Cu–Ga–Se thin films prepared by a combination of electrodeposition and evaporation techniques

Cu–Ga–Se thin films were prepared using a combination of electrodeposition and evaporation techniques. A Cu–Se/Mo/glass precursor thin film was first prepared by galvanostatic electrodeposition. On top of this film three different thicknesses of Ga were deposited by evaporation. The Cu–Ga–Se thin films were formed by annealing the Ga/Cu–Se/Mo/glass thin film configuration in a tubular chamber with Se powder, at different temperatures. Thin films were characterized by X-ray diffraction (XRD), photocurrent spectroscopy (PS), inductively coupled plasma (ICP) analysis, and scanning electron microscopy (SEM). The detailed analysis from X-ray reveals that after annealing at 550 °C the CuGaSe₂ phase is formed when the thickness of Ga is 0.25 μm, however at 0.5 μm and 1.0 μm Ga the formation of CuGa₃Se₅ and CuGa₅Se₈ phases is observed respectively. Band gap values were obtained using photocurrent spectroscopy.     

Precursor modification for preparation of CIS films by selenization technique

CuInSe₂ films have been prepared using the selenization technique. Preparation of the precursor as well as selenization were carried out by the vacuum evaporation technique. The sequence of copper and Indium layer deposition during precursor preparation affects the morphological and structural properties of precursor which directly have effects on the properties of selenized CIS films. A thin layer of amorphous selenium at the substrate/film interface has been used to improve the adherence of the film. The effect of the Se under-layer has been studied on the layers of copper, indium, CuIn precursors and CIS films, using structural, morphological and optical properties. The surface morphology of a single layer of copper and indium, with and without the Selenium under-layer, are quite different and drastically affect the properties of the precursor and selenized films. The Se under-layer does not take part in the chemical reaction of CIS formation during the selenization process. The modified CIS films are uniform, single phase, polycrystalline, chalcopyrite with (1 1 2) preferred orientation showing an energy band gap of 0.99 eV and an absorption coefficient of 10⁵ cm⁻¹, and have good adherence to the substrate for the scotch tape test.     

Preparation of Cu(In,Ga)(S,Se)2 thin films by sequential evaporation and annealing in sulfur atmosphere

Cu(In,Ga)(S,Se)₂ thin films with high Ga/III ratio (around 0.8) were prepared by sequential evaporation from CuGaSe₂, CuInSe₂, In₂Se₃ and Ga₂Se₃ compounds and then annealing in H₂S gas atmosphere. The annealing temperature was varied from 400 to 500 °C. These samples were characterized by means of XRF, EPMA, XRD and SEM. The S/(S+Se) mole ratio in the thin films increased with increase in the annealing temperature, keeping the Cu, In and Ga contents nearly constant. The open circuit voltage increased and the short circuit current density decreased with increase in the annealing temperature. The best solar cell using Cu(In,Ga)(S,Se)₂ thin film with Ga/(In+Ga)=0.79 and S/(S+Se)=0.11 annealed at 400 °C demonstrated V_oc=535 mV, I_sc=13.3 mA/cm², FF=0.61 and efficiency=4.34% without AR-coating.     

Sub-micrometer thick CuInSe2 films for solar cells using sequential elemental evaporation

CuInSe₂ thin films were prepared using sequential vacuum evaporation of In, Se and Cu at moderately low substrate temperatures, avoiding any treatment using toxic H₂Se gas. The samples were annealed at 400 °C at a pressure of 10⁻⁵ mbar to form CuInSe₂. Structural, optical, electrical, compositional and morphological characterizations were carried out on these films. We could obtain highly stoichiometric film, using this simple method, without opting for co-evaporation or high substrate temperature for deposition.     

Improved CIGS thin-film solar cells by surface sulfurization using In2S3 and sulfur vapor

Surface sulfurization of Cu(In,Ga)Se₂ (CIGS) thin films was carried out using two alternative techniques that do not utilize toxic H₂S gas; a sequential evaporation of In₂S₃ after CIGS deposition and the annealing of CIGS thin films in sulfur vapor. A Cu(In,Ga) (S,Se)₂ thin layer was grown on the surface of the CIGS thin film after sulfurization using In₂S₃, whereas this layer was not observed for CIGS thin films after sulfurization using sulfur vapor, although a trace quantity of S was confirmed by AES analysis. In spite of the difference in the surface modification techniques, the cell performance and process yield of the ZnO:Al/CdS/CIGS/Mo/glass thin-film solar cells were remarkably improved by using both surface sulfurization techniques.     

