Sintering behavior and microwave dielectric properties of Bi3(Nb1−xTax)O7 solid solutions

Solid solutions of Bi₃(Nb_1−xTa_x)O₇ (x = 0.0, 0.3, 0.7, 1) were synthesized using solid state reaction method and their microwave dielectric properties were first reported. Pure phase of fluorite-type could be obtained after calcined at 700 °C (2 h)⁻¹ between 0 ≤ x ≤ 1 and Bi₃(Nb_1−xTa_x)O₇ ceramics could be well densified below 990 °C. As x increased from 0.0 to 1.0, saturated density of Bi₃(Nb_1−xTa_x)O₇ ceramics increased from 8.2 to 9.1 g cm⁻³, microwave permittivity decreased from 95 to 65 while Q_f values increasing from 230 to 560 GHz. Substitution of Ta for Nb modified temperature coefficient of resonant frequency τ_f from −113 ppm °C⁻¹ of Bi₃NbO₇ to −70 ppm °C⁻¹ of Bi₃TaO₇. Microwave permittivity, Q_f values and τ_f values were found to correlate strongly with the structure parameters of fluorite solid solutions and the correlation between them was discussed in detail. Considering the low densified temperature and good microwave dielectric proprieties, solid solutions of Bi₃(Nb_1−xTa_x)O₇ ceramics could be a good candidate for low temperature co-fired ceramics application.     

ZnO掺杂对Ca0.25(Li0.43Sm0.57)0.75TiO3陶瓷烧结性能和微波介电性能的影响

采用溶胶-凝胶法制备Ca_0.25(Li_0.43Sm_0.57)_0.75TiO₃(CLST)微波介质陶瓷纳米粉体, 研究了ZnO掺杂量和烧结温度对CLST+ xmol% ZnO陶瓷烧结性能和微波介电性能的影响。XRD分析结果表明: 随着ZnO掺杂量x的增加, 陶瓷的晶体结构从正交相变为伪立方相, 并在x≥1.5的样品中出现了杂相。CLST+ xmol% ZnO陶瓷的致密化烧结温度随x的增加而降低, x=1.0的样品的致密化烧结温度比x=0的降低了200 ℃。介电常数ε_r和频率品质因数Qf 随x增加和烧结温度的升高具有最优值, 频率温度系数则单调降低。x=1.0的样品在1100 ℃烧结时具有优异的综合性能: ρ = 4.85 g/cm³, ε_r =102.8, Qf = 5424 GHz, τ_f = -8.2×10^-6/℃。表明ZnO掺杂的CLST陶瓷是一种很有发展潜力的微波介质陶瓷。     

Microwave dielectric properties and microstructures of MgTa2O6 ceramics with CuO addition

The effect of CuO addition on the microstructures and the microwave dielectric properties of MgTa₂O₆ ceramics has been investigated. It is found that low level-doping of CuO (up to 1 wt.%) can significantly improve the density of the specimens and their microwave dielectric properties. Tremendous sintering temperature reduction can be achieved due to the liquid phase effect of CuO addition observed by scanning electronic microscopy (SEM). The sintered samples exhibit excellent microwave dielectric properties, which depend upon the liquid phase and the sintering temperature. With 0.5 wt.% CuO addition, MgTa₂O₆ ceramic can be sintered at 1400 °C and possesses a dielectric constant (_r) of 28, a Q × f value of 58000 GHz and a temperature coefficient of resonant frequency (τ_f) of 18 ppm/°C.     

Microstructural and piezoelectric properties of low temperature sintering PMN-PZT ceramics with the amount of Li2CO3 addition

PMN-PZT ceramics doped with Li₂CO₃ and Bi₂O₃ as sintering aids were manufactured in order to develop the low temperature sintering ceramics for multilayer piezoelectric transformer, and their micro structural, dielectric and piezoelectric properties were investigated. The sintering aids were proved to lower the sintering temperature of doped PMN-PZT ceramics due to the effect of LiBiO₂ liquid phase. Optimal values for multilayer piezoelectric transformer application, such as electromechanical coupling factor (k_p) of 0.50, mechanical quality factor (Q_m) of 2264, and dielectric constant (K) of 1216, and curie temperature (T_c) of 317 °C were found at 0.1 wt.% Li₂CO₃ added ceramics sintered at 940 °C.     

