采用石墨碳源沉积金刚石薄膜

采用固相石墨为碳源，使用微波等离子体化学气相沉积（MPCVD）法，在Si(111)上沉积高质量的金刚石薄膜。研究了在气相碳源浓度处于不饱和状态时，沉积气压和石墨温度对生长速率的影响。利用SEM，XRD，红外光谱分析薄膜表面形貌和质量。结果表明高质量的金刚石薄膜可在H2激发而生的封闭的等离子体气氛下合成，高的有沉积气压和石墨温度会导致高的气相碳源浓度，从而有利于提高薄膜的生长速率，而低的气相碳源浓度有利于沉积薄膜的质量的提高。     

脉冲电弧放电电离有机溶液制备碳膜的研究

利用脉冲电弧放电电离甲醇、乙醇、丙酮等有机溶液在常温、常压下制备了含金刚石成分的碳膜。用扫描电子显微镜(SEM)，激光Raman光谱和傅里叶红外光谱(FTIR)研究了薄膜的形貌和质量。结果表明：在相同的放电条件下甲醇比乙醇、丙酮等有机溶液等更有利于金刚石的合成；而提高放电电压和降低甲醇浓度有助于提高薄膜中金刚石成分的含量。     

直流电弧等离子体喷射CVD金刚石膜的制备工艺探讨

介绍了直流电弧等离子体喷射CVD金刚石膜的沉积原理,探讨了在实际生产过程中获得高质量CVD金刚石膜的工艺条件.     

Deposition of crackless freestanding diamond films on Mo substrates with Zr interlayer

The Mo substrate with Zr interlayer,namely composite substrate,was employed to solve the problem of crack formation in the freestanding diamond film deposition.Freestanding diamond films deposited on the composite substrates by the direct current arc plasma jet chemical vapor deposition(CVD) method were investigated with scanning electron microscopy(SEM),X-ray photoelectron spectroscopy (XPS),X-ray diffraction(XRD),and Raman spectroscopy.In addition,the stress distribution during the large area freestand...     

化学气相沉积金刚石薄膜的介电性能研究

目的研究CVD金刚石薄膜的介电性能．方法采用直流电弧等离子体CVD制备金刚石薄膜,测定其结构和介电性能（频率与电导、介电常数及损耗因子的关系）．结果CVD金刚石薄膜的介电性能主要取决于样品的多晶性质,以及表面和晶界处的非金刚石相和杂质成分．在500℃下对样品进行退火可以除去其中的大部分非晶石墨相,但不能去除所有的非晶石墨相和杂质．结论CVD金刚石薄膜如果要在电子器件上获得应用,在样品的制备和后处理方面还有许多工作要做．     

辅助气体对分阶段制备金刚石膜的影响

采用形核 甲烷/氢气生长-辅助气体/甲烷/氢气生长的新工艺,在镜面抛光的单晶硅片上制备了金刚石膜,并用扫描电子显微镜和激光拉曼光谱等测试方法对薄膜的表面形貌和质量性能进行了表征;研究了添加辅助气体对已有金刚石晶型生长的影响.结果表明:以甲烷/氢气为气源时,金刚石膜生长率一般为1.8 μm/h,当分别加入氧气、二氧化碳、氮气时,其生长率都有所提高,其中加入二氧化碳时,其生长率是甲烷/氢气为气源的3倍多,但是加入氩气时,其生长率下降;通过新工艺,在加入氮气或氩气时,第一生长阶段为微米,而第二生长阶段为纳米尺寸,最后制备出具有微/纳米双层复合金刚石膜.     

Diagnosis of gas phase near the substrate surface in diamond film deposition by high-power DC arc plasma jet CVD

Optical emission spectroscopy （OES） was used to study the gas phase composition near the substrate surface during diamond deposition by high-power DC arc plasma jet chemical vapor deposition （CVD）. C2 radical was determined as the main carbon radical in this plasma atmosphere. The deposition parameters, such as substrate temperature, anode-substrate distance, methane concentration, and gas flow rate, were inspected to find out the influence on the gas phase. A strong dependence of the concentrations and distribution of radicals on substrate temperature was confirmed by the design of experiments （DOE）. An explanation for this dependence could be that radicals near the substrate surface may have additional ionization or dissociation and also have recombination, or are consumed on the substrate surface where chemical reactions occur.     

