功率循环中表面安装器件(SMD)热变形的实时全息干涉测量研究

功率循环中表面安装器件（ＳＭＤ）的热应变是影响ＳＭＤ焊点可靠性的重要因素之一．本文采用实时全息干涉度量法对一个具有１００条引线的塑料四边引线封装器件（ＰＱＦＰ）在功率循环中的热－力耦合离面变形场进行了测量，获得了分别位于ＰＱＦＰ和印制电路版（ＰＣＢ）表面的离面变形数值，并根据两者之间的离变形失配，精确地计算出了引线和焊点的变形，为全面了解ＳＭＤ在功率循环条件下的热力学行为及分析ＳＭＤ焊点的疲劳失效机理提供了精确可靠的实验数据．     

电子封装器件GBA的实时全息干涉实验研究

本文采用实时全息干涉方法对电运行中的ＰＢＧＡ器件及外部热辐射条件下ＰＢＧＡ的离面变形进行了测量,得到ＰＢＧＡ呈球面弯曲及马鞍形翘曲变形的实验结果,并初步分析了产生形变差异的原因。     

功率循环中表面安装器件（SMD）热变形的实时全息干扰测量研究

功率循环中表面安装器件（ＳＭＤ）的热应变是影响ＳＭＤ焊点可靠性的重要因素之一。本采用实时全息干涉度量法对一个具有１００条引线的塑料四边引线封装器件（ＰＱＦＰ）在功率循环中的热－力耦合离面变形场进行了测量，获得了分别们于ＰＱＦＰ和负责制电路版（ＰＣＢ）表面的离面变形数值，并根据两之间的变形失配，精确地计算出了引线和焊点的变形，为全面了解ＳＭＤ在功率循环条件下的热力学行为及分析ＳＭＤ焊点的疲劳失效     

全息干涉法在表面封装组件质量检测中的应用

利用二次曝光全息干涉技术对表面封装组件(SMA)在功率循环中的离面变形场进行了测试.为解决从器件边缘到印制电路板(PCB)间干涉条纹级次的不连续问题,实验中采用了"搭桥"技术来处理表面封装器件(SMD)和PCB的变形失配;此外,全息干涉技术还被用于一个实际产品(硬盘驱动器)的无损在线检测.结果表明:模塑J引线封装体(PLCC)和PCB由于中心热源及材料的热膨胀系数差而导致离面弯曲变形;沿器件边缘,引线和焊点经历了非共面的离面变形;通过正常硬盘驱动电路板和失效板的干涉条纹数量的对比,能快速简捷地检测板的质量.全息干涉测量法在微电子技术可靠性分析领域有广泛的应用前景.     

全息干涉法在表面封装组件质量检测中的应用

利用二次曝光全息干涉技术对表面封装组件(SMA)在功率循环中的离面变形场进行了测试.为解决从器件边缘到印制电路板(PCB)间干涉条纹级次的不连续问题,实验中采用了"搭桥"技术来处理表面封装器件(SMD)和PCB的变形失配;此外,全息干涉技术还被用于一个实际产品(硬盘驱动器)的无损在线检测.结果表明:模塑J引线封装体(PLCC)和PCB由于中心热源及材料的热膨胀系数差而导致离面弯曲变形;沿器件边缘,引线和焊点经历了非共面的离面变形;通过正常硬盘驱动电路板和失效板的干涉条纹数量的对比,能快速简捷地检测板的质量.全息干涉测量法在微电子技术可靠性分析领域有广泛的应用前景.     

几种新型集成电路器件的封装技术

介绍了目前集成电路器件封装的发展情况,重点是目前受到市场普遍关注的ＢＧＡ（球栅阵列）、ＱＦＰ（矩型扁平封装）和ＣＳＰ（芯片尺寸封装）器件的封装的技术。     

日本下一代超小型高速电路的市场预测

日本印刷电路工业会（ＪＰＣＡ）在１９９７年度进行了“下一代超小型高速电路封装技术的动向调查”活动。以对设备厂家、器件厂家、电路衬底厂家等的系统调查为基础，进行了在特定电器设备上的ＢＧＡ、ＣＳＰ、ＭＣＭ等的封装衬底及新工艺技术衬底的市场预测，本文作一概...     