Ex-situ and in-situ analyses on reaction mechanism of CuInSe2 (CIS) formed by selenization of sputter deposited CuIn precursor with Se vapor

Formation mechanism of CIS thin films by selenization of sputter deposited CuIn precursor with Se vapor was investigated by ex-situ and in-situ phase analysis tools. Precursor films were composed of In, CuIn and Cu₂In compounds, and their relative fractions were systematically changed with Cu/In ratios. Those films were found to have a double layered structure with nearly pure In particles (top layer) placed on the flat Cu-rich bottom layer, and the morphologies were also significantly affected by Cu/In ratio. At the initial stage of selenization, the outer In-rich layer reacted with Se vapor to form In-Se binary, which is the first selenide phase appeared, and inner Cu-rich phases acted as a Cu source to supply Cu to outer In-Se phase to form ordered vacancy compounds (OVC). As these reactions continues, in conjunction with Se incorporation into inner Cu-rich region, the films gradually changes from OVC to α-CIS, reflecting that the formation route of CIS is closely related to the elemental and phase distribution in precursor films. Selenized CIS films were further processed to fabricate CIS thin film solar cells, resulting in the best cell efficiency of 10.44%.     

Investigation of the chalcogen interdiffusion in CuIn(TeSe)2 thin films

Graded thin films of CuInSe₂ on CuInTe₂ have been obtained by annealing of precursor structures containing Se and Te separated in depth. The depth profile of the phases in the film was investigated using X-ray diffraction with grazing incidence of the primary beam. Quasi-epitaxial growth of CuInSe₂ on a CuInTe₂ film next to the Mo back-electrode was observed after annealing at 450°C in vacuum. Annealing at higher temperature lead to chalcogen interdiffusion resulting in quaternary films. However, heat treatments of already reacted films did not result in any detectable interdiffusion. From these results the mechanisms governing the growth of films from precursors containing the chalcogens Se and Te separated in depth are discussed with respect to their application for thin film solar cells.     

Thermal diffusion of Cu into In2Se3: A better approach to SEL technique in the deposition of CuInSe2 thin films

This paper reports the modifications made in the preparation techniques of getting CuInSe₂ thin films starting with chemical bath deposited (CBD) selenium films. In the present study, CBD Se film was converted into CuInSe₂ by stacked elemental layer (SEL) technique and also by thermal diffusion of Cu into In₂Se₃. In both the cases CBD Se films were used to avoid toxic Se vapor and H₂Se gas. Improvements were made in these techniques through a detailed study, varying the composition of the films over a wide range by changing the Cu/In ratio. Structural, optical and electrical characterizations were performed. On comparing the material properties of CuInSe₂ deposited by these two techniques, it was found that photosensitivity was better for samples prepared by thermal diffusion of Cu into In₂Se₃. So the technique of thermal diffusion of Cu into In₂Se₃ was found to be better than SEL technique in the preparation of CuInSe₂ using CBD Se. Cu-rich, In-rich and nearly stoichiometric samples could be prepared by thermal diffusion of Cu into In₂Se₃. These samples were analyzed using energy dispersive spectroscopy, Raman spectroscopy and atomic force microscopy also.     

Real-time investigations on the formation of CuInSe2 thin film solar cell absorbers from electrodeposited precursors

In this article, we present results of a detailed real-time X-ray diffraction (XRD) study on the formation of CuInSe₂ from electroplated precursors. The solid-state reactions observed during the selenisation of three different types of precursors are presented. The first type of precursors (I) consists of the nanocrystalline phases Cu_2−xSe and InSe at room temperature, which react to CuInSe₂ starting at 470 K. The second type of precursor (II) shows an inhibited CuInSe₂ formation out of the initial phases Cu_2−xSe and γ-In₂Se₃ starting at 400 K. The third precursor type (III) shows completely different selenisation behaviour. Starting from the intermetallic compound Cu₁₁In₉ and amorphous selenium, the formation of the binary selenides In₄Se₃ and CuSe is observed after the melting point of selenium at 494 K. After selenium transfer reactions, the compound semiconductor CuInSe₂ is formed out of Cu_2−xSe and InSe. This type (III) reaction path is well known for the selenisation of SEL precursors (stacked elemental layers of sputtered copper and indium and thermally evaporated selenium).     

