烧结助剂对Mg4Nb2O9陶瓷性能的影响

研究了Bi2O3-V2O5、CuO-Bi2O3-V2O5、Li2CO3-V2O5掺杂对Mg4Nb2O9陶瓷烧结特性和微波介电性能的影响。通过XRD分析材料物相组成,结果表明,CuO-Bi2O3-V2O5、Bi2O3-V2O5的添加能有效地将Mg4Nb2O9陶瓷烧结温度从1 350℃降至950℃,但同时陶瓷的品质因数(Q.f)有很大恶化。掺杂w(Li2CO3-V2O5)=3%,试样致密化温度降至950℃,保温5 h,其具有良好的微波介电性能:介电常数(rε)为14.0,Q.f为83 276 GHz。     

Pb/Bi复掺对Y2O3-2TiO2微波介质陶瓷性能的影响

研究了PbTiO3和Bi2Ti2O7复合掺杂对新型的具有中介电常数的Y2O3-2TiO2系微波介质陶瓷物相组成、介电性能和烧结温度的影响。结果表明,掺杂后的陶瓷材料主晶相仍为A2B2O7型烧绿石结构,未发现第二相,Bi3+和Pb2+共同占据Y3+所在的A位。Pb/Bi复合掺杂有效降低了陶瓷的烧结温度,当w(PbTiO3)=2%和w(Bi2Ti2O7)=8%时,烧结温度降低为1 260℃,且陶瓷具有较好的介电性能,即介电常数rε≈64,介质损耗tanδ≈3.6×10-3,品质因数与频率的乘积Q×f≈2 438 GHz。     

微波烧结法制备Bi_2O_3-ZnO-Ta_2O_5陶瓷

研究了三元体系Bi2O3-ZnO-Ta2O5微波陶瓷的微波烧结情况,从烧结机理、陶瓷结构、显微形貌和介电性能等方面对微波烧结的样品和常规烧结样品进行了比较.实验结果表明,微波烧结大幅度缩短了烧结时间,并且很好地促进了Bi2O3-ZnO-Ta2O5陶瓷的致密化,制成的样品晶粒细小均一,且介电性能在一定程度上得到了优化.     

加强军队医药卫生科技查新工作

采用固相反应法研究了ZnO-B2O3(ZB)玻璃对Ca[(Li1/3Nb2/3)0.9Ti0.1]O3-δ(CLNT)烧结性能和微波介电性能的影响.X-射线衍射图谱表明,ZB玻璃含量的增加有利于正交钙钛矿相的稳定形成,w(ZB)＞3%时,第二相开始形成;随ZB玻璃添加量的增加,CLNT陶瓷的烧结温度可降低到940℃,Q×f和介电常数εr均先增大后减小,频率温度系数τf负向增大.掺入w(ZB)=3%,在940℃烧结4 h,CLNT陶瓷获得如下微波介电性能:Q×f=13 705 GHz,εr=23.7,τf=-59×10-6/℃.     

CuO掺杂Ba_(0.6)Sr_(0.4)TiO_3陶瓷的结构与性能

采用传统陶瓷制备工艺,以容差因子为依据进行CuO掺杂,制备了可在较低温度烧结成瓷的Ba_(0.6)Sr_(0.4)TiO_3(BSTO)基陶瓷.结果表明,w(CuO)=0.5%～4.0%的BSTO基陶瓷可在1 200 ℃烧结成瓷,且不会引入杂相.介电性能测试表明,在室温低频下,随CuO掺杂量的增加,BSTO陶瓷的介电常数增加,而介电损耗降低;在微波频段下,BSTO基陶瓷的介电常数和介电损耗均随CuO掺杂量的增加而增大.可调性测试表明,在1 kV/mm的直流偏压下,各BSTO基陶瓷掺杂样的可调性均大于10%,其中,试样w(CuO)=1%的可调性达到13.2%.     

