Interfacial reactions and mechanical properties between Sn-4.0Ag-0.5Cu and Sn-4.0Ag-0.5Cu-0.05Ni-0.01Ge lead-free solders with the Au/Ni/Cu substrate

Sn-4.0Ag-0.5Cu (SAC) and Sn-4.0Ag-0.5Cu-0.05Ni-0.01Ge (SACNG) lead-free solders reacting with the Au/Ni/Cu multi-layer substrate were investigated in this study. All reaction couples were reflowed at 240 and 255 °C for a few minutes and then aged at 150 °C for 100-500 h. The (Cu, Ni, Au)₆Sn₅ phase was formed by reflowing for 3 min at the interface. If the reflowing time was increased to 10 min, both (Cu, Ni, Au)₆Sn₅ and (Ni, Cu, Au)₃Sn₄ phases formed at the interface. The AuSn₄ phase was found in the solder for all reaction couples. An addition of Ni and Ge to the solder does not significantly affect the IMC formation. After a long period of heat-treatment, the thickness of the (Cu, Ni, Au)₆Sn₅ and (Ni, Cu, Au)₃Sn₄ phases increased and the intermetallic compounds (IMCs) growth mechanism obeyed the parabolic law and the IMC growth mechanism was diffusion-controlled. The mechanical strengths for both the soldered joints decreased with increasing thermal aging time. The SACNG/Au/Ni/Cu couple had better mechanical strength than that in the SAC/Au/Ni/Cu couple.     

Interfacial Reactions and Bonding Strength of Sn-xAg-0.5Cu/Ni BGA Solder Joints

The present study details the microstructure evolution of the interfacial intermetallic compounds (IMCs) layer formed between the Sn-xAg-0.5Cu (x = 1, 3, and 4 wt.%) solder balls and electroless Ni-P layer, and their bond strength variation during aging. The interfacial IMCs layer in the as-reflowed specimens was only (Cu,Ni)₆Sn₅ for Sn-xAg-0.5Cu solders. The (Ni,Cu)₃Sn₄ IMCs layer formed when Sn-4Ag-0.5Cu and Sn-3Ag-0.5Cu solders were used as aging time increased. However, only (Cu,Ni)₆Sn₅ IMCs formed in Sn-1Ag-0.5Cu solders, when the aging time was extended beyond 1500 h. Two factors are expected to influence bond strength and fracture modes. One of the factors is that the interfacial (Ni,Cu)₃Sn₄ IMCs formed at the interface and the fact that fracture occurs along the interface. The other factor is Ag₃Sn IMCs coarsening in the solder matrix, and fracture reveals the ductility of the solder balls. The above analysis indicates that during aging, the formation of interfacial (Ni,Cu)₃Sn₄ IMCs layers strongly influences the pull strength and the fracture behavior of a solder joint. This fact demonstrates that interfacial layers are key to understanding the changes in bonding strength. Additionally, comparison of the bond strength with various Sn-Ag-Cu lead-free solders for various Ag contents show that the Sn-1Ag-0.5Cu solder joint is not sensitive to extended aging time.     

Intermetallic compound growth suppression at high temperature in SAC solders with Zn addition on Cu and Ni-P substrates

The effect of adding 0.5-1.5 wt.% Zn to Sn-3.8Ag-0.7Cu (SAC) solder alloy during reflow and solid state ageing has been investigated. In particular, the role of the Zn addition in suppressing interfacial Intermetallic Compound (IMC) growth on Cu and Ni-P substrates has been determined. Solder-substrate couples were aged at 150 °C and 185 °C for 1000 h. In the case of 0.5-1.0 wt.% Zn on Cu substrate, Cu₃Sn IMC was significantly suppressed and the morphology of Cu₆Sn₅ grains was changed, leading to suppressed Cu₆Sn₅ growth. In the SAC-1.5Zn/Cu substrate system a Cu₅Zn₈ IMC layer nucleated at the interface followed by massive spalling of the layer into the solder, forming a barrier layer limiting Cu₆Sn₅ growth. On Ni-P substrates the (Cu,Ni)₆Sn₅ IMC growth rate was suppressed, the lowest growth rate being found in the SAC-1.5Zn/Ni-P system. In all cases the added Zn segregated to the interfacial IMCs so that Cu₆Sn₅ became (Cu,Zn)₆Sn₅ and (Cu,Ni)₆Sn₅ became (Ni,Cu,Zn)₆Sn₅. The effect of Zn concentration on undercooling, wetting angles and IMC composition changes during ageing are also tabulated, and a method of incorporating Zn into the solder during reflow without compromising solder paste reflow described.     

