无线控制式原子力显微镜系统

提出了一种基于嵌入式系统和WiFi无线控制的接触模式原子力显微镜(AFM)系统。该AFM系统直接由迷你型移动电源给扫描与反馈电路及嵌入式系统等供电;嵌入式系统由微型电脑树莓派和微小型ADDA模块构成,通过WiFi与笔记本电脑实现无线数据通信。利用这一方法,成功研发了无线控制式AFM系统,并开展了微纳米样品的扫描成像实验。实验结果表明,该AFM系统的横向分辨率达到纳米量级,纵向分辨率达到0.1nm,最大扫描范围为3.6μm×3.6μm。该系统的显著特点是无需交流市电供电,无需直流高压电源,也无需与计算机之间的线缆连接,可在约100m远处通过无线控制的方式实现AFM的扫描成像。这一新型AFM系统,不仅能够在微纳米技术的常规领域得到应用,而且在野外考察、隔离环境、真空条件、气体氛围环境及星际探测等特殊领域具有广阔的应用前景。     

基于微流控驻停气泡的连续型气-液微反应器

快速高效的气-液反应对生物物理学、化学和医学领域的发展具有十分重要的意义。微流控系统以其高传热传质效率和低物质消耗等优点为气-液反应提供了一个新的平台。介绍一种基于微流控驻停气泡的新型气-液微反应器系统,该系统利用微流道中的气泡和流动液体反应物之间稳定可控的气-液体界面来加速传质。微流控驻停气泡通过流体通道壁上特殊设计的裂隙结构生成,这使驻停气泡易于阵列。驻停气泡的大小和形貌通过改变气体质量传递来控制和调节,进而实现对气-液界面物质交换的有效控制。提出的微反应器为纳米晶体合成、先进生物材料制备等应用提供可控且稳定的气-液界面。     

多模态动态原子力显微镜系统

动态原子力显微镜(atomic force microscope,AFM)是通过检测悬臂谐振状态的变化来对物体表面形貌进行测量的。通过对谐振状态的三种因素即振幅、相位、频率的检测,动态AFM可以分为三种工作模式,即振幅反馈、相位反馈与频率反馈模式,这三种反馈模式有着不同的扫描特点。基于硅悬臂具有高阶谐振的特性,动态原子力显微镜可以在悬臂工作于高阶谐振状态时对物体进行扫描。综合上述工作模式研制了一套多模态动态AFM,可以在三种反馈模式、不同阶谐振状态下对物体进行扫描测量。利用该系统在不同反馈模式、不同阶谐振状态下进行了扫描测试,结果显示,系统在各模式下具有亚纳米分辨力,其中在相位反馈模式,悬臂二阶谐振时可达到最优灵敏度与分辨力,分别为17.5V/μm和0.29nm,在最优灵敏度与分辨力状态下对光栅试样进行了三维扫描,得到光栅的三维形貌图。     

亚纳米精度长度溯源计量型动态模式原子力显微镜

通过与长度溯源三轴激光干涉仪测量系统结合,设计开发计量型动态模式原子力显微镜(AFM).此AFM系统中,三轴激光干涉仪系统用于实时测量AFM测头与试样的相对位移.激光干涉仪系统的x,y,z测量轴正交于AFM探针顶端附近的一点,基本可以避免系统的阿贝误差,使AFM具有极高的测量精度.除此之外,扫描过程中三轴激光干涉仪系统还用于工作台x,y方向位移的反馈控制,完全克服AFM中压电器件的缺陷对水平尺寸测量的影响.分析表明,在对纳米标准栅的平均栅距测量中,AFM系统达到亚纳米的测量精度.     

原子力与扫描隧道组合显微镜

由大连理工大学物理系研制的原子力与扫描隧道组合显微镜 ( AF/ PSTM) ,9月 2 3日通过了国家教育部组织的鉴定。鉴定委员会对该成果给予了高度评价。该仪器是同时具有纳米分辨原子力显微镜和纳米分辨光学显微镜双重功能图像分解的纳米成像仪器。仪器技术原理是在 AF/ PSTM中设置一个双功能共振光纤尖 ,当光纤尖在样品表面近场扫描时 ,反馈控制等振幅扫描成像 ,一次扫描中 ,同时采集样品的原子力显微镜 AFM图像和光子扫描隧道显微镜PSTM图像。该仪器在分子生物学、医药学、新材料学、集成光学、纳米科技等领域均很有用 ,高校将来甚至…     

工艺螺杆压缩机中气液分离系统的设计和应用

论述了工艺螺杆压缩机中气液分离器的设计及其控制系统,其主要起着将气液混合气中的气体和液体分开,使干气体进入工艺气管网,使分出的液体循环喷入压缩机,引入自动化控制系统后使得该系统更能确保螺杆压缩机运行的安全、可靠和经济实用.     

