X射线光电子能谱仪样品前处理装置的设计及应用

针对商品X射线光电子能谱仪(XPS)不能在通常的化学反应条件下进行原位分析的缺点,设计了与能谱仪配套连接的样品前处理装置.该装置可以将经预处理(如高温氧化、还原和预吸附等)或反应后的样品厌氧转入能谱仪,使X射线光电子能谱仪对表面的探测结果能真实地代表样品在反应或预处理后的组成与结构特征.对还原态NiO的XPS表征结果表明,采用样品前处理装置进行处理后,还原态NiO从反应器转至能谱仪过程中没有发生再氧化现象.     

RLVIP技术制备Ge1-xCx薄膜的X射线光电子能谱

应用低压反应离子镀(RLVIP)技术在Ge基底上沉积了Get1-xCx薄膜.制备过程中,低压等离子源作为辅助等离子源,Ge作为蒸发材料,CH4作为反应气体,在相同的沉积条件下以不同的沉积速率制备了C含量(x)从0.23到0.78的Ge1-xCx薄膜.X射线衍射测试表明制备的Ge1-xCx薄膜为无定形结构.用X射线光电子能谱研究了不同C含量下Ce1-xCx薄膜中C的化学键合变化.研究结果表明;当x>0.78时,成键为C-H键;当x为0.53～0.62时,成键为C-C键;当x<0.47时,成键为Ge-C键.     

RLVIP制备Ge1－xCx薄膜的X射线光电子能谱研究

应用低压反应离子镀（Reactive Low Voltage Ion Plating：RLVIP）在Ge基底上沉积了Ge1-xCx薄膜。制备过程中,低压等离子源作为辅助等离子源,Ge作为蒸发材料,CH4作为反应气体,在相同的条件下以不同沉积速率制备了C含量( x )从0.23到0.78的Ge1-xCx薄膜。X射线衍射测试表明制备的Ge1-xCx薄膜为无定形结构。通过X射线光电子能谱研究了不同C含量下Ge1-xCx薄膜的化学键合变化。测试结果表明当 x > 0.78时,成键为C-H键;当x在0.53至0.62时,成键为C-C键;当x < 0.47时,成键为Ge-C键。     

X射线衍射仪变温样品室的改进与应用

本文介绍了在原X射线衍射仪变温样品室的基础上进行改进,实现在多种条件下进行相变和化学反应的分析,以及改进后的应用。     

在线分析器样品处理系统技术应用及发展综论

以21世纪前沿技术的高端视野来审视在线分析系统的样品处理系统技术，样品处理系统技术是过程分析器工程应用系统（以下简称在线分析系统）的核心和关键技术，确立这一最新的核心技术观念意义深远，将对在线分析系统的推广应用和在线分析工程技术的发展，产生极大的激励和促进作用。     

X射线诱导俄歇电子能谱(XAES)的应用

简要介绍X射线诱导俄歇电子能谱(XAES)用于化学分析的一般性理论。XAES可与X射线光电子能谱(XPS)一起用于元素化学态分析。但是XAES分析有其优势,(1)俄歇参数与荷电位移无关,结果无需荷电校准就可用于价态分析;(2)在一些涉及过渡元素和重元素物质的价态分析时,XAES峰化学位移大于XPS峰;(3)对于分析一些轻元素(如K、Mg、Al等),XAES峰比某些XPS峰有更高的灵敏度。因而,XAES可弥补XPS分析的某些不足,可方便、有效地表征元素价态。通过实例,介绍XAES在这3个方面的实际应用。     

X射线称重在制药行业应用的可行性及优势

将X射线称重在制药行业进行尝试性应用,根据产生原理及相关实现方法对实际应用能带来的优点进行阐述。     

Sialolith characterization by scanning electron microscopy and X-ray photoelectron spectroscopy

The objective of this study has been to characterize sialolith, a calcium phosphate deposit that develops in the human oral cavity, by high-resolution field emission scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The morphological and chemical data obtained helped in the determination of their formation mechanism in salivary glands. Sialoliths in the submandibular salivary glands may arise secondary to sialodenitis, but not via a luminal organic nidus. We believe this is the first study that characterizes a sialolith by XPS.     

The tribo-chemistry of graphite fluoride studied using X-ray photoelectron spectroscopy

A preliminary investigation involving the application of X-ray photo-electron spectroscopy (XPS) for the study of the degradation, under sliding conditions, of thin graphite fluoride films on steel has been carried out. The results described here show that the technique can provide invaluable information in establishing the mode of failure of the lubricating film.     