Cu6Sn5和Ni3Sn4结构性能的第一原理计算

基于密度泛函理论的第一原理,计算了锡基无铅焊点界面常见的金属间化合物Cu6Sn5和Ni3Sn4的平衡晶格常数、合金形成焓以及弹性常数,分析了结构稳定的电子机制.结果表明,Cu6Sn5较Ni3Sn4合金形成能负,因此Cu6Sn5在热力学上更稳定,其合金化能力也较强.在力学性能方面,两相均属脆性相,表现出弹性各向异性,而Ni3Sn4的键合作用较强,弹性模量、剪切模量均大于Cu6Sn5,但Cu6Sn5表现出更好的塑性.从电子结构的角度,Cu6Sn5的成键主要来自于Cu原子d,p轨道与Sn原子p杂化,而Ni原子d轨道与Sn原子p轨道的强烈杂化作用是Ni3Sn4成键的主要原因.     

Suppressing effect of 0.5 wt.% nano-TiO2 addition into Sn-3.5Ag-0.5Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

This study investigated the effects of adding 0.5 wt.% nano-TiO₂ particles into Sn3.5Ag0.5Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 100, 125, 150, and 175 °C for up to 7 days. The results indicate that the morphology of the Cu₆Sn₅ phase transformed from scallop-type to layer-type in both SAC solder/Cu joints and Sn3.5Ag0.5Cu-0.5 wt.% TiO₂ (SAC) composite solder/Cu joints. In the SAC solder/Cu joints, a few coarse Ag₃Sn particles were embedded in the Cu₆Sn₅ surface and grew with prolonged aging time. However, in the SAC composite solder/Cu aging, a great number of nano-Ag₃Sn particles were absorbed in the Cu₆Sn₅ surface. The morphology of adsorption of nano-Ag₃Sn particles changed dramatically from adsorption-type to moss-type, and the size of the particles increased.The apparent activation energies for the growth of overall IMC layers were calculated as 42.48 kJ/mol for SAC solder and 60.31 kJ/mol for SAC composite solder. The reduced diffusion coefficient was confirmed for the SAC composite solder/Cu joints.     

Stabilisation of Cu6Sn5 by Ni in Sn-0.7Cu-0.05Ni lead-free solder alloys

Cu₆Sn₅ exists at least in two crystal structures with an allotropic transformation from monoclinic η'-Cu₆Sn₅ at temperatures lower than 186 °C to hexagonal η-Cu₆Sn₅. We recently discovered that the hexagonal structure of Cu₆Sn₅ in lead-free solder alloys with trace Ni additions is stable down to room temperature using high resolution TEM/ED/EDS. This report further confirm the phase stabilising effect of Ni by analysing samples of Cu₆Sn₅ extracted from a Sn-0.7wt%Cu-0.05wt%Ni lead-free solder alloy. Techniques used include X-ray diffraction, transmission electron microscopy and differential scanning calorimetry.     