多层印制板新技术—ALIVH

需用层数少、装连密度高、设计简单、制造方便，已经用于便携电话中技术环境在变化除了电子元器件的极小片状化、半导体器件的微细间距化之外，又出现了ＢＧＡ（球栅阵列）、ＣＳＰ（芯片尺寸封装）及ＭＣＭ（多芯片组件）等新型封装形式，围绕着多层印制线路板的技术环境...     

基于最小能量原理的SMT焊点三维形态预测

本文应用最小能量原理和有限元方法建立表面组装技术（ＳＭＴ：Ｓｕｒｆａｃｅ Ｍｏｕｎｔ Ｔｅｃｈｎｏｌｏｇｙ）形成的焊点三维形态预测模型,并运用该模型对塑料球栅阵列（ＰＢＧＡ：Ｐｌａｓｔｉｃ Ｂａｌｌ Ｇｒｉｄ Ａｒｒａｙ）器件焊点三维形态问题进行了预测和分析。最后将预测结果与试验结果以及国外学者用数学分析模型所得的预测结果进行了对比验证。     

BGA／MCM进入现代组装技术的主流

文中分别介绍了ＢＧＡ与ＭＣＭ的概念，分类，发展现状，应用情况及发展趋势等。ＢＧＡ与ＭＣＭ是现代组装技术的两个新概念，是ＳＭＴ（表面贴装技术）与ＳＭＤ（表面贴装元器件）的发展和革新，从其产生到现在，发展不过几年的时间。电子界的权威士对ＢＧＡ的发展很乐观，他们认为ＢＧＡ将成为高密度、高性能、多功能及高Ｉ／Ｏ引线射封装的最佳选择。而ＭＣＭ将更多地应用ＢＧＡ，逐渐降低成本，减小尺寸和重量，进一步提高性能，     

Mechanical characterization of plastic ball grid array package flexure using moire interferometry

Most previous studies of PBGA packaging reliability focused on the effect of thermal cycling. However, as portable electronic products such as cellular phones and laptop computers are reduced in size and become more readily available, isothermal flexural fatigue also becomes an important reliability issue. Solder interconnects subjected to mechanically induced deformation may result in failure. In the current work, moire interferometry is used to investigate the influence of PCB flexure on interconnect strains. A versatile testing apparatus is developed to load PBGA packages in four point bending. Moire fringe patterns are recorded and analyzed at various bending loads to examine the variation in displacement and strain between the components. Solder balls across the entire array experience large shear strains, often resulting in plastic deformation, which reduces service life of the package.     

PBGA焊点热疲劳寿命的正交试验及回归分析

通过对ＰＢＧＡ焊点形态参数与焊点热疲劳寿命的正交试验,利用大型统计分析软件进行多元线性回归分析,建立起ＰＢＧＡ焊点高度固定,芯片在上焊点高度不固定及芯片在下焊 度不固定三种不同工作条件下形态参数与热疲劳寿命之间的回归多项表式,即ＰＢＧＡ焊点形参数与热疲劳寿命的关系表达式。     

基于反向条纹投影的动态物体形变测量

本文提出一种应用反向条纹投影技术对动态三维物体进行形变测量的方法。该方法应用反向条纹投影原理,首先根据绝对相位测量法计算出反向条纹,然后投影反向条纹图到动态形变物体表面,并用高帧频摄像机跟踪记录物体表面反向条纹的动态变化过程,成像面上的反向条纹只在待测物体有形变的区域发生弯曲变形,没有形变的部分则仍然保持直条纹,显明地记录了形变物体的变形,处理时经过傅里叶变换、频谱滤波、傅里叶逆变换等就可以得到形变物体的面形变化。可以只处理物体产生形变的部分,滤波过程也就变得比较简单。对振动过程中的薄膜形变进行了测量和分析,证实了该方法的有效性。     

Ribbed package geometry for reducing thermal warpage and wire sweepduring PBGA encapsulation

The effects of changing package shape to a ribbed geometry on thermal warpage and wire sweep of a plastic BGA (PBGA) are investigated in this paper. Three rib geometries (border, diagonal, and cross) with a variation of rib widths and thicknesses are compared with the original plane geometry. Finite element analyses of thermal warpage during the reflow process of PBGA molding with and without ribbed geometry are carried out. Numerical modeling shows that the border rib has the least thermal warpage at the reflow condition. Flow visualization was performed to study the effect of rib geometry on wire sweep, and demonstrates that the wire sweep in ribbed packages is significantly less than that in the original nonribbed package     

