固定间隙的空气式静电放电

为更好地研究空气式静电放电,利用新型ESD模拟测试系统研究了固定间隙的空气式静电放电特性。在较宽范围的电压电平下,用数字存储示波器测量放电电流的上升时间、峰值、自制金属半圆环上的耦合电压峰-峰值,并记录了放电电流和耦合电压的波形。分析测量结果及其与放电电压和放电间隙之间的变化关系,可知在一定的间隙间距上,放电电流随着放电电压的增大而增大,高压放电也能产生上升沿比较陡的电流脉冲;在一定的放电电压下,存在着一个放电间隙间距使得放电电流峰值最大或耦合电压最大;不同电压下的频谱分布和能量分布不一样。     

空气式静电放电抗扰度试验方法

静电放电(electrostatic discharge,ESD)抗扰度试验作为电磁兼容(EMC)试验的一项重要内容,其执行标准IEC 61000-4-2还存在诸多问题,尤其是空气式ESD的重复性问题。为此,基于动能-势能转换原理,采用导轨带动电极运动结构和步进电机装置,用近似单摆结构的试验方法,设计和研制了2种新的ESD抗扰度试验平台,实现了空气式ESD抗扰度试验中对放电电极接近速度的准确控制。利用这2种ESD抗扰度试验平台对空气式ESD的重复性进行了研究。试验结果表明,ESD参数如放电电流峰值、接近速度和放电电压具有很好的规律性,并且在一定的放电电压和接近速度下,空气式ESD也可以具有较好的重复性。在相同放电电压和接近速度下,利用第2种ESD抗扰度试验平台得到的放电电流峰值和上升时间的变异系数均小于利用第1种ESD抗扰度试验平台得到的放电电流峰值和上升时间的变异系数,因此第2种单摆式ESD抗扰度试验平台的重复性要好于第1种ESD抗扰度试验平台的重复性。     

空气间隙固定和连续变化时的空气静电放电事件研究

为得到2种状态下空气静电放电（ESD）辐射电磁场与放电间隙间距、放电电压和电极接近速度之间的关系,在-30～30kV的宽电压范围和多种温湿度条件下,通过实验测量记录了两种状态的空气ESD事件;给出了空气ESD事件的解释;提出了空气ESD存在“增长间隙区”、“跌落间隙区”、“平坦间隙区”和“零放电间隙区”4个放电间隙区。...     

对空气式静电放电的研究

为改善空气放电模拟方法,用静电放电模拟测试装置研究了IEC标准规定的空气式静电放电的放电特性。通过手动方式使充电后的放电电极快速靠近电流靶获得空气静电放电事件,放电电压具有2~20 kV较宽范围的电压电平和正负电压极性。利用Agilent数字存储示波器测量了空气静电放电放电电流的上升时间、峰值以及耦合到自制的金属半圆环上的峰-峰值电压,并记录了放电电流和耦合电压的波形。通过分析和比较测量结果研究了测量参数随放电电平的变化趋势。空气放电电流的特性与静电放电抗扰度试验标准IEC 61000-4-2对接触式放电的规定类似,耦合电压与放电电压之间没有直接的相关性。实验表明在一定电压范围、电极速度可控时可能获得空气放电的重复性。     

影响空气式静电放电特性的相关因素分析

为了提高静电放电特别是空气式静电放电试验结果的重复性,从理论和试验两方面对影响空气式静电放电(ESD)特性的相关因素进行了研究,结果表明:电弧长度是影响空气式ESD特性的一个最直接因素,不同电弧长度会得到差别很大的空气式ESD事件,相同放电条件下,电弧长度越短,峰值电流越大,上升时间越小;其它条件一定的情况下,电极的接近速度会影响到电弧长度而引入时间相关效应,进而影响空气式ESD特性,比如当放电电压一定时,接近速度越快,峰值电流越大,上升时间越小;不同的放电电极极性将产生空间极性效应或空间电荷效应,从而影响空气式ESD特性;不同的环境条件尤其是空气成分与空气湿度对空气式ESD的影响很大。这些研究成果将为空气式ESD的试验规律研究提供理论依据。     