Investigation of the copper concentration on photocurrent collection of CuInSe2 solar cells

In this study, CuInSe₂ (CISe) thin films were prepared from thermally evaporated Cu/In precursors, having various Cu/In atomic ratio, under the same selenization conditions. The precursors were converted into CISe absorber by annealing in a quartz tube furnace in the selenium vapours at substrate temperature of 500 °C. We developed four CISe films with Cu/In atomic ratio of 0.81–1.19, denoted as Cu‐very rich, Cu‐rich, Cu‐poor, and Cu‐very poor CISe thin films respectively. The effects of Cu/In atomic ratio on grain size, surface morphology, micro‐structure and defect formation of the resulting CISe films were examined. It has been found that the photovoltaic properties were strongly related to Cu concentration, as well as carrier transport mechanism. Defects at the surface and in the bulk of CISe thin films were observed using X‐ray diffraction (XRD), X‐ray photoelectron spectroscopy, Raman spectroscopy, energy dispersive X‐ray spectroscopy and scanning electron microscopy. Moreover, XRD revealed that the CISe film surface had a preferred orientation along the (112) plane. The XRD intensity and full width at half maximum of the (112) plane of CISe varied according to the Cu/In atomic ratio. Our experimental results show that the Cu‐rich solar cell achieves conversion efficiency of 4.55% and exhibits an exceptional high short‐circuit current density. Copyright © 2016 John Wiley & Sons, Ltd.     

p-Type CuSbS2 thin films by thermal diffusion of copper into Sb2S3

We report the preparation of copper antimony sulfide (CuSbS₂) thin films by heating Sb₂S₃/Cu multilayer in vacuum. Sb₂S₃ thin film was prepared from a chemical bath containing SbCl₃ and Na₂S₂O₃ salts at room temperature (27 °C) on well cleaned glass substrates. A copper thin film was deposited on Sb₂S₃ film by thermal evaporation and Sb₂S₃/Cu layers were subjected to annealing at different conditions. Structure, morphology, optical and electrical properties of the thin films formed by varying Cu layer thickness and heating conditions were analyzed using different characterization techniques. XRD analysis showed that the thin films formed at 300 and 380 °C consist of CuSbS₂ with chalcostibite structure. These thin films showed p-type conductivity and the conductivity value increased with increase in copper content. The optical band gap of CuSbS₂ was evaluated as nearly 1.5 eV.     

Improved Cu(In,Ga)(S,Se)2 thin film solar cells by surface sulfurization

Surface sulfurization was developed as a technique for fabricating efficient ZnO : Al/CdS/graded Cu(In,Ga)(S,Se)₂/ Mo/glass solar cells. Prior to the sulfurization, single-graded Cu(In,Ga)Se₂ (CIGS) films were deposited by a multi-stage process. The sulfurization of CIGS films was carried out using a H₂S---Ar mixture at elevated temperatures. The crystallographic and compositional properties of the absorber layers were investigated by XRD, SEM and AES analyses. After sulfurization, sulfur atoms were substituted for selenium atoms at the surface layer of CIGS films to form a Cu(In,Ga)(S,Se)₂ absorber layer. The diffusion of sulfur depends strongly on the grain structure of CIGS film. The cell efficiency of the 8–11% range before sulfurization was improved dramatically to 14.3% with V_oc = 528 mV, J_sc = 39.9 mA/cm² and FF = 0.68 after the sulfurization process.     

