具有快速瞬态响应和低静态电流的CMOS低漏失稳压器设计

 设计了一种具有快速瞬态响应能力的低漏失稳压器,利用提出的一种瞬态响应加速(Transient Response Enhancement,TRE)电路,有效地提高了稳压器的瞬态响应速度,而且瞬态响应速度的提高并不增加静态电流.设计的LDO电路采用0.5μm标准CMOS工艺投片验证,芯片面积为0.49mm².该LDO空载下的静态电流仅23μA,最大带载200mA.在1μF输出电容、200mA/100ns负载阶跃变化时的最大瞬态输出电压变化量小于3.5％.     

A full on-chip CMOS low-dropout voltage regulator with VCCS compensation

A full on-chip CMOS low-dropout(LDO) voltage regulator with high PSR is presented.Instead of relying on the zero generated by the load capacitor and its equivalent series resistance,the proposed LDO generates a zero by voltage-controlled current sources for stability.The compensating capacitor for the proposed scheme is only 0.18 pF,which is much smaller than the capacitor of the conventional compensation scheme.The full on-chip LDO was fabricated in commercial 0.35μm CMOS technology.The active chip area...     

An ultra-low power output capacitor-less low-dropout regulator with slew-rate-enhanced circuit

An ultra-low power output-capacitorless low-dropout (LDO) regulator with a slew-rate-enhanced (SRE)circuit is introduced.The increased slew rate is achieved by sensing the transient output voltage of the LDO and then charging (or discharging) the gate capacitor quickly.In addition,a buffer with ultra-low output impedance is presented to improve line and load regulations.This design is fabricated by SMIC 0.18 μm CMOS technology.Experimental results show that,the proposed LDO regulator only consumes an ultra-low quiescent current of 1.2 μA.The output current range is from 10 μA to 200 mA and the corresponding variation of output voltage is less than 40 mV.Moreover,the measured line regulation and load regulation are 15.38 mV/V and 0.4 mV/mA respectively.     

一种瞬态响应增强的片上LDO系统设计

分析了传统LDO提高系统稳定性及瞬态响应的局限性,提出了一种片内集成补偿技术。该技术无需外挂电容和等效串联电阻(ESR),即可使系统在全负载范围内保持稳定,并具有良好的纹波抑制能力。仿真结果表明,系统空载时静态电流为46μA,且能提供200mA的最大负载电流,低频电源抑制比达到-65.6dB,启动时间只有16μs,在输出电容为10pF、负载电流以200mA/2μs突变时,最大下冲电压为120mV,上冲电压为160mV。     

采用增强型AB跟随器的快速响应LDO

设计了一种采用增强型AB跟随器作为缓冲器的快速响应LDO.利用跟随器的动态电流提高能力,显著地改善了误差放大器对功率MOS管寄生大电容的驱动;同时,由负反馈引起的阻抗降低效应将功率管的寄生电容极点推到了更高的频率,提高了环路的相位裕度.采用TSMC0.35-μm CMOS工艺进行仿真,当负载电流在0.1μs内从1 mA跳变到50 mA以及从50 mA跳变到1 mA时,相对于同等条件下的源跟随器LDO,输出峰值分别减少4 mV和46 mV,且稳定时间只需要0.2 μs和0.5 μs.     

一种1.2V,80mA,5μF快速瞬态响应、高稳定性LDO的设计

基于上华0.5μm工艺,设计了输入电压为1.5V,输出电压为1.2V,最大输出电流为80mA,用于DC/DC里的CMOS低压差线性稳压器(Low-dropout regulator),作为带隙基准输出端的后续模块,以达到滤波和提高参考电压精度的目的。提出了一种补偿网络,可以保证负载电流发生变化时,相位裕量不发生变化;在补偿网络的基础上添加一个感应电容能够快速跟踪极点的变化,从而保证在负载电流跳变瞬间稳定性保持不变,防止了输出电压发生振荡的情形。此外,设计了一种瞬态响应提高电路结构来改善负载瞬态响应。仿真结果表明,在tt corner下该LDO线性稳压器在负载电流为1mA和80mA时的相位裕度均为83°,环路增益为80dB,流片测试结果显示过冲电压和欠冲电压均不超过100mV。     

