无线传感器网络分布式迭代定位误差控制算法

针对无线传感器网络分布式迭代定位中误差的传播和累积问题,该文首先分析了锚节点几何形状对定位误差的影响,提出了基于几何精度因子的误差控制算法,巧妙设计了加权策略,将锚节点几何形状对定位精度的影响以权值的形式定量体现在迭代定位过程中,在每一轮迭代中有效控制了误差的传递,进而提高了整个网络的分布式定位精度。与传统的最小二乘定位算法和基于轮数的误差控制算法进行了仿真比较,结果表明,基于几何精度因子的误差控制算法定位性能最优,网络定位精度分别提高了25%和15%。     

一种基于场强差的GSM网络移动台定位法

提出了一种在GSM无线蜂窝网络中利用服务BS（基站）和MS（移动台）测量的场强差值对MS进行定位的方法。通过计算机的仿真结果表明，该方法能够较好地克服多径和不规则地形带来的场强起伏，达到较高的定位精度。通过提出的的算法，可以克服传统的利用GSM蜂窝网络对移动台定位的局限性，从而使利用GSM蜂窝网络对移动台位置定位的实现更简单。     

CAPS卫星导航系统定位精度分析方法研究

卫星导航系统的定位精度主要受伪距测量的精度和卫星的空间几何分布两方面的影响.GPs等相同轨道分布的卫星导航系统一般采用DOP(几何精度因子)来分析定位精度.我国的转发式卫星导航定位系统CAPS是由GEO商用通信卫星以及一定数量的倾斜轨道通信卫星(IGSO)组成的混合星座导航系统,转发地面控制站信号,实现导航定位等功能.由于不同轨道卫星轨道误差不同,用户得到的卫星轨位精度和测量伪距精度也不相同,因此定位精度计算时必须考虑这种差异.本文引入加权几何精度因子(WDOP)的概念,对CAPS的定位精度进行了分析.通过仿真实验可以看出,由加权几何精度因子计算所得的定位精度能更真实地描述定位精度状况.     

基站几何布局对定位误差的影响

针对目前无线网络定位精度不够高的缺点,文中利用误差分析的方法探讨了影响无线网络定位精度的有关因素.在不考虑非视距误差的情况下其定位误差主要取决于网络中各基站的几何分布.通过仿真显示,在不考虑非视距误差的情况下,基站几何布局对移动台的定位误差具有较大的影响.因此在多基站的环境下,文中给出一种定位基站选择算法,可以有效的提高定位精度.     

靶场BD/GPS联合定位及速度解算方法

随着靶场试验多星测量系统接收机的使用,针对GPS、北斗单一定位系统定位精度不高、定位可靠性不强、可见星不够的问题,文中充分利用北斗和GPS原始测量信息,在对各系统的测量数据进行时空对准提出了一种基于加权几何精度因子选星的双系统融合解算模型,给出了目标位置和速度解算方法。仿真实验证明,该方法科学合理,其研究结果对北斗系统的精度验证和多星测量系统接收机在靶场的应用具有参考意义。     

无线电导航系统中基于GDOP的伪卫星定位误差研究

在卫星导航系统中,卫星定位的精度等性能很大程度上取决于定位卫星之间的相对几何布局,而GDOP(几何精度因子)正是衡量定位卫星几何布局优劣的一个很好的量度.为了更好地提高伪卫星的定位精度,从GDOP值的研究入手,得出一种基于加权GDOP(WGDOP)值的地面伪卫星定位误差算法.最后经过仿真比较基于常规GDOP和WGDOP两种精度因子的定位误差的大小,体现出WGDOP算法的优越性.     

一种利用移动无线传感器网络特性的定位算法

在研究移动无线传感器网络特性的基础上,借鉴蒙特卡洛算法思想,提出一种利用移动无线传感器网络特性进行定位的算法(EFL).EFL算法把移动无线传感器网络的移动特性和低秩特性作为节点定位的约束条件以提高节点定位的精度.仿真结果表明,采用EFI算法,节点的定位精度有较大提高.     

基于PDOP加权的模糊卡尔曼滤波在GLONASS单点定位中的应用

本文分析了几何精度因子(GDOP)对卫星导航系统定位精度的影响，提出了一种基于PDOP加权的模糊控制卡尔曼滤波方法．将其应用于GLONASS单点定位，结果表明，该方法可显著提高GLONASS单点定位精度。     

移动台定位估计数据融合增强模型及其仿真研究

为了提高蜂窝网中对移动台(MS)的定位精度，在文献[1]中，Kleine-Ostmann提出了一种对电波到达时间(TOA)和到达时间差(TDOA)测量值进行融合的模型。本文对该模型进行了改进，增加了AOA测量值的使用，提出了融合度更高的增强型数据融合模型。分析和仿真结果表明，只要AOA测量值达到一定精度要求，该模型就能取得更好的定位性能。     

矢量法确定无线定位系统的几何精度因子及其应用

无线定位系统中几何精度因子是影响系统定位精度的关键因素之一。本文提出的矢量法确定无线定位系统几何精度因子的方法简便、有效，通过在CDMA无线定位系统中进行仿真和实际测试，表明采用此算法确定的几何精度因子可以有效地反映无线定位中几何架构对定位精度的影响，与实际测量精度一致，对定位系统的基站架设和系统测试过程中精度估计有实际的指导意义。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.