Nested Digital Background Calibration of a 12-bit Pipelined ADC Without an Input SHA

To reduce power dissipation, the input sample-and-hold amplifier (SHA) is eliminated in a pipelined analog-to-digital converter (ADC) with nested background calibration. The nested architecture calibrates the pipelined ADC with an algorithmic ADC that is also calibrated. Without an input SHA, a timing difference between the sampling instants of the two ADCs creates an error that interferes with calibration of the pipelined ADC. This problem is overcome with digital background timing compensation. It uses a differentiator with fixed coefficients to build an adaptive interpolator. With a 58-kHz sinusoidal input, the 12-bit 20-Msample/s pipelined ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 70.2 dB, a spurious-free dynamic range (SFDR) of 80.3 dB, and an integral nonlinearity (INL) of 0.75 least significant bit (LSB). With a 9-MHz input, the SNDR is 64.2 dB, and the SFDR is 78.3 dB. About 2 million samples or 0.1 s are required for convergence. The prototype occupies 7.5 mm² in 0.35-mum CMOS and dissipates 231 mW from 3.3 V, which is 23 mW less than in a previous prototype with the input SHA.     

A 1.8-V 22-mW 10-bit 30-MS/s Pipelined CMOS ADC for Low-Power Subsampling Applications

This paper describes a 10-bit 30-MS/s subsampling pipelined analog-to-digital converter (ADC) that is implemented in a 0.18 mum CMOS process. The ADC adopts a power efficient amplifier sharing architecture in which additional switches are introduced to reduce the crosstalk between the two opamp-sharing successive stages. A new configuration is used in the first stage of the ADC to avoid using a dedicated sample-and-hold amplifier (SHA) circuit at the input and to avoid the matching requirement between the first multiplying digital-to-analog converter (MDAC) and flash input signal paths. A symmetrical gate-bootstrapping switch is used as the bottom-sampling switch in the first stage to enhance the sampling linearity. The measured differential and integral nonlinearities of the prototype are less than 0.57 least significant bit (LSB) and 0.8 LSB, respectively, at full sampling rate. The ADC exhibits higher than 9.1 effective number of bits (ENOB) for input frequencies up to 30 MHz, which is the twofold Nyquist rate (fs/2), at 30 MS/s. The ADC consumes 21.6 mW from a 1.8-V power supply and occupies 0.7 mm², which also includes the bandgap and buffer amplifiers. The figure-of-merit (FOM) of this ADC is 0.26 pJ/step.     

一种数字CMOS工艺制造的10位100MS/s流水线ADC

介绍了采用0.18μm数字工艺制造、工作在3.3V下、10位100MS/s转换速率的流水线模数转换器。提出了一种适用于1.5位MDAC的新的金属电容结构,并且使用了高带宽低功耗运算放大器、对称自举开关和体切换的PMOS开关来提高电路性能。芯片已经通过流片验证,版图面积为1.35mm×0.99mm,功耗为175mW。14.7MS/s转换速率下测得的DNL和INL分别为0.2LSB和0.45LSB,100MS/s转换速率下测得的DNL和INL分别为1LSB和2.7LSB,SINAD为49.4dB,SFDR为66.8dB。     

一种10bit双通道流水线SAR ADC设计

为了提高模数转换器的采样频率并降低其功耗,提出一种10 bit双通道流水线逐次逼近型（SAR）模数转换器（ADC）。提出的ADC包括两个高速通道,每个通道都采用流水线SAR结构以便低功率和减小面积。考虑到芯片面积、运行速度以及电路复杂性,提出的处于第二阶段的SAR ADC由1 bit FLASH ADC和6 bit SAR ADC组成。提出的ADC由45 nm CMOS工艺制作而成,面积为0.16 mm2。ADC的微分非线性和积分非线性分别小于0.36 最低有效位（LSB）和0.67 LSB。当电源为1.1 V时,ADC的最大运行频率为260 MS/s。运行频率为230 MS/s和260 MS/s的ADC的功率消耗分别为13.9 mW和17.8 mW。     

A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration

Digital calibration using adaptive signal processing corrects for offset mismatch, gain mismatch, and sample-time error between time-interleaved channels in a 10-b 120-Msample/s pipelined analog-to-digital converter (ADC). Offset mismatch between channels is overcome with a random chopper-based offset calibration. Gain mismatch and sample-time error are overcome with correlation-based algorithms, which drive the correlation between a signal and its chopped image or its chopped and delayed image to zero. Test results show that, with a 0.99-MHz sinusoidal input, the ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 56.8 dB, a peak integral nonlinearity of 0.88 least significant bit (LSB), and a peak differential nonlinearity of 0.44 LSB. For a 39.9-MHz sinusoidal input, the ADC achieves a peak SNDR of 50.2 dB. The active area is 5.2 mm/sup 2/, and the power dissipation is 234 mW from a 3.3-V supply.     