Current buffer compensation topologies for LDOs with improved transient performance

The goal of internal frequency compensation of a low dropout voltage regulator (LDO) is the selection of a small-value, ESR-independent output capacitor. Cascode compensation formed by a common-gate transistor acting as a current buffer, an optional series resistor, and a compensation capacitor creates a dominant pole and a left-half-plane (LHP) zero, allowing adequate phase margin and stable LDO design. To this end, a 1.21?V output, 100?mA, 0.1?C10???F output capacitor, ESR-independent, low voltage LDO using cascode compensation with replica bias is designed and fabricated in a 0.5???m CMOS process with an area of 0.22?mm². A line regulation of 0.05% V/V, load regulation of 0.001% V/mA and dropout voltage of 220?mV were measured. LDO-specific pole-zero analysis is detailed. In addition to this design, two improved transient response LDO architectures using cascode compensation with split-length transistors are also explored. A Power Good feature is discussed, which enables direct interface between the LDO and a micro-processor.     

一种适合便携式电子系统应用的LDO的设计

为解决低压差线性稳压器(Low-dropout voltage regulator,LDO)的稳定性问题,提出了一种新的内部补偿策略。相比于传统的零极点跟踪补偿,这种新的补偿策略更容易实现足够的相位裕度。该LDO不需要外接ESR电容,只需一只2.2μF的瓷片电容就能实现稳定输出,尤适合便携式电子系统等应用场合。芯片采用1.5μm BCD(Bipolar-CMOS-DMOS)工艺设计和实现。测试结果表明,该LDO的线性调整率和负载调整率的典型值分别为4.8mV/V和45μV/mA。瞬态响应的最大超调量为70 mV。     

A fully on-chip area-efficient CMOS low-dropout regulator with fast load regulation

Fully integrated voltage regulators with fast transient response and small area overhead are in high demand for on-chip power management in modern SoCs. A fully on-chip low-dropout regulator (LDO) comprised of multiple feedback loops to tackle fast load transients is proposed, designed and simulated in 90?nm CMOS technology. The LDO also adopts an active frequency compensation scheme that only needs a small amount of compensation capacitors to ensure stability. Simulation results show that, by the synergy of those loops, the LDO improves load regulation accuracy to 3???V/mA with a 1.2?V input and 1?V output. For a 100?mA load current step with the rise/fall time of 100?ps, the LDO achieves maximum output voltage drop and overshoot of less than 95?mV when loaded by a 600?pF decoupling capacitor and consumes an average bias current of 408???A. The LDO also features a magnitude notch in both its PSRR and output impedance that provides better suppression upon the spectral components of the supply ripple and the load variation around the notch frequency. Monte Carlo simulations are performed to show that the LDO is robust to process and temperature variations as well as device mismatches. The total area of the LDO excluding the decoupling capacitor is about 0.005?mm². Performance comparisons with existing solutions indicate significant improvements the proposed LDO achieves.     

A Transient-Enhanced Low-Quiescent Current Low-Dropout Regulator With Buffer Impedance Attenuation

This paper presents a low-dropout regulator (LDO) for portable applications with an impedance-attenuated buffer for driving the pass device. Dynamically-biased shunt feedback is proposed in the buffer to lower its output resistance such that the pole at the gate of the pass device is pushed to high frequencies without dissipating large quiescent current. By employing the current-buffer compensation, only a single pole is realized within the regulation loop unity-gain bandwidth and over 65deg phase margin is achieved under the full range of the load current in the LDO. The LDO thus achieves stability without using any low-frequency zero. The maximum output-voltage variation can be minimized during load transients even if a small output capacitor is used. The LDO with the proposed impedance-attenuated buffer has been implemented in a 0.35-mum twin-well CMOS process. The proposed LDO dissipates 20-muA quiescent current at no-load condition and is able to deliver up to 200-mA load current. With a 1-muF output capacitor, the maximum transient output-voltage variation is within 3% of the output voltage with load step changes of 200 mA/100 ns.     

