雪崩光电二极管对空激光测距接收机

根据雪崩光电二极管最佳应用理论设计出一种新的激光测距接收机,其特有的雪崩管工作电压建立方式,使它能在很宽的温度范围内工作,具有极强的背景辐射环境适应性,已成功地用于对空激光测距。     

激光测距应用中雪崩光电二极管最佳工作状态的再研究

回顾了雪崩光电二极管最佳工作状态的确定方法。根据R.J.McIntyre给出的关于达通型雪崩光电二极管的噪声谱密度结果,分析了不同背景下,确定最佳工作状态的最佳噪声分配比的特性,并给出了实验结果。给出了不但能确定和保持雪崩光电二极管的最佳工作状态,而且可以保持恒定的虚警率的实用方法。     

雪崩光电二极管过剩噪声的测量和抑制方法

雪崩光电二极管(APD)因为其高灵敏度和高增益带宽的优势已被广泛应用在高比特率、远程光纤通信系统中,而雪崩过程中产生的过剩噪声直接影响到APD的信噪比,因此,研究过剩噪声对APD性能的提升具有重要意义.目前,国内外测试雪崩光电二极管过剩噪声的方法主要有直接功率测量法和相敏探测法,本文对这两种测试方法和其优缺点进行了分析...     

雪崩光电二极管在激光测距机中的应用

本文根据雪崩光电二极管的噪声特性．提出了按照噪声分配原则来确定雪崩光电二极管最佳工作点的方法。对放大器，接收光路设计和雪崩管的偏压电源等问题均进行了讨论。实验表明应用APD-1型雪崩光电二扳管，使激光测距系统的测程比用pin硅光电二极管时增加一倍以上，接收灵敏度提高27～15倍。     

脉冲激光测距仪雪崩光电探测器最佳工作状态和接收灵敏度研究

根据脉冲激光测距仪目前广泛应用的达通型硅雪崩光电二极管（Si-APD)的噪声谱密度,从理论和实验结果分析各种测距精度的脉冲激光测距仪,在不同脉冲宽度条件下,Si-APD的负载电阻、接收放大器带宽、噪声等效功率,最小可探测功率以及信噪比等数据,并将其进行比较。说明保持Si-APD器件的最佳工作状态是提高激光测距仪的探测灵敏度和测量数据的稳定性、可靠性的重要条件。     

长波长高速雪崩光电二极管的理论研究

本文以现有的理论研究和实验研究的结果为依据,提出了长波长高速及超高速雪崩光电二极管(APD)的两设计原则:一是在雪崩管内建立合理的电场强度分布;二是尽可能减少电寄生。这是得到高速或超高速响应、高量子效率以及低噪声性能的根本途径。     

硅基雪崩光电二极管技术及应用

硅基雪崩光电二极管是一种可用于对微弱光甚至单光子进行探测的光电器件,被广泛应用于激光测距、激光成像、量子通信和生物医疗等领域.从工作原理、常见结构和分类3个方面对硅基雪崩光电二极管的技术进行分析,并对其性能发展趋势进行阐述,最后介绍了硅基雪崩光电二极管的应用.     

雪崩光电二极管特性与测量

本文首先介绍了雪崩光电二极管的应用特性及工作原理,随后在不同通信速率及不同偏压条件下对APD的灵敏度进行了即时测量,对光通信领域的接收性能提升提供了较好的理论指导及技术支持。     

基于雪崩光电二极管的1550 nm单光子探测模块

单光子探测模块在多个领域中有重要的用途,然而现有的单光子探测模块依赖进口芯片.研制了一种基于国产元器件的1550 nm的单光子探测模块,改进了触发信号处理电路,避免了使用进口芯片.在触发信号的作用下,雪崩光电二极管进入盖革模式,处在盖革模式下的雪崩光电二极管接收到光子以后,产生雪崩信号;雪崩光电二极管的输出信号中的雪崩...     