Electrochromic properties of nanocrystalline MoO3 thin films

Electrochromic MoO₃ thin films were prepared by a sol–gel spin-coating technique. The spin-coated films were initially amorphous; they were calcined, producing nanocrystalline MoO₃ thin films. The effects of annealing temperatures ranging from 100 °C to 500 °C were investigated. The electrochemical and electrochromic properties of the films were measured by cyclic voltammetry and by in-situ optical transmittance techniques in 1 M LiClO₄/propylene carbonate electrolyte. Experimental results showed that the transmittance of MoO₃ thin films heat-treated at 350 °C varied from 80% to 35% at λ = 550 nm (ΔT =  45%) and from 86% to 21% at λ ≥ 700 nm (ΔT =  65%) after coloration. Films heat-treated at 350 °C exhibited the best electrochromic properties in the present study.     

Alkoxide route to La0.5Sr0.5CoO3 epitaxial thin films on SrTiO3

An all alkoxide based sol–gel route was investigated for preparation of epitaxial La_0.5Sr_0.5CoO₃ (LSCO) films on 100 SrTiO₃ (STO) substrates. Films with 20–30 to 80–100 nm thickness were prepared by spin-coating 0.2–0.6 M (metal) solutions on the STO substrates and heat treatment to 800 °C at 2 °C min^− 1, 30 min, in air. The films were epitaxial with a cube-on-cube alignment and the LSCO cell was strained to match the STO substrate of 3.905 Å closely; a and b = 3.894 Å and 3.897 Å for the 20–30 and 80–100 nm films, respectively. The c-axis was compressed to 3.789 Å and 3.782 Å for the 20–30 and 80–100 nm films, respectively, which resulted in an almost unchanged cell volume as compared to polycrystalline film and nano-phase powders prepared in the same way. The SEM study showed mainly very smooth, featureless surfaces, but also some defects. A film prepared in the same way on an -Al₂O₃ substrate was dense and polycrystalline with crystallite sizes in the range 10–50 nm and gave cubic cell dimensions of a_c = 3.825 Å. The conductivity of the ca 30–40 nm thick polycrystalline film was 1.7 mΩcm, while the epitaxial 80–100 nm film had a conductivity of around 1.9 mΩcm.     

Dielectric and piezoelectric properties of sol–gel derived Ca doped PbTiO3

Synthesis of Ca doped PbTiO₃ powder by a chemically derived sol–gel process is described. Crystallization characteristics of different compositions Pb_1−xCa_xTiO₃ (PCT) with varying calcium (Ca) content in the range x = 0–0.45 has been investigated by DTA/TGA, X-ray diffraction and scanning electron microscopy. The crystallization temperature is found to decrease with increasing calcium content. X-ray diffraction reveals a tetragonal structure for PCT compositions with x ≤ 0.35, and a cubic structure for x = 0.45. Dielectric properties on sintered ceramics prepared with fine sol–gel derived powders have been measured. The dielectric constant is found to increase with increasing Ca content, and the dielectric loss decreases continuously. Sol–gel derived Pb_1−xCa_xTiO₃ ceramics with x = 0.45 after poling exhibit infinite electromechanical anisotropy (k_t/k_p) with a high d₃₃ = 80 pC/N, ′ = 298 and low dielectric loss (tan δ = 0.0041).     

Impact fatigue properties of epoxy resin filled with SiO2 particles

Impact fatigue tests were carried out on epoxy resin filled with SiO₂ particles. The effects of the percentage of SiO₂ particles and the impact cyclic loading frequency on the impact fatigue strength was investigated. The micromechanism of impact fatigue failure was examined and correlated with the morphology of the fracture surface. The impact stress amplitude, σ_t, can be estimated by the formula, σ₂(N_f · Te)^mt = D_t where (N_f· Te) is the cumulative duration time, and mt and D_t, are parameters describing impact fatigue characteristics. The impact fatigue strength and the static strength are governed by the percent of SiO₂ particles. Crack initiation under monotonie cyclic impact loading was attributed to decision of the epoxy-SiO₂ interface. Unstable crack propagation occurs when the crack passes through the SiO₂ particles.     

