发射层对指数掺杂Ga1-χAlχ As/GaAs光阴极性能的影响

为了探索发射层厚度对指数掺杂Ga1-χAlχAs/GaAs光电阴极光学性能与光电发射性能的影响,实验制备了两种发射层厚度不同的阴极样品,并测试得到400μm～1 000 nm内反射率、透射率与光谱响应曲线.实验结果说明发射层2.0 μm厚的样品比1.6μm厚的样品性能更好.利用薄膜光学矩阵理论公式计算阴极膜系反射率、透射率、吸收率与发射层厚度的关系公式,并对原有的量子效率公式进行光谱反射率和短波截止限的修正.用修正后的公式仿真不同发射层厚度下光阴极吸收率与光谱响应曲线,指出发射层厚度对阴极光学性能与光电发射性能的不同影响.进一步计算得到指数掺杂的Ga1-χAlχAs/GaAs光电阴极最佳发射层厚度范围是1.8μm～2.4μm.     

会议文章 发射层对指数掺杂Ga1-xAlxAs/GaAs光阴极性能的影响

为了探索发射层厚度对指数掺杂Ga1-xAlxAs/GaAs光电阴极光学性能与光电发射性能的影响,实验制备了两种发射层厚度不同的阴极样品,并测试得到400~1000 nm内反射率、透射率与光谱响应曲线。实验结果说明发射层2.0 μm厚的样品比1.6 μm厚的样品性能更好。利用薄膜光学矩阵理论公式计算阴极膜系反射率、透射率、吸收率与发射层厚度的关系公式,并对原有的量子效率公式进行光谱反射率和短波截止限的修正。用修正后的公式仿真不同发射层厚度下光阴极吸收率与光谱响应曲线,指出发射层厚度对阴极光学性能与光电发射性能的不同影响。进一步计算得到指数掺杂的Ga1-xAlxAs/GaAs光电阴极最佳发射层厚度范围是1.8~2.4 μm。     

高温激活的变掺杂GaAs光电阴极研究

为了获得高量子效率的GaAs光电阴极,要求GaAs材料的电子扩散长度足够长,且电子表面逸出几率大,而这两个参数都要受到P型掺杂浓度的限制。经过对由体内到表面掺杂浓度由高到低的变掺杂GaAs光电阴极进行比较深入的激活实验和光谱响应理论研究,实验结果显示,适当的表面掺杂浓度GaAs光电阴极材料,在高温激活结束后获得了较高的灵敏度和较好的稳定性。根据实验结果和反射式变掺杂GaAs光电阴极量子效率理论预测曲线,对变掺杂GaAs光电阴极材料掺杂结构提出了进一步优化的思路。研究表明,变掺杂GaAs光电阴极将成为发展我国高性能GaAs光电阴极的一项重要途径。     

不同尺寸分布的自组织In0.55Al0.45As/Al0.5Ga0.5As量子点的静压光谱

在15K测量了不同尺寸分布的In0.55A10.45As/Al0.5Ga05As量子点的静压光致发光,静压范围为0-1.3GPa.常压下观察到三个发光峰,分别来源于不同尺寸的量子点(横向直径分别为26、52和62am)的发光.它们的压力系数分别为82、94和98meV/Gpa,都小于In0.55Al0.45As体材料带边的压力系数,特别是尺寸为26nm的小量子点比In0.55Al0.45As体材料带边小17%,并且压力系数随量子点尺寸的变小而减小.理论计算表明有效质量的增大和Γ-X混合是量子点压力系数变小的主要原因,并得到横向直径为26和52nm的小量子点的Γ-X混合势为15和10meV.根据实验还确定In0.55Al0.45As/Al0.5Ga0.5As量子点系统X能带具有Ⅱ类结构,并且估算出价带不连续量为0.15±0.02.     

GaAs阴极激活铯源质量对成像器件性能的影响

为了解决三代微光器件研究中出现的阴极灵敏度低、光电发射不均匀、稳定性差等问题,重点开展了铯源质量对阴极性能产生影响的试验研究。结果表明,激活铯源纯度、装配结构、铯源与阴极距离对阴极光电发射灵敏度、均匀性影响最大。铯源出口孔径多少大小及射出方向是阴极产生暗班的主要原因。在铯源材料成分结构与阴极距离确定之后,阴极灵敏度的高低主要决定于对铯源的除气工艺,通过对铯源除气工艺进行优化,制备出了阴极灵敏度大于1700μA/lm三代微光器件。     

GaAs/GaAlAs透射式光电阴极发射电子的平均横向能量

用扫描电镜观测了 Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 透射式光电阴极的表面形貌,计算了阴极表面形貌对阴极发射电子的平均横向能量的贡献,测量了阴极激活过程中阴极发射电子的平均横向能量随激活时间的变化。结果表明, Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 阴极表层的 Ｃｓ／ Ｏ 激活层对电子的散射是导致阴极发射电子的平均横向能量值增高的根本原因。最后提出减少阴极发射电子的平均横向能量的技术途径。     