一种硅基雪崩光电探测器的研究

硅基雪崩光电探测器（Si-APD）性能参数的研究可以优化改进器件结构的设计,而结构设计直接影响雪崩光电探测器的光电特性。本文针对Si基雪崩光电探测器的性能参数和器件结构进行研究,提出了改善器件性能参数的工艺方法,最终设计了一种硅基雪崩光电探测器结构。     

HgCdTe MWIR Back-Illuminated Electron-Initiated Avalanche Photodiode Arrays

This paper reports data for back-illuminated planar n-on-p HgCdTe electron-initiated avalanche photodiode (e-APD) 4 × 4 arrays with large unit cells (250 × 250 μm²). The arrays were fabricated from p-type HgCdTe films grown by liquid phase epitaxy (LPE) on CdZnTe substrates. The arrays were bump-mounted to fanout boards and characterized in the back-illuminated mode. Gain increased exponentially with reverse bias voltage, and the gain versus bias curves were quite uniform from element to element. The maximum gain measured was 648 at −11.7 V for a cutoff wavelength of 4.06 μm at 160 K. For the same reverse-bias voltage, the gains measured at 160 K for elements with two different cutoff wavelengths (3.54 μm and 4.06 μm at 160 K) show an exponential increase with increasing cutoff wavelength, in agreement with Beck’s empirical model for gain versus voltage and cutoff wavelength in HgCdTe e-APDs. Spot scan data show that both the V = 0 response and the gain at V = −5.0 V are spatially uniform over the large junction area. To the best of our knowledge, these are the first spot scan data for avalanche gain ever reported for HgCdTe e-APDs. Capacitance versus voltage data are consistent with an ideal abrupt junction having a donor concentration equal to the indium concentration in the LPE film. U.S. Workshop on the Physics and Chemistry of II-VI Materials Newport Beach, California October 10–12, 2006.     

平面型InGaAs/InP APD边缘提前击穿行为的抑制

平面型雪崩光电二极管(APD)在结弯曲处具有高的电场,导致在结边缘的提前击穿.运用FEMLAB软件对不同工艺流程制备的三种不同结构平面型InP/InGaAs APD的电场分布进行了二维有限元模拟,在表面电荷密度为5×1011cm-2时分析了吸收层厚度、保护环掺杂浓度、保护环和中央结纵向及横向间距等因素对边缘提前击穿特性的抑制程度.比较了这三种结构的InP/InGaAs APD在边缘提前击穿的抑制特性的优劣.通过理论研究对平面InP/InGaAs APD进行了优化.     

Noise Temperature Characteristics and Gain-control of Avalanche Photodiodes for Laser Radar

Avalanche photodiodes（APDs） are promising light sensors with high quantum efficiency and low noise. It has been extensively used in radiation detection, laser radar and other weak signal detection fields. Unlike other photodiodes, APD is a very sensitive light detector with very high internal gain. The basic theory shows that the gain of APD is related to the temperature. The internal gain fluctuates with the variation of temperature. Investigated was the influence of the variation of the gain induced by the fluctuation of temperature on the output from APD for a very weak laser pulse input in laser radar. An active reverse-biased voltage compensation method is used to stabilize the gain of APD. An APD model is setup to simulate the detection of light pulse signal. The avalanche process, various noises and temperature＇s effect are all included in the model. Our results show that for the detection of weak light signal such as in laser radar, even a very small fluctuation of temperature could cause a great effect on APD＇s gain. The results show that the signal-tonoise ratio of the APD＇s output could be improved effectively with the active gain-control system.     

具有超晶格雪崩区的电子倍增型雪崩光电二极管

基于碰撞离化理论研究设计了In0.53 Ga0.47 As/In0.52 Al0.48As电子倍增超晶格结构雪崩光电二极管,使用MOCVD外延得到实验片,经过工艺流片后进行封装测试.测试结果显示,具有超晶格雪崩区的电子倍增型APD器件,其暗电流可以控制在纳安级,光电流增益达到140,证明具有超晶格雪崩区的电子倍增型雪崩光电二极管具有很好的光电探测性能.     

10Gbit/s InGaAs/InP雪崩光电二极管

基于InGaAs/InP吸收区、渐变区、电荷区和倍增区分离雪崩光电二极管(SAGCMAPD)器件结构,利用数值计算方法,模拟了各层参数对器件频率响应特性的影响.模拟结果表明,吸收层、倍增层厚度及电荷层面电荷密度可影响器件的-3 dB带宽;随增益的增加,器件带宽会逐渐降低;电荷层面电荷密度对器件击穿电压有明显影响.结合此模拟结果,制作出了高速InGaAs/InP雪崩光电二极管,并对器件进行了封装测试.测试结果表明,该结果与模拟结果相吻合.器件击穿电压为30 V;在倍增因子为1时,器件响应度大于0.8 A/W;在倍增因子为9时,器件暗电流小于10 nA,-3 dB带宽大于10 GHz,其性能满足10 Gbit/s光纤通信应用要求.     