Sb2O3掺杂Zn-Nb-O基微波介质陶瓷的结构与性能

采用传统电子陶瓷工艺制备(ZnNb2O6-Zn3Nb2O8)-Sb2O3(ZZS)陶瓷,研究了Sb2O3含量对ZZS陶瓷结构及介电性能的影响规律。结果表明,Sb2O3的加入促进了陶瓷的烧结,陶瓷中除ZnNb2O6和Zn3Nb2O8两种主晶相外未有新相生成,Sb2O3则以Sb3+或Sb5+置换Nb5+/Zn2+形成置换固溶体;陶瓷的介电常数(εr)随Sb2O3含量的增加先增大后减小,保持在23～25之间,介电损耗略有增加。微波频段下,0.7ZnNb2O6-0.3Zn3Nb2O8陶瓷的介电常数随Sb2O3含量的增加略有减小,品质因数与频率的乘积(Q×f)值先增大后减小。当w(Sb2O3)=1%时,陶瓷综合性能最佳,εr=22.88,Q×f=38 871GHz。     

ZrO2掺杂对Ba(Zn1/3Ta2/3)O3陶瓷介电性能的影响

采用固相反应烧结法制备了ZrO2掺杂的Ba(Zn1/3Ta2/3)O3微波介质陶瓷,研究了陶瓷的烧结特性和介电性能。结果表明,ZrO2掺杂能有效降低Ba(Zn1/3Ta2/3)O3陶瓷的烧结温度,改善陶瓷的微波介电性能。当x(ZrO2)=4%时,Ba(Zn1/3Ta2/3)O3陶瓷致密化烧结温度由纯相时的1 600℃降至1 300℃,同时陶瓷材料的微波介电性能达到最佳值,即介电常数εr=34.79,品质因数与频率的乘积Q×f=148 000(8GHz),谐振频率温度系数τf=0.3×10-6/℃。     

掺BCB低温共烧ZnNb2O6微波介质陶瓷的研究

研究了BaCu(B2O5)(BCB)对ZnNb2O6 微波介质陶瓷烧结特性和介电性能的影响.结果表明,BCB 玻璃料形成的液相加速了颗粒间的传质,促进了烧结,能有效的使ZnNb2O6 陶瓷的烧结温度降低至875℃,随着BCB含量的增多,样品中出现了第二相.w(BCB)=3%的ZnNb2O6 陶瓷在875℃保温4 h,获得优异的综合介电性能,即介电常数εr=23.4,品质因数与频率的乘积Q×f=13 230 GHz,谐振频率温度系数τr,=-78.41×10-6/℃,与Ag共烧研究表明,ZnNb2O6 陶瓷与Ag电极化学兼容性较好,未发生明显的扩散反应现象,可作为一种新型的低温烧结微波介质陶瓷用于多层微波器件的制作.     

前列腺素E1相关性白细胞减少伴血小板减低1例

研究了B2O3对陶瓷的烧结性能及微波介电特性的影响.研究表明,B2O3的掺入能有效降低Ca[(Li1/3Nb2/3)0.92Zr0.08]O3-δ(CLNZ)陶瓷体系的烧结温度150~200 ℃,谐振频率温度系数τf随B2O3掺入量增加及烧结温度的提高,由负值向正值方向增大.在1 000 ℃,掺入质量分数w(B2O3)=2.5%,陶瓷微波介电性能最佳:介电常数εr=31.3,品质因数与频率之积Qf=13 680 GHz,τf =-8.7 μ℃-1.     

Ba_(0.6)Sr_(0.4)TiO_3/ZnNb_2O_6复相陶瓷的显微结构和介电性能

采用传统电子陶瓷工艺制备了Ba_(0.6)Sr_(0.4)TiO_3/ZnNb_2O_6(BSTZ)复相陶瓷,研究了ZnNb_2O_6含量对BSTZ陶瓷结构和介电性能的影响规律.结果表明,BSTZ复相陶瓷可在较低温度下烧结成瓷;陶瓷中除了Ba_(0.6)Sr_(0.4)TiO_3和ZnNb_2O_6两种主晶相,还有新相BaNb_(3.6)O_(10)生成;陶瓷的介电常数和介电损耗均随ZnNb2O6含量的增加而降低;当x(ZnNb_2O_6)=0.6(摩尔比)时,复相陶瓷在微波下的介电常数为74,介电损耗为0.043,可调性可达10.54%(1.0 kV/mm).     