空气静电放电若干特性分析

针对国际电工委员会标准IEC61000-4-2静电放电抗扰度试验方法存在的问题,对影响空气静电放电的一个重要因素-电弧结构进行了讨论。在此基础上,利用新研制的静电放电模拟测试系统,分析了接近速度和放电电压对放电电流峰值、上升时间、感应电压峰—峰值以及试验结果重复性的影响。试验结果表明:放电电压一定时,放电电流峰值、感应电压峰-峰值随接近速度的增大而增大;上升时间随接近速度的增大而减小;在一定的接近速度和放电电压下,空气静电放电也可以实现较好的重复性。这些规律性的试验结果,为建立静电放电抗扰度试验新方法提供了依据。     

一种新型ESD电压发生器的设计与调试

针对静电放电(Electro-static Discharge.简称ESD)对芯片造成损伤的现象,研究了静电放电发生的过程及产生的原因.首先阐述了几种常见的模拟静电放电过程的模型,然后利用彩色电视机的一体式行回扫变压器作为直流高压源、串联SCR作为高压开关,设计并制作出符合IEEE Std C62,38-1994标准的ESD人体模型实验发生仪器,并对ESD人体放电模型中的body/finger模型进行了实验模拟.最后给出放电电压为4kV时测量的ESD电流脉冲波形,并与理想放电波形进行对比,其结果验证了该方案的可行性和易操作性.     

ESD发生器开关动作对抗扰度试验的影响

分析了人体-金属静电放电(ESD)发生器开关动作的基本过程;说明了在ESD抗扰度试验中ESD发生器开关动作的影响。通过空气放电模拟测试装置测量并记录了ESS-200 AX、SANKI NS61000-2A和NSG-435 3种ESD发生器开关动作的影响。由小环耦合电压的测量研究了ESD发生器开关动作产生的辐射场。结果表明,使用不同的ESD发生器开关动作的影响程度不一样,且使用相同的ESD发生器开关闭合和开关释放的影响存在差异。对小环耦合电压的频谱分析表明,开关动作会产生频谱范围较宽的电磁骚扰,影响对高速逻辑器件的ESD抗扰度试验。在进行ESD抗扰度试验时,需考虑ESD辐射场,尤其需要降低或控制ESD发生器开关动作产生的辐射场。     

ESD脉冲对集成电路损伤效应的实验研究

为了研究复杂波形脉冲对集成电路的损伤效应,用改变ESD模拟器放电参数产生的不同的静电放电脉冲对某集成电路芯片进行了注入损伤效应实验。给出了各主要的损伤参数与放电电压的散点图,并借助曲线拟合的方法进行了分析。结果表明:IC芯片注入通路上的电阻在脉冲波形发生变化时变化不大,电流随放电电压增大;芯片上的峰值功率及峰值能量与放电电压满足P(W)=AUBD。最后,比较了各脉冲注入下器件的主要参数损伤阈值,得到结论:ESD模拟器放电参数改变对器件损伤阈值大小的影响在1~2倍间,相同参数在不同注入脉冲下的阈值处于同数量级。     

印制电路板静电放电的防护设计

印制电路板存在静电放电（ESD）的干扰,静电放电能够通过功能端口及可接触的地方进入装置。抑制静电放电就是防止高电压脉冲通过辐射和传导影响系统功能。本文从静电放电的产生分析,对印制板电路抗干扰设计提出了参考设计方法。     

Characteristic measurement of discharge current injected by the air discharge of an ESD gun onto a ground