Growth Behavior of Intermetallic Compounds at SnAgCu/Ni and Cu Interfaces

The growth behavior of reaction-formed intermetallic compounds (IMCs) at Sn3.5Ag0.5Cu/Ni and Cu interfaces under thermal-shear cycling conditions was investigated. The results show that the morphology of (Cu _x Ni_1–x )₆Sn₅ and Cu₆Sn₅ IMCs formed both at Sn3.5Ag0.5Cu/Ni and Cu interfaces gradually changed from scallop-like to chunk-like, and different IMC thicknesses developed with increasing thermal-shear cycling time. Furthermore, Cu₆Sn₅ IMC growth rate at the Sn3.5Ag0.5Cu/Cu interface was higher than that of (Cu _x Ni_1–x )₆Sn₅ IMC under thermal-shear cycling. Compared to isothermal aging, thermal-shear cycling led to only one Cu₆Sn₅ layer at the interface between SnAgCu solder and Cu substrate after 720 cycles. Moreover, Ag₃Sn IMC was dispersed uniformly in the solder after reflow. The planar Ag₃Sn formed near the interface changed remarkably and merged together to large platelets with increasing cycles. The mechanism of formation of Cu₆Sn₅, (Cu _x Ni_1–x )₆Sn₅ and Ag₃Sn IMCs during thermal-shear cycling process was investigated.     

Microstructure, kinetic analysis and hardness of Sn-Ag-Cu-1 wt% nano-ZrO2 composite solder on OSP-Cu pads

Nano-sized, nonreacting, noncoarsening ZrO₂ particle-reinforced Sn-Ag-Cu composite solders were prepared by mechanically dispersing ZrO₂ nano-particles into Sn-Ag-Cu solder and the interfacial morphology between the solder and organic solderability preservative (OSP)-Cu pads were characterized metallographically. At their interfaces, island-shaped Cu₆Sn₅ and Cu₃Sn intermetallic compound (IMC) layers were found in solder joints with and without the ZrO₂ particles and the IMC layer thickness was substantially increased with reaction time and temperature. In the solder ball region, needle-shaped Ag₃Sn and spherically-shaped Cu₆Sn₅ IMC particles were found to be uniformly distributed in the β-Sn matrix. However, after the addition of ZrO₂ nano-particles, Ag₃Sn and Cu₆Sn₅ IMC particles appeared with a fine microstructure and retarded the growth rate of the IMC layers at their interfaces. From a kinetic analysis, the calculated activation energies for the total (Cu₆Sn₅ + Cu₃Sn) IMC layers for Sn-Ag-Cu and Sn-Ag-Cu-1 wt% ZrO₂ composite solder joints on OSP-Cu pads were about 53.2 and 59.5 kJ/mol, respectively. In addition, solder joints containing ZrO₂ nano-particles displayed higher hardness due to the uniform distribution of ZrO₂ nano-particles as well as the refined IMC particles. The hardness values of the plain Sn-Ag-Cu solder joint and solder joints containing 1 wt% of ZrO₂ nano-particles after 5 min reaction at 250 °C were about 15.0 Hv and 17.1 Hv, respectively. On the other hand, their hardness values after 30 min reaction were about 13.7 Hv and 15.5 Hv, respectively.     

Effects of Pd concentration on the interfacial reaction and mechanical reliability of the Sn-Pd/Ni system

The liquid-solid reaction between Sn-xPd alloy and Ni (x = 0.05-1 wt.%) and the resulting mechanical reliability of the system were examined in this study. The reactions strongly depended on the Pd concentration and the reaction time. When the Pd concentration was low (i.e., x = 0.05 wt.%), the reaction product was only Ni₃Sn₄. In contrast, when the Pd concentration was high (i.e., x ≥ 0.2 wt.%), the reaction product became a dual-layer structure of (Pd,Ni)Sn₄-Ni₃Sn₄. Between 0.05 wt.% and 0.2 wt.% (e.g., x = 0.1 wt.%), discontinuous (Pd,Ni)Sn₄ grains scattered over the Ni₃Sn₄ layer developed. Interestingly, the (Pd,Ni)Sn₄ grains were gradually dispersed in the molten Sn-Pd alloy, leaving the Ni₃Sn₄ at the interface, as the reaction time increased. These Pd-dependent reactions were dictated by thermodynamics and can be rationalized using the Pd-Ni-Sn isotherm. Furthermore, the results of the high-speed-ball-shear (HSBS) test indicated that the mechanical strength of the Sn-Pd/Ni joints dramatically degraded by over one third due to the formation of (Pd,Ni)Sn₄ at the interface. The implication is that the Pd concentration in Sn-Pd solder joints should be reduced to a level below 0.2 wt.% to prevent the creation of an undesired microstructure.     