Theoretical studies of poly(para-phenylene vinylene) (PPV) and poly(para-phenylene) (PPP)

The electroluminescence from PPV and the blue light emission from PPP constitute exciting subjects of study. The band gap of these semiconducting polymers can be engineered in a wide range from red to ultraviolet by structural changes made on them. In the present work, we present a theoretical approach based on semiempirical and ab initio total energy and force calculations of PPV and PPP. We perform a conformational analysis in order to investigate the connection between their structural, optical and electronic properties. We use the large cell approach, in connection with the semiempirical quantum method Extended Hückel (BICON-CEDiT code) and the density functional theory (DFT) within the full-potential linearized augmented-plane-wave method (FPLAPW) as implemented in the computational code WIEN2k. Our results are compared to other calculations and to optical absorption measurements.     

(Sr_(0.5)Ba_(0.5))_(1.9)Ca_(0.1)NaNb_(5–x)TaxO_(15)陶瓷的介电性能

通过Ta掺杂改性钨青铜陶瓷(Sr0.5Ba0.5)1.9Ca0.1NaNb5–xTaxO15(x=0～0.30),分析了Ta掺杂量对其烧结性能、微观结构及介电性能的影响。陶瓷的烧结温度随x的增大略有提高。当x<0.10时,陶瓷的tC和弛豫性变化不大;当x≥0.10时,tm(1kHz)明显降低,从270℃(x=0)降低至231℃(x=0.30)。且tm随频率增加向高温移动,弛豫性明显增强。认为Ta掺杂引起其性能变化是由于Ta—O键与Nb—O键键能的差异,导致陶瓷氧八面体中心离子位移量以及A位离子有序程度的变化所致。     

Miniband spectra of (AlAs)M(GaAs)N(111) superlattices

Semiconductors - Electron states in the conduction band of (111)-oriented (AlAs)M(GaAs)N superlattices (SLs) with M≥N and N&;lt;10 are considered. The properties of such SLs are mainly...     

单层超晶格Ga_(0.47)In_(0.53)As/InP(110)及半导体合金Ga_(0.235)In_(0.765)P_(0.5)As_(0.5)的状态密度及介电常数(英文)

The DOS, JDOS and ε2(Ω) of monolayer superlattice Ga0.47ln0.53As/ InP(110) have been calculated by a tight-binding approach and compared with that of alloy Ga0.235ln0.765P0.5As0.5 which has the same stoi-chiometric composition as the monolayer superlattice. By using the techniques of the group theory we have obtained the expressions of momentum matrix elements between valence band states and conduction band states with four adjustable parameters. These parameters are determined by fitting the calculated values of ε2(Ω) with the experimental values for InP, GaAs and InAs. Our results show that the superlattice periodicity makes its DOS, JDOS and ε2(Ω) different from those of alloy in varying degree. Due to the folding of Brillouin zone, the JDOS of superlattice turns round in comparison with that of alloy. The momentum matrix elements have different effects for the superlattices and alloys.For the alloys, they can only change the amplitudes of peaks but not the positions of peaks; however, for the superlattices both amplitude and position can be changed.     

纳米复合(Nd,Pr)FeTiBC永磁合金的结构与磁性能

采用熔体快淬法制备了纳米复合(Nd1-xPrx)9.4Fe75.6Ti4B10.5C0.5(x为0,0.2,0.4,0.6,0.8和1.0)合金薄带,研究了Pr对合金薄带结构与磁性能的影响规律。结果表明:Pr降低了合金薄带的晶化温度,使合金薄带晶粒变得粗大,不利于合金矫顽力的提高。Pr对合金薄带磁性能的影响不大,不同Nd和Pr比例的合金薄带在最佳热处理条件下,剩磁Br在0.86 T与0.90 T之间,内禀矫顽力Hcj在1 000 kA/m左右,最大磁能积(BH)max介于130 kJ/m3与136 kJ/m3之间。     

