Dependence of photoluminescence spectra of epitaxial Pb1 ? xEuxTe (0 ≤ x ≤ 0.1) alloy layers on conditions of growth

The photoluminescence spectra of the Pb_{1 − x} Eu _x Te (0 ≤ x ≤ 0.1) alloy are studied at low temperatures. Epitaxial layers were grown by molecular-beam epitaxy at different temperatures. Along with the basic line corresponding to interband radiative recombination, additional emission lines are observed in the low-energy region of the spectra. Some nonuniformities are observed at the sample surface (within an area smaller than 1% of the total surface area). The concentration and size (1–10 μm) of the nonuniformities decrease with increasing temperature of growth. The additional emission lines are attributed to local nonuniformities in the layer. The dependence of the band gap of the Pb_1−x Eu _x Te (0 ≤ x ≤ 0.1) alloy on the composition parameter x is determined at 77.4 K. The dependence is nonlinear and adequately described by the relation E _g [eV] = 0.213 + 4.8x − 18.4x ².     

Ferromagnetism in diluted Pb1 ? x ? y Ge x Cr y Te magnetic semiconductors

Magnetic properties of Pb_{1 − x − y} Ge _x Cr _y Te alloys (x = 0.02–0.20, y = 0.01–0.08) were studied. It was detected that the magnetic susceptibility of alloys consists of two contributions: the paramagnetic Curie-Weiss part (the temperature region is T < 50 K) caused, probably, by the Cr³⁺ ion paramagnetism, and the high-temperature ferromagnetic part (T < 300 K). The dependences of the concentration of magnetic centers on the composition of the matrix were obtained from the paramagnetic and ferromagnetic contributions. It was shown that a decrease in the concentration of paramagnetic centers can be, at least qualitatively, explained by the transformation of the electronic structure as the germanium concentration increases. A phenomenological model was suggested, which explains the behavior of magnetic properties as the chromium content increases, and possible mechanisms of ferromagnetic ordering in studied alloys are discussed. Original Russian Text ? E.P. Skipetrov, M.G. Mikheev, F.A. Pakpour, L.A. Skipetrova, N.A. Pichugin, E.I. Slyn’ko, V.E. Slyn’ko, 2009, published in Fizika i Tekhnika Poluprovodnikov, 2009, Vol. 43, No. 3, pp. 316–323.     

The influence of hydrogenation on the electrical properties of the CdxHg1 ? xTe epitaxial structures

The phenomenon of hydrogenation of the Cd _x Hg_{1 − x} Te films is studied. Hydrogenation was performed via either boiling the Cd _x Hg_{1 − x} Te films in deionized water or using the electrochemical treatment. It is established that, during contacts with aqueous media, the acceptor centers are introduced into the films; their concentration can exceed 10¹⁷ cm⁻³. It is shown that two types of hydrogen-based acceptors are introduced, namely, fast and slow acceptors, and their diffusivities are evaluated. It is found that hydrogen partially exists after treatment in an electrically inactive form and can be activated with further storage or during heating. After activation, the hole concentration can become as high as 10¹⁸ cm⁻³. The influence of pH of the medium on the rate of introduction of hydrogen into the material is discussed.     

Magnetic susceptibility of (Bi2 ? xSbx)Te3 (0 < x < 1) alloys in the temperature range 2 to 50 K

The superconducting quantum interferometer device with Josephson junctions (SQUID magnetometer) is used to study the temperature dependences of the magnetic susceptibility of (Bi_2−x Sb _x )Te₃ (0 < x < 1) alloy crystals in the temperature range 2 to 50 K, at the magnetic field vector H orientations H | C ₃ and H ⊥ C ₃ with respect to the crystal trigonal axis C ₃. It is found that the magnetic susceptibility of the ion core of the samples under study is χ ^G = −0.35 × 10⁻⁶ cm³/g, the contribution of lattice defects to magnetic susceptibility can be disregarded, and the contribution of free carriers is of a diamagnetic nature in the entire studied temperature range. It is shown that the contribution of free carriers to the resulting magnetic susceptibility and its anisotropy can be described within the Pauli and Landau-Peierls approach. In calculating the magnetic susceptibility, taking into account the constant concentration of free carriers in the state of pronounced degeneracy, it is found that the temperature dependence of the anisotropic effective masses varies with crystal chemical composition. This is possibly associated with the complex structure of the valence band and its variation as the Sb₂Te₃ content in the alloy increases.     

