A 10-bit 100-MS/s CMOS pipelined folding A/D converter

This paper presents a 10-bit 100-MSample/s analog-to-digital（A/D） converter with pipelined folding architecture.The linearity is improved by using an offset cancellation technique and a resistive averaging interpolation network.Cascading alleviates the wide bandwidth requirement of the folding amplifier and distributed interstage track/hold amplifiers are used to realize the pipeline technique for obtaining high resolution.In SMIC 0.18μm CMOS,the A/D converter is measured as follows:the peak integral nonlinearity and differential nonlinearity are±0.48 LSB and±0.33 LSB,respectively.Input range is 1.0 V_P-P with a 2.29 mm² active area.At 20 MHz input @ 100 MHz sample clock,9.59 effective number of bits,59.5 dB of the signal-to-noise-and-distortion ratio and 82.49 dB of the spurious-free dynamic range are achieved.The dissipation power is only 95 mW with a 1.8 V power supply.     

一种10位100-MS/s CMOS流水折叠式A/D转换器

采用流水折叠结构设计了一种10位100-MSample/s A/D转换器。失调取消技术和电阻平均插值网络提高了转换器的线性度。级联结构放宽了折叠放大器的带宽要求,采用分布式级间跟踪保持放大器实现流水线技术来获得更高的转换精度。基于SMIC 0.18 μm CMOS工艺的测试结果如下：INL和DNL的峰值分别为0.48 LSB and 0.33 LSB。输入电压范围VP-P为1.0 V,芯片面积2.29 mm2。100 MHz采样,20 MHz输入信号下,ENOB为9.59位,SNDR为59.5 dB,SFDR为82.49 dB。1.8V电源电压下功耗仅为95 mW。     

A self-trimming 14-b 100-MS/s CMOS DAC

A 14-b 100-MS/s CMOS digital-analog converter (DAC) designed for high static and dynamic linearity is presented. The DAC is based on a central core of 15 thermometer decoded MSBs, 31 thermometer decoded upper LSBs (ULSBs) and 31 binary decoded lower LSBs (LLSBs). The static linearity corresponding to the 14-b specification is obtained by means of a true background self-trimming circuit which does not use additional current sources to replace the current source being measured during self-trimming. The dynamic linearity of the DAC is enhanced by a special track/attenuate output stage at the DAC output which tracks the DAC current outputs when they have settled but attenuates them for a half-clock cycle after the switching instant. The DAC occupies 3.44 mm×3.44 mm in a 0.35-μm CMOS process, and is functional at up to 200 MS/s, with best dynamic performance obtained at 100 MS/s. At 100 MS/s, power consumption is 180 mW from a 3.3-V power supply, and 210 mW at 200 MS/s     

A 10-bit 200-MS/s CMOS parallel pipeline A/D converter

This paper describes a 10-bit 200-MS/s CMOS parallel pipeline analog-to-digital (A/D) converter that can sample input frequencies above 200 MHz. The converter utilizes a front-end sample-and-hold (S/H) circuit and four parallel interleaved pipeline component A/D converters followed by a digital offset compensation. By optimizing for power in the architectural level, incorporating extensively parallelism and double-sampling both in the S/H circuit and the component ADCs, a power dissipation of only 280 mW from a 3.0-V supply is achieved. Implemented in a 0.5-μm CMOS process, the circuit occupies an area of 7.4 mm². The converter achieves a differential nonlinearity and integral nonlinearity of ±0.8 LSB and ±0.9 LSB, respectively, while the peak spurious-free-dynamic-range is 55 dB and the total harmonic distortion better than 46 dB at a sampling rate of 200 MS/s     

A continuously calibrated 12-b, 10-MS/s, 3.3-V A/D converter

The continuous calibration of high-linearity, highspeed analog/digital converters (ADCs) can minimize system complexity by allowing a single converter to maintain its accuracy over time. This paper introduces a continuous calibration technique for pipelined and successive approximation ADCs that avoids some of the limitations of earlier designs by performing the calibration in the analog domain. The calibration is made transparent to the overall system by employing an extra stage that is calibrated outside of the main converter's operation and periodically substituted for a stage within the main converter. A 12-b, pipelined ADC employing this architecture has been integrated in a 0.5-μm, single-poly, quadruple-metal, 3.3-V CMOS technology. The measured dynamic performance indicates that at a 10-MHz sampling rate, the circuit achieves a peak signal-to-noise-plus-distortion ratio of 67 dB and a total harmonic distortion of -77 dR for a 4.8-MHz input. The total power dissipated by the prototype is 335 mW, and its active area is 3.71×3.91 mm²     