快速热退火对高应变InGaAs/Ga As量子阱的影响

用固态分子束外延技术生长了高应变In0.45Ga0.55As/GaAs量子阱材料. 研究了快速热退火对高应变InGaAs/GaAs量子阱材料光学性质的影响. 本文采用假设InGaAs/GaAs量子阱中的In-Ga原子扩散为误差函数扩散并解任意形状量子阱的薛定谔方程的方法，对不同退火温度下InGaAs/GaAs量子阱室温光致发光峰值波长拟合，得到了In原子在高应变InGaAs/GaAs量子阱中的扩散系数以及扩散激活能（0.88eV) .     

磁场对GaAs/AlxGa1-xAs异质结系统中束缚极化子的影响

对GaAs/AlxGa1-xAs单异质结系统引入三角势近似异质结势,同时考虑体纵光学(LO)声子和有效近似下两支界面光学(IO)声子的影响,采用变分法讨论了外界恒定磁场对束缚于近界面杂质的光学极化子结合能的影响.利用改进的Lee-Low-Pines(LLP)中间耦合方法处理电子-声子和杂质-声子的相互作用,计算了杂质态结合能随杂质位置、磁场强度、电子面密度的变化关系.结果表明,极化子结合能随磁场呈现增加的趋势,其中LO声子对结合能的负贡献受磁场影响显著,而IO声子的负贡献受磁场的影响并不明显,但当杂质靠近界面时,杂质-IO声子相互作用对磁场的影响很敏感.结果还表明,导带弯曲作用不容忽略;电子像势对结合能的影响很小,可以忽略.     

缓冲层对多量子阱材料GaAs／Ga1-xAlxAs共振态的影响

从理论上研究缓冲层的厚度和特性对多量子阱材料(GaAs／Ga1-xAlxAs)中的共振态的影响，利用界面响应理论的格林函数方法，计算了局域和总电子态密度以及电子对结的穿透率，展示了缓冲层特性对态密度特征峰、穿透率的影响。结果表明，缓冲层具有控制共振隧穿电子和影响系统电子态的作用。     

调制掺杂Al_xGa_(1-x)As/GaAs异质结持久光电导的光谱响应

本文在77 K下研究了调制掺杂 n-Al_(0.3)Ga_(0.7)As/GaAs异质结持久光电导的光谱响应.结果表明,掺 Cr GaAs衬底中Cr深能级上电子的激发和 Al_xGa_(1-x)As中DX中心的光离化都产生持久光电导.     

GaAs光电阴极的MOCVD法生长及其激活工艺研究

本文报道了用ＭＯＣＶＤ法生长出了有效的ＧａＡｓ光电阴极材料，并且在国产的ＧａＡｓ光电阴极激活系统上进行激活实验，其反射式积分灵敏度高于１０００μＡ／ｌｍ。     

掩蔽与选择性热氧化条形GaAs—Ga_(1-x)Al_xAs DH激光器的偏振特性

本文研究具有掩蔽和选择性热氧化(MSTO)结构条形GaAs-Ga_(1-x)Al_xAsDH激光器的偏振特性,发现这类器件同时输出强度相近、相位无关的TE和TM模,不同于通常的半导体激光器主要是TE模输出的情况。本文从激光器有源区内应力分布和光弹性效应的观点,对此异常的偏振特性作出了定性解释。     

Femtosecond studies of intervalley scattering in GaAs and AlxGa1-xAs

Results are presented from ensemble Monte Carlo simulations of the relaxation of photoexcited electrons and holes. The results are compared directly with three types of femtosecond optical experiments: transient absorption saturation, pump and continuum probe, and tunable pump-probe experiments. For these experiments we find that intervalley scattering has a dominant effect for the first several hundred femtoseconds, and that electron-electron scattering is only important at later times.     

具有AlGaAs缓变结构的InGaP/GaAs HBT性能改进分析

对改进型结构具有零导带势垒尖峰的缓变InGaP/AlGaAs/GaAs HBT器件的直流和高频特性进行了理论探讨,并同传统突变结构的InGaP/GaAs HBT的相应性能作了比较。结果表明:在低于30 nm的一定范围内的缓变层厚度下,与突变的InGaP/GaAs HBT相比,改进型结构的InGaP/AlGaAs/GaAs HBT具有更低的offset和开启电压、更强的电流驱动能力、更好的伏-安输出特性和高频特性。     

Influence of sputtering pressure on optical constants of a-GaAs1-xNx thin films*

Amorphous GaAs_1-xN_x(a-GaAs_1-xN_x) thin films have been deposited at room temperature by a reactive magnetron sputtering technique on glass substrates with different sputtering pressures.The thickness,nitrogen content,carrier concentration and transmittance of the as-deposited films were determined experimentally.The influence of sputtering pressure on the optical band gap,refractive index and dispersion parameters（E_o,E_d） has been investigated.An analysis of the absorption coefficient revealed a direct optical transition characterizing the asdeposited films.The refractive index dispersions of the as-deposited a-GaAs_1-xN_x films fitted well to the Cauchy dispersion relation and the Wemple model.     