An immunity testing method for electrostatic discharge (ESD) is being specified in IEC 61000‐4‐2, in which the contact discharge of an ESD gun is being normally specified. Air discharge testing is known to be a severe immunity test compared to contact discharge testing, while the discharge current injected is not well reproduced. Grasping the behavior of the current injected by the air discharge would be helpful in establishing the worst‐case ESD immunity testing. We previously measured the discharge currents for air discharge testing onto the IEC‐recommended current transducer with a commercially available ESD gun, and showed that there exists a specific relationship of Ip·tr^ξ/V_c=constant (ξ=0.75), between rise time tr and current peak Ip. The current transducer, however, has a frequency‐dependent transfer impedance which should affect the measured current waveform. In this study, we investigated whether the above‐mentioned specific relationship can be obtained for air discharge of an ESD gun onto a ground that assumes a metal enclosure of electronic equipment under test. A method was presented for estimating the discharge current from simultaneously measured magnetic fields with two magnetic field probes regardless of the distance between the gun discharge‐point and the probe position. This method was validated for contact discharge of an ESD gun to an SMA connector. With this method, we estimated the discharge currents injected onto a ground for air discharge testing of an ESD gun with intentionally fast and slow approaches. As a result, we could confirm a specific relationship between rise time tr and current peak Ip of Ip·tr^ξ/V_c=constant with ξ=0.57 independent of charge voltages and gun approaches. © 2007 Wiley Periodicals, Inc. Electr Eng Jpn, 158(4): 51– 59, 2007; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.20454     

Equivalent circuit modeling of discharge current injected in contact with an ESD‐gun

The transient electromagnetic (EM) fields caused by an electrostatic discharge (ESD) have broadband frequency spectra, which cause serious failure to high‐tech information equipment. From this perspective, ESD testing for the EM immunity of the equipment is specified by IEC 61000‐4‐2, in which the detailed waveform of the discharge current injected onto the IEC recommended Pellegrini target in contact with an ESD‐gun is prescribed for calibration. However, the factors for determining the current waveform remain unclear, and thus the IEC prescribed current waveform is unlikely to be injected into actual equipment. In this study, based on the structure of an ESD‐gun, an equivalent circuit modeling is proposed for analyzing the discharge current injected onto a 50‐Ω SMA connector instead of the IEC target that has frequency‐dependent transmission characteristics. Its validity is confirmed by comparing the calculated current waveform with the measured result. The proposed circuit modeling is also validated from measurement of the discharge current injected onto a transmission line by the ESD‐gun. © 2004 Wiley Periodicals, Inc. Electr Eng Jpn, 149(1): 8–14, 2004; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.10367     

Calculation of magnetic near field generated by the contact discharge of an ESD gun

An ESD (electrostatic discharge) testing is specified in the IEC 61000‐4‐2, in which the detailed waveform of the discharge current injected by an ESD gun is prescribed. However, due to lack of understanding of the discharge process, it is difficult to confirm whether or not the IEC current waveform can be injected onto actual equipment. We thus previously proposed an equivalent circuit model for the ESD gun based on its geometrical structure, and showed decisive factors for the discharge current. In this study, in order to confirm the feasibility of the above equivalent circuit model, we measured with a 6‐GHz wide‐band digital oscilloscope the discharge current through an SMA connector and the resultant magnetic near field for the contact discharge of an ESD gun. As a result, we found that both measured waveforms approximately agree with those calculated from our equivalent circuit model. We then measured with respect to charge voltages the magnetic near fields for the contact discharge of the ESD gun to the ground, which revealed that the measured waveform around the first peak is in fair agreement with the calculated one. Furthermore, we found that the magnetic field peak increases with increasing charge voltage, whose dependence can be predicted from our equivalent model. © 2005 Wiley Periodicals, Inc. Electr Eng Jpn, 153(1): 17–24, 2005; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/eej.20194     

考虑寄生参数影响的芯片RC-HBM静电测试模型

采用常规的人体模型(Human Body Model, HBM)进行静电释放(Electro-Static Discharge, ESD)测试时往往容易受到寄生参数的影响,使得电源芯片抗静电能力测量值与实际抗静电能力存在偏差,导致劣质产品通过HBM ESD测试,影响电源芯片产品良品率的提升。为此,提出了一种RC-HBM模型,通过引入RC并联支路,校正因寄生参数引起的静电放电电流的偏差,满足电源芯片静电可靠性测试的要求。首先阐述了静电对电源芯片的损坏机理。其次,分析了寄生参数对ESD电流的影响,阐述了常规HBM ESD测试的局限性。并提出了一种新型的RC-HBM模型,给出了RC并联支路参数的设计依据。最后,通过批量实验验证了所提RC-HBM模型的准确性和合理性。     

