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本文论述了使用4H-SiC衬底及外延层制作MESFET的方法,测得了栅长为0.7μm、栅宽为332、m的MESFET的直流、S参数和输出功率特性。 相似文献
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曲兰欣 《固体电子学研究与进展》1995,(4)
1.8GHz下功率密度为2.8W/mm的4H-SiCMESFET据《IEEEE.D.L.》第15卷第10期报道,CharlesE.Weitzel等已研制成一种4H-SiCMESFET。采用4H-SiC是由于它比6H-SiC高出两倍的电子迁移率。器件的... 相似文献
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研究并制造了2.6~2.8GHz输出功率100W、脉宽1μs、占空比25%、增益7dB、效率35%的硅微波脉冲功率晶体管。本文介绍了该器件的设计考虑和采用的工艺技术,给出了研制结果。 相似文献
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研究了一种采用ADI公司的ADF4153小数N分频PLL频率合成器芯片来实现宽频带、小步进的频率合成器的方法.ADF4153可以实现无线通信系统接收机和发射机中本地振荡器,他包括低噪声的数字鉴频鉴相器、电荷泵和可编程分频器.该频率合成器频率范围4~8 GHz,步进1 MHz,且在8 GHz输出时,相位噪声低于-85 dBc/Hz@1 kHz. 相似文献
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自DECT和WDCT标准诞生以来,全球2.4GHz数字无绳技术经过多年的持续发展,从上游的基带芯片、射频(RF)芯片、实时操作系统到下游的应用层软件等各项技术均已成熟,形成了一条完整的产业链。相对于模拟无绳电话,2.4GHz数字无绳电话具有高清晰通话音质、安全保密抗干扰、更大通话范围、功耗低电力持久、 相似文献
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本文给出了利用0.18umCMOS工艺设计的5.2GHz低噪声放大器。在1.8V电压下,工作电流为24mA增益为15.8dB噪声系数为1.4dB. 相似文献
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Weitzel C.E. Palmour J.W. Carter C.H. Nordquist K.J. 《Electron Device Letters, IEEE》1994,15(10):406-408
MESFET's were fabricated using 4H-SiC substrates and epitaxy. The D.C., S-parameter, and output power characteristics of the 0.7 μm gate length, 332 μm gate width MESFET's were measured. At νds =25 V the current density was about 300 mA/mm and the maximum transconductance was in the range of 38-42 mS/mm. The device had 9.3 dB gain at 5 GHz and fmax=12.9 GHz. At Vds=54 V the power density was 2.8 W/mm with a power added efficiency=12.7% 相似文献
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基于自主研发的碳化硅(SiC)材料外延技术,优化了材料各层结构及参数,减小了Al记忆效应,最终得到了高质量SiC外延片。采用自主研发成熟的SiC MESFET工艺平台,制作了多凹栅器件结构,优化了凹槽尺寸,采用细栅制作技术完成了栅电极制作,最终得到了不同栅宽的SiC MESFET芯片。突破了大栅宽芯片流片、封装及大功率脉冲测试技术,研制成功了微波功率特性良好的MESFET器件。微波测试结果表明,在2 GHz脉冲条件下,0.25 mm栅宽器件,输出功率密度达到8.96 W/mm,功率附加效率达到30%。单胞20 mm大栅宽器件,3.4 GHz脉冲条件下,功率输出达到94 W,功率附加效率达到22.4%。 相似文献
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The millimeter-wave power performance of a 75-μm×0.3-μm InP MISFET with SiO2 insulator is presented. The combination of high intrinsic transconductance (120 mS/mm), current density (1 A/mm), and gate-source and gate-drain breakdown voltages (35 V) led to a record power density of 1.8 W/mm and 20% power-added efficiency at 30 GHz. This power density is the highest ever reported for any three-terminal device at this frequency 相似文献
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Hossein Elahipanah 《Microelectronics Journal》2011,42(2):299-304
In this paper, a very high gain 4H-SiC power MESFET with incorporation of L-gate and source field plate (LSFP-MESFET) structures for high power and RF applications is proposed. The influence of L-gate and source field plate structures on saturation current, breakdown voltage (Vb) and small-signal characteristics of the LSFP-MESFET was studied by numerical device simulation. The optimized results showed that Vb of the LSFP-MESFET is 91% larger than that of the 4H-SiC conventional MESFET (C-MESFET), which meanwhile maintains almost 77% higher saturation drain current characteristics. The maximum output power densities of 21.8 and 5.5 W/mm are obtained for the LSFP-MESFET and C-MESFET, respectively, which means about 4 times larger output power for the proposed device. Also, the cut-off frequency (fT) of 23.1 GHz and the maximum oscillation frequency (fmax) of 85.3 GHz for the 4H-SiC LSFP-MESFET are obtained compared to 9.4 and 36.2 GHz for that of the C-MESFET structure, respectively. The proposed LSFP-MESFET shows a new record maximum stable gain exceeding 22.7 dB at 3.1 GHz, which is 7.6 dB higher than that of the C-MESFET. To the best of our knowledge, this is 2.5 dB greater than the highest gain yet reported for SiC MESFETs, showing the potential of this device for high power RF applications. 相似文献
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Hampson M.D. Shyh-Chiang Shen Schwindt R.S. Price R.K. Chowdhury U. Wong M.M. Ting Gang Zhu Dongwon Yoo Dupuis R.D. Milton Feng 《Electron Device Letters, IEEE》2004,25(5):238-240
Current metal-organic chemical vapor deposition-grown AlGaN-GaN heterojunction field-effect transistor devices suffer from threading dislocations and surface states that form traps, degrading RF performance. A passivation scheme utilizing a polyimide film as the passivating layer was developed to reduce the number of surface states and minimize RF dispersion. Continuous-wave power measurements were taken at 18 GHz on two-finger 0.23-/spl mu/m devices with 2/spl times/75 /spl mu/m total gate width before and after passivation yielding an increase from 2.14 W/mm to 4.02 W/mm in power density, and 12.5% to 24.47% in power added efficiency. Additionally, a 2/spl times/25 /spl mu/m device yielded a peak power density of 7.65 W/mm at 18 GHz. This data suggests that polyimide can be an effective passivation film for reducing surface states. 相似文献
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