A 14-b 20-Msamples/s CMOS pipelined ADC

The capacitor error-averaging technique, updated with look-ahead decision and digital correction, is used to demonstrate a 14-b 20-Msamples/s pipelined analog-to digital converter (ADC) with no trimming or calibration. The prototype ADC exhibits a differential nonlinearity (DNL) of +0.23/-0.28 least significant bit (LSB), an integral nonlinearity (INL) of +0.95/-1.06 LSB, a spurious-free dynamic range (SFDR) of 91.6 dB, and a signal-to-noise ratio (SNR) of 74.2 dB with a 1-MHz input and a 20-MHz clock. The prototype in 0.5-μm CMOS occupies an area of 4.5×2.4 mm² and consumes 720 mW at 5 V     

An Ultra Low Energy 12-bit Rate-Resolution Scalable SAR ADC for Wireless Sensor Nodes

A resolution-rate scalable ADC for micro-sensor networks is described. Based on the successive approximation register (SAR) architecture, this ADC has two resolution modes: 12 bit and 8 bit, and its sampling rate is scalable, at a constant figure-of-merit, from 0-100 kS/s and 0-200 kS/s, respectively. At the highest performance point (i.e., 12 bit, 100 kS/s), the entire ADC (including digital, analog, and reference power) consumes 25 muW from a 1-V supply. The ADC's CMRR is enhanced by common-mode independent sampling and passive auto-zero reference generation. The efficiency of the comparator is improved by an analog offset calibrating latch, and the preamplifier settling time is relaxed by self-timing the bit-decisions. Prototyped in a 0.18-mum, 5M2P CMOS process, the ADC, at 12 bit, 100 kS/s, achieves a Nyquist SNDR of 65 dB (10.55 ENOB) and an SFDR of 71 dB. Its INL and DNL are 0.68 LSB and 0.66 LSB, respectively     

A 6-b 1.3-Gsample/s A/D converter in 0.35-μm CMOS

A 6-b Nyquist A/D converter (ADC) that converts at 1.3 GHz is reported. Using array averaging and a wideband track-and-hold, a 6-b flash ADC achieves better than 5.5 effective bits for input frequencies up to 630 MHz at 1 Gsample/s, and five effective bits for 650-MHz input at 1.3 Gsample/s. Peak INL and DNL are less than 0.35 LSB and 0.2 LSB, respectively. This ADC consumes about 500 mW from 3.3 V at 1Gsample/s. The chip occupies 0.8-mm² active area, fabricated in 0.35-μm CMOS     

A 1.2-V 19.2-mW 10-bit 30-MS/s pipelined ADC in 0.13-icm CMOS

A 10-bit 30-MS/s pipelined analog-to-digital converter (ADC) is presented.For the sake of lower power and area,the pipelined stages are scaled in current and area,and op amps are shared between the successive stages.The ADC is realized in the 0.13-tt,m 1-poly 8-copper mixed signal CMOS process operating at 1.2-V supply voltage.Design approaches are discussed to overcome the challenges associated with this choice of process and supply voltage,such as limited dynamic range,poor analog characteristic devices,the limited linearity of analog switches and the embedded sub-1-V bandgap voltage reference.Measured results show that the ADC achieves 55.1-dB signal-to-noise and distortion ratio,67.5-dB spurious free dynamic range and 19.2-mW power under conditions of 30 MSPS and 10.7-MHz input signal.The FoM is 0.33 pJ/step.The peak integral and differential nonlinearities are 1.13 LSB and 0.77 LSB,respectively.The ADC core area is 0.94 mm2.     

A 10-b 150-MSample/s 1.8-V 123-mW CMOS A/D converter with 400-MHz input bandwidth

This work describes a 10-b 150-MSample/s 4-b-per-stage single-channel CMOS pipelined ADC incorporating improved gate-bootstrapping techniques for a wideband SHA and temperature- and supply-insensitive CMOS references. The proposed ADC is designed and fabricated in a 0.18-/spl mu/m one-poly six-metal CMOS technology. The measured differential and integral nonlinearities are within 0.69 LSB and 1.50 LSB, respectively. The prototype ADC shows a peak signal-to-noise-and-distortion ratio (SNDR) of 52 dB at 150 MSample/s. The ADC maintains the SNDR over 52 dB and 43 dB, respectively, for input frequencies up to the Nyquist frequency and 400 MHz at 140 MSample/s. The active die area is 2.2 mm/sup 2/ and the chip consumes 123 mW at 150 MSample/s.     