基于平板扫描器的新型AFM系统

研制了一种基于平板扫描器的新型原子力显微镜(AFM)系统。该系统创新地把二维平板扫描器和一维反馈控制器相结合,有效地克服了传统扫描器Z向反馈控制与XY扫描平面之间的非线性交叉耦合误差,同时保证了大范围扫描时检测光路的稳定性。利用该系统与传统AFM作了氧化铝薄膜和光栅对比扫描实验,结果表明这种AFM系统能够获得无扭曲、规则的理想图像。     

基于 LSTM 的矩形纳米光栅 AFM 图像复原方法

原子力显微镜(AFM)利用探针与待测物之间的交互作用力进行成像,通过获取矩形纳米光栅计量标准器具的高分辨率成像得到相关的几何量参数并进行标定,实现从标准计量器具到工作计量器具的量值传递。在AFM扫描过程中,由于针尖的影响作用,使得扫描所获图像是探针和样品共同作用的结果,而不是样品形貌的真实描述。针对这一现象,本文提出了一种基于长短期记忆网络(LSTM)的AFM图像复原方法,该方法对通过膨胀法获得的仿真图像各扫描行进行训练,进而获得适用于矩形纳米光栅AFM图像复原模型。实验结果表明,针对线宽20 nm,高40 nm的矩形纳米光栅,经过该方法复原后光栅线宽的相对误差为7.40%,相较于传统的复原方法进一步提高了测量准确度。     

一种高精度多功能双用原子力显微镜技术及应用

主要研究了一种基于高精度IPC-205B型扫描隧道显微镜(STM)的新型高精度多功能双用原子力显微镜(AFM)技术及其应用.阐述该原子力显微镜的工作原理、组成及应用,详细介绍了该AFM镜体的独特结构和新型微悬臂的制作及其检测方法.该AFM采用简单适用的新型微悬臂.并利用STM检测微悬臂的起伏,通过四维机械驱动和双压电陶瓷扫描,有效提高了扫描精度,扩大了扫描范围.该机型集AFM和STM功能为一体,其中STM可以单独使用.该机型检测精度可达:横向0.1 nm,纵向0.01 nm.并用该样机进行了样品表面形貌和隧道谱的实验研究.     

气液联控位置伺服系统模糊并联控制

气液联控系统是在常规气压伺服系统中,引入液体介质而构成的一种新型气液复合介质控制系统-气液联控(PHCC)系统。该文采用了模糊控制方法对气液联控串联式位置伺服系统进行气、液并联控制,对系统跟踪阶跃、正弦和斜坡等典型输入信号的响应进行了试验。试验结果表明,该并联模糊控制器具有较好的控制效果。     

Friction and wear effects on a micro/nano‐scale

In this paper are described tribological effects which can be found in micro‐tribological systems, and in those macro‐systems which can be analysed by micro‐methods, e.g., by atomic force microscopy (AFM) or related methods. Micro‐tribology systems have friction contacts with loads in the micro/nano‐newton range and/or dimensions in the micro/nanometre range. Experiments on the micro/nano‐scale should be easier to explain by theoretical modelling due to their simpler system structure. An example is discussed of adhesion and friction measurements between AFM tips and clean, flat, solid surfaces in ultra‐high vacuum, which shows some of the special aspects of micro/nano‐tribology. Surprising friction characteristics on surfaces with an artificial micro‐structure can be explained by skilled and careful topographical analysis of the friction path with an AFM. In micro‐sensor contacts, ‘single wear events’ can be detected using AFM analysis of the contact region. For ceramic compounds, different friction levels for the components of the material can be found. The problems, difficulties, and dangers of misinterpretation are also discussed.     

