MSB The Analog解码器

自从MSB的第一代解码器开始．我就对此品牌情有独钟．皆因其产品不仅售价平易近人．而且简单易用,最重要是一但接上其他数码信号源,就立即将原来的声音变得更悦耳动听,所以该厂一款早期出品的LinkDACⅢ依然长驻听音室开声。     

An Applied Method for Designing Maximally Decimating Non-uniform Filter Banks

1　ＩｎｔｒｏｄｕｃｔｉｏｎＭｕｌｔｉｒｅｓｏｌｕｔｉｏｎｓｉｇｎａｌｐｒｏｃｅｓｓｉｎｇｉｓｂｅｃｏｍｉｎｇｍｏｒｅｐｏｐｕｌａｒｉｎｃｏｍｍｕｎｉｃａｔｉｏｎａｎｄｉｎｆｏｒｍａｔｉｏｎｐｒｏ ｃｅｓｓｉｎｇｆｉｅｌｄｓｂｅｃａｕｓｅｏｆｉｔｓｆｉｎｅｐｒｏｐｅｒｔｙ ,ｅｓｐｅｃｉａｌｌｙｉｎｉｍａｇｅｃｏｄｉｎｇ .Ｉｔｓｐｌｉｔｓａｓｉｇｎａｌｉｎｔｏｓｅｖｅｒａｌｓｕｂ ｂａｎｄｓｉｇｎａｌｓｗｉｔｈｄｉｆｆｅｒｅｎｔｂａｎｄｗｉｄｔｈｓｔｏｕｔｉｌｉｚｅｔｈｅｃｈａｒａｃｔｅｒｄｉｆｆｅ…     

Optimization Of FRM Filters Using The WLS–Chebyshev Approach

This paper presents efficient methods for designing linear-phase finite impulse response filters by combining the frequency-response masking (FRM) approach and the weighted least-squares (WLS)-Chebyshev method. We first use the WLS-Chebyshev method to design quasi-equiripple FRM filters, achieving better performances with respect to the passband ripple or the stopband attenuation, when compared with the standard FRM design. Then, by exploiting the concept of critical bands, introduced in this paper, we present a method for designing modified FRM filters with a further reduction in the computational complexity. This is achieved by properly relaxing the specifications for the FRM base and masking filters and using the ability of the WLS-Chebyshev method to trade off the minimum attenuation and the total energy in the filters stopband. Computational savings are in the order of 10%–15% of the original number of coefficients of the standard FRM design (using the concept of dont care bands for the masking filters).     

Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST

This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. It is based on a double-modulation, square-wave and sigma-delta, together with a simple Digital Processing Algorithm. It leads to an efficient and robust approach very suitable for BIST applications. In this line, some considerations for on-chip implementation are addressed together with simulation results that validate the feasibility of the proposed approach.Diego Vázquez was born in El Coronil, Sevilla, Spain, in 1966. He received the Licenciado en Física degree in 1989 and the Doctor en Ciencias Físicas degree in 1995, both from the University of Sevilla, Spain. Since 1990, he has been with the Departamento de Electrónica y Electromagnetismo, University of Sevilla, where he is a Associate Professor, and also with the Instituto de Microelectrónica de Sevilla, Centro Nacional de Microelectrónica (IMSE-CNM-CSIC), Sevilla, Spain. He has published about 100 papers in international journals, books and major conferences. In 1992 he won the Best Paper Award of the 10th IEEE VLSI Test Symposium. His research interests are in the fields of design, fault tolerance, test, and design for testability of analog and mixed-signal circuits.Gloria Huertas was born in Sevilla, Spain, in 1974. She received the Licenciado en Física degree in 1997 and the Ph.D. in 2004, both from the University of Sevilla, Spain. Since then, she has been with the Departamento de Electrónica y Electromagnetismo, University of Sevilla, where she is Assistant Professor, and also with the Instituto de Microelectrónica de Sevilla, Centro Nacional de Microelectrónica (IMSE-CNM-CSIC), Sevilla, Spain. Her research focuses on designing electronic mixed-signal circuits and systems including techniques for testability.África Luque was born in Zamora (Spain) in 1977. She received the Licenciado en Física degree in 2000 from the University of Sevilla, Sevilla, Spain. She is with the Departamento de Electrónica y Electromagnetismo, University of Sevilla, and also with the Instituto de Microelectrónica de Sevilla, Centro Nacional de Microelectrónica (IMSE-CNM-CSIC), Sevilla, Spain, where she is currently pursuing the Ph.D. degree. Her research focuses on the design and test of mixed-signal circuits including Silicon-On-Insulator technologies.Manuel J. Barragan was born in Sevilla, Spain, in 1980. He received the Licenciado en Física degree in 2003 from the University of Sevilla, Sevilla, Spain. He is currently pursuing the Ph.D. degree from the Instituto de Microelectrónica de Sevilla (IMSE, CNM) on the topics of test and design for testability of analog and mixed-signal circuits.Gildas Leger was born in St. Brieuc, Côtes dArmor, France, in 1976. He received the Ingénieur en Physique degree in 1999 from the National Institute of Applied Sciences (INSA) of Rennes, France.He is currently pursuing the Ph.D. degree from the Instituto de Microelectrónica de Sevilla (IMSE, CNM). His research focuses on designing electronic mixed-signal circuits and systems including techniques for testability, specially in the domain of analog to digital conversion.Adoración Rueda joined the Department of Electronics and Electromagnetism at the University of Seville in 1976 as Assistant Professor, and obtained the Ph.D. degree in 1982. From 1984 to 1996 she was Associate Professor in that Department, where now holds the position of Full Professor in Electronics. In 1989 she became researcher at the Department of Analog Design of the National Microelectronics Center (CNM), now Institute of Microelectronics at Seville (IMSE).She has participated in several research projects financed by the Spanish CICYT and by different programs of the European Community. She has published about 135 papers in international journals, books and major conferences. In 1992 she won the Best Paper Award of the 10th IEEE VLSI Test Symposium. Her research interests are currently focused on the topics of Design and Test of Analog and Mixed-signal Circuits, Behavioral Modeling of Mixed-signal Circuits, and development of CAD tools.Jose Luis Huertas received the Licenciado en Física degree nd the Doctor en Ciencias Físicas degrees in 1969 and 1973, respectively, both from the University of Sevilla, Spain.From 1970 to 1971, he was with the Philips International Institute, Eindhoven, The Netherlands, as a postgraduate student. Since 1971, he has been with the Departamento de Electrónica y Electromagnetismo, University of Sevilla, Spain, where he is a Full Professor. He is also the Director of the Instituto de Microelectrónica de Sevilla, Centro Nacional de Microelectrónica de Sevilla, Seville, Spain. His current interests include the design and testing of analog/digital integrated circuits, computer-aided IC analysis and design, fuzzy logic, nonlinear microelectronics, and neural networks.     

Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X–Y Zoning Method

We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X–Y zoning method. In the method, we could implement a diagnosis procedure based on a diagnostic method for digital circuits because we developed a data processing method to handle data discretely. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC’97 benchmark circuits with hard faults and soft faults. These improved methods can reduce the diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.     

The Application of ODE Method in MOP

ＴｈｅＡｐｐｌｉｃａｔｉｏｎｏｆＯＤＥＭｅｔｈｏｄｉｎＭＯＰ￥ＺｈｏｕＺｏｎｇｆａｎｇ（ＣｈｏｎｇｑｉｎｇＵｎｉｖｅｒｓｉｔｙｏｆＰｏｓｔｓａｎｄＴｅｌｅｃｏｍｍｕｎｉｃａｔｉｏｎ，Ｃｈｏｎｇｑｉｎｇ６３００６５，Ｐ．Ｒ．Ｃｈｉｎａ）Ａｂｓｔｒａｃｔ...     

Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks

This paper presents the application of the oscillation test methodology as an alternative to test configurable analog blocks of Field Programmable Analog Arrays. The blocks of the device under test are first configured to behave as oscillators. Then, the output frequency and amplitude are observed to obtain the signature of the fault-free circuit. During test, this signature is compared to the actual output signal. Experimental results show the effectiveness of the method in detecting parametric and large deviation faults of the tested components.A paper based on this work was presented at the Fourth IEEE Latin American Test Workshop, Natal, Brazil, February 2003.Tiago Roberto Balen was born in Erechim, Brazil, in 1979. He received the Electrical Engineering degree from the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil in 2004. At present, he is M.Sc. student in the Electrical Engineering Department and works in the Prototyping and Test Laboratory at UFRGS. His research interests include analog and mixed-signal design and test, built-in self-test and design-for-testability. He has published papers on FPAA testing in important conferences, such as the VLSI Test Symposium (VTS) and the International Test Conference (ITC).Antonio Andrade, Jr., received the Electrical Engineering degree from the Universidade Federal da Bahia (UFBA), Salvador, Brazil, in 2003, and is currently pursuing the M.Sc. degree at Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil. His experience as a researcher includes the design of a temperature controller using thermo-resistive sensors and FPGA prototyping, at the Instrumentation Laboratory in UFBA, in 2001, a 2-month scholarship from Laboratorio Nacional de Luz Sincrotron (LNLS), Campinas, Brazil, in 2002, and 2 years as a graduate student at the Prototyping and Test Laboratory, at UFRGS. His primary research topics include Mixed-Signal Circuit and Systems Testing as well as fast system prototyping in platforms as FPGAs and FPAAs, having published papers in important conferences, such as the VLSI Test Symposium (VTS) and International Test Conference (ITC), in the field of FPAA testing.Florence Azaïs received the Ph.D. degree in electrical engineering from the University of Montpellier, France in 1996. She is currently working in the Microelectronics department of the Laboratory of Computer Science, Robotics and Microelectronics of Montpellier (LIRMM) as a researcher of the National Council of Scientific Research (CNRS). Since 1993, she has been interested in the general domain of test and reliability of integrated circuits and systems. Her main research interests include fault modeling, analog and mixed-signal circuit testing, MEMS testing, reliability and failure analysis of integrated systems. She has authored or co-authored over 80 international papers on these topics. She also served as a member of the Program Committee of several international conferences (DATE, ICCD, ETS, IMSTW, LATW).Marcelo Lubaszewski received the Electrical Engineering and M.Sc. degrees from the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, in 1986 and 1990, respectively. In 1994, he received the Ph.D. degree from the Institut National Polytechnique de Grenoble (INPG), France. In 2001, he joined the Laboratoire dInformatique, Robotique et Microélectronique de Montpellier in France as an Invited Researcher for 3 months and, in 2004, the Instituto de Microelectrónica de Sevilla (IMSE) in Spain for 1 year. He is currently with UFRGS, where he has been an Associate Professor since 1990. His primary research interests include design and test of mixed-signal, micro-electro-mechanical and core-based systems, self-checking and fault-tolerant architectures, and computer-aided testing. He has published over 150 papers in international journals and conferences on these topics. Dr. Lubaszewski has served as the general chair or program chair of the Symposium on Integrated Circuits and Systems Design (SBCCI) and of the Latin American Test Workshop (LATW), and as a member of the Organizing or the Program Committee of the VLSI Conference, the International Mixed-Signals Testing Workshop, the Asian Test Symposium, the European Design and Test Conference, the Design of Complex Integrated Systems Conference, the European Test Symposium and the GHz/Gbps Test Workshop. He has also served as a Guest Editor of the Journal of Electronic Testing: Theory and Applications and as an Associate Editor of the Design and Test of Computers Magazine.Michel Renovell is head of the Microelectronics Department at LIRMM (Laboratory of Computer Science, Automation and Microelectronics of Montpellier). His research interests include: Fault modeling, Analog testing and FPGA testing. He is Vice-Chair of the IEEE TTTC (Test Technology Technical Committee). He is a member of the editorial board of JETTA and the editorial board of IEEE Design & Test. Michel has been General Chair of the International Mixed Signal Testing Workshop IMSTW2000, the Field Programmable Logic Conference FPL2002 and the European Test Symposium ETS2004.     

