共查询到20条相似文献,搜索用时 114 毫秒
1.
在Hi-Fi功放或AV功放中,虽然大型铝电解电容器占据了机内的很大一部分空间,但因其容量/体积比很高,在诸如电源滤波、储能等方面却是必不可少的。这里我们介绍发烧级铝电解电容器的结构特点与几款世界著名的发烧级铝电解电容器产品。 相似文献
2.
介绍电容的物理意义及电容器的构造,分类,特性参数,电气功能,综述液态铝电解电容器的结构性能特点及其面临的机遇和挑战,回顾铝电解电容器的发展历程,并展望其发展趋势。小型片式化的固态铝电解电容器具有优异的电气特性,必将是未来产品和应用的主角。 相似文献
3.
介绍电容的物理意义及电容器的构造,分类,特性参数,电气功能;综述液态铝电解电容器的结构性能特点及其面临的机遇和挑战,回顾铝电解电容器的发展历程,并展望其发展趋势,小型片式化的固态铝电解电容器具有优异的电气特性,必将是未来产品和应用的主角。 相似文献
4.
开关电源用铝电解电容器的失效机理探讨 总被引:2,自引:0,他引:2
研究彩色电视机早返机开关电源用铝电解电容器失效现象及其失效机理,并针对开关电源如何选用铝电解电容器,提出了增加电容器CV积、增强耐纹波能力等建议措施,以减少铝电解电容器在产品中的早期失效。 相似文献
5.
苏波 《电子产品可靠性与环境试验》2009,27(5):53-55
介绍了一种直卧两用的铝电解电容器,其特征是焊片盖板结构,轴向双向引出,容易散热,能够承受较大的电流冲击,稳定性好,可以提高铝电解电容器产品的可靠性。 相似文献
6.
电容量衰减现象在铝电解电容器生产过程中普遍存在,只是原因各不相同。电容量衰减易造成产品电容量分布不均匀、电容量合格率低,严重时会造成产品接触不良,导致无电容量,产品失效率上升,给铝电解电容器产品的质量稳定性带来很大的影响。通过分析形成电容量衰减的各种原因,找到相应解决的措施,使铝电解电容器生产过程中质量稳定,原材料用量减少,成本下降,增强产品的市场竞争能力。 相似文献
7.
8.
为研制适用于程控交换机等通信设备的大型铝电解电容器CD272X型100V-27000μF,外形尺寸为φ65mm×120mm产品,分析了影响铝电解电容器损耗角正切的各因素。通过研制工作电解液、改进产品结构和选择合适的电解纸,降低了产品的损耗角正切值,提高了该产品的电性能。 相似文献
9.
10.
11.
《Telematics and Informatics》2005,22(3):221-238
Ambient Intelligence is a vision of the future information society stemming from the convergence of ubiquitous computing, ubiquitous communication and intelligent user-friendly interfaces. It offers an opportunity to realise an old dream, i.e. the smart or intelligent home. Will it fulfil the promises or is it just an illusion—offering apparently easy living while actually increasing the complexity of life? This article touches upon this question by discussing the technologies, applications and social implications of ambient intelligence in the home environment. It explores how Ambient Intelligence may change our way of life. It concludes that there are great opportunities for Ambient Intelligence to support social developments and modern lifestyles. However, in order to gain wide acceptance a delicate balance is needed: the technology should enhance the quality of life but not be seeking domination. It should be reliable and controllable but nevertheless adaptive to human habits and changing contexts. 相似文献
12.
A Study of Accelerated Storage Test Conditions Applicable to Semiconductor Devices and Microcircuits
This preliminary theoretical study on the application of accelerated stress testing for determining storage life of semiconductor devices and microcircuits has resulted in the following conclusions: There are more environmental stresses that can be applied to the accelerated testing of plastic encapsulated microcircuits, than hermetic devices. For hermetic devices, the assurance of initial hermeticity and wire bond integrity should insure long storage-dormancy life. Since only limited storage-dormancy data are available, accelerated testing and verification with use conditions data are necessary to support the conclusion of this study. 相似文献
13.
基于LED照明灯具的散热片设计与分析 总被引:3,自引:1,他引:2
新一代大功率白光LED光源具有很多优点,如节能、环保、寿命长等,但大功率LED的散热也是一个至关重要的问题。如果LED散热问题解决不好,LED灯具工作一段时间后就会输出光功率减小,芯片加速老化,工作寿命缩短。文章从LED散热问题着手,详细介绍了目前广泛商用的大功率LED器件结构及导热途径、所用散热基片的特点,以及LED所用的散热片设计和计算方法。另外介绍了一种大功率LED在散热片上不同位置温度变化的测试结果,并推导出用于计算LED器件散热的有效公式。 相似文献
14.