Determination of the thickness and spectral dependence of the refractive index of Al x In1 − x Sb epitaxial layers from reflectance spectra

A nondestructive method for measuring the thicknesses of epitaxial layers of Al _x In_{1 ? x} Sb alloys based on interference effects in reflectance spectra measured in a wide wavelength range (1–28 μm) is implemented. The studied 0.9–3.3 μm thick Al _x In_{1 ? x} Sb layers are grown on highly lattice-mismatched GaAs substrates by molecular beam epitaxy. The found thicknesses are in good agreement with the independent data of scanning electron microscopy. The spectral dependence of the refractive index n(E) of Al _x In_{1 ? x} Sb layers is measured both for the regions of transparency and fundamental absorption. The refractive index for the case of E < E ₀ was calculated by a double-oscillator model using a refined experimental dependence of the band gap on the composition E ₀(x). The experimental data on the n(E) of Al _x In_{1 ? x} Sb for energies E > E ₀ are found based on the interference pattern.     

Characterization of Cd1-xZnxTe (0≤x≤1) Nanolayers Grown by Atomic Layer Deposition on GaSb and GaAs (001) Oriented Substrates

ZnTe, CdTe, and the ternary alloy CdZnTe are important semiconductor materials used widely for the detection of an important range of electromagnetic radiation as gamma ray and X-ray. Although, recently these materials have acquired renewed importance due to the new explored nanolayer properties of modern devices. In addition, as shown in this work they can be grown using uncomplicated synthesis techniques based on the deposition in vapour phase of the elemental precursors. This work presents the results obtained from the deposition of nanolayers of these materials using the precursor vapour on GaAs and GaSb (001) substrates. This growth technique, extensively known as atomic layer deposition (ALD), allows the layers growth with nanometric dimension. The main results presented in this work are the used growth parameters and the results of the structural characterization of the layers by the means of Raman spectroscopy measurements. Raman scattering shows the peak corresponding to longitudinal optical (LO)-ZnTe, which is weak and slightly redshift in comparison with that reported for the ZnTe bulk at 210 cm–1. For the case of the CdTe nanolayer, Raman spectra presented the LO-CdTe peak, which is indicative of the successful growth of the layer. Its weak and slightly redshift in comparison with that reported for the CdTe bulk can be related with the nanometric characteristic of this layer. The performed high-resolution X-ray diffraction (HR-XRD) measurement allows to study some important characteristics such as the crystallinity of the grown layer. In addition, the HR-XRD measurement suggests that the crystalline quality has dependence on the growth temperature.     

Simulation of relaxation times and energy spectra of the CdTe/Hg1 ? xCdxTe/CdTe quantum well for variable valence band offset, well width, and composition x

The dependences of relaxation times and energy spectrum of the CdTe/Hg_{1 − x} Cd _x Te/CdTe quantum well (QW) on its parameters were simulated in the cadmium molar fraction range 0 < x < 0.16. It was found that the x increase from 0 to 0.16 changes electron wave function localization in the QW. A criterion for determining the number of interface levels of localized electrons depending on QW parameters was obtained. The effect of a sharp (by two orders of magnitude) increase in the relaxation time of localized electrons was detected at small QW widths and x close to 0.16.     