Effect of rare earth metal Ce addition to Sn-Ag solder on interfacial reactions with Cu substrate

The effect of adding a small amount of rare earth cerium (Ce) element to low Ag containing Sn-1wt%Ag Pb-free solder on its interfacial reactions with Cu substrate was investigated. The growth of intermetallic compounds (IMCs) between three Sn-1Ag-xCe solders with different Ce contents and a Cu substrate was studied and the results were compared to those obtained for the Ce-free Sn-1Ag/Cu systems. In the solid-state reactions of the Sn-1Ag(-xCe)/Cu solder joints, the two IMC layers, Cu₆Sn₅ and Cu₃Sn, grew as aging time increased. Compared to the Sn-1Ag/Cu joint, the growth of the Cu₆Sn₅ and Cu₃Sn layers was depressed for the Ce-containing Sn-1Ag-xCe/Cu joint. The addition of Ce to the Sn-Ag solder reduced the growth of the interfacial Cu-Sn IMCs and prevented the IMCs from spalling from the interface. The evenly-distributed Ce elements in the solder region blocked the diffusion of Sn atoms to the interface and retarded the growth of the interfacial IMC layer.     

Interstitial solid solution Hf5GaxSn3 (x = 0-1)

Formation of an interstitial solid solution Hf₅Ga_xSn₃ (x = 0-1) based on the binary compound Hf₅Sn₃ (structure type Mn₅Si₃, Pearson symbol hP16, space group P6₃/mcm, a = 8.36562(6), c = 5.70775(4) Å from X-ray powder diffraction) was established at 600 °C. The crystal structure (structure type Hf₅CuSn₃, ordered derivative of Ti₅Ga₄, hP18, P6₃/mcm) was refined on X-ray single-crystal diffraction data for three compositions: Hf₅Ga_0.16(3)Sn₃ (a = 8.3288(12), c = 5.6988(11) Å), Hf₅Ga_0.53(2)Sn₃ (a = 8.4205(12), c = 5.7655(12) Å) and Hf₅GaSn₃ (a = 8.5564(12), c = 5.7859(12) Å). The Ga atoms occupy Wyckoff position 2b at the centres of Hf₆ octahedral interstices.     

Improving the shear strength of Sn–Ag–Cu–Ni/Cu–Zn solder joints via modifying the microstructure and phase stability of Cu–Sn intermetallic compounds

This study focuses on the correlation between high-speed impact tests and the interfacial reaction in Sn-3.0Ag-0.5Cu-0.1Ni/Cu (wt%) and Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints. Adding Ni into the Sn–Ag–Cu solder alters the interfacial morphology from scallop type to layer type and exhibits high shear strength after reflow in both solder joints. However, the shear strength of Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints degrades significantly after thermal aging at 150 °C for 500 h. It is notable that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints still present higher shear strength after aging at 150 °C. The weakened shear strength in Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints is due to stress accumulation in the interfacial (Cu,Ni)₆Sn₅ compound induced by the phase transformation from a high-temperature hexagonal structure (η-Cu₆Sn₅) to a low-temperature monoclinic structure (η'-Cu₆Sn₅). However, doping small amounts of Zn into (Cu,Ni)₆(Sn,Zn)₅ can inhibit the phase transformation during thermal aging and maintain strong shear strength. These experiments demonstrate that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints can act as a stable connection in the micro-electronic packaging of most electronic products at their average working temperatures.     