微弱光信号探测APD处理电路设计

雪崩光电二极管(APD)具备微弱光信号探测性能,其相关处理电路的设计直接关乎APD探测能力的大小。分析了APD光电探测器工作原理、自身特性及外界影响因素,研究了APD工作电路的组成与最佳工作电路的设计问题。后期信号处理阶段,设计了APD信号放大处理电路,满足了低噪声、带宽匹配,微弱信号放大的要求。在APD微弱光信号探测领域具有一定的意义。     

A Theoretical Model for the HgCdTe Electron Avalanche Photodiode

A ballistic model is presented for electron avalanche multiplication in the conduction band of HgCdTe, based upon the concept of an optical phonon limited mean free path for the electron, λ _e. The model predicts avalanche gain as a function of applied bias voltage V, and a threshold voltage for impact ionization V _th. Impact ionization probabilities are calculated analytically using a simplified band structure model for HgCdTe and used to estimate values for the threshold energy for impact ionization. A simple ballistic model is developed to correlate the relationship between electron energy and applied bias voltage, based upon the relevant electron scattering mechanisms in HgCdTe. A comparison with published gain–voltage data suggests that the process is limited by optical phonon scattering, and the relationship between electron energy and applied bias voltage, for a uniform electric field F = V/W, across a diode depletion width W, is given by E = α(E)V, where α(E) = [λ _e(E)/W]. For high electron energies λ _e(E) is independent of E and α(E) depends only on the dielectric parameters of the material. Using this simple model it is easy to predict electron avalanche gain versus voltage for any parametric combination of diode geometry, bandgap, and operating temperature.     

基于自适应噪声抵消的光电二极管阵列检测器

由于普通光电二极管阵列检测器(PDAD)无法克服光源波动造成的影响,设计开发了一种采用自适应噪声抵消技术的PDAD。该检测器采用分光镜实现光的分束和合束,采用凹面光栅实现分光系统,PDA作为光电接收元件。在斩光器和后续电路的配合下,实现了在同一PDA上信号光光谱、参考光光谱和暗电流的分时测量。由于采用参考光的吸光度信号对样品光的吸光度信号进行自适应噪声抵消,可以有效降低光源光强波动的影响,使基线短期噪声降低1×10-5AU,漂移降低为1×10-4AU/h。     

硅基雪崩光电探测器倍增层掺杂的研究

硅基雪崩光电探测器的器件性能与倍增层的掺杂浓度有着密切联系。研究了硅基雪崩光电探测器倍增层的掺杂浓度对雪崩击穿电压和光谱响应度等特性的影响。在硼的注入剂量由5.0×1012 cm-2减小为2.5×1012cm-2时,倍增层内电场强度逐渐降低,吸收区电场强度迅速增大,器件的雪崩击穿电压由16.3V迅速上升到203V,而光谱响应在95%的击穿电压下,峰值响应波长由480nm红移至800nm,对应的响应度由11.2A/W剧增到372.3A/W。综合考虑光谱响应和雪崩击穿电压的影响,在硼注入剂量为3.5×1012 cm-2时,可获得击穿电压为43.5V和响应度为342.5A/W的器件模型,对实际器件的制备具有一定参考价值。     

平面型InP/InGaAs雪崩光电二极管多级台阶结构研究

平面型雪崩光电二极管(APD)在结弯曲处具有更高的电场,易导致结边缘的提前击穿.运用FEMLAB软件对多级台阶结构的平面型InP/lnGaAs APD的电场分布进行了二维有限元模拟,在表面电荷密度为5×10~(11)cm~(-2)时分析了台阶级数、台阶高度等因素对边缘提前击穿特性的抑制程度.通过理论研究对平面InP/InGaAS APD进行了优化.

Abstract：

For planar-type avalanche photodiode (APD), it is hard to suppress edge pre-breakdown with double-stepped p-region profile. In order to suppress the edge pre-breakdown, amulti-stepped p-region is proposed and studied. A finite element two-dimensional (2-D) simulation is performed to study the electric field of planar-type APD with multi-stepped p-region. The effects of the step number and deep in suppressing the edge pre-breakdown are analyzed and the planar-type APD structure is optimized theoretically.