A 10-b 120-MS/s CMOS Track-and-Hold Amplifier

A novel track-and-hold (T&H) employing an operational transconductance amplifier (OTA) with two cross-coupled differential pairs (CCDPs) is proposed for high-accuracy and high-frequency applications. The T&H has a simple architecture requiring smaller capacitors and fewer switches and offers higher speed, lower distortion, and lower power dissipation than its op-amp based counterparts. The chip implemented in 0.35 μm CMOS process operates from a single 1.8 V supply and achieves more than 10-bits precision for sampling rate in excess of 120 MS/s.Jong-Kug Seon was born in Seoul, Korea, in 1966. He received the B.S. and M.S. degrees in Electronic Engineering from INHA University, Korea, in 1993 and 1995, respectively. In 1995, he joined the research & Development Center, LG Industrial Systems Co., Ltd., Korea, where he was engaged in the development of In-Circuit Tester (ICT) and worked on circuit designs at Urban Business System Lab. He moved to France in 1997 and received the Ph.D degree with the subjects related to VHDL-AMS (Analog Mixed System) and circuit design of Phase-Locked Loop, in Communication and Electronic Engineering from ENST (Ecole Nationale Superieure des Telecommunications), Paris, France, in 2000. From November 2000 to December 2003, he was with Nortel Networks, Harlow, UK, as an Analog Circuit Design Engineer, where he was working on the research and development of high-speed integrated circuits for optical communications.Since 2004 he has been with the Telemetrics Laboratory at the research {&} Development Center, LG Industrial Systems Co., Ltd., Korea, as the project leader of the RF Integrated Circuit and System Design Unit.He specializes in CMOS and BiCMOS analog integrated circuits and RF device modeling, particularly for telecommunication applications. He has published more than 10 papers in international journals and conferences and holds 5 patents in the fields of Analog circuit design and MOSFET device modeling. He has been awarded the Outstanding Paper Award in Mixed Design of Integrated Circuits and Systems, Poland, 2000.     

A 70-MS/s 110-mW 8-b CMOS folding and interpolating A/D converter

A CMOS analog to digital converter based on the folding and interpolating technique is presented. This technique is successfully applied in bipolar A/D converters and now also becomes available in CMOS technology. The analog bandwidth of the A/D converter is increased by using a transresistance amplifier at the outputs of the folding amplifiers and, due to careful circuit design, the comparators need no offset compensation. The result is a small area (0.7 mm² in 0.8 μm CMOS), high speed (70 MS/s), and low-power (110 mW at 5 V supply, including reference ladder) A/D converter. A 3.3 V supply version of the circuit runs at 45 MS/s and dissipates 45 mW     

A 14-b, 100-MS/s CMOS DAC designed for spectral performance

A 14-bit, 100-MS/s CMOS digital-to-analog converter (DAC) designed for spectral performance corresponding more closely to the 14-bit specification than current implementations is presented. This DAC utilizes a nonlinearity-reducing output stage to achieve low output harmonic distortion. The output stage implements a return-to-zero (RZ) action, which tracks the DAC once it has settled and then returns to zero. This RZ circuit is designed so that the resulting RZ waveform exhibits high dynamic linearity. It also avoids the use of a hold capacitor and output buffer as in conventional track/hold circuits. At 60 MS/s, DAC spurious-free dynamic range is 80 dB for 5.1-MHz input signals and is down only to 75 dB for 25.5-MHz input signals. The chip is implemented in a 0.8-μm CMOS process, occupies 3.69×3.91 mm ² of die area, and consumes 750 mW at 5-V power supply and 100-MS/s clock speed     

An 8-b 85-MS/s parallel pipeline A/D converter in 1-μm CMOS

A new architecture consisting of a time-interleaved array of pipelined analog-to-digital converters (ADCs) is presented. A prototype has been designed consisting of four switched-capacitor (S/C) multistage pipelined ADCs in parallel. Hardware cost is minimized by sharing resistor strings, bias circuitry and clock generation circuitry over the array. Digital error correction is employed to ease comparator accuracy requirements. Techniques are employed to minimize the effect of mismatches across the array. A key circuit issue is the design of a high-speed sample-and-hold (S/H) amplifier: a fully differential, mostly NMOS, non-folded-cascode operational-amplifier topology is used. An experimental chip was implemented in 1-μm CMOS and 8-b resolution at a sample rate of 85 megasamples per second (MS/s) was obtained. Signal-to-noise plus distortion (S/(N+D)) was 41 dB for an input sinusoid of 40 MHz     

A 15-b 40-MS/s CMOS pipelined analog-to-digital converter with digital background calibration