Glass-free LTCC microwave dielectric ceramics

The sintering behavior, microstructure and microwave dielectric properties of complex pyrophosphate compounds AMP₂O₇ (A = Ca, Sr; M = Zn, Cu) were investigated in this paper. All compounds could be densified below the temperature of 950 °C without any glass addition, and exhibit low permittivity (_r < 8), high Q × f value and negative temperature coefficient of resonant frequency. The Q × f value was discussed from the point of view of bond strength. The chemical compatibility with silver and copper was also investigated. All compounds seriously react with silver at 700 °C. However SrZnP₂O₇ could be co-fired with copper in reduced atmosphere. The microwave dielectric properties of SrZnP₂O₇ sintered at 950 °C in reducing atmosphere are: _r = 7.06, Q × f = 52781 GHz, τ_f = −70 ppm/°C. In terms of its lower sintering temperature, chemical compatibility with copper and good microwave dielectric properties, SrZnP₂O₇ ceramic is very promising for low temperature co-fired ceramic (LTCC) applications.     

高Q值(1-x)(Sr0.2Nd0.208Ca0.488)TiO3-xNd(Ti0.5Mg0.5)O3微波陶瓷的微结构及介电性能研究

采用固相法制备了(1-x)(Sr_0.2Nd_0.208Ca_0.488)TiO₃-xNd(Ti_0.5Mg_0.5)O₃(0.3≤x≤0.4, SNCT-NTMx)系微波介质陶瓷材料, 并研究了该体系的相组成、显微结构、烧结性能和微波介电性能之间的关系。结果表明: 在x = 0.3~0.35范围内, SNCT-NTMx陶瓷形成了正交钙钛矿固溶体, 并伴随有少量未知第二相; 当x增至0.4时, 第二相含量有所增加。介电性能研究结果显示: 随着x的增加, 体系介电常数(ε_r)减小, 但品质因子(Q×f)得到改善; 此外, 体系谐振频率温度系数(τ_f)随NTM含量的增加逐渐向负值方向移动。当x = 0.35, 陶瓷样品在1520℃烧结4 h 得到的微波介电性能较优: ε_r=50.1, Q×f =44910 GHz, τ_f= -1.7×10^-6/℃。     

Controllable formation of Er–Yb codoped Al2O3 films by the non-aqueous sol–gel method

1 mol%Er³⁺–10 mol%Yb³⁺ codoped Al₂O₃ thin films have been prepared on thermally oxidized SiO₂/Si(110) substrates by a dip-coating process in the non-aqueous sol–gel method from the hydrolysis of aluminum isopropoxide [Al(OC₃H₇)₃] under isopropanol environment. Addition of N,N-dimethylformamide (DMF) as a drying control chemical additive (DCCA) into the sol suppresses formation of the cracks in the Er³⁺–Yb³⁺ codoped Al₂O₃ thin films when the rare-earth ion is doped with a high doping concentration. Homogeneous, smooth and crack-free Er³⁺–Yb³⁺ codoped Al₂O₃ thin films form at the conditions by a molar ratio of 1:1 for DMF:Al(OC₃H₇)₃. A strong photoluminescence spectrum with a broadband extending from 1.400 to 1.700 µm centered at 1.533 µm is obtained for the Er³⁺–Yb³⁺ codoped Al₂O₃ thin films, which is unrelated to the addition of DMF. Controllable formation of the Er³⁺–Yb³⁺ codoped Al₂O₃ thin films may be explained by the fact that the DMF assisted the deprotonation process of Al–OH at the surfaces of gel particles, resulting in enhancement of the degree of polymerization of sols and improvement of the mechanical properties of gel thin films.     