IEC61000-4-2标准试验平台的局限性分析及其完善的探讨

为解决国际标准IEC 61000-4-2规定的静电放电(ESD)抗扰度试验平台存在的局限性,通过分析ESD模拟器开关动作、ESD电流及其导数、ESD辐射场、试验结果的判定准则和试验方法的不完善规范对ESD抗扰度试验的影响,探讨了IEC标准试验平台问题存在的原因.研究发现,ESD模拟器开关动作对试验结果会产生很大影响,其...     

A modified LDMOS device with improved ESD protection performance

A modified lateral‐diffusion metal–oxide–semiconductor (MLDMOS) device with improved electrostatic discharge (ESD) protection performance is proposed for high‐voltage ESD protection. In comparison with the traditional LDMOS and the LDMOS with an embedded silicon‐controlled rectifier (LDMOS‐SCR), the proposed device has better ESD robustness and higher holding voltage. By optimizing key parameters, such as the spacing between the drain and the poly gate, the effective channel length, and the number of fingers, the MLDMOS can achieve a maximum failure current over 80 mA/µm, which is larger than that of LDMOS‐SCR. © 2014 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.     

Variations in discharge current waveforms and their power spectra injected from contact discharges of ESD‐gun with different arrangements

The International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000‐4‐2) of electronic equipment against electrostatic discharges (ESDs), in which a discharge current to be injected onto equipment under test is specified. As for the waveform, however, not the whole waveform but only the rise time, the first peak, and the current amplitudes at 30 and 60 ns are given in the time domain together with their uncertainties, which are required to check on the condition that an ESD generator (ESD‐gun) shall be arranged vertically to an IEC‐recommended calibration target and its earth return wire is kept away as far as possible from a vertical ground plane (IEC standard arrangement). In this study, to clarify how arrangements of an ESD‐gun and its earth return wire affect discharge currents, we measured discharge current waveforms for contact discharges of an ESD‐gun onto an IEC calibration target with respect to various inclinations of the ESD‐gun and arrangements of its earth return wire, and also calculated their current power spectra normalized to that of the discharge current for the IEC standard arrangement. As a result, we found that inclinations of the ESD gun affect the first peak current, which increases current power spectra by 14 dB at frequencies over 300 MHz, and that arrangements of the return wire influence the current waveforms between the first and second peaks, which provides variations in power spectra by ±12 dB in the frequency range from 10 MHz to 200 MHz. This finding suggests that arrangements of an ESD‐gun and its earth return wire are likely to cause different immunity test results. It was also found that in comparison with measured discharge currents for the standard arrangement, the calculated waveform of a discharge current from a formula, which has been included in the recent standard, has a more gentle falling waveform, and produces power spectra of +15 dB in the frequency range from 10 MHz to 200 MHz and –12 dB at frequencies over 300 MHz. © 2012 Wiley Periodicals, Inc. Electr Eng Jpn, 180(1): 9–14, 2012; Published online in Wiley Online Library ( wileyonlinelibrary.com ). DOI 10.1002/eej.21270     

聚合物ESD抑制器抑制特性的测试方法

为了消除静电放电时产生的辐射场对静电放电抑制器测试结果的影响,基于法拉第笼的屏蔽效应、依据国际电工委员会IEC61000-4-2标准和国军标GJB911-1990,利用静电放电模拟器和静电放电电流波形测试装置等设备,测试了某型号聚合物静电放电抑制器的抑制特性。测试结果表明,采用IEC61000-4-2标准规定的电流靶结合法拉第笼的方法,测试静电放电时通过抑制器的电流,能够保证电流波形不失真;而加在抑制器两端的电压,须使用有效带宽足够宽的电压探头配合示波器来测量,同时应尽可能消除静电放电时产生的辐射场对电压探头的影响。