A large-sample atomic force microscope observing in both air and liquid

A large-sample atomic force microscope (AFM) that allows high resolution observation in both air and liquid has been developed. With a unique beam tracking method, laser beam is capable of reflecting off the same spot on the AFM cantilever throughout raster scan over the entire scan area, either operating in air or in liquid environment. Incorporating the stand-alone AFM probe unit with an automated large sample stage, wide-scan-range imaging can be realized with high resolution and slight distortion. In addition, an image stitching method is utilized to build a broad merged image with range up to millimeters while keeping nanometer order resolution. By using a large-volume liquid bath, large and massive sample can be observed in liquid with this AFM system. Several typical experiments have been carried out to demonstrate the imaging ability and stability of this AFM. Topographic structures of gold pattern on a glass substrate are scanned at two different places on the same specimen surface. The porosity of a sheet of filter paper is then characterized in both air and water. Finally, larger-area AFM image of anodic aluminum oxide template in oxalic acid is on spot obtained by merging several individually scanned images together. Experiments show that this AFM system can offer high resolution and wide range AFM images even for large samples with remarkable capabilities in various environments.     

Visualization of cytoskeletal elements by the atomic force microscope

We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane, soluble proteins, and organelles from the cell. The remaining cytoskeleton can then be directly visualized in either liquid or air-dried ambient conditions. These two types of scanning provide complimentary information. Scanning in liquid visualizes the surface filaments of the cytoskeleton, whereas scanning in air shows both the surface filaments and the total "volume" of the cytoskeletal fibers. The smallest fibers observed were ca. 50 nm in diameter. The lateral resolution of this technique was ca.20 nm, which can be increased to a single nanometer level by choosing sharper AFM tips. Because the AFM is a true 3D technique, we are able to quantify the observed cytoskeleton by its density and volume. The types of fibers can be identified by their size, similar to electron microscopy.     

Finite-element vibration analysis of tapping-mode atomic force microscopy in liquid

Investigation of morphology and mechanical properties of biological specimens using atomic force microscopy (AFM) often requires its operation in liquid environment. Due to the hydrodynamic force, the vibration of AFM cantilevers in liquid shows dramatically different dynamic characteristics from that in air. A good understanding of the dynamics of AFM cantilevers vibrating in liquid is needed for the interpretation of scanning images, selection of AFM operating conditions, and evaluation of sample's mechanical properties. In this study, a finite element (FE) model is used for frequency and transient response analysis of AFM cantilevers in tapping mode (TM) operated in air or liquid. Hydrodynamic force exerted by the fluid on AFM cantilevers is approximated by additional mass and hydrodynamic damping. The additional mass and hydrodynamic damping matrices corresponding to beam elements are derived. With this model, numerical simulations are performed for an AFM cantilever to obtain the frequency and transient responses of the cantilever in air and liquid. The comparison between our simulated results and the experimentally obtained ones shows good agreement. Based on the simulations, different characteristics of cantilever dynamics in air and liquid are discussed.     

Fast contact-mode atomic force microscopy on biological specimen by model-based control

The dynamic behavior of the piezoelectric tube scanner limits the imaging rate in atomic force microscopy (AFM). In order to compensate for the lateral dynamics of the scanning piezo a model based open-loop controller is implemented into a commercial AFM system. Additionally, our new control strategy employing a model-based two-degrees-of-freedom controller improves the performance in the vertical direction, which is important for high-speed topographical imaging. The combination of both controllers in lateral and vertical direction compensates the three-dimensional dynamics of the AFM system and reduces artifacts that are induced by the systems dynamic behavior at high scan rates. We demonstrate this improvement by comparing the performance of the model-based controlled AFM to the uncompensated and standard PI-controlled system when imaging pUC 18 plasmid DNA in air as well as in a liquid environment.     

Improved parallel scan method for nanofriction force measurement with atomic force microscopy

Based on Ruan and Bhushan's study [J. Ruan and B. Bhushan, J. Tribol. 116, 378 (1994)], an improved method for quantitative nano/microfriction force measurements with the atomic force microscope (AFM) is presented. The related theoretical derivation is given in detail. The coefficient of friction can be calculated by scanning in the direction parallel to the long axis of the AFM cantilever. Then conversion factor, which can convert the lateral deflection response of the photodetector into corresponding friction force, is identified with the Meyer and Amer method [G. Meyer and N. M. Ame, Appl. Phys. Lett. 57, 2089 (1990)]. Like Ruan and Bhushan method, the advantage of this approach is that the coefficient of friction can be obtained with the plan-view geometry of AFM cantilevers and some common uncertainties, such as thickness, coating, and material properties, are not necessary. The result of the experiments performed utilizing rectangular cantilevers of different lengths shows that this improved method produces an accurate agreement for cantilevers of different lengths, thus the method can be used to measure nano/microfriction force.     

