使用了测试电路板专门设计较复杂,以区分不同加工条件下的差异、三种助焊剂包括水基和醇基配方和两种电路板表面处理铜OSP和浸银处理。测试表明,SACX0307填补了SAC305合金与SnCu共晶合金系列之间的空白,就波峰焊的四个主要特性而言,其性能优于Sn99.3Cu0.7和SnCuNiSn99.3Cu0.7,而原材料成本低于SAC305。     

无铅Sn—Ag—Sb与Sn—Zn—In润湿性研究

通过实验测定Sn—Ag—Sb及Sn—Zn—In系列合金的润湿角，进行了润湿性研究，发现Sn—Ag—Sb及Sn—Zn—In系焊料存在润湿性差的缺点，通过添加低表面张力的金属或稀土元素可在一定程度上降低润湿角，能提高润湿性。     

Mechanical Deformation Behavior of Sn-Ag-Cu Solders with Minor Addition of 0.05 wt.% Ni

The aim of the present work is to develop a comparative evaluation of the microstructural and mechanical deformation behavior of Sn-Ag-Cu (SAC) solders with the minor addition of 0.05 wt.% Ni. Test results showed that, by adding 0.05Ni element into SAC solders, generated mainly small rod-shaped (Cu,Ni)₆Sn₅ intermetallic compounds (IMCs) inside the β-Sn phase. Moreover, increasing the Ag content and adding Ni could result in the change of the shape and size of the IMC precipitate. Hence, a significant improvement is observed in the mechanical properties of SAC solders with increasing Ag content and Ni addition. On the other hand, the tensile results of Ni-doped SAC solders showed that both the yield stress and ultimate tensile strengths decrease with increasing temperature and with decreasing strain rate. This behavior was attributed to the competing effects of work hardening and dynamic recovery processes. The Sn-2.0Ag-0.5Cu-0.05Ni solder displayed the highest mechanical properties due to the formation of hard (Cu,Ni)₆Sn₅ IMCs. Based on the obtained stress exponents and activation energies, it is suggested that the dominant deformation mechanism in SAC (205)-, SAC (0505)- and SAC (0505)-0.05Ni solders is pipe diffusion, and lattice self-diffusion in SAC (205)-0.05Ni solder. In view of these results, the Sn-2.0Ag-0.5Cu-0.05Ni alloy is a more reliable solder alloy with improved properties compared with other solder alloys tested in the present work.     

电子组装用高温无铅钎料的研制

Bi-Ag合金是一种替代高铅钎料的芯片封装无铅焊料。研制了Bi-2.5Ag、Bi-2.5Ag-0.1RE、Bi-5Ag-0.1RE、Bi-7.5Ag-0.1RE、Bi-10Ag、Bi-10Ag-0.1RE钎料。结果表明,该合金系钎料的熔化温度范围随Ag含量的增加而增大,而且其润湿性能良好,润湿角都处于30o～40o。不同Ag含量的Bi-Ag/Cu接头在界面处发生断裂,剪切强度差别不大,都略大于30MPa。Bi-Ag/Cu界面没有金属间化合物形成,结合强度较弱。     

Sn-Zn-Bi-Ag系钎料物理性能研究

通过成分设计形成了Sn-Zn-Bi-Ag系钎料合金。针对微电子产业的应用要求研究了钎料的物理性能,分析了Sn-Zn-Bi-Ag系钎料中合金元素对钎料物理性能的影响。发现:Sn-Zn-Bi-Ag系钎料的合金元素中Bi、Ag含量(质量分数)的增加会使钎料的密度增大,而Zn含量对钎料的密度影响不大。Zn含量5.0%~6.5%,Bi含量1.5%~3.0%,Ag含量0.5%~0.8%范围的Sn-Zn-Bi-Ag钎料具有较好的润湿性能。Sn-Zn-Bi-Ag系钎料中Bi含量不高时,钎料的电阻率均比传统Sn-37Pb钎料小。随着Bi含量的增加,钎料的电阻率有明显增大的趋势。     

Solder joint reliability of indium-alloy interconnection

Recent high-density very large scale integrated (VLSI) interconnections in multichip modules require high-reliability solder interconnection to enable us to achieve small interconnect size andlarge number of input/output terminals, and to minimize soft errors in VLSIs induced by α-particle emission from solder. Lead-free solders such as indium (In)-alloy solders are a possible alternative to conventional lead-tin (Pb-Sn) solders. To realize reliable interconnections using In-alloy solders, fatigue behavior, finite element method (FEM) simulations, and dissolution and reaction between solder and metallization were studied with flip-chip interconnection models. We measured the fatigue life of solder joints and the mechanical properties of solders, and compared the results with a computer simulation based on the FEM. Indium-alloy solders have better mechanical properties for solder joints, and their flip-chip interconnection models showed a longer fatigue life than that of Pb-Sn solder in thermal shock tests between liquid nitrogen and room temperatures. The fatigue characteristics obtained by experiment agree with that given by FEM analysis. Dissolution tests show that Pt film is resistant to dissolution into In solder, indicating that Pt is an adequate barrier layer material for In solder. This test also shows that Au dissolution into the In-Sn solder raises its melting point; however, Ag addition to In-Sn solder prevents melting point rise. Experimental results show that In-alloy solders are suitable for fabricating reliable interconnections.     

A review of lead-free solders for electronics applications

Ever since RoHS was implemented in 2006, Sn3.0Ag0.5Cu (SAC305) has been the primary lead-free solder for attaching electronic devices to printed circuit boards (PCBs). However, due to the 3.0 wt% Silver (Ag) in SAC305, companies have been looking at less expensive solder alternatives, especially for use in inexpensive products that have short operating lives and are used in mild application conditions. This paper reviews new lead-free solder alternatives and the trends in the industry, including SnCu-based solders, SnAgCu solders with Ag content < 1.0 wt%, SnAg solders, and no-Ag low-temperature solders (e.g., SnBi-based solders). The analysis is conducted for reflow, wave, and rework conditions and for packaged and flip-chip devices.     

High-Reliability Low-Ag-Content Sn-Ag-Cu Solder Joints for Electronics Applications

Sn-Ag-Cu (SAC) alloy is currently recognized as the standard lead-free solder alloy for packaging of interconnects in the electronics industry, and high- Ag-content SAC alloys are the most popular choice. However, this choice has been encumbered by the fragility of the solder joints that has been observed in drop testing as well as the high cost of the Ag itself. Therefore, low-Ag-content SAC alloy was considered as a solution for both issues. However, this approach may compromise the thermal-cycling performance of the solders. Therefore, to enhance the thermal-cycling reliability of low-Ag-content SAC alloys without sacrificing their drop-impact performance, alloying elements such as Mn, Ce, Ti, Bi, In, Sb, Ni, Zn, Al, Fe, and Co were selected as additions to these alloys. However, research reports related to these modified SAC alloys are limited. To address this paucity, the present study reviews the effect of these minor alloying elements on the solder joint reliability of low-Ag-content SAC alloys in terms of thermal cycling and drop impact. Addition of Mn, Ce, Bi, and Ni to low-Ag-content SAC solder effectively improves the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Taking into consideration the improvement in the bulk alloy microstructure and mechanical properties, wetting properties, and growth suppression of the interface intermetallic compound (IMC) layers, addition of Ti, In, Sb, Zn, Al, Fe, and Co to low-Ag-content SAC solder has the potential to improve the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Consequently, further investigations of both thermal-cycling and drop reliability of these modified solder joints must be carried out in future work.