The AOR Iterative Method for Preconditioned Linear Systems

In Ref.[1], two preconditioned methods for linear system Ax = b (1) are introduced, where nnAC×∈ ,nb∈ C are given and nx ∈ C is unknown. It is given as the following preconditioned methods. The preconditioned linear system A~ x= b~ (2) where A~ = (I S~)A, and b~ = (I S~)b with S~=????????????? 000000001LMMMMLLna and the preconditioned linear system A =(3) 0where I is the identity matrix, L and U are strictly lower and upper triangular matrices obtained from A, respectively. The c…     

The Application of ODE Method in Constrained Optimization

ＴｈｅＡｐｐｌｉｃａｔｉｏｎｏｆＯＤＥＭｅｔｈｏｄｉｎＣｏｎｓｔｒａｉｎｅｄＯｐｔｉｍｉｚａｔｉｏｎ￥ＺｈｏｕＺｏｎｇｆａｎｇ（ＣｈｏｎｇｑｉｎｇＵｎｉｖｅｒｓｉｔｙｏｆｐｏｓｔｓａｎｄＴｅｌｅｃｏｍｍｕｎｉｃａｔｉｏｎ，Ｃｈｏｎｇｑｉｎｇ６３００６...     

A Novel Method to Simultaneously Measure the Straightness

A precise two--degree--of--freedom measuring system (2DMS) is developed based on single--mode optical fiber, LD, cube corner retroreflector and four--quadrant photodetector (4-Q), and the simultaneous on--line measurement of lateral and vertical direction straightness errors of the linear stage is carried out. The moving part is wireless, which eliminates any errors introduced by pushing and pulling the wires. The sensitivity of the straightness error measurement can be improved by a factor of 2 with the cube corner retroreflector. This fiber- based optically aligned beam is used to establish a reference line for the straightness measurement of any mechanical system. 4--Q detector is used to receive the laser beam. A chip microcomputer is developed to conduct alldata acquisition and signal processing. The beam drift influence can be removed in the greatest extent from the system. The experiments on the measurement system stability,repeatability and its comparison with the HP5528 double--frequency laser interferometer are carried out.     

DAC（Digital to Analog Converter）版图布局的理论与实现

本文详细介绍了模拟前端芯片发送通道DAC的布局原理和设计方案，由于DAC的实际性能很大程度上由版图的布局质量决定，所以本文也着重讲述了根据DAC工作原理来确定的合理的布图理论以及如何保证关键指标的实现。     

A second-order extension of the edge-selection algorithm for a ΣΔ-DAC architecture insensitive to oversampling clock jitter

In this paper we propose a ΣΔ-digital-to-analogue converter (DAC) architecture using a clock from an all-digital fractional programmable clock generator as an oversampling clock. Although this method is attractive in respect of implementation issues, it has not been widely used because the clock generated by this method contains a significant amount of jitter. The proposed architecture uses an edge-selection algorithm to suppress the in-band noise caused by the oversampling clock jitter. The improvement of the algorithm over the previous work is mainly achieved by adopting a second-order four-way edge selection. Simulation results show that the improved algorithm achieves a signal-to-noise distortion ratio of around 100 dB when applied to a 1-bit ΣΔ-DAC for a voiceband codec and that the performance degradation due to the clock jitter has been kept within 3 dB.     

A Method to Reconstruct Nth-Order Periodically Nonuniform Sampled Signals

A continuous time signal x(t) with Fouriertransform X(v) band-limited to ?ω /2相似文献   

The Laser Doppler Shift Method for Measuring Slider Flying Characteristics

１ＩｎｔｒｏｄｕｃｔｉｏｎＩｎｍａｇｎｅｔｉｃｒｅｃｏｒｄｉｎｇｅｑｕｉｐｍｅｎｔ，ｔｈｅｒｅａｄ／ｗｒｉｔｅｍａｇｎｅｔｉｃｈｅａｄｓｌｉｄｅｒｉｓｆｉｘｅｄｏｎｔｈｅｒｅｖｏｌｖｅｄｍａｇｎｅｔｉｃｄｉｓｋｗｈｉｃｈｉｓｆｌｙｉｎｇｗｉｔｈｈｉｇ...     