This study presents a 15-b 40-MS/s switched-capacitor CMOS pipelined analog-to-digital converter (ADC). High resolution is achieved by using a correlation-based background calibration technique that can continuously monitor the transfer characteristics of the critical pipeline stages and correct the digital output codes accordingly. The calibration can correct errors associated with capacitor mismatches and finite opamp gains. The ADC was fabricated using a 0.25-/spl mu/m 1P5M CMOS technology. Operating at a 40-MS/s sampling rate, the ADC attains a maximum signal-to-noise-plus-distortion ratio of 73.5 dB and a maximum spurious-free-dynamic-range of 93.3 dB. The chip occupies an area of 3.8/spl times/3.6 mm/sup 2/, and the power consumption is 370 mW with a single 2.5-V supply.     

A power-efficient 10-bit 40-MS/s sub-sampling pipelined CMOS analog-to-digital converter

This paper presents a 10-bit 40-MS/s pipelined analog-to-digital converter (ADC) in a 0.13-μm CMOS process for subsampling applications. A simplified opamp-sharing scheme between two successive pipelined stages is proposed to reduce the power consumption. For subsampling, a cost-effective fast input-tracking switch with high linearity is introduced to sample the input signal up to 75 MHz. A two-stage amplifier with hybrid frequency compensation is developed to achieve both high bandwidth and large swing with low power dissipation. The measured result shows that the ADC achieves over 77 dB spurious free dynamic range (SFDR) and 57.3 dB signal-to-noise-plus-distortion ratio (SNDR) within the first Nyquist zone and maintains over 70 dB SFDR and 55.3 dB SNDR for input signal up to 75 MHz. The peak differential nonlinearity (DNL) and integral nonlinearity (INL) are ±0.2 LSB and ±0.3 LSB, respectively. The ADC consumes 15.6 mW at the sampling rate of 40 MHz from a 1.2-V supply voltage, and achieves a figure-of-merit (FOM) value of 0.22 pJ per conversion step.     

A 12-b, 10-MHz, 250-mW CMOS A/D converter

A 12-b, 10-MHz, 250-mW, four-stage analog-to-digital converter (ADC) was implemented using a 0.8-μm p-well CMOS technology. The ADC based on a digitally calibrated multiplying digital-to-analog converter (MDAC) selectively employs a binary-weighted capacitor array in the front-end stage and a unit-capacitor array in the remaining back-end stages to obtain 12 b level linearity while maintaining high yield. All the analog and digital circuit functional blocks are fully integrated on a single chip, which occupies a die area of 15 mm² (4.2 mm×3.6 mm). Measured differential nonlinearity (DNL) and integral nonlinearity (INL) of the prototype are less than ±0.8 LSB and ±1.8 LSB, respectively     

A 12-b 5-Msample/s two-step CMOS A/D converter

Two-step flash architectures are an effective means of realizing high-speed high-resolution analog-to-digital converters (ADCs) because they can be implemented without the need for operational amplifiers having either high gain or a large output swing. Moreover, with conversion rates approaching half those of fully parallel designs, such half-flash architectures provide both a relatively small input capacitance and low power dissipation. The authors describe the design of a 12-b 5-Msample/s A/D converter that is based on a two-step flash topology and has been integrated in a 1-μm CMOS technology. Configured as a fully differential circuit, the converter performs a 7-b coarse flash conversion followed by a 6-b fine flash conversion. Both analog and digital error correction are used to achieve a resolution of 12 b. The converter dissipates only 200 mW from a single 5-V supply and occupies an area of 2.5 mm × 3.7 mm     

A 10-b 15-MHz CMOS recycling two-step A/D converter

A two-step recycling technique is applied to implement a 10-b CMOS analog-to-digital (A/D) converter with a video conversion rate of 15 Msample/s. In a prototype digitally corrected converter, one capacitor-array multiplying digital-to-analog converter (MDAC) is used repeatedly as a sample-and-hold (S/H) amplifier, a DAC, and a residue amplifier so that the proposed converter may obtain linearity with the capacitor-array matching. An experimental fully differential A/D converter implemented using a double-poly 1-μm CMOS technology consumes 250 mW with a 5-V single supply, and its active die area, including all digital logic and output buffers, is 1.75 mm² (2700 mil²). Because the conversion accuracy of the proposed architecture relies on a capacitor-array MDAC linearity, high-resolution CMOS A/D conversions are feasible at high frequencies if sophisticated circuit techniques are further developed. For high-speed two-phase versions, the system can be easily modified to use multiplexing and/or pipelining techniques with a separate S/H amplifier and/or two separate flash converters     