Ni segregation in the interfacial (Cu,Ni)6Sn5 intermetallic layer of Sn-0.7Cu-0.05Ni/Cu ball grid array (BGA) joints

Ni segregation in the interfacial (Cu,Ni)₆Sn₅ intermetallic layer of Sn-0.7Cu-0.05Ni/Cu BGA solder joints was investigated by using synchrotron micro X-ray fluorescence (XRF) analysis and synchrotron X-ray diffraction (XRD). Compared to Sn-0.7Cu/Cu BGA joints, Ni containing solder show suppressed Cu₃Sn growth in both reflow and annealed conditions. In as-reflowed Sn-0.7Cu-0.05Ni/Cu BGA joints, Ni was relatively homogenously distributed within interfacial (Cu,Ni)₆Sn₅. During subsequent annealing, the diffusion of Ni in Cu₆Sn₅ was limited and it remained concentrated adjacent the Cu substrate where it contributes to the suppression of Cu₃Sn formation at the interface between the Cu substrate and Cu₆Sn₅ intermetallics.     

Microstructural evolution of intermetallic compounds in Sn–3.5Ag–X (X = 0, 0.75Ni, 1.0Zn and 1.5In)/Cu solder joints during liquid aging

In this paper, the microstructural evolution of IMCs in Sn–3.5Ag–X (X = 0, 0.75Ni, 1.0Zn, 1.5In)/Cu solder joints and their growth mechanisms during liquid aging were investigated by microstructural observations and phase analysis. The results show that two-phase (Ni₃Sn₄ and Cu₆Sn) IMC layers formed in Sn–3.5Ag–0.75Ni/Cu solder joints during their initial liquid aging stage (in the first 8 min). While after a long period of liquid aging, due to the phase transformation of the IMC layer (from Ni₃Sn₄ and Cu₆Sn phases to a (Cu, Ni)₆Sn₅ phase), the rate of growth of the IMC layer in Sn–3.5Ag–0.75Ni/Cu solder joints decreased. The two Cu₆Sn₅ and Cu₅Zn₈ phases formed in Sn–3.5Ag–1.0Zn/Cu solder joints during the initial liquid aging stage and the rate of growth of the IMC layers is close to that of the IMC layer in Sn–3.5Ag/Cu solder joints. However, the phase transformation of the two phases into a Cu–Zn–Sn phase speeded up the growth of the IMC layer. The addition of In to Sn–3.5Ag solder alloy resulted in Cu₆(Sn_x,In_1?x)₅ phase which speeded up the growth of the IMC layer in Sn–3.5Ag–1.5In/Cu solder joint.     

Sn Mössbauer spectroscopy study of the magnetic properties of the HfFe6Ge6-type compounds: SmMn6Sn4Ge2 and GdMn6Sn4Ge2

The HfFe₆Ge₆-type compound SmMn₆Sn₄Ge₂ has been studied by single-crystal magnetisation and ¹¹⁹Sn Mössbauer spectroscopy. The compound orders ferromagnetically at T_c = 420 K and displays an easy-axis anisotropy from T_c to T_SR = 130 K. Below T_SR, both magnetisation and ¹¹⁹Sn Mössbauer spectroscopy measurements indicate a deviation from the [0 0 1] direction and the presence of easy-cone anisotropy. The angle of the moments with respect to the [0 0 1] direction is estimated to 26-31° from Mössbauer spectroscopy results, in good accordance with the magnetisation results. The isotypic compounds GdMn₆Sn₄Ge₂ and GdMn₆Sn₆ studied by ¹¹⁹Sn Mössbauer spectroscopy display easy plane anisotropy in the whole temperature range 300-4.2 K. The anisotropy behaviours of the LMn₆Sn₄Ge₂ compounds are discussed and the coexistence of easy cone anisotropy for both the SmMn₆Sn₄Ge₂ and HoMn₆Sn₄Ge₂ suggests the play of a positive second-order anisotropy constant of the Mn sublattice.     