Influence of substrate on the pulsed laser deposition growth and microwave behaviour of KTa0.6Nb0.4O3 potassium tantalate niobate ferroelectric thin films

Thin films of potassium tantalate niobate KTa_0.6Nb_0.4O₃ (KTN) were grown by pulsed laser deposition on five different substrates suitable for microwave devices: (100)MgO, (100)LaAlO₃, (1–102)sapphire (R-plane), (0001)sapphire (C-plane) and alumina. The high volatility of potassium at the film growth temperature required the addition of an excess of potassium to the ablation target. For optimized deposition conditions, Rutherford backscattering showed that the KTN films had a 1: 1 atomic ratio for K:(Nb + Ta). As grown KTN thin films were single-phase, without any particular orientation on sintered alumina, whereas an epitaxial growth with the (100) orientation was achieved on (100)MgO and (100)LaAlO₃ with a mosaicity Δω_(100)KTN close to 0.7°–1.5° and  0.4°–0.9°, respectively, attesting a high crystalline quality. In contrast, growth of KTN on R-plane sapphire results in a texture with the (100) orientation and the presence of the (110) orientation as a secondary one. The room temperature measurements carried out on Au interdigited capacitors patterned on KTN coated (100) LaAlO₃ and sapphire led at 1 GHz to an agility ΔC / C  4.6% and  7.2%, respectively, for a moderate applied field of 15 kV cm^− 1. Stubs patterned on the same systems led to an agility ΔF_r / F_r of  2.2% and 4.2%, respectively, for F_r = 7 GHz and the same applied field.     

Structure and electrical properties of (100)-oriented Pb(Zn1/3Nb2/3)O3–Pb(Mg1/3Nb2/3)O3–PbTiO3 thin films on La0.7Sr0.3MnO3 electrode by chemical solution deposition

(100)-oriented 0.462Pb(Zn_1/3Nb_2/3)O₃–0.308Pb(Mg_1/3Nb_2/3)O₃–0.23PbTiO₃ (PZN-PMN-PT) perovskite ferroelectric thin films were prepared on La_0.7Sr_0.3MnO₃/LaAlO₃ (LSMO/LAO) substrate via a chemical solution deposition route. The perovskite LSMO electrode was found to effectively suppress the pyrochlore phase while promote the growth of the perovskite phase in the PZN-PMN-PT film. The film annealed at 700 °C exhibited a high dielectric constant of 2130 at 1 kHz, a remnant polarization, 2P_r, of 29.8 μC/cm², and a low leakage current density of 7.2 × 10^− 7 A/cm² at an applied field of 200 kV/cm. The ferroelectric polarization was fatigue-free at least up to 10¹⁰ cycles. Piezoelectric coefficient, d₃₃, of 48 pm/V was also demonstrated. The results showed that much superior properties could be achieved with the PZN-PMN-PT thin films on the solution derived LSMO electrode than on Pt electrode by sputtering.     

NaCu3Ti3Sb0.5Ta0.5O12陶瓷的高介电性质及相关机制的研究

在不同烧结温度下, 利用传统的固相反应工艺制备了一系列NaCu₃Ti₃Sb_0.5Ta_0.5O₁₂陶瓷, 系统测试了它们的晶体结构、微观结构、介电性质和复阻抗谱。结果显示, 所有的NaCu₃Ti₃Sb_0.5Ta_0.5O₁₂陶瓷的主相都呈现类钙钛矿结构, 介电性质随烧结温度变化很大。高于1020℃烧结的陶瓷的室温相对介电常数大于3000, 具有高介电性质。复阻抗谱显示, NaCu₃Ti₃Sb_0.5Ta_0.5O₁₂陶瓷的电学分布不均匀, 由绝缘性的晶界和半导性的晶界组成。通过XRD和XPS测试发现, 在陶瓷中观察到了CuO第二相和Cu、Ti、Sb、Ta离子的变价。因此, 利用内阻挡层电容效应可以解释NaCu₃Ti₃Sb_0.5Ta_0.5O₁₂陶瓷的高介电性质。     

Influence of rare-earth oxides on structure and crystallization properties of Bi2O3–B2O3 glass