Electromagnetic interference (EMI) of system-on-package (SOP)

Electromagnetic interference (EMI) issues are expected to be crucial for next-generation system-on-package (SOP) integrated high-performance digital LSIs and for radio frequency (RF) and analog circuits. Ordinarily in SOPs, high-performance digital LSIs are sources of EMI, while RF and analog circuits are affected by EMI (victims). This paper describes the following aspects of EMI in SOPs: 1) die/package-level EMI; 2) substrate-level EMI; 3) electromagnetic modeling and simulation; and 4) near electromagnetic field measurement. First, LSI designs are discussed with regard to radiated emission. The signal-return path loop and switching current in the power/ground line are inherent sources of EMI. The EMI of substrate, which work as coupling paths or unwanted antennas, is described. Maintaining the return current path is an important aspect of substrate design for suppressing EMI and for maintaining signal integrity (SI). In addition, isolating and suppressing the resonance of the DC power bus in a substrate is another important design aspect for EMI and for power integrity (PI). Various electromagnetic simulation methodologies are introduced as indispensable design tools for achieving high-performance SOPs without EMI problems. Measurement techniques for near electric and magnetic fields are explained, as they are necessary to confirm the appropriateness of designs and to investigate the causes of EMI problems. This paper is expected to be useful in the design and development of SOPs that take EMI into consideration.     

Sr0.3Ba0.7Bi3.7La0.3Ti4O15铁电陶瓷的烧结及介电性能

采用两步烧结工艺制备Sr0.3Ba0.7Bi3.7La0.3Ti4O15铁电陶瓷,研究了烧结工艺对陶瓷的晶相和介电性能的影响。结果表明:适当提高最高温度、保温温度和保温时间可改善陶瓷的介电性能。当最高温度为1180～1200℃,在1050～1080℃保温5～15h时,其εr为238～262,tanδ小于10–2,σ为1.0×10–11～10–12S·m–1。该烧结工艺可减少铋的挥发,降低氧空位浓度,因而减弱了陶瓷的高温低频耗散现象。随着保温时间的增加,高温电导得到有效抑制,在1050℃保温15h样品的σ降低了一个数量级,在280℃时为5.2×10–9S·m–1。     

sol-gel法制备Ba_(3.99)Sm_(9.34)Ti_(18)O_(54)微波介质陶瓷

以柠檬酸为络合剂,通过sol-gel法制备了Ba3.99Sm9.34Ti18O54陶瓷前驱体;经1100℃预烧2h压片成型后,再在1300℃保温3h,即得到了烧结致密的陶瓷样品。与传统固相法相比,其烧结温度降低了50℃,且陶瓷晶粒细小,晶粒分布均匀,具有更加优良的微波介电性能:εr=79.56,Q·f=9636GHz(4.71GHz),τf=–1.23×10–6/℃。     

MSTRIP (Parameters of Microstrip) (Computer Program Descriptions)

This program calculates the characteristic impedance, phase velocity, and effective dielectric constant of single or coupled microstrip lines. Parameters to be specified by the user are as follows: range of W/H/sub 1/, S/H/sub 1/, substrate dielectric constant, single or coupled lines with or without an upper ground plane.     

High-resolution transmission electron microscopy study of Ca(3)Co(4)O(9)

The crystal structure of Ca(3)Co(4)O(9) was investigated using high-resolution transmission electron microscopy (HRTEM) and the image-simulation method. The c(*) was 10.8A and the b parameters were 4.56A for the Ca(2)CoO(3) block and 2.82A for the CoO(2) sheet. The [110] zone axis HRTEM images confirmed that Ca(3)Co(4)O(9) has a modulated layered structure with modulation. For the first time, the atomic positions of the Ca and Co atoms in the Ca(2)CoO(3) block were identified, corresponding to three rows of dark spots in the [110] direction. The observed HRTEM images for Ca(2)CoO(3) agreed well with the calculated images based on the structural model obtained by the Rietveld refinement method.