Analog to digital converter for high density neural signal recording front-end in 90 nm

High-fidelity recording of neural signals requires varying levels of signal gain to capture low-amplitude single-unit activity in the presence of high-amplitude population activity. A floating-point approach has been used to widen the dynamic range of analog-to-digital converters (ADC) designed for this application. In this paper we present an ADC, designed for multi-channel, portable neural signal recording systems. To achieve low power consumption, small die area and wide dynamic range, an ADC based on a time-based algorithm, combined with a floating-point pipelined structure has been designed and simulated. A conventional variable-gain amplifier (VGA) stage has been eliminated in favor of a reference-current in a time-based ADC architecture. The 12-b pipelined time-based floating-point ADC has been designed with a 7-b mantissa and an exponent that provides an additional 5 bits of dynamic range. The mantissa is determined by a uniform 7-b pipelined time-based analog to digital converter. The ADC chip was designed and simulated in a 90 nm CMOS process, which occupies an active area of 360 μm × 550 μm, and consumes 7.8 μW at 1.2 V in full-scale conversion.     

A Novel Method to Get Super-Resolution Images from Low-Resolution Compressed Video

1IntroductionSuper-Resolution (SR) is the process of reconstruct-ing a higher resolution i mage from Low-Resolution(LR)input observations .These LRobservations are ac-quired by either multiple sensors or by a single sensori maging the scene over a period of ti me[1]. No matterthe source of observation,the critical requirement forSRis that the observations contain different but relatedviews of the scene .In the field,there are many typicalmethods proposed to address the problem, such as :B…     

Genetic Control of Aerogel and Nanofoam Properties,Applied to Ni–MnOx Cathode Design

Aerogels are ultralight porous materials whose matrix structure can be formed by interlinking 880 nm long M13 phage particles. In theory, changing the phage properties would alter the aerogel matrix, but attempting this using the current production system leads to heterogeneous lengths. A phagemid system that yields a narrow length distribution that can be tuned in 0.3 nm increments from 50 to 2500 nm is designed and, independently, the persistence length varies from 14 to 68 nm by mutating the coat protein. A robotic workflow that automates each step from DNA construction to aerogel synthesis is used to build 1200 aerogels. This is applied to compare Ni–MnO_x cathodes built using different matrixes, revealing a pareto-optimal relationship between performance metrics. This work demonstrates the application of genetic engineering to create “tuning knobs” to sweep through material parameter space; in this case, toward creating a physically strong and high-capacity battery.     

New Compensated Method to the Phase for a Bulk Optic Faraday Current Sensor

ＮｅｗＣｏｍｐｅｎｓａｔｅｄＭｅｔｈｏｄｔｏｔｈｅＰｈａｓｅｆｏｒａＢｕｌｋＯｐｔｉｃＦａｒａｄａｙＣｕｒｒｅｎｔＳｅｎｓｏｒ￥ＨＥＳａｉｘｉａｎ；ＺＨＯＮＧＳｉｄｏｎｇ；ＹＵＭｏｚｈｉ；ＨＵＹｏｕｌｉｎ（ＷｕｈａｎＴｅｃｈｎｏｌｏｇｙＵｎｉｖｅｒｓ...     

A New Method to Investigate InGaAsP Single-Photon AvalancheDiodes Using a Digital Sampling Oscilloscope

介绍了由带尾纤的InGaAs/InP雪崩光电二极管建立的近红外单光子探测系统. 使用带宽50GHz 的数字采样示波器，首次直观地展现了门模式（即盖革模式）工作状态下，单光子探测的模式和过程. 并且在波长分别为1310和1550nm的情况下进行了定量研究. 在1550nm，工作温度203K条件下，该探测器达到了暗计数概率2.4E-3每门，量子效率52%, 50kHz的门信号重复频率；在工作温度为238K时，相应参数分别为8.5E-3,43%和200kHz.     

New Compenated Method to the Phase for a Bulk Optic Faraday Current Sensor

A new method to reduce the reflection-induced phase between the two ortho-gonal components of the linearly polarized light after the reflections is presented.This kind of sensor haad essier to fabricate and adjust than that whose internal reflection is at critical angle.