共查询到19条相似文献,搜索用时 156 毫秒
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煤制备洋葱状富勒烯的HREM分析 总被引:4,自引:1,他引:3
采用直流电弧放电法以煤为原料制备富勒烯。实验采用工作气体为Ar,催化剂选用纳米Cu颗粒。所得到的阴极产物的HREM观察表明:在适当的工艺条件和催化剂作用下,可宏量制备出碳纳米颗粒—洋葱状富勒烯(nano-structured onion-like-fullerenes;NSOFs),直径为25~40nm;同时生成一些特殊形状的碳纳米管,其形状为探讨高温条件下碳纳米管向洋葱状富勒烯转变提供了有力的证据;煤的独特结构使其在制备过程中沿两条路径形成富勒烯:非晶态碳原子的石墨化和芳香结构的重排。X射线能谱分析表明煤中舍有Mg、Si、S等微量矿物元素,这些元素的存在意味着可能对洋葱状富勒烯的生成有催化作用, 相似文献
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以分子量为600、400和200的聚乙二醇(PEG)为介质电弧放电法制备了洋葱状富勒烯(OLFs);利用空气氧化法于450℃条件下对产物进行了提纯,并用含氧射频等离子体对纯化后的OLFs进行了表面氧化修饰;用场发射扫描电镜、高分辨透射电镜、X射线衍射和傅立叶变换红外光谱对所得产物进行了表征和分析。结果表明:在PEG200中放电制得的OLFs粒径均匀,石墨化程度较高;空气氧化法能提高OLFs产物的纯度;当氧气含量为20%时,表面氧化修饰效果明显。 相似文献
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Bimorph nano actuators synthesized by a two-layer focused ion beam (FIB) chemical vapor deposition (CVD) process have been demonstrated. The core bimorph segment of the actuator is a column structure made of two 200-nm thick tungsten-based-conductor (TBC) and diamond-like-carbon (DLC) layers. Several segments can be connected together of different angles to construct actuators with various moving capabilities when joule heating is applied via silicon MEMS (Microelectromechanical System) heater as the actuation source. Experimentally, a prototype five-segment actuator has shown projection displacement of 600 ± 60 nm under an input power of 1.02 W (160 mA and 6.41 V). The actuator has been repeatedly operated for over 100 times without any indication of degradation. As such, this work represents a new class of nano actuators based on versatile and flexible FIB-CVD bimorph nanostructures. 相似文献
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激光化学气相沉积(Laser Chemical Vapor Deposition,LCVD)石墨烯制备受聚焦光斑影响很大。实时检测光斑,可实现石墨烯LCVD法可控制备。设计聚焦光斑测量光学系统,提出一种基于圆拟合的改进算法检测光斑中心和半径,计算、标定光斑面积。该方法在圆拟合基础上加入了二值化、形态学处理及连通性判别等预处理方法。实验表明,该方法测得圆心位置与真值误差平均为5.58 pixel,光斑面积与真值误差平均为1.93×10-9 m2,优于传统的重心法和霍夫检测法,具有较快的计算速度和检测精度,可实现LCVD法制备石墨烯实验中聚焦光斑的非接触式测量,且对其他激光加工工艺的质量控制有借鉴意义。 相似文献
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《Materials Science in Semiconductor Processing》2002,5(2-3):301-304
In order to fill small via-holes and trenches for ultralarge scale integration (ULSI) interconnects, we propose an anisotropic chemical vapor deposition (CVD) method by which Cu is deposited at a high rate at the bottom of a trench compared to that at its side wall. The ion irradiation is the key to realize the anisotropic CVD. The anisotropy, which is a ratio of deposition rate at the bottom of a trench to that at its side wall, tends to increase with energy as well as flux of ions (H3+ is the predominant ion) impinging on the substrate surface, while it does not depend on H flux. We demonstrate promising anisotropic filling of trenches by the anisotropic CVD method. 相似文献
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LICVD制备纳米SiO2粉末工艺研究 总被引:2,自引:0,他引:2
对LICVD制备纳米SiO2粉末工艺了理论分析,探索了工艺参数与粒子特征的关系,并且利用正安装置成功地制备纳米SiO2粉末。 相似文献
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分析了激光诱导化学气相淀积过程中激光对气体的激发机理,采用半经典近似的方法,推导出气体吸系数的数学表达式,以此为基础讨论了实验参量-激光强度、频率、气体压强对气体吸收过程的影响。 相似文献
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Epitaxial films of Y3Fe5O12, Eu3Fe5O12, (Eu, Y)3Fe5O12, and Er3Fe5O12 l-2μm thick have been chemically vapor deposited on <111> GGG and <100> SmGG garnet substrates from 1000°C to 1200°C in an
oxygen atmosphere from metal organic source compounds. These source compounds which are used here for the first time in chemical
vapor deposition are tris 2, 2, 6, 6, tetramethyl 3, 5 heptanedionate complexes, (thd or M(thd)3) of the metals used. In the reactor, the individual compounds are volatilized in a helium carrier in separate source containers.
The vapors are then combined, and premixed without reaction at about 300°C with a large excess of 02 and passed with high velocity, ∿500 cm/sec, onto an r.f. heated substrate. The growth rate under these conditions is 0.4
- 0.8μm/hr. X-ray double diffraction, glancing angle X-ray and microprobe analyses were employed to characterize the crystallinity
and stoichiometry, respectively, of the resulting garnet films. They were single crystal and exhibited a lattice constant
dependent upon the rare earth to Fe ratio.
The Eu containing films were not pseudomorphic probably due to the large lattice mismatch between substrate and film in most
cases. The erbium iron garnet films were apparently close to pseudomorphic as determined by measured film and substrate lattice
constants. 相似文献
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Effects of substrate surface preparation on chemical vapor deposition growth of 4H-SiC epitaxial layers 总被引:1,自引:0,他引:1
S. E. Saddow T. E. Schattner J. Brown L. Grazulis K. Mahalingam G. Landis R. Bertke W. C. Mitchel 《Journal of Electronic Materials》2001,30(3):228-234
The effects of chemical mechanical polish (CMP) and pre-growth oxidation and etching of vicinal 4H−SiC substrates on the quality
of epitaxial films have been investigated. Samples with and without a collodial silica CMP and oxidation/etch treatment were
studied with optical microscopy, cross section transmission electron microscopy (TEM) and atomic force microscopy (AFM) before
and after chemical vapor deposition. Evidence of polishing damage was evident prior to growth in all samples without CMP treatment.
Oxidation and etching appeared to generate defects by preferential etching of bulk defects such as dislocations and low angle
grain boundaries. Evidence of the polishing damage remained after chemical vapor deposition (CVD) growth on the samples without
CMP and the defect density was worse for the oxidized samples compared to the unoxidized ones. The unoxidized CMP wafer had
the lowest defect density and rms roughness of the samples studied. 相似文献