Development of Single-Transistor-Control LDO Based on Flipped Voltage Follower for SoC

The design issues of a single-transistor-control (STC) low-drop-out (LDO) based on flipped voltage follower is discussed in this paper, in particular the feedback stability at different conditions of output capacitors, equivalent series resistances (ESRs) and load current. Based on the analysis, an STC LDO was implemented in a standard 0.35-mum MOS technology. It is proven experimentally that the LDO provides stable voltage regulation at a variety of output-capacitor/ESR conditions and is also stable in no output capacitor condition. The preset output voltage, minimum unregulated input voltage, maximum output current at a dropout voltage of 200 mV, ground current and active chip area are 1 V, 1.2 V, 50 mA, 95 muA, and 140 mum times 320 mum, respectively. The full-load transient response in the no output capacitor case is faster than a micro second and is about 300 ns.     

A robust low quiescent current power receiver for inductive power transmission in bio implants

In this paper, a robust low quiescent current complementary metal-oxide semiconductor (CMOS) power receiver for wireless power transmission is presented. This power receiver consists of three main parts including rectifier, switch capacitor DC–DC converter and low-dropout regulator (LDO) without output capacitor. The switch capacitor DC–DC converter has variable conversion ratios and synchronous controller that lets the DC–DC converter to switch among five different conversion ratios to prevent output voltage drop and LDO regulator efficiency reduction. For all ranges of output current (0–10 mA), the voltage regulator is compensated and is stable. Voltage regulator stabilisation does not need the off-chip capacitor. In addition, a novel adaptive biasing frequency compensation method for low dropout voltage regulator is proposed in this paper. This method provides essential minimum current for compensation and reduces the quiescent current more effectively. The power receiver was designed in a 180-nm industrial CMOS technology, and the voltage range of the input is from 0.8 to 2 V, while the voltage range of the output is from 1.2 to 1.75 V, with a maximum load current of 10 mA, the unregulated efficiency of 79.2%, and the regulated efficiency of 64.4%.     

一种高稳定性高精度低压差线性稳压器的分析与设计

提出了LDO,其基于缓慢滚降式频率补偿方法,通过在电路中引入三个极零对(极零对的产生没有增加静态功耗),不仅克服了常规LDO不能使用低等效串联电阻、低成本陶瓷输出电容的缺点,而且确保了系统在整个负载和输入电压变化范围内稳定工作.由于LDO通常给高性能模拟电路供电,因此其输出电压精度至关重要;而该补偿方法能满足高环路增益、高单位增益带宽的设计要求,从而大幅提高LDO的精度.该LDO基于0.5μm CMOS工艺实现.后仿结果表明,即使在低压满负载条件下,其开环DC增益仍高于70dB,满载时单位增益带宽可达3MHz,线性调整率和负载调整率分别为27μV/V和3.78μV/mA,过冲和欠冲电压均小于30mV,负载电流为150mA时的漏失电压(dropout电压)仅为120mV.     

基于动态频率补偿的LDO电路设计

文中提出了一种基于动态频率补偿技术的LDO电路。通过添加电压缓冲器,提高了LDO的环路增益和瞬态响应特性。该电路通过电流镜采样调整管电流,使主极点频率与第三极点频率随负载电流的改变而产生相同倍数的变化,克服了LDO零极点随负载变化而导致环路稳定性变差的问题。文中设计采用中电二十四所HC12.BJT工艺,利用Spectre仿真工具进行仿真,研究了不同负载电流下该LDO的频率特性及其稳定性问题。仿真结果表明,该电路在10 μA~100 mA负载电流的变化范围内,LDO环路的相位裕度保持在50°~70°之间,证明提出的LDO调整器具有良好的稳定性。     

High slew rate current mode transconductance error amplifier for low quiescent current output-capacitorless CMOS LDO regulator

This paper presents a CMOS low quiescent current output-capacitorless low-dropout regulator (LDO) based on a high slew rate current mode transconductance amplifier (CTA) as error amplifier. Using local common-mode feedback (LCMFB) in the proposed CTA, the order of transfer characteristic of the circuit is increased. Therefore, the slew rate at the gate of pass transistor is enhanced. This improves the LDO load transient characteristic even at low quiescent current. The proposed LDO topology has been designed and post simulated in HSPICE in a 0.18 µm CMOS process to supply the load current between 0 and 100 mA. The dropout voltage of the LDO is set to 200 mV for 1.2–2 V input voltage. Post-layout simulation results reveal that the proposed LDO is stable without any internal compensation strategy and with on-chip output capacitor or lumped parasitic capacitances at the output node between 10 and 100 pF. The total quiescent current of the LDO including the current consumed by the reference buffer circuit is only 3.7 µA. A final benchmark comparison considering all relevant performance metrics is presented.     