Optical properties of quaternary GaNxAsyP1 ? x ? y semiconductor alloys

The optical properties of quaternary GaN _x As _y P_{1 − x − y} semiconductor alloys grown on a GaP (100) substrate surface are studied by photoluminescence spectroscopy in the temperature range 20–300 K and by photoluminescence excitation spectroscopy at liquid-nitrogen temperature. The measurements are carried out for the GaN _x As _y P_{1 − x − y} alloys, for which the nitrogen and arsenic molar fractions x and y range from 0.006 to 0.012 and from 0.00 to 0.18, respectively. A comparative analysis of the data is conducted, and the dependences of the energy position of the photoluminescence peak on the composition of the quaternary alloy are established. From the studies of photoluminescence in the range 20–300 K, it is found that the temperature dependence of the position of the photoluminescence peak substantially differs from the behavior described by Varshni’s expression.     

Effect of surface chemical treatments on Ti-p-Si1 ? xGex and Ni-p-Si1 ? xGex contact properties

The effect of various chemical treatments of the alloy surface on the properties of Ti-p-SiGe and Ni-p-SiGe contacts fabricated by vacuum thermal deposition at a substrate temperature of 350–400°C has been studied. Etching under various conditions is used to form an initial surface with various surface-state densities. It is shown that an intermediate nickel germanosilicide layer is formed in nickel-based structures during thermal deposition of contacts, which has a significant effect on the current-voltage and capacitance-voltage characteristics of structures.     

Effect of the number of pairs of the layers on the quality of the superlattices of the InxGa1 ? xAs/GaAs/.../GaAs(001) type grown by molecular beam epitaxy under computer control

By the specified program of computer control over the growth process, superlattices of the In _x Ga_{1 − x} As/GaAs/.../GaAs(001) type with the number of alternating pairs N ₁ = 12, N ₂ = 6, and N ₃ = 3 were grown. Using the X-ray methods of quantitative analysis, the values of periods T ₁ = 22 nm, T ₂ = 22.5 nm, and T ₃ = 22.3 nm and the In content x ₁ = 0.09, x ₂ = 0.091, and x ₃ = 0.092 in these superlattices are measured. In the superlattice with N ₁ = 12, the plastic deformation is detected. In superlattices with N ₂ = 6 and N ₃ = 3, no plastic deformation during the growth was observed. The obtained magnitudes of the periods turned out smaller by a factor of approximately 2 and the alloy concentration turned out smaller by 1/3 than it was specified by the computer program. The measured and calculated values of elastic stresses turned out equal to σ_2N = 2.43 × 10⁶ Pa and σ^{2N − 1} = −0.88 × 10⁹ Pa, at which the plastic deformation took place in the layers of the superlattice with N ₁ = 12. In superlattices with N ₂ = 6 and N ₃ = 3, the elastic stresses were σ_2N = 1.96 × 10 6 Pa, σ_{2N − 1} = −1.45 × 10⁹ Pa and σ_2N = 0.99 × 10⁶ Pa, σ_{2N − 1} = −1.88 × 10⁹ Pa, respectively. These stresses turned out insufficient to initiate the process of dislocation generation. Original Russian Text ? G.F. Kuznetsov, 2009, published in Fizika i Tekhnika Poluprovodnikov, 2009, Vol. 43, No. 4, pp. 493–500.     

Flexibility of p–n Junction Formation from SWIR to LWIR Using MBE-Grown Hg(1–x)CdxTe on Si Substrates

In this paper, we show the versatility of using molecular-beam epitaxy (MBE) for the growth of the mercury cadmium telluride (HgCdTe) system. Abrupt composition profiles, changes in doping levels or switching doping types are easily performed. It is shown that high-quality material is achieved with Hg_(1–x)Cd _x Te grown by MBE from a cadmium mole fraction of x = 0.15 to x = 0.72. Doping elements incorporation as low as 10¹⁵ cm⁻³ for both n-type and p-type material as well as high incorporation levels >10¹⁸ cm⁻³ for both carrier types were achieved. X-ray curves, secondary-ion mass spectrometry (SIMS) data, Hall data, the influence of doping incorporation with cadmium content and growth rate, etch pit density (EPD), composition uniformity determined from Fourier-transform infrared (FTIR) transmission spectro- scopy, and surface defect maps from low to high x values are presented to illustrate the versatility and quality of HgCdTe material grown by MBE. All data presented in this work are from layers grown on silicon (112) substrate.     