Determination of oxygen in acid-treated high-purity niobium by X-ray photoelectron spectroscopy

High-purity niobium was immersed in nitric acid and hydrofluoric acid for two minutes and the resulting product was characterized. Scanning electron microscopy was employed to characterize the morphology of the acid treated product. Inert gas fusion was used for determination of oxygen in the high-purity niobium. X-ray photoelectron spectroscopy was employed to characterize the surface ratio of oxygen to niobium. The oxygen concentration was 30 ppm in the acid-treated material and 70 ppm in the untreated material. X-ray photoelectron spectroscopy was employed to characterize the reduction of oxygen at the surface. The ratio of oxygen to niobium decreased from 9.75 to 2.60 without treatment compared to acid treatment for two minutes. The concentrations of adsorbed water and niobium oxide decreased following etching. The acid-treated high-purity niobium was characterized by argon ion bombardment; adsorbed water molecules and niobium oxides were not present but non-lattice oxygen was observed.     

Anisotropic oxidation of MoS2 crystallites studied by angle-resolved X-ray photoelectron spectroscopy

The oxidation behavior of the solid lubricant MoS₂ was studied using X-ray photoelectron spectroscopy. MoS₂-containing slip ring brushes were used to take advantage of anisotropic orientation of the plate-shaped MoS₂ crystallites occurring during fabrication of the brushes. Because oxidation occurs preferentially at the edges of the crystallites, greater oxidation fractions are measured when the edges are oriented toward the photoelectron energy analyzer. These results indicate a novel method for separately probing the chemistry on the edge and (lubricious) basal surfaces of MoS₂.     

现代X光电子能谱(XPS)分析技术

现代电子能谱仪有3个主要功能:单色XPS(Mono XPS)、小面积XPS(SAXPS)和成像XPS(iXPS),被认为是光电子能谱仪发展方向。本文介绍这3个功能突出的特点及在材料微分析方面的实际应用。     

Note: binding energy scale calibration of electron spectrometers for photoelectron spectroscopy using a single sample

The feasibility of calibrating the binding energy scale for photoelectron spectroscopy using a single sample without sputter cleaning was investigated. By measuring the Fermi level of a Au film with both monochromatic Al Kα (hν = 1486.7 eV) and He Iα (hν = 21.22 eV), the binding energy scale was simply and accurately calibrated. This method is found to yield binding energy values for the Cu 2p(3/2), Ag 3d(5/2), and Au 4f(7/2) peaks that agree with the standard tabulated values defined in International Organization for Standardization 15472 to within ±0.02 eV.     

The use of X-ray photoelectron spectroscopy to estimate the stability of primary mass standards

Because it is still defined in terms of an artefact, the limit on the accuracy with which the SI unit of mass can be realised is largely limited by the surface stability of the kilogram standard. Not only is this true on the case of the International Prototype used to define the unit but also for national standard copies and indeed for mass standards in general. This paper describes the use of X-ray photoelectron spectroscopy (XPS) to study the accretion of contamination of the surfaces of standard masses. Angle Resolved X-ray photoelectron spectroscopy (AR XPS) was used to characterise the surfaces of platinum–iridium and stainless steel mass standards stored either in air or in vacuum, or which have been transferred between the two media. Various analysis methods for XPS data have been compared both in terms of providing an overlayer thickness on the mass standard and in terms of analysing the composition of this layer of contamination.     

Investigation of transfer phenomenon by X-ray photoelectron spectroscopy and tribological properties of polymers sliding against polymers

Tribological properties of polymeric materials were investigated with various polymer-polymer combinations by means of a pin-on-disk wear testing apparatus. The specific wear rate was related to the cohesive energy density of the polymeric materials, but hat of a given polymer slider was dependent on the mated polymeric materials, and a high wear rate was observed in the sliding against a polymer counterface with higher cohesive energy than that of the slider. By means of X-ray photoelectron spectroscopy it was confirmed that the polymer transfer did occur on the mated polymer, and the degree of covering of the track with transfer films could be estimated. The covering ratio with transfer films was dependent on the polymer-polymer combinations. Poly(tetrafluoroethylene) (PTFE) transfer film on various polymers was very effective in reducing friction irrespective of the covering with the transfer films. With the other polymers, high density poly(ethylene) (HDPE), poly(propylene) (PP), and polyacetal (PAc), the transfer film was less effective in reducing friction than PTFE transfers and friction in the steady state dependent on the polymer-polymer combinations.