Surface forces, surface chemistry and tribology

Scanning probe methods have been applied to the investigation of tribological phenomena on the nanometre and nanonewton scale. The systems studied have included parallel investigation of identical tribosystems on the macro and nano scales, where the inherent differences in the AFM/LFM and flat-on-disk experiments have been compared; oxide-covered surfaces in contact under electrolytes, where the adhesion hysteresis and frictional behaviour was shown to be strongly dependent on the solution pH; and polymer surfaces, where advantage can be taken of variations in the interactions between the scanning tip and different polymers, to perform chemically sensitive, high-resolution surface imaging of polymer blends.     

Error analysis and regression mode of the V‐grooved sample in the atomic force microscope simulation measurement mode by the molecular mechanics

Based on the molecular mechanics, this study uses the two‐body potential energy function to construct a trapezoidal cantilever nano‐scale simulation measurement model of contact mode atomic force microscopy (AFM) under the constant force mode to simulate the measurement the nano‐scale V‐grooved standard sample. We investigate the error of offset distance of the cross‐section profile when using the probes with different trapezoidal cantilever probe tip radii (9.5, 8.5, and 7.5 Å) to scan the peak of the V‐grooved standard sample being reduced to one‐tenth (1/10) of its size, and use the offset error to inversely find out the regression equation. We analyze how the tip apex as well as the profile of the tip edge oblique angle and the oblique edge angle affects the offset distance. Furthermore, a probe with a larger radius of 9.5 nm is used to simulate and measure the offset error of scan curve, and acquire the regression equation. By the conversion proportion coefficient of size (ω), and revising the size‐reduced regression equation during the small size scale, a revised regression equation of a larger size scale can be acquired. The error is then reduced, further enhancing the accuracy of the AFM scanning and measurement. SCANNING 31: 147–159, 2009. © 2009 Wiley Periodicals, Inc.     

Nano/microtribology Stick-Slip Number Under an Atomic Force Microscope and Its Characteristics

The atomic force microscope (AFM) has become a main instrument in observing nano/microtribological characteristics of sample surfaces. In this paper, we investigated the micro-scale adhesive contact between the AFM tip and the sample surface based on the Maugis–Dugdale contact model, and analyzed the energy conversion and dissipation process during the AFM scanning process. A dimensionless stick-slip number = 8U₁h²/(kR_s ²) was defined, which can serve as a characteristic index for the appearance of nano/microtribology stick-slip behavior. If the stick-slip number is less than one, i.e., <1, the AFM tip slides on the sample surface and no stick-slip behavior occurs in the AFM lateral force signal. When the stick-slip number equals one, i.e., = 1, the tip jumps on the sample surface and the AFM lateral force signal begins to exhibit a stick-slip behavior but without energy dissipation. Only in the case of >1 does the stick-slip behavior appear in the AFM lateral force signal accompanied by an obvious energy dissipation. The defined stick-slip number demonstrates that the nano/microtribological stick-slip behavior is due to the adhesive hysteresis as well as the instability motion of the AFM tip during the scanning process. Finally, the influence on nano/microtribology stick-slip behavior of sample surface energy, surface topography, scanning velocity, spring constant of AFM cantilever probe, etc. are investigated theoretically and experimentally. Various experimental results of nano/microtribology stick-slip behavior under AFM are successfully interpreted according to the stick-slip number.     

AFM characterization of biomolecules in physiological environment by an advanced nanofabricated probe

Many relevant questions in biology and medicine require both topography and chemical information with high spatial resolution. Several biological events that occur at the nanometer scale level need to be investigated in physiological conditions. In this regard Atomic Force Microscopy (AFM) is one of the most powerful tools for label‐free nanoscale characterization of biological samples in liquid environment. Recently, the coupling of Raman spectroscopy to scanning probe microscopies has opened new perspectives on this subject; however, the coupling of quality AFM spectroscopy with Raman spectroscopy in the same probe is not trivial. In this work we report about the AFM capabilities of an advanced high‐resolution probe that has been previously nanofabricated by our group for coupling with Raman spectroscopy applications. We investigate its use for liquid AFM measurements on biological model samples like lipid bilayers, amyloid fibrils, and titin proteins. We demonstrate topography resolution down to nanometer level, force measurement and stable imaging capability. We also discuss about its potential as nanoscale chemical probe in liquid phase. Microsc. Res. Tech., 2012. © 2012 Wiley Periodicals, Inc.