Formation of CuIn(S,Se)2 thin film by thermal diffusion of sulfur and selenium vapours into Cu–In alloy within a closed graphite container

The formation of CuIn(S,Se)₂ thin films by thermal diffusion of sulfur (S) and selenium (Se) vapours into co-sputtered Cu–In alloy within a closed-space graphite container is reported. All films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), Four-point-probe and hot-probe measurements. Cu–In alloy films with composition varying from Cu-rich to In-rich were deposited. The synthesized In-rich films yielded CuIn₅(S,Se)₈ spinel compound which gradually transformed into a single phase CuIn(S,Se)₂ as the film composition approached the Cu-rich region. The morphology of the CuIn₅(S,Se)₈ was found to differ from the stoichiometric and Cu-rich CuIn(S,Se)₂ as observed from SEM. EDX composition analysis of the films showed a Cu/In ratio varying from 0.36 to 1.54 and a (S+Se)/(Cu+In) varying from 0.97 to 1.32. The amount of S incorporated in the films was found to differ with changes in the composition. The resistivity of the films ranged between 10⁻¹ and 10⁷ Ω cm and it strongly followed the change in the alloy film composition.     

Deposition and characterization of CuInSe2

Polycrystalline CuInSe₂ thin film solar cells were prepared by two methods: three-source evaporation and co-electrodeposition from a single bath. Structural and compositional characterization was carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The evaporation technique produced chalcopyrite CIS for stoichmetric and In-rich films while the Cu-rich films exhibited only the sphalerite phase. SEM analysis shows grain sizes of 0.5–0.7 μum for stoichmetric CIS. Electron diffraction also revealed the presence of CIS. It was found that sufficient Cu, In and Se could be co-electrodeposited from a single bath. EDS analysis showed that annealing resulted in the loss of Se. The adhesion of the film to the substrate depends critically on the current density and time of deposition.     

Surface sulfurization studies of Cu(InGa)Se2 thin film

Sulfurization of copper indium gallium diselenide (CIGS) thin films solar cell absorber has been used to enhance the open-circuit voltage of the device by increasing the band gap of the absorber near the interface. Sulfurization of a homogeneous co-evaporated Cu(InGa)Se₂ thin film was studied in hydrogen sulfide and in a mixture of hydrogen sulfide and hydrogen selenide gases with the inclusion of oxygen. The structural and compositional properties of the absorber layer were investigated by XRD, EDS and AES. Sulfurization in hydrogen sulfide gas forms a fully converted sulfide layer at the top of the absorber layer, which in turn forms a barrier for the current collection. Sulfurization in a mixture of hydrogen sulfide and hydrogen selenide gases forms a wide band gap Cu(InGa)(SeS)₂ layer at the surface, but at the same time there is Ga diffusion away from the surface with the inclusion of sulfur at the surface.     

Effect of bath temperature and annealing on the formation of CuInSe2

CuInSe₂ films of 2 μm thickness were electrodeposited potentiostatically, from aqueous solution containing thiocyanate as a complexing agent, on Mo substrates. For all the experiments, the potential of the potentiostatic deposition of the materials was chosen to be −1 V, whereas the bath temperature of electrolyte was varied from 20 to 80 °C. It was found that the electrodeposited CuInSe₂ was characterized by an amorphous layer and densely-packed nanometric grains with a good homogeneity. After vacuum annealing at 200 °C, glancing angle X-ray diffraction revealed the presence of the CuInSe₂ phase whereas annealing under selenium atmosphere lead to the growth of molybdenum selenide compound MoSe₂, in addition to a better crystallization of the copper indium diselenide compound. Scanning electron microscopic revealed that despite an increase in the grains dimensions, there was no significant change in the films surface morphology when the bath temperature was varied from 20 to 80 °C. At the same time, the composition of the electrodeposited Cu-In-Se layers becomes richer in copper. This increase in copper concentration is mainly compensated by a deficit in selenium atoms.     