近些年来,短波通信在电力应急通信方面发展的如火如荼,为人民的正常生活提供了必要条件。电力应急方式的选择要适应当地的客观实际条件,同时也要适应当地科学技术的世纪发展水平。日常的生活中,无线电波测传播与应用随处可见,无线电广播、手机通话、信号呼救等问题都普遍应用了短波通信技术。本论文首先简述了有关短波通信的原理和内涵,同时介绍了几种常见的短波通信在电力应急通信中的应急探索方案,希望能推动电力应急通信中短波通信的应用与完善。 相似文献
15.
System improvement and deterioration are defined in terms of partial orderings between life distributions. The effects of ageing of `the distribution of time to first failure' on improvement and deterioration of a repairable system subject to minimal repairs, are investigated. Under various types of life distributions we derive explicitly the times at which the system should be condemned (replaced by a new one) to minimize the total cost of maintenance and replacement in terms of parameters of the distribution and of the cost function 相似文献
16.
Neftali Nuez Manuel Vazquez Vincenzo Orlando Pilar Espinet‐Gonzlez Carlos Algora 《Progress in Photovoltaics: Research and Applications》2015,23(12):1857-1866
An adequate qualification of concentrator photovoltaic solar cells and cell‐on‐carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi‐quantitative temperature‐accelerated life test to qualify solar cells and cell‐on‐carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi‐quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper. Copyright © 2015 John Wiley & Sons, Ltd. 相似文献
17.
激光冲击强化可以降低小孔构件裂纹扩展速率,提高疲劳寿命。疲劳扩展是疲劳寿命的主要组成部分,不同的应力水平会影响疲劳扩展,其对未强化试样和强化试样的影响是不同的。为此通过激光冲击强化TC4-DT钛合金双联小孔试样,然后进行疲劳试验,研究应力水平下的激光冲击小孔构件疲劳扩展。研究结果表明:应力水平提高会导致疲劳条带宽度增大,同时强化端同比增大尺寸大于未强化端,未强化端(I0)和强化端疲劳条带宽度(I1)差值(I0-I1)与未冲击端疲劳条带宽度(I0)的比值也有降低的趋势。因此,增大应力水平会增大疲劳条带宽度,应力水平的变化对激光冲击强化后试样的疲劳扩展影响更大,应力水平增大降低激光冲击强化疲劳寿命增益;在激光冲击强化参数一定时,应该规定适用的应力水平范围。 相似文献
18.
Our daily life is already based on a very high level of connectivity and interconnectedness with many benefits but also with a growing threat level from cyberspace. Our critical infrastructure will also become more and more involved in this process of interconnectedness. Especially with the topic of “smart” many things are likely to get more comfortable and easier. Smart homes are to be controlled remotely, smart meters should decrease our energy consumption and smart grids should enable the transformation of the power supply system to renewable and sustainable energy production. The pictures conjured up by these topics are very colourful. But seldom the responsible people are aware of the consequences of an increasing interconnectedness. The results are complex systems with a completely different behaviour from our current machines. They are not controllable in the same way we used to do with machines until now. On the other hand it could be a high risk to merge the known insecure ICT systems with our critical infrastructure, especially with our power supply system. Our whole life is heavily dependent on the reliability of the power supply system and there is only one European power network. We should not risk this essential system for survival by increasing interconnectedness inconsiderately and without an adequate knowledge of complex systems. 相似文献
19.
高可靠性长寿命碲镉汞焦平面阵列像元性能参数慢慢变差退化失效,确定它的储存寿命要用B类试验缩短试验时间。有效加速寿命试验ALT或加速退化试验ADT的恒定热应力,应大于高温+90℃、2 160 h。定量加速试验前,应进行高加速应力筛选试验HASS迫使缺陷发展,以暴露可能存在的早期故障。根据碲镉汞红外焦平面探测器杜瓦组件高温储存试验性能退化测试数据,用统计模型对在恒定高温应力水平下获得的失效时间或退化特征性能参数进行转换,得到在+25℃额定应力水平下的储存寿命大于50年。超过3 000 h高温储存试验结果表明,残余工艺应力释放导致试验前1 500 h像元性能有向好的趋势,在高温+80℃的真空环境下烘烤20天不会造成明显的像元性能恶化。 相似文献
20.
Life Cycle Costing (LCC) has attracted growing attention as a tool for choosing between designs of operational facilities and between modes of operating them. Since failures, repairs, and replacements are major contributors to life cycle costs, it has become apparent that
eliability,
vailability, and
aintainability (RAM) modeling techniques should be incorporated into LCC modeling. A variety of approaches to combining these techniques have appeared in the technical literature. This paper is a state-of-the art review of the literature pertaining to availability-based life cycle cost analysis. 相似文献