PBGA固化后产生翘曲的有限元模拟分析

由于PBGA器件中各材料热膨胀系数有差异,固化后易产生翘曲变形。采用有限元模拟法对PBGA器件的EMC封装固化和后固化过程进行了分析。结果表明:固化过程是影响翘曲的关键过程,残余应力增加,翘曲变形有所增加。如固化后最大残余应力为95.24MPa,翘曲位移为0.1562mm;后固化以后最大残余应力为110.3MPa,翘曲位移为0.1674mm,翘曲位移增加值仅为0.0112mm。适当增加硅粉填充剂的含量,可以减小固化工艺后的翘曲变形。     

Reliability of plastic ball grid array package

The reliability of plastic ball grid array (PBGA) package is studied for different materials. The reliability of the PBGA packages using conventional Bismaleimide-Triazine type PWB and our original product PWB that is made of high Tg epoxy resin is evaluated. The PBGA package using our original PWB has a feature of lower warpage for the package, and has similar performance regarding the thermal cycling stability and the endurance during reflow soldering as compared with the PBGA using the conventional PWB. The endurance during reflow soldering for each PBGA is JEDEC STD Method A112 level 3. In order to improve the endurance during reflow soldering, not only PWB materials but also other factors are investigated. As a result, the molding compound with the property of low moisture absorption and the die attach material with the properties of high adhesion strength and fracture strength are effective to improve the endurance property during reflow soldering. The package crack mechanism during reflow soldering is briefly described as follows     

Experimental Approach and Evaluation on Dynamic Reliability of PBGA Assembly

The aim of this paper is to provide a systematic method to perform experimental test and theoretical evaluation on fatigue characteristics of plastic-ball-grid-array (PBGA) assembly under random vibration. A specified PBGA assembly which contains different structural and material parameters was manufactured. The fatigue characteristics of PBGA assembly under random vibration were tested. Manson-Coffin empirically derived formula and rain-flow algorithm were used to achieve the fatigue life of solder joints. In the meantime, the failure curve (reliability-cycle number curve) can be obtained by using Weibull distribution method when PBGA assembly is on different working situation. Finally, life prediction of corner solder balls was deduced based on three-band technology and cumulative damage index. Test results lay a basis for high-reliability design of PBGA assembly for engineering application.     

PBGA组件振动疲劳寿命的实验研究

为了得到在基频激励下PBGA封装的可靠度特性,设计制作了一块包含不同结构和材料参数的PBGA组件样品,利用可靠性实验的方法测试了PBGA组件在正弦单频激励条件下的疲劳特性,同时运用Manson-Coffin方程经验公式及雨流计数法得到了相对应的焊点疲劳寿命.最后利用疲劳统计中威布尔分布得到了当PBGA芯片位于PCB不同位置、不同激励时可靠度-循环失效圈数曲线(R-N曲线).结果表明,大直径焊点芯片、分布在约束较多PCB上的芯片、无铅焊点芯片的焊点可靠度较高.     

基于正交试验设计的塑封球栅阵列器件焊点工艺参数与可靠性关系研究

基于正交试验设计法对塑封球栅阵列(PBGA)器件焊点工艺参数与可靠性关系进行了研究.采用混合水平正交表L₁₈(2×3⁷)设计了18种不同工艺参数组合的PBGA测试样件,进行了546小时、最大循环周数2140周的PBGA测试样件可靠性加速热循环试验.基于试验结果进行了极差分析和方差分析;研究了PBGA测试样件寿命的威布尔分布;采用有限元分析方法对热循环加载条件下PBGA焊点内应力应变分布进行了研究.试验结果表明失效焊点裂纹出现于焊点与芯片基板的交界面上.研究结果表明:样件规格对PBGA焊点可靠性有高度显著影响,芯片配重对PBGA焊点可靠性有显著的影响,焊盘直径和钢网厚度对PBGA焊点可靠性无显著影响;最优工艺参数组合为:S2D2G2M1和S2D2G2M2.有限元分析表明在热循环加载条件下PBGA器件内应力最大区域位于焊点与芯片基板的接触面上,裂纹首先在焊点与芯片基板的接触面处产生,有限元分析结果与试验结果相吻合.