Influence of CdCl2 treatment on structural and optical properties of vacuum evaporated CdTe thin films

In this article we have discussed the structural, optical properties of vacuum evaporated CdTe thin films before and after CdCl₂ treatment. The CdTe thin films were prepared by vacuum evaporation. Films were prepared under the vacuum of 10⁻⁶ Torr. The structural studies have been performed by the X-ray diffraction (XRD) technique. The XRD analysis of vacuum evaporated CdTe films reveals that the structure of films is polycrystalline in nature. However, the crystallinity has been improved after the CdCl₂ treatment as shown by an increase of the diffraction peak intensities. This is due to the enhancement in the atomic mobility of CdTe. The optical properties of the CdTe thin films have been studied by the spectrophotometer in the 300–800 nm wavelength range. It is observed that the optical band gap energy is highly dependent on CdCl₂ treatments. The optical transitions in these films are found to be direct and allowed.     

Effects of annealing on CuInSe2 films grown by molecular beam epitaxy

CuInSe₂ (CIS) thin films with a range of Cu/In ratios were grown by molecular beam epitaxy on GaAs (0 0 1) at substrate temperatures of T_s = 450–500°C and the effects of annealing under various atmospheres have been investigated. Photoluminescence spectra obtained from an ex-situ vacuum annealed CIS film at a temperature of T_A = 350°C showed a red-shift and a broadening of an emission peak (peak c) which originally appeared at 0.970 eV before annealing and the red-shifted peak c was found to consist of two overlapping peaks. The excitation power dependence of these overlapping peaks indicated the radiative recombination processes associated with the emissions to be a conduction band to acceptor transition (peak at 0.970 eV) and a transition due to donor-acceptor pairs (peak at 0.959 eV), indicating the formation of a shallow donor-type defect during the vacuum annealing process. The origin of this defect has tentatively been attributed to Se vacancies. On the other hand, the molar fraction of oxygen increased with increasing annealing temperature in dry-air. An epitaxially grown In₂O₃ phase was found both in Cu-rich and In-rich films annealed at T_A 350°C, which was not observed in the films annealed in Ar atmosphere. Thermodynamic calculations based on the Cu---In---Se---O---N system showed In₂O₃ to be the most stable phase in good agreement with the experimental results.     

Fabrication of CuInSe2 films and solar cells by the sequential evaporation of In2Se3 and Cu2Se binary compounds

Cu₂Se/In_xSe(x≈1) double layers were prepared by sequentially evaporating In₂Se₃ and Cu₂Se binary compounds at room temperature on glass or Mo-coated glass substrates and CuInSe₂ films were formed by annealing them in a Se atmosphere at 550°C in the same vacuum chamber. The In_xSe thickness was fixed at 1 μm and the Cu₂Se thickness was varied from 0.2 to 0.5 μm. The CuInSe₂ films were single phase and the compositions were Cu-rich when the Cu₂Se thickness was above 0.35 μm. And then, a thin CuIn₃Se₅ layer was formed on the top of the CuInSe₂ film by co-evaporating In₂Se₃ and Se at 550°C. When the thickness of CuIn₃Se₅ layer was about 150 nm, the CuInSe₂ cell showed the active area efficiency of 5.4% with V_oc=286 mV, J_sc=36 mA/cm² and FF=0.52. As the CuIn₃Se₅ thickness increased further, the efficiency decreased.     

Some physical investigations on AgInS2 sprayed thin films

AgInS₂ thin films have been prepared on glass substrates by the spray pyrolysis process using an aqueous solution which contains silver acetate (AgCH₃CO₂), thiourea (SC(NH₂)₂) and indium chloride (InCl₃) as precursors. The depositions were carried out in the range of the substrate temperature from 260 to 420 °C. The value of the concentration ratio in the spray solution of indium and silver elements x=[Ag⁺]/[In³⁺] was varied from 1 to 1.5 with [In³⁺]=10⁻² M and [S²⁻]/[In³⁺] was taken constant, equal to 4. The structural study shows that AgInS₂ thin film, prepared at 420 °C using optimal concentration ratio x=1.3 crystallizes in the chalcopyrite phase with a strong (1 1 2) X-ray diffraction line. Moreover, microprobe analysis (EPMA) shows that a nearly stoichiometric composition is obtained for these experimental conditions. Indeed, the atomic percentage of elements were. 24.5, 25.0, 49.5 for Ag, In and S, respectively. On the other hand from transmission and reflectance spectra, the obtained band gap energy is 1.83 eV for such film.