Bi₂O₃·B₂O₃ glasses doped with rare-earth oxides (RE₂O₃) (RE³⁺ = La³⁺, Pr³⁺, Sm³⁺, Gd³⁺, Er³⁺ and Yb³⁺) were prepared by the melting–quenching method. The relationships between composition and properties were demonstrated by IR, DSC, XRD and SEM analysis. The results show that the network structure resembles that of undoped Bi₂O₃·B₂O₃ glass, composing of [BO₃], [BO₄] and [BiO₆] units. RE₂O₃ stabilizes the glass structure as a modifier. Transition temperature (T_g) increases linearly with cationic field strength (CFS) of RE³⁺. La₂O₃, Pr₂O₃, Sm₂O₃ and Gd₂O₃ are benefit to promote the formation of BiBO₃ crystal. When Er₂O₃ and Yb₂O₃ are introduced, respectively, the main crystal phase changes to Bi₆B₁₀O₂₄. Transparent surface crystallized samples are obtained by reheating at 460–540 °C for 5 h. In this case, needle like BiBO₃ crystal or rare-earth-doped BiBO₃ crystal (Pr_xBi_1−xBO₃ and Gd_xBi_1−xBO₃) are observed, which is promising for non-linear optical application.     

MgO/SrO/La2O3多元添加对(Zr0.8Sn0.2)TiO4微波陶瓷结构性能影响

基于液相促进固相反应烧结机制, 设计MgO/SrO/La₂O₃多元复合添加(Zr_0.8Sn_0.2)TiO₄(ZST)体系, 探究复合添加剂对ZST陶瓷的物相组成、微观结构、烧结特性以及高频介电性能等参数的影响。实验结果表明: 陶瓷的主晶相均为ZST相; 适量添加MgO/SrO/La₂O₃可以有效地降低ZST陶瓷的烧结温度, 获得较优的微波介电性能; 但MgO添加量的增多对材料的综合性能有小幅度的影响; SrO的添加量过大会造成晶粒的不完全生长、瓷体不致密和气孔的增多, 从而导致材料的密度、介电常数和Q×f值的下降; 此外, 添加剂对陶瓷的频率温度系数(τ_f)影响不大。在复合添加0.2wt%MgO、0.6wt%SrO、1.0wt%La₂O₃时, 1300℃保温5 h的ZST陶瓷综合性能优异: ρ=5.14 g/cm³, ε_r=40.11, Q×f=51000 GHz (f=5.61 GHz), τ_f=-2.85×10^-6℃^-1。     

Pyroelectric properties of BST/PLT composite thick films with addition of xPbO–(1 − x)B2O3 glass

The Ba_xSr_1−xTiO₃ (BST)/Pb_1−xLa_xTiO₃ (PLT) composite thick films (20 μm) with 12 mol% amount of xPbO–(1 − x)B₂O₃ glass additives (x = 0.2, 0.35, 0.5, 0.65 and 0.8) have been prepared by screen-printing the paste onto the alumina substrates with silver bottom electrode. X-ray diffraction (XRD), scanning electron microscope (SEM) and an impedance analyzer and an electrometer were used to analyze the phase structures, morphologies and dielectric and pyroelectric properties of the composite thick films, respectively. The wetting and infiltration of the liquid phase on the particles results in the densification of the composite thick films sintered at 750 °C. Nice porous structure formed in the composite thick films with xPbO–(1 − x)B₂O₃ glass as the PbO content (x) is 0.5 ≥ x ≥ 0.35, while dense structure formed in these thick films as the PbO content (x) is 0.8 ≥ x ≥ 0.65. The volatilization of the PbO in PLT and the interdiffusion between the PLT and the glass lead to the reduction of the c-axis of the PLT phase. The operating temperature range of our composite thick films is 0–200 °C. At room temperature (20 °C), the BST/PLT composite thick films with 0.35PbO–0.65B₂O₃ glass additives provided low heat capacity and good pyroelectric figure-of-merit because of their porous structure. The pyroelectric coefficient and figure-of-merit F_D are 364 μC/(m² K) and 14.3 μPa^−1/2, respectively. These good pyroelectric properties as well as being able to produce low-cost devices make this kind of thick films a promising candidate for high-performance pyroelectric applications.     