磁场对GaAs/Al_xGa_(1-x)As异质结系统中束缚极化子的影响

对GaAs/AlxGa1-xAs单异质结系统引入三角势近似异质结势,同时考虑体纵光学(LO)声子和有效近似下两支界面光学(IO)声子的影响,采用变分法讨论了外界恒定磁场对束缚于近界面杂质的光学极化子结合能的影响.利用改进的Lee-Low-Pines(LLP)中间耦合方法处理电子-声子和杂质-声子的相互作用,计算了杂质态结合能随杂质位置、磁场强度、电子面密度的变化关系.结果表明,极化子结合能随磁场呈现增加的趋势,其中LO声子对结合能的负贡献受磁场影响显著,而IO声子的负贡献受磁场的影响并不明显,但当杂质靠近界面时,杂质-IO声子相互作用对磁场的影响很敏感.结果还表明,     

GaAs MISFET制备中柠檬酸/双氧水溶液对GaAs/AlxGa1-xAs结构的选择湿法腐蚀

用α台阶仪和原子力显微镜(AFM)研究了不同体积比的柠檬酸(50%)/双氧水溶液对GaAs/AlxGa1-xAs系统的选择湿法腐蚀特性,对AlxGa1-xAs停止层的组分和腐蚀液体积比进行了优化.当腐蚀液体积比在1.5∶1到2∶1范围时获得了最好的选择腐蚀效果.在25℃.温度条件下,当腐蚀液体积比为1.5∶1时,对Al摩尔分数x为0.2、0.3和1的GaAs/AlxGa1-xAs系统腐蚀比分别为45、74和大于200,表面腐蚀形貌均匀平整.将这种选择腐蚀技术用于GaAsMISFET的栅槽工艺,获得了良好的阈值电压均匀性.     

Influence of MBE growth temperature on GaAs/AlAs resonant tunneling structures

Double barrier GaAs/AlAs tunneling structures with typical 2.5:1 room temperature peak-to-valley current ratios are examined using Deep Level Transient Spectroscopy. Deep level trap concentrations are found to be much higher in samples grown at 550° C compared to those grown at 650° C. For devices grown at 550° C, an impedance switch-ing effect due to a high concentration of deep levels is observed. The peak-to-valley ratio of the tunneling devices is largely unaffected by the growth temperatures in this range, indicating that higher growth temperatures can be employed to grow resonant tunnel-ing diodes than previously suggested in the literature.     

Influence of DX centers on the performance of unipolarsemiconductor lasers based on GaAs-AlxGa1-xAs

Optical and electrical characteristics of quantum cascade lasers, made in the GaAs-Al_xGa_1-xAs material system, show persistent changes at low temperatures, when devices are illuminated with an external white light. The magnitude of the effect is a function of the exposure time and finally saturates. The induced variation on the threshold current density of the lasers is more than 30%. This effect is related to the presence of deep donors (DX centers) in the high aluminum content AlGaAs cladding layers, which under illumination release electrons, thus increasing waveguide losses. By analyzing the light induced variations of the optical characteristics we were able to deduce the waveguide losses of our devices     

Large signal and noise properties of heterojunction AlxGa1-xAs/GaAs DDRIMPATTs

Simulation studies are carried out on the large signal and noise properties of heterojunction (HT) Al_xGa_1-xAs/GaAs double drift region (DDR) IMPATT devices at V-band (60 GHz). The dependence of Al mole fraction on the aforementioned properties of the device has been investigated. A full simulation software package has been indigenously developed for this purpose. The large signal simulation is based on a non-sinusoidal voltage excitation model. Three mole fractions of Al and two complementary HT DDR structures for each mole fraction i.e., six DDR structures are considered in this study. The purpose is to discover the most suitable structure and corresponding mole fraction at which high power, high efficiency and low noise are obtained from the device. The noise spectral density and noise measure of all six HT DDR structures are obtained from a noise model and simulation method. Similar studies are carried out on homojunction (HM) DDR GaAs IMPATTs at 60 GHz to compare their RF properties with those of HT DDR devices. The results show that the HT DDR device based on N-Al_xGa_1-xAs/p-GaAs with 30% mole fraction of Al is the best one so far as large signal power output, DC to RF conversion efficiency and noise level are concerned.