A 10-b 185-MS/s track-and-hold in 0.35-μm CMOS

This paper discusses the design and the implementation of a high-speed track-and-hold amplifier in 0.35-μm CMOS, featuring 10-b resolution up to 185 MS/s. The implemented folded-cascode input buffer allows a relatively large input range, 1-V_pp differential, and low harmonic distortion at the same time. The sampler is based oh a switched-source-follower (SSF) architecture with double switch-off action and saturation-mode switches, providing short aperture times and high linearity. A spur-free dynamic range (SFDR) of 63 dB at 185 MS/s was measured with a dual-tone 45-MHz±250-kHz test signal. The open-loop architecture makes harmonic distortion little sensitive to the input frequency: 10-b resolution is maintained up to 45 MHz with 1 V_pp and up to 70 MHz with 0.7 V_pp. A suitable hold-mode feedthrough rejection is achieved by means of feedforward cancellation with a MOS capacitor operating in depletion or accumulation. The track-and-hold amplifier consumes 70 mW from a 3.3-V supply     

A 14-b 12-MS/s CMOS pipeline ADC with over 100-dB SFDR

A 1.8-V 14-b 12-MS/s pseudo-differential pipeline analog-to-digital converter (ADC) using a passive capacitor error-averaging technique and a nested CMOS gain-boosting technique is described. The converter is optimized for low-voltage low-power applications by applying an optimum stage-scaling algorithm at the architectural level and an opamp and comparator sharing technique at the circuit level. Prototyped in a 0.18-/spl mu/m 6M-1P CMOS process, this converter achieves a peak signal-to-noise plus distortion ratio (SNDR) of 75.5 dB and a 103-dB spurious-free dynamic range (SFDR) without trimming, calibration, or dithering. With a 1-MHz analog input, the maximum differential nonlinearity is 0.47 LSB and the maximum integral nonlinearity is 0.54 LSB. The large analog bandwidth of the front-end sample-and-hold circuit is achieved using bootstrapped thin-oxide transistors as switches, resulting in an SFDR of 97 dB when a 40-MHz full-scale input is digitized. The ADC occupies an active area of 10 mm/sup 2/ and dissipates 98 mW.     

一个10位、50MS/s CMOS折叠流水结构A/D转换器

在 0.6μmDPDM标准数字CMOS工艺条件下 ,实现 10位折叠流水结构A/D转换器 ,使用动态匹配技术 ,消除折叠预放电路的失调效应 ;提出基于单向隔离模拟开关的分步预处理 ,有效压缩了电路规模 ,降低了系统功耗 .在5V电源电压下 ,仿真结果为 :当采样频率为50MSPS时 ,功耗为 12 0mW ,输入模拟信号和二进制输出码之间延迟为2.5个时钟周期 ,芯片面积 1.44mm2 .     

A 10-b 40-Msample/s BiCMOS A/D converter

A fully-differential, 10-b, 40-Msample/s pipelined analog-to-digital converter (ADC) has been developed and tested. The converter exhibits a signal-to-(noise+distortion) ratio (SNDR) of 57.1 dB and consumes <400 mW of power from a single 5 V supply. The converter can digitize not only a fully-differential but also a single-ended input signal over a wide input range with little variation in converter performance. In addition, a full-power bandwidth (FPBW) of >250 MHz is made possible with the open-loop sampling scheme     

一个10位、50MS/s CMOS折叠流水结构A/D转换器

在0.6μm DPDM标准数字CMOS工艺条件下,实现10位折叠流水结构A/D转换器,使用动态匹配技术,消除折叠预放电路的失调效应;提出基于单向隔离模拟开关的分步预处理,有效压缩了电路规模,降低了系统功耗.在5V电源电压下,仿真结果为:当采样频率为50MSPS时,功耗为120mW,输入模拟信号和二进制输出码之间延迟为2.5个时钟周期,芯片面积1.44mm2.     

一款14位250MS/s采样率的电流舵数模转换器

A 14-bit 250-MS/s current-steering digital-to-analog converter(DAC) was fabricated in a 0.13μm CMOS process.In conventional high-speed current-steering DACs,the spurious-free dynamic range(SFDR) is limited by nonlinear distortions in the code-dependent switching glitches.In this paper,the bottleneck is mitigated by the time-relaxed interleaving digital-random-return-to-zero(TRI-DRRZ).Under 250-MS/s sampling rate,the measured SFDR is 86.2 dB at 5.5-MHz signal frequency and 77.8 dB up to 122 MHz.The DAC occupies an active area of 1.58 mm2 and consumes 226 mW from a mixed power supply of 1.2/2.5 V.