共查询到17条相似文献,搜索用时 125 毫秒
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脉冲激光薄膜制备技术 总被引:16,自引:2,他引:14
脉冲激光薄膜沉积是近年来受到普遍关注的制膜新技术。简要介绍了脉冲激光薄膜沉积技术的物理原理、独具的特点和研究发展动态,并介绍了采用脉冲激光薄膜沉积技术制备硅基纳米PtSi薄膜的结果 相似文献
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冯秀丽 《中国材料科技与设备》2007,4(4):15-18
本文简述了LiCoO2在粉体和薄膜中晶体结构与电化学性能;详细介绍了钴酸锂薄膜的制备方法并评述了不同合成方法、制备条件对钴酸锂薄膜结合强度、结构、形貌及电化学性能的影响,指出脉冲激光沉积法是一项值得深入研究的钴酸锂薄膜制备技术。 相似文献
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大功率脉冲激光纳米薄膜制备技术 总被引:2,自引:0,他引:2
陈学康 《真空科学与技术学报》1995,(2)
讨论脉冲激光薄膜沉积技术的基本物理过程、独具的优点及可能的应用,并介绍了一些激光制备薄膜实验的结果。 相似文献
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E. Kaidashev V. Dneprovski D. Breus R. N. Sheftal 《Journal of Superconductivity and Novel Magnetism》2000,13(3):407-410
Using a shadowed pulsed laser deposition allows us to reduce the number of droplets on the YBa2Cu3O7?x film surface obtained by pulsed laser deposition method. In this study, we present a new modification of pulsed laser deposition method: a shadowed off-axis pulsed laser deposition. The substrate surface lies in the plain defined by the laser beam. A rectangular shadow mask located between target and substrate reduce the quantity of large particles deposited from the diffusion flow. Such geometry allows us to carry out the laser plume scanning on the target surface for simultaneous one-step double-sided deposition films with a droplet-free surface. Both films had good superconducting properties. 相似文献
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Using a shadowed pulsed laser deposition allows us to reduce the number of droplets on the YBa2Cu3O7–x
film surface obtained by pulsed laser deposition method. In this study, we present a new modification of pulsed laser deposition method: a shadowed off-axis pulsed laser deposition. The substrate surface lies in the plain defined by the laser beam. A rectangular shadow mask located between target and substrate reduce the quantity of large particles deposited from the diffusion flow. Such geometry allows us to carry out the laser plume scanning on the target surface for simultaneous one-step double-sided deposition films with a droplet-free surface. Both films had good superconducting properties. 相似文献
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Doped silicon nanowires (NWs) were epitaxially grown on silicon substrates by pulsed laser deposition following a vapour-liquid-solid process, in which dopants together with silicon atoms were introduced into the gas phase by laser ablation of lightly and highly doped silicon target material. p-n or p(++)-p junctions located at the NW-silicon substrate interfaces were thus realized. To detect these junctions and visualize them the electron beam induced current technique and two-point probe current-voltage measurements were used, based on nanoprobing individual silicon NWs in a scanning electron microscope. Successful silicon NW doping by pulsed laser deposition of doped target material could experimentally be demonstrated. This doping strategy compared to the commonly used doping from the gas phase during chemical vapour deposition is evaluated essentially with a view to potentially overcoming the limitations of chemical vapour deposition doping, which shows doping inhomogeneities between the top and bottom of the NW as well as between the core and shell of NWs and structural lattice defects, especially when high doping levels are envisaged. The pulsed laser deposition doping technique yields homogeneously doped NWs and the doping level can be controlled by the choice of the target material. As a further benefit, this doping procedure does not require the use of poisonous gases and may be applied to grow not only silicon NWs but also other kinds of doped semiconductor NWs, e.g. group III nitrides or arsenides. 相似文献
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Rau JV Latini A Teghil R De Bonis A Fosca M Caminiti R Rossi Albertini V 《ACS applied materials & interfaces》2011,3(9):3738-3743
Attempts to synthesize and/or theoretically predict new superhard materials are the subject of an intense research activity. The trials to deposit them in the form of films have just began. WB(2) (77 wt % WB(2) and 23 wt % WB(4)) and WB(4) (65 wt % WB(4) and 35 wt % WB(2)) polycrystalline bulk samples were obtained in this work via electron beam synthesis technique and, subsequently, used as targets for films preparation by the pulsed laser deposition method. The targets were irradiated by a frequency-doubled Nd:glass laser with a pulse duration of 250 fs. The films grown on SiO(2) substrates at 600 °C were characterized by X-ray diffraction, scanning electron and atomic force microscopies, and Vickers microhardness technique. The deposited films are composed of WB(4). The intrinsic film hardness, calculated according to the "law-of-mixtures" model, lies in the superhardness region 42-50 GPa. 相似文献
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R.C. Estler S. Foltyn A.R. Garcia R.E. Muenchausen N.S. Nogar M. Trkula 《Materials and Manufacturing Processes》1990,5(4):529-548
High quality thin films of high temperature superconductors (HTS) have been fabricated using pulsed or cw lasers as physical vapor deposition sources. There is current interest in scaling the pulsed laser deposition (PLD) technique to coat 3-in. wafers with HTS. Process control and diagnostics relevant to achieving the required scaling and reproducibility will be reviewed. 相似文献