Crystallophysical properties of the In1 ? yGayAs1 ? xNx/GaAs heterostructures

Some properties of the In_{1 − y} Ga _y As_{1 − x} N _x unordered alloys and physical prerequisites of their use in science and technology are considered. The results of studying the intermolecular interaction in the systems under study and the features of their application to the In_{1 − y} Ga _y As_{1 − x} N _x /GaAs functional hetero-structures are presented.     

Optical properties of quantum-confined heterostructures based on GaPxNyAs1 ? x ? y alloys

The results of calculations of the band gap in GaP _x N _y As_{1 − x − y} alloys and the estimated parameter of hybridization of the conduction band in GaP and the localized level of nitrogen are reported. The optical properties of quantum-confined heterostructures based on GaP _x N _y As_{1 − x − y} alloys synthesized on the GaP (100) substrate surface are studied by photoluminescence measurements in the temperature range of 15–300 K. The heterostructures consist of GaP_0.814N_0.006As_0.18 quantum wells separated by GaP barrier layers. The well width and the barrier thickness are 5 nm. Heterostructures with different numbers of periods are considered. On optical excitation of the structures, an intense photoluminescence line is observed in the spectral range 620–650 nm. The photoluminescence spectra of the GaP_0.814N_0.006As_0.18/GaP quantum wells are profoundly broadened because of the inhomogeneity of the quaternary alloy in composition. It is established that the increase in the number of quantum well layers from 10 to 25 does not results in degradation of the photoluminescence properties of the heterostructures. The results of the study support the view that it is possible to produce efficient optoelectronic devices on the basis of GaP _x N _y As_{1 − x − y} alloys.     

Composition and parameters of domains resulting from spinodal decomposition of quaternary alloys in epitaxial GaInP/Ga x In1 ? x As y P1 ? y /GaInP/GaAs(001) heterostructures

Structural and optical properties of two- and three-layer epitaxial heterostructures containing GaInP/Ga _x In_{1 − x} As _y P_{1 − y} quaternary alloy layers were studied. Domain formation due to spinodal decomposition of the quaternary alloy was detected in three-layer heterostructures. As a result, an additional long-wavelength band appears in the photoluminescence spectra, and an additional doublet of the line appears in X-ray diffraction patterns of the (006) line. The domain composition was determined on the basis of Vegard’s law and the Kouphal equation. Original Russian Text ? E.P. Domashevskaya, N.N. Gordienko, N.A. Rumyantseva, B.L. Agapov, P.V. Seredin, L.A. Bityutskaya, I.N. Arsent’ev, L.S. Vavilova, I.S. Tarasov, 2008, published in Fizika i Tekhnika Poluprovodnikov, 2008, Vol. 42, No. 9, pp. 1086–1093.     

Transport and Thermoelectric Properties of the Ca1?xSrxRu1?yMnyO3 System

The magnetic, transport, and thermoelectric properties of Ca_1−x Sr _x Ru_1−y Mn _y O₃ have been investigated. Ferromagnetism with relatively high T _C (>200 K) was introduced by Mn doping. In particular, ferromagnetism appeared in the Ca_0.5Sr_0.5Ru_1−y Mn _y O₃ system at y > 0.2. The maximum T _C (=270 K) was recorded for a specimen of Ca_0.5Sr_0.5Ru_0.4Mn_0.6O₃. The ferromagnetism seems to be due to the mixed-valence states of Mn³⁺, Mn⁴⁺, Ru⁴⁺, and Ru⁵⁺ ions. The metallic character of Ru-rich specimens was suppressed by Mn substitution, and the system was transformed into a semiconductor at relatively low Mn content near y = 0.1. Specimens with higher Mn content (y > 0.8) had large thermoelectric power (50 μV K⁻¹ to 130 μV K⁻¹ at 280 K) accompanied by relatively low resistivity (0.03 Ω cm to 1 Ω cm). The Ca_0.5Sr_0.5Ru_1−y Mn _y O₃ system seems to have good potential as a thermoelectric material for use above 300 K.     