BGA焊点界面化合物纳米压痕力学行为

利用纳米压痕法对BGA焊点(Cu,Ni)₆Sn₅,Cu₆Sn₅,Cu₃Sn界面化合物(IMC)进行了压痕试验.基于Oliver-Pharr法确定了(Cu,Ni)₆Sn₅,Cu₆Sn₅,Cu₃Sn的弹性模量和压痕硬度,研究了加载速率对IMC纳米压痕力学行为的影响及其变化规律.结果表明,锯齿流变效应与加载速率的大小是相关的.在加载速率较小的情况下(Cu,Ni)₆Sn₅,Cu₆Sn₅,Cu₃Sn都具有锯齿流变效应,但程度不同;在加载速率较大的情况下(Cu,Ni)₆Sn₅,Cu₃Sn锯齿流变效应不明显,而Cu₆Sn₅的锯齿流变效应相对明显.(Cu,Ni)₆Sn₅,Cu₆Sn₅,Cu₃Sn界面IMC的弹性模量分别为126,118,135 GPa;压痕硬度分别为6.5,6.3,5.8 GPa;含镍的(Cu,Ni)₆Sn₅化合物弹性模量和压痕硬度均比Cu₆Sn₅的值要高.     

Low temperature processing of (Zr0.8Sn0.2)TiO4 ceramics with improved Q factor

Polycrystalline (Zr_0.8Sn_0.2)TiO₄ (ZST) ceramics have been synthesized by solid-sate reaction method. The effect of B₂O₃, ZnO-B₂O₃ or 5ZnO-2B₂O₃ glass addition (0.2-1.0 wt.%) on microwave dielectric properties of ZST ceramics are investigated. The increase in average grain size via growth of large grains and dissolution of small grains is explained by Ostwald ripening phenomena. The highest Q × f_o values are found to be 61,500, 48,500 and 51,900 GHz for the ZST dielectric resonators added with B₂O₃, ZnO-B₂O₃ and 5ZnO-2B₂O₃ respectively. The effect of liquid phase sintering on microstructure and microwave dielectric properties of ZST ceramics is discussed.     

TiO_2纳米颗粒掺杂对Sn-3.0Ag-0.5Cu-xTiO_2焊点界面Cu_6Sn_5 IMC晶粒生长的影响机理

研究了Ti O2纳米颗粒掺杂影响回流焊过程中Sn-3.0Ag-0.5Cu-x Ti O2焊点界面Cu6Sn5金属间化合物(intermetallic compound,IMC)晶粒生长机理.基于Cu原子扩散通量驱动晶粒成熟生长(flux driven ripening,FDR)理论模型分析了Cu6Sn5IMC晶粒生长机理.结果表明,Ti O2纳米颗粒掺杂改变了焊点界面Cu6Sn5IMC晶粒形貌和尺寸.含Ti O2纳米颗粒的焊点Cu6Sn5IMC晶粒尺寸要小于不含Ti O2纳米颗粒的焊点,且晶粒分布要更加均匀.试验数据与FDR理论模型基本吻合.Cu6Sn5IMC晶粒生长指数分别为0.346,0.338,0.332和0.342,这说明Cu6Sn5IMC晶粒生长是由原子互扩散和晶粒成熟共同控制.     

Cu基板退火处理的Cu/Sn58Bi/Cu钎焊接头界面微结构

研究了铜基板退火处理对Cu/Sn58Bi界面微结构的影响. 结果表明,在回流以及时效24 h后Cu/Sn58Bi/Cu界面只观察到Cu₆Sn₅. 随着时效时间的增加,在界面形成了Cu₆Sn₅和Cu₃Sn的双金属间化合物(IMC)层,并且IMC层厚度也随之增加. 长时间时效过程中,在未退火处理的铜基板界面产生了较多铋偏析,而在退火处理的铜基板界面较少产生铋偏析. 比较退火处理以及未退火处理的铜基板与钎料界面IMC层生长速率常数,发现铜基板退火处理能减缓IMC层生长,主要归因于对铜基板进行退火处理能够有效的消除铜基板的内应力与组织缺陷,从而减缓Cu原子的扩散,起到减缓IMC生长的作用.