Ultraviolet emitting (Y1−xGdx)2O3−δ thin films deposited by radio frequency magnetron sputtering: Combinatorial modeling, synthesis, and rapid characterization

Gadolinium-doped, yttrium oxide thin films have been deposited on silicon (001) substrates by radio-frequency (RF) magnetron reactive sputtering that exhibit cathodoluminescence (CL) at ultraviolet frequencies. The maximum CL brightness occurred at λ314–315 nm characteristic of the ⁶P_3 / 2 → ⁸S (λ = 314 nm) transition observed in Gd-doped, yttrium oxide powders. The radiative recombination takes place at the rare earth activator Gd³⁺ site embedded in the Y₂O_3−δ host; the optical transition resides within the band gap of the Y₂O_3−δ host and the transition observed is characteristic of atomic gadolinium. A combinatorial approach to sputtering was used to deposit a film of variable composition from 1 to 23 at.% Gd in Y₂O_3−δ in order to rapidly discern the composition node of optimal CL brightness. A simulation was created for the purpose of predicting the film combinatorial composition for binary and ternary alloys prior to sputtering experiments in order to facilitate our combinatorial thin film synthesis technique. The model prediction varied from the real experimental composition profile by only 2.2 at.% Gd ± 1.6 at.% proving the predictor as a useful aide to complement combinatorial thin film experiments. A film of composition Y_1.56Gd_0.44O_3.25 (8.3 at.% Gd) yielded the maximum CL brightness. CL brightness increased continuously up to the 8.3 at.% Gd composition due to the increased number of activators present in the host. Beyond this composition the brightness drastically decreased. The oxygen composition in the combinatorial film was strongly dependent on the Gd composition; films were sub-stoichiometric δ > 0 below 6 at.% Gd and was over-stoichiometric δ < 0 beyond this composition.     

Frequency dependent electrical conductivity and dielectric relaxation behavior in amorphous (90V2O5–10Bi2O3) oxide semiconductors doped with SrTiO3

We report on the experimental results of frequency dependent a.c. conductivity and dielectric constant of SrTiO₃ doped 90V₂O₅–10Bi₂O₃ semiconducting oxide glasses for wide ranges of frequency (500–10⁴ Hz) and temperature (80–400 K). These glasses show very large dielectric constants (10²–10⁴) compared with that of the pure base glass (≈10²) without SrTiO₃ and exhibit Debye-type dielectric relaxation behavior. The increase in dielectric constant is considered to be due to the formation of microcrystals of SrTiO₃ and TiO₂ in the glass matrix. These glasses are n-type semiconductors as observed from the measurements of the thermoelectric power. Unlike many vanadate glasses, Long's overlapping large polaron tunnelling (OLPT) model is found to be most appropriate for fitting the experimental conductivity data, while for the undoped V₂O₅–Bi₂O₃ glasses, correlated barrier hopping conduction mechanism is valid. This is due to the change of glass network structure caused by doping base glass with SrTiO₃. The power law behavior (σ_ac=A(ω^s) with s<1) is, however, followed by both the doped and undoped glassy systems. The model parameters calculated are reasonable and consistent with the change of concentrations (x).     

Spectroscopic ellipsometry analysis of GaAs1 − xNx layers grown by molecular beam epitaxy

In this work, we present the effect of nitrogen incorporation on the dielectric function of GaAsN samples, grown by molecular beam epitaxy (MBE) followed by a rapid thermal annealing (for 90 s at 680 °C). The GaAs_1 − xN_x samples with N content up to 1.5% (x = 0.0%, 0.1%, 0.5%, 1.5%), are investigated using room temperature spectroscopic ellipsometry (SE). The optical transitions in the spectral region around 3 eV are analyzed by fitting analytical critical point line shapes to the second derivative of the dielectric function. It was found that the features associated with E₁ and E₁ + Δ₁ transitions are blue-shifted and become less sharp with increasing nitrogen incorporation, in contrast to the case of E₀ transition energy in GaAs_1 − xN_x. An increase of the split-off Δ₁ energy with nitrogen content was also obtained, in agreement to results found with MOVPE GaAs_1 − xN_x grown samples.