14 bit 50 ms/s 0.18 μm CMOS pipeline ADC based on digital error calibration

Described is a 14 bit 50 MS/s CMOS four-stage pipeline A/D converter (ADC)-based on a digital code-error calibration. The proposed calibration technique measures the capacitor mismatch errors of the front-end multiplying DAC (MDAC) with the back-end pipeline stages while the measured code errors are stored in memory and corrected in the digital domain during normal conversion. The calibration needs the increased power dissipation and chip area of 1.4 and 10.7 , respectively, compared to a 14 bit uncalibrated conventional pipeline ADC. The prototype ADC fabricated in a 0.18 um CMOS process occupies an active die area of 4.2 mm² and consumes 140 mW at 1.8 V and 50 MS/s. After calibration, the measured DNL and INL of the ADC are improved from 0.69 to 0.39 LSB and from 33.60 to 2.76 LSB, respectively.     

A 14-bit digitally self-calibrated pipelined ADC with adaptive bias optimization for arbitrary speeds up to 40 MS/s

This paper presents a 14-bit digitally self-calibrated pipelined analog-to-digital converter (ADC) featuring adaptive bias optimization. Adaptive bias optimization controls the bias currents of the amplifiers in the ADC to the minimum amount required, depending on the sampling speed, environment temperature, and power-supply voltage, as well as the variations in chip fabrication. It utilizes information from the digital calibration process and does not require additional analog circuits. The prototype ADC occupies an area of 0.5/spl times/2.3 mm/sup 2/ in a 0.18-/spl mu/m dual-gate CMOS technology; with a power supply of 2.8 V, it consumes 19.2, 33.7, 50.5, and 72.8 mW when operating at 10, 20, 30, and 40 MS/s, respectively. The peak differential nonlinearity (DNL) is less than 0.5 least significant bit (LSB) for all the sampling speeds with temperature variation up to 80/spl deg/C. When operated at 20 MS/s with 1-MHz input, the ADC achieves 72.1-dB SNR and 71.1-dB SNDR.     

Low-power CMOS fully-folding ADC with a mixed-averaging distributed T/H circuit

This paper describes an 8-bit 125 Mhzlow-powerCMOS fully-foldinganalog-to-digital converter(ADC).A novel mixed-averaging distributed T/H circuit is proposed to improve the accuracy. Folding circuits are not only used in the fine converter but also in the coarse one and in the bit synchronization block to reduce the number of comparators for low power. This ADC is implemented in 0.5μm CMOS technology and occupies a die area of 2 × 1.5 mm~2. The measured differential nonlinearity and integral nonlinearity are 0.6 LSB/-0.8 LSB and 0.9 LSB/-1.2 LSB, respectively. The ADC exhibits 44.3 dB of signal-to-noise plus distortion ratio and 53.5 dB of spurious-free dynamic range for 1 MHz input sine-wave. The power dissipation is 138 mW at a sampling rate of 125 MHz at a 5 V supply.     

A 12-bit self-calibrating SAR ADC achieving a Nyquist 90.4-dB SFDR

This paper describes a 10 or 12 bit programmable successive approximation register ADC for bridge stress monitoring systems requiring high-resolution, high linearity, low power and small size. Its sampling rate is scalable, from 0 to 200 kS/s. The proposed ADC employs a novel time-domain comparator with offset cancellation. Prototyped in a 0.18-μm, 6MIP CMOS process, the ADC, at 12 bit, 100 kS/s, achieves a Nyquist SNDR of 68.74 dB (11.13), an SFDR of 90.36 dB, while dissipating 579.6 μW from a 1.8-V supply. The on-chip calibration improves the DNL from +0.2/?0.74 LSB to +0.23/?0.25 LSB and INL from +1.27/?0.97 LSB to +0.41/?0.4 LSB.     