Full On-Chip CMOS Low-Dropout Voltage Regulator

This paper proposes a solution to the present bulky external capacitor low-dropout (LDO) voltage regulators with an external capacitorless LDO architecture. The large external capacitor used in typical LDOs is removed allowing for greater power system integration for system-on-chip (SoC) applications. A compensation scheme is presented that provides both a fast transient response and full range alternating current (AC) stability from 0- to 50-mA load current even if the output load is as high as 100 pF. The 2.8-V capacitorless LDO voltage regulator with a power supply of 3 V was fabricated in a commercial 0.35-mum CMOS technology, consuming only 65 muA of ground current with a dropout voltage of 200 mV. Experimental results demonstrate that the proposed capacitorless LDO architecture overcomes the typical load transient and ac stability issues encountered in previous architectures.     

基于高摆率误差放大器的无片外电容LDO设计

为了解决无片外电容低压差线性稳压器(LDO)的瞬态响应性能较差的问题,采用跨导提高技术设计了一种高摆率的误差放大器.在误差放大器的基础上,通过电容将LDO的输出端耦合至电流镜构建瞬态增强电路,提升LDO的瞬态响应能力,且瞬态增强电路可以引入两个左半平面零点,改善环路的稳定性.同时,误差放大器采用动态偏置结构,进一步减小...     

0.13μm BiCMOS低压差线性稳压器

设计了一种0.13μm BiCMOS低压差线性稳压器(LDO),包括BiCMOS误差放大器、带软启动的BiCMOS带隙基准源、"套筒式"共源-共栅补偿电路等。为了改善线性瞬态响应性能,在BiCMOS误差放大器的前级设置了动态电流偏置电路。由于所设计的BiCMOS带隙基准源对温度的敏感性较小,故能为LDO提供高精度的基准电压。对所设计的LDO进行了工艺流片。流片测试结果表明,该LDO可提供60 mA的输出电流且最小压差只有100 mV。测试同时验证了所设计LDO的负载和瞬态响应都得到改善:负载调整率为0.054 mV/mA,线性调整率为0.014%,而芯片面积约为0.094 mm2,因此特别适用于高精度、便携式片上电源系统。     

一种全集成型CMOS LDO线性稳压器设计

设计了一种基于0.25μm CMOS工艺的低功耗片内全集成型LDO线性稳压电路。电路采用由电阻电容反馈网络在LDO输出端引入零点,补偿误差放大器输出极点的方法,避免了为补偿LDO输出极点,而需要大电容或复杂补偿电路的要求。该方法电路结构简单,芯片占用面积小,无需片外电容。Spectre仿真结果表明：工作电压为2.5 V,电路在较宽的频率范围内,电源抑制比约为78 dB,负载电流由1 mA到满载100 mA变化时,相位裕度大于40°,LDO和带隙电压源的总静态电流为390μA。     

一种快速瞬态响应的无片外电容LDO的设计

基于上华0.5μm工艺,设计了输入电压范围为3.5～6.5V,输出电压为3.3V,最大输出电流为100mA的CMOS无片外电容的低压差线性稳压器.提出了一种自动检测网络用来快速感应负载电流的变化,抑制输出电压的跳变,改善了负载瞬态响应.在稳定性方面,采用miller补偿,加之第二级采用了输出电阻很小的buffer结构[1],这样主极点和次极点分离很远使得系统稳定.仿真表明,该LDO在VIN=6.5V和VIN=3.5V下under-shoot分别为156mV和135mV,overshoot分别为145mV和60mV,线性调整率和负载调整率分别为0.023%和0.5%.