Surface and Interface Properties of Metal-Organic Chemical Vapor Deposition Grown a -Plane Mg x Zn1– x O (0?≤ x ≤?0.3) Films

The a-plane Mg _x Zn_1−x O (0 ≤ x ≤ 0.3) films were grown on r-plane () sapphire substrates using metal-organic chemical vapor deposition (MOCVD). Growth was done at temperatures from 450°C to 500°C, with a typical growth rate of ∼500 nm/h. Field emission scanning electron microscopy (FESEM) images show that the films are smooth and dense. X-ray diffraction (XRD) scans confirm good crystallinity of the films. The interface of Mg _x Zn_1−x O films with r-sapphire was found to be semicoherent as characterized by high-resolution transmission electron microscopy (HRTEM). The Mg _x Zn_1−x O surfaces were characterized using scanning tunneling microscopy (STM) in ultrahigh vacuum (UHV). Low-energy electron diffraction (LEED) shows well-ordered and single-crystalline surfaces. The films have a characteristic wavelike surface morphology with needle-shaped domains running predominantly along the crystallographic c-direction. Photoluminescence (PL) measurements show a strong near-band-edge emission without observable deep level emission, indicating a low defect concentration. In-plane optical anisotropic transmission was observed by polarized transmission measurements.     

Synthesis,Structure and Electrical Properties of(SnO2)x(In2O3)1?x(x=0.5–1) Nanocomposites

The experimental results of synthesizing thin films (<1 μm thick) of (SnO₂) _x (In₂O₃)_{1 − x} (x = 0.5–1 wt) nanocomposites fabricated by high-frequency magnetron sputtering of metal-oxide targets in a controlled Ar + O₂ atmosphere are presented. The films, deposited on hot substrates (400°C), are studied by the X-ray diffraction analysis, atomic-force microscopy, and optical and electrical methods. The effect of the synthesis conditions and film composition on the size of crystalline grains, band gap, and the concentration and mobility of free charge carriers was determined. It is shown that films of the composition (SnO₂) _x (In₂O₃)_{1 − x} with x = 0.9 are the most promising for applications in gas sensorics.     

Influence of Cadmium Composition on CH4–H2-Based Inductively Coupled Plasma Etching of Hg1?xCdxTe

In this paper, inductively coupled plasma etching of Hg_1−x Cd _x Te in CH₄–H₂-based chemistry is studied. This work is focused on the effects of substrate temperature, ion energy, and alloy composition on etch rate and surface composition. A strong influence of substrate temperature is shown. The etch rate is multiplied by more than a factor of 3 when the temperature is increased from 5°C to 35°C. A purely physical Cd removal mechanism is ruled out using x-ray photoelectron spectroscopy data from samples etched at different temperatures. Under the conditions of very low ion energy, an etching mechanism limited by the supply of active species from the plasma predicts an Hg_1−x Cd _x Te etch rate evolution that fits very well with our data.     

Thermoelectric Properties of Tix(HfyZr1?y)1?xNiSn0.998Sb0.002 Half-Heusler Ribbons

Ribbons of Ti _x (Hf _y Zr_1−y )_1−x NiSn_1−z Sb _z (x = 0.1 to 1, y = 0.1 to 0.9, z = 0, 0.002, 0.004) were prepared by spin casting and annealed for 1 h at T _a = 1000 K, 1050 K, 1073 K, and 1100 K. The crystal phase of the ribbons was investigated by x-ray diffraction analysis and transmission electron microscopy. All the ribbons consisted of a phase with a half-Heusler structure. The Seebeck coefficient, electrical conductivity, thermal conductivity, power factor, and figure of merit ZT at room temperature were clarified experimentally as a function of x, y, z, and T _a. Despite the large thermal conductivity, the power factor and figure of merit were remarkably large at x = 0.5, y = 0.5, z = 0.002, and T _a = 1073 K, because the Seebeck coefficient and electrical conductivity were large.