大面积金刚石膜生长过程中的缺陷和内应力

采用甲烷和氢气作为气源,在直径为50 mm的抛光单晶硅片上,利用新型微波等离子体化学气相沉积(MPCVD)装置制备出金刚石膜.用扫描电子显微镜观测金刚石膜的表面形貌,利用激光Raman光谱表征金刚石膜的质量以及X射线衍射检测金刚石膜的成分和晶界缺陷.结果表明V(CH4)/V(H2)为1%,基片温度为845℃时,生长金刚石膜的质量较好,并且具有完整的晶体形貌,但是扫描电子显微镜图×5 000倍时,观察到金刚石膜中明显的晶体缺陷存在,同时X射线衍射图表明金刚石膜的内应力较大.     

纳米针状金刚石膜的制备

利用高功率微波等离子体化学气相沉积方法在硅衬底上沉积了多晶金刚石薄膜,然后利用电子束蒸发方法在金刚石薄膜表面上沉积了5 nm厚的Pt薄膜.利用Pt的自组织化效应,再通过氢等离子体照射、氧等离子体刻蚀、王水处理等手段,使金刚石薄膜表面形成了纳米针.利用拉曼光谱和扫描电子显微镜(SEM)表征金刚石薄膜的结构,拉曼光谱显示在1 315 cm^-1处出现纳米金刚石特征峰,SEM显示纳米针均匀地直立在金刚石薄膜表面,每平方厘米大约含有10⁸个纳米针,纳米针的平均高度约为1 μm.     

基片预处理对CVD金刚石薄膜形核的影响

微波辅助等离子体化学气相沉积法是目前低压气相合成金刚石薄膜方法中应用最普遍、工艺最成熟的方法,形核是CVD金刚石沉积的第一步．利用微波辅助等离子体化学气相沉积装置,研究了硅基片预处理方式对金刚石薄膜形核密度的影响．在工作气压为5-8kPa,微波功率为2500—5000W,甲烷流量为4-8cm^3／min,氢气流量为200em3／min,沉积温度为500℃-850℃的条件下,在单晶Si基片上沉积金刚石薄膜．通过扫描电子显微镜形貌观察表明,基片预处理能够显著提高金刚石形核密度,同时用拉曼光谱表征了金刚石薄膜的质量,     

Preparation and characterization of nano-crystalline diamond films on glass substrate

Adherent nano diamond films were successfully deposited on glass substrate by microwave plasma assisted CVD method in H2-CH4 and Ar-CH4 environment. Raman, AFM (Atomic Force Microscope), TEM (Transmission Electron Microscope), FTIR, and Nano Indentation techniques were used for characterization of the obtained nano diamond films. It was found that the average grain size was less than 100 nm with a surface roughness value as low as 2 nm. The nano diamond films were found to have excellent transparency in visible and IR spectrum range, and were as hard as natural diamond. Experimental results were presented. Mechanisms for nano diamond film deposition were discussed.     

氧等离子体刻蚀CVD金刚石膜

分别采用直流辉光、微波和电子回旋共振3种氧等离子体对CVD金刚石膜表面进行了刻蚀．利用扫描电子显微镜对三种等离子体刻蚀后金刚石膜表面的形貌进行了观察分析．通过对刻蚀后形貌差异的比较,探讨了它们各自的刻蚀机理,并从等离子体鞘层理论出发建立了刻蚀模型．     

MPECVD法在抛光石英玻璃上沉积金刚石薄膜

采用微波等离子体增强化学气相沉积方法(MPECVD),利用氢气和甲烷混合气体,在抛光石英基片上低温沉积出金刚石薄膜。用扫描电子显微镜(SEM)、激光拉曼光谱仪(Raman)和傅立叶红外光谱仪(FTIR)对薄膜的表面形貌、颗粒尺寸、纯度和光学透过性能进行了表征。通过SEM发现,得到的金刚石薄膜的颗粒尺寸为0.2~0.3μm,形核密度超过109cm-2,从薄膜形貌可以发现,较高温度有利于提高薄膜的生长速率和颗粒尺寸的均匀性。通过拉曼光谱和红外透射光谱分析发现,较高温度下沉积的薄膜具有较高的金刚石相含量,薄膜的光学透过性能也相对较好。     

大气电弧等离子体技术在熔石英表面加工中的应用

为了快速获得无亚表面损伤光学表面,提出了一种新型的大气电弧射流等离子体加工方法,该方法的装置采用转移弧电弧放电原理产生大气射流等离子体,通过调节改变喷枪的气压及几何结构,对束斑的尺寸及能量密度进行调节,同时基于其束斑高能离子的物理效应,研究了大气条件下熔石英表面材料的加工工艺.实验结果表明:当采用等离子体喷枪嘴孔径2.5mm,作用距离为2.0mm时,对熔石英的峰值去除速率可达到82.9μm·min-1,单次抛光后,元件表面粗糙度Ra值由237nm下降到103nm.     