A 10-bit 30-MS/s successive approximation register analog-to-digital converter for low-power sub-sampling applications

A 10-bit 30-MS/s successive approximation register analog-to-digital converter (ADC), which is suitable for low-power sub-sampling applications, is presented. Bootstrapped switches are used to enhance the sampling linearity at the high input frequency. The proposed ADC adopts a binary-weighted split-capacitor array with the energy efficient switching procedure and includes an asynchronous clock scheme to yield more power and speed-efficiency. The ADC is fabricated in a 65 nm complementary metal-oxide-semiconductor technology and occupies an active area of 0.07 mm². The differential and integral nonlinearities of the ADC are less than 0.82 and 1.13 LSB, respectively. The ADC shows a signal-to-noise-distortion ratio of 56.60 dB, a spurious free dynamic range of 73.35 dB, and an effective number of bits (ENOB) of 9.11-bits with a 2.5-MHz sinusoidal input at 30-MS/s. It exhibits higher than 8.86 ENOB for input frequencies up to 78-MHz. The ADC consumes 0.85 mW at a 1.1 V supply and achieves a figure-of-merit of 51 fJ/conversion-step.     

A 4-GS/s 4-bit Flash ADC in 0.18- μm CMOS

A 4-bit noninterleaved flash ADC implemented in 0.18-mum digital CMOS achieves a sampling rate of 4 GS/s. A 32 mum by 32 mum, on-chip differential inductor in each comparator extends the sampling rate without an increase in power consumption. A combination of DAC trimming and comparator redundancy reduces the measured DNL and INL to less than 0.15 LSB and 0.24 LSB, respectively. The measured ENOB with a 100 MHz full-power input is 3.84 bits and 3.48 bits, at 3 GS/s and 4GS/s, respectively. The ADC achieves a bit error rate of less than 10^-11 at 4 GS/s.     

A 10-bit 50 MS/s Pipelined ADC With Capacitor-Sharing and Variable-$g_{m}$ Opamp

A pipelined analog-to-digital converter (ADC) architecture which is suitable for low power and small area is presented. The prototype ADC achieves 10-bit resolution with only two opamps by removing a front-end sample-and-hold amplifier (SHA) and sharing an opamp between two successive pipeline stages. The errors from the absence of SHA and opamp-sharing are greatly reduced by the proposed techniques and circuits. Further reduction of power and area is achieved by using a capacitor-sharing technique and variable- $g_{m}$ opamp. The ADC is implemented in 0.18 $muhbox{m}$ CMOS technology and occupies a die area of 0.86 ${hbox{mm}}^{2}$. The differential and integral nonlinearity of the ADC are less than 0.39 LSB and 0.81 LSB, respectively, at full sampling rate. The ADC achieves 56.2 dB signal-to-noise plus distortion ratio, 72.7 dB spurious free dynamic range, ${-}$66.2 $~$dB total harmonic distortion, 9.03 effective number of bits for a Nyquist input at full sampling rate, and consumes 12 mW from a 1.8 V supply.      

采用改进型1.5位/级结构的10位100MHz流水线模数转换器

介绍了一个采用改进型1.5位/级结构的10位100MHz流水线结构模数转换器.测试结果表明,模数转换器的信噪失真比最高可以达到57dB,在100MHz输入时钟下,输入信号为57MHz的奈奎斯特频率时,信噪失真比仍然可以达到51dB.模数转换器的差分非线性和积分非线性分别为0.3LSB和1.0LSB.电路采用0.18μm混合信号CMOS工艺实现,芯片面积为0.76mm2.     

A 10-bit 50-MS/s subsampling pipelined ADC based on SMDAC and opamp sharing

This paper describes a 10-bit,50-MS/s pipelined A/D converter(ADC) with proposed area- and power-efficient architecture.The conventional dedicated sample-hold-amplifier(SHA) is eliminated and the matching requirement between the first multiplying digital-to-analog converter(MDAC) and sub-ADC is also avoided by using the SHA merged with the first MDAC(SMDAC) architecture,which features low power and stabilization.Further reduction of power and area is achieved by sharing an opamp between two successive pi...     

A digital background calibration technique for time-interleavedanalog-to-digital converters

A 10-bit 40-Msample/s two-channel parallel pipelined ADC with monolithic digital background calibration has been designed and fabricated in a 1 μm CMOS technology. Adaptive signal processing and extra resolution in each channel are used to carry out digital background calibration. Test results show that the ADC achieves a signal-to-noise-and-distortion ratio of 55 dB for a 0.8-MHz sinusoidal input, a peak integral nonlinearity of 0.34 LSB, and a peak differential nonlinearity of 0.14 LSB, both at a 10-bit level. The active area is 42 mm², and the power dissipation is 565 mW from a 5 V supply