应力下LDD nMOSFET栅控产生电流退化特性研究

研究了LDD nMOSFET栅控产生电流在电子和空穴交替应力下的退化特性。电子应力后栅控产生电流减小,相继的空穴注人中和之前的陷落电子而使得产生电流曲线基本恢复到初始状态。进一步发现产生电流峰值在空穴应力对电子应力引发的退化的恢复程度与阈值电压和最大饱和漏电流不同。电子应力中陷落电子位于栅漏交叠区附近的沟道侧I区和LDD侧的II区中氧化层中。GIDL应力中,空穴注入进II区中和了陷落电子,使得产生电流的退化基本得到恢复,但这些空穴并未有效中和I区中的陷落电子,因此阈值电压和最大饱和漏电流退化恢复的程度较小,分别为20%和7%。     

90nm工艺下nMOS器件最大衬底电流应力特性

研究了90nm工艺条件下的轻掺杂漏(lightly-doped drain,LDD)nMOSFET器件最大衬底电流应力特性.在比较分析了连续不同电应力后LDD nMOSFET的GIDL(gate-induced drain leakage)电流变化后,发现当器件的栅氧厚度接近1nm,沟长接近100nm时,最大衬底电流应力不是电子注入应力,也不是电子和空穴的共同注入应力,而是一种空穴注入应力,并采用空穴应力注入实验、负最大衬底电流应力实验验证了这一结论.     

90nm工艺下nMOS器件最大衬底电流应力特性

研究了90nm工艺条件下的轻掺杂漏(lightly-doped drain,LDD)nMOSFET器件最大衬底电流应力特性.在比较分析了连续不同电应力后LDD nMOSFET的GIDL(gate-induced drain leakage)电流变化后,发现当器件的栅氧厚度接近1nm,沟长接近100nm时,最大衬底电流应力不是电子注入应力,也不是电子和空穴的共同注入应力,而是一种空穴注入应力,并采用空穴应力注入实验、负最大衬底电流应力实验验证了这一结论.     

一个新的pMOSFET栅电流退化模型

研究了最大栅电流应力(即pMOSFET最坏退化情况)下pMOSFET栅电流的退化特性.实验发现,在最大栅电流应力下,pMOSFET栅电流随应力时间会发生很大下降,而且在应力初期和应力末期栅电流的下降规律均会偏离公认的指数规律.给出了所有这些现象的详细物理解释,并在此基础上提出了一种新的用于pMOSFET寿命评估的栅电流退化模型.     

一个新的pMOSFET栅电流退化模型

研究了最大栅电流应力 (即 p MOSFET最坏退化情况 )下 p MOSFET栅电流的退化特性 .实验发现 ,在最大栅电流应力下 ,p MOSFET栅电流随应力时间会发生很大下降 ,而且在应力初期和应力末期栅电流的下降规律均会偏离公认的指数规律 .给出了所有这些现象的详细物理解释 ,并在此基础上提出了一种新的用于 p MOSFET寿命评估的栅电流退化模型     

HALO结构pMOSFETs在V_g=V_d/2应力模式下应力相关的热载流子退化

研究了超薄栅(2 .5 nm )短沟HAL O- p MOSFETs在Vg=Vd/ 2应力模式下不同应力电压时热载流子退化特性.随着应力电压的变化,器件的退化特性也发生了改变.在加速应力下寿命外推方法会导致过高地估计器件寿命.在高场应力下器件退化是由空穴注入或者电子与空穴复合引起的,随着应力电压的下降器件退化主要是由电子注入引起的.最后,给出了两种退化机制的临界电压并在实验中得到验证     

HALO结构pMOSFETs在Vg=Vd/2应力模式下应力相关的热载流子退化

研究了超薄栅(2.5nm)短沟HALO-pMOSFETs在Vg=Vd/2应力模式下不同应力电压时热载流子退化特性.随着应力电压的变化,器件的退化特性也发生了改变.在加速应力下寿命外推方法会导致过高地估计器件寿命.在高场应力下器件退化是由空穴注入或者电子与空穴复合引起的,随着应力电压的下降器件退化主要是由电子注入引起的.最后,给出了两种退化机制的临界电压并在实验中得到验证.     

不同栅压应力下1.8V pMOS热载流子退化机理研究

本文详细研究了不同栅压应力下1.8V pMOS器件的热载流子退化机理.研究结果表明,随着栅压应力增加,电子注入机制逐渐转化为空穴注入机制,使得pMOS漏极饱和电流(I_dsat)、漏极线性电流(I_dlin)及阈值电压(V_th)等性能参数退化量逐渐增加,但在V_gs=90%*V_ds时,因为没有载流子注入栅氧层,使得退化趋势出现转折.此外,研究还发现,界面态位于耗尽区时对空穴迁移率的影响小于其位于非耗尽区时的影响,致使正向I_dsat退化小于反向I_dsat退化,然而,正反向I_dlin退化却相同,这是因为I_dlin状态下器件整个沟道区均处于非耗尽状态.     

20V NLDMOS器件在关态雪崩击穿条件下的退化

对一种工作在关态雪崩击穿条件下的20V的NLDMOS器件的退化特性进行了研究。通过电流脉冲应力实验、TCAD软件仿真、以及电荷泵测试,提出了两种退化机制。第一种机制是N型漂移区中热空穴注入到氧化层中,在氧化层中形成固定正电荷;第二种机制是漂移区中界面态的增加引起的载流子迁移率下降。这两种机制都随着雪崩电流的增加而增强。     

直接隧穿应力下超薄栅氧MOS器件退化

研究了栅氧厚度为1.4nm MOS器件在恒压直接隧穿应力下器件参数退化和应力感应漏电流退化.实验结果表明,在不同直接隧穿应力过程中,应力感应漏电流(SILC)的退化和Vth的退化均存在线性关系.为了解释直接隧穿应力下SILC的起因,建立了一个界面陷阱和氧化层陷阱正电荷共同辅助遂穿模型.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Call for Papers

正Wireless Body-area Networks The last decade has witnessed the convergence of three giant worlds:electronics,computer science and telecommunications.The next decade should follow this convergence in most of our activities with the generalization of sensor networks.In particular with the progress in medicine,people live longer and the aging of population will push the development of wireless personal networks     

Call for Papers—Feature Topic,Vol.12,No.7,2015

正Information Centric Networking Information-Centric Networking(ICN) is an emerging direction in Future Internet architecture research,gaining significant tractions among academia and industry.Aiming to replace the conventional host-to-host communication model by a data-centric model,ICN treats data content as the first     

JOURNAL OF ELECTRONICS(CHINA)

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NEXT GENERATION WIRELESS NETWORKS–ESPECIALLY THE USE OF MILLI-MICROWAVE BANDS

The global bandwidth shortage of wireless communications has motivated the exploration of the naillimeter wave （ram-wave） frequency spectrum for the next generation wireless communications. Recent advances in RF CMOS technology and high speed baseband signal processing technologies have enabled tile extensive research and development of turn-wave wireless communications. The multi gigabit per second data rate of ram-wave system will lead to applications in many important scenarios, such as WPAN, WLAN,back-haul for cellular system. And the frequency bands include 28 GHz, 38 GHz, 45GHz, 60GHz, E-BAND and even beyond 100 GHz. The propagation and the imitation of the RF circuits design in these frequency bands make the directional antennas be inevitable for mm-wave communications.