Influence of methane on hot filament CVD diamond films deposited on high-speed steel substrates with WC-Co interlayer

Diamond films were deposited on high-speed steel substrates by hot filament chemical vapor deposition (HFCVD) method. To minimize the early formation of graphite and to enhance the diamond film adhesion, a WC-Co coating was used as an interlayer on the steel substrates by high velocity oxy-fuel spraying. The effects of methane content on nucleation, quality, residual stress and adhesion of diamond films were investigated. The results indicate that the increasing methane content leads to the increase in nucleation density, residual stress, the degradation of quality and adhesion of diamond films. Diamond films deposited on high-speed steel (HSS) substrate with a WC-Co interlayer exhibit high nucleation density and good adhesion under the condition of the methane content initially set to be a higher value (4%, volume fraction) for 30 min, and then reduced to 2% for subsequent growth at pressure of 3 kPa and substrate temperature of 800 °C.     

单晶金刚石生长过程中的应力研究

使用实验室自制的10 kW微波等离子体设备,研究单晶金刚石不同生长阶段的应力表现形式。通过等离子状态参数模拟和发射光谱诊断,研究不同生长阶段几种主要基团的分布和含量;通过扫描电子显微镜和拉曼光谱仪对金刚石的表面形貌和结晶质量进行表征。在整个生长阶段,单晶金刚石边缘区域的电场密度和等离子密度逐渐增强,在功率一定的情况下,中间区域的等离子密度会削弱,并且随着时间延长厚度增加,等离子体状态参数差别越明显,导致单晶金刚石生长模式发生改变,表面的层状生长改为梯度生长,边缘的多取向竞争生长失衡,取向杂乱的多晶在边缘处产生,在这种生长模式影响下,单晶金刚石的生长应力和热应力交替影响其生长状态。结果导致在生长初期,单晶金刚石应力较小且分布均匀,随着时间延长厚度增加,单晶金刚石受缺陷导致的生长应力和温差导致的热应力影响递增,产生裂纹。     

Synthesis of boron-doped diamond/porous Ti composite materials — Effect of carbon concentration

Highly boron-doped diamond films were deposited on porous titanium substrates by hot filament chemical vapor deposition technique.The morphology variation of highly boron-doped diamond films grown on porous titanium substrates was investigated,and the effects of carbon concentration on nucleation density and diamond growth were also studied.The continuous change of surface morphology and structure of diamond film were characterized by scanning electron microscopy.The structures of diamond film and interlayer were analyzed by X-ray diffraction.The quality of boron-doped diamond film was confirmed by visible Raman spectroscopy.The experimental results reveal that surface morphology and quality of boron-doped diamond films are various due to the change of carbon concentration.The thickness of intermediate layer decreases with the carbon concentration increasing.     

燃焰法CVD金刚石薄膜生长过程的实验研究

采用燃焰法在硅基片表面进行了金刚石薄膜沉积实验．介绍了用金刚石微粉研磨基片表面对金刚石成核及生长的影响．根据不同沉积时间基片表面的扫描电子显微照片，分析了金刚石薄膜的生长过程，得出了金刚石薄膜的生长过程是以岛状生长模式形成连续膜的结论．     

WC-Co硬质合金上高质量金刚石薄膜的制备

采用微波等离子体化学气相沉积法在硬质合金基体上制备金刚石薄膜.研究了铜过渡层和酸蚀脱钴两种基体前处理工艺以及在施加铜过渡层的情况下,不同的沉积气压和基片温度对金刚石薄膜的质量的影响.结果表明:在施加铜过渡层后,在适中的沉积条件下(沉积气压6.0 kPa,基片温度约为780℃)可得到质量较好的金刚石薄膜.     

表面覆盖氮化硼膜的金刚石膜的场发射特性

利用热丝化学气相沉积（HFCVD）方法在Si衬底上生长了4μm厚的金刚石膜,然后利用射频磁控溅射方法在金刚石膜上沉积了100nm厚的六角氮化硼（h—BN）薄膜．在超高真空系统中测试了覆盖氮化硼（BN）薄膜前后金刚石膜的场发射特性,结果表明覆盖BN薄膜后的金刚石膜的场发射特性明显提高,开启电场由14V／μm升到8V／μm．F—N曲线表明,覆盖BN薄膜后的金刚石膜在强电场区域的场增强因子有所降低,这可能归因于场发射点随着电场的增强而改变．