Single-step phase-shifting speckle interferometry

We propose a simplified technology of recording and processing speckle interferograms with phase shift that does not require the calibration of the phase-shifting devices and allows one to use the minimum possible number of images. We present the data on the verification of the algorithms and the results of experiments aimed at the investigation of the displacements of the surfaces of metal specimens and performed according to the proposed technology. __________ Translated from Fizyko-Khimichna Mekhanika Materialiv, Vol. 43, No. 4, pp. 93–102, July–August, 2007.     

Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry

A method for the isolation of two-dimensional (2D) displacement components by using one phase map obtained by phase-shifting electronic speckle pattern interferometry (ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation is measured. If the deformation of the object is symmetrical, two components of deformation can be separated from each other by using the mixed phase distribution. We turn over the mixed phase map first to obtain the second phase map, and then overlap them. Two displacement components can be separated from each other by boundary alignment and algebraic calculation between the two phase maps. This method has been proved feasible by a typical three-point bending experiment. Some experimental results are offered and compared with the results obtained by a dual-beam symmetrical illuminations experiment. This technique presented provides an alternative approach to 2D deformation measurement.     

Systematic errors of phase-shifting speckle interferometry

A theoretical and numerical investigation of the systematic phase errors in phase-shifting speckle interferometry is presented. The theoretical investigation analyzes the behavior of some systematic error induced by intensity variations in two cases of data-computing techniques. The first case deals with the technique in which the phase change is computed, unwrapped, and then linearly filtered; the second case deals with the technique in which the data are linearly filtered before the arctangent calculation and then unwrapped. With the first filtering technique it is shown that it is preferable when the phase change is of relatively low spatial frequency, leading to a particularly accurate method. With the second case it is demonstrated that an important parameter of speckle interferometry is the modulation factor of the interference frame that induces phase errors when the data are filtered before the arctangent calculation. We show that this technique is better than the first when the phase change is composed of high-spatial-frequency variations. The theoretical investigation of the two techniques is compared with numerical simulations, considering the frequency characteristics of the phase change, and this shows a good match between theory and simulations.     

Decorrelation-induced phase errors in phase-shifting speckle interferometry

The purpose of this research is the quantitative investigation of decorrelation-induced phase errors in speckle interferometry. Measurements in speckle interferometry are inherently affected by decorrelation, i.e., by alterations of the speckle fields during measurement. Likewise, the random phases carrying the interferometric information change during decorrelation. Image plane and pupil plane decorrelation are considered for both smooth and speckle reference wave interferometers. Since the decorrelation effect depends on the aperture and the pixel size, the calculations include not only the case of speckles being well resolved by the camera but also the case of unresolved speckles. Different standard deviations of the phase error are obtained from the probability density of the pixel modulation and the phase before and after decorrelation. Most cases (apart from pupil plane decorrelation in speckle reference wave setups) appear to obey exactly the same phase error statistics. In particular, the number of speckles per pixel does not affect the phase error distribution over the whole image. The only important parameters determining the decorrelation-induced phase errors are the amount of decorrelation and the pixel modulation.     

Reconstruction of surfaces from phase-shifting speckle interferometry: Bayesian approach

The reconstruction of surfaces from speckle interferometry data is a demanding data-analysis task that involves edge detection, edge completion, and image reconstruction from noisy data. We present an approach that makes optimal use of the experimental information to minimize the hampering influence of the noise. The experimental data are then analyzed with a combination of wavelet transform and Bayesian probability theory. Nontrivial examples are presented to illustrate the proposed technique.     

Effects of random vibration in high-speed phase-shifting speckle pattern interferometry

The influence of random vibrations on the performance of a dynamic phase-shifting speckle pattern interferometer is investigated by means of experiments and numerical simulations. Two aspects are evaluated: first, temporal unwrapping reliability, second, vibration-induced phase noise. The former is found to be a significant constraint, even for peak velocities well below the Nyquist velocity limit of the interferometer. Shorter sampling windows and higher framing rates are shown to increase the unwrapping success rate, but longer windows reduce the phase error. Three analytical criteria for determining the expected unwrapping success rate are proposed and compared.     

Fringe analysis method for electronic speckle pattern interferometry using only speckle patterns before and after deformation

Electronic speckle pattern interferometry is employed in many industrial fields as a useful deformation measurement method. However, two speckle patterns obtained before and after the deformation are necessary for measurement. Furthermore, at least three speckle patterns are required for high resolution measurement using ordinary fringe scanning technologies. In this paper, a novel method that can measure high speed deformations using a limited number of speckle patterns without using high speed cameras is proposed. The method enables application to dynamic deformation analysis because the method involves analysis using only two speckle patterns obtained before and after the deformation. A novel optical system that can record some spatial information into each speckle is set up for the method. In experimental results, it is confirmed that the out-of-plane deformation measurement can be precisely performed by the method and that the resolution power is almost equivalent to that of the ordinary method.     

Phase retrieval in digital speckle pattern interferometry by use of a smoothed space-frequency distribution

We evaluate the use of a smoothed space-frequency distribution (SSFD) to retrieve optical phase maps in digital speckle pattern interferometry (DSPI). The performance of this method is tested by use of computer-simulated DSPI fringes. Phase gradients are found along a pixel path from a single DSPI image, and the phase map is finally determined by integration. This technique does not need the application of a phase unwrapping algorithm or the introduction of carrier fringes in the interferometer. It is shown that a Wigner-Ville distribution with a smoothing Gaussian kernel gives more-accurate results than methods based on the continuous wavelet transform. We also discuss the influence of filtering on smoothing of the DSPI fringes and some additional limitations that emerge when this technique is applied. The performance of the SSFD method for processing experimental data is then illustrated.     

Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods

The measurement of dynamic displacements by use of speckle pattern interferometry and temporal phase unwrapping allows for the evaluation of large-object displacement fields without the propagation of spatial unwrapping errors. If a temporal carrier is introduced in one of the beams of the interferometer, phase data for whole-object displacement can be retrieved by use of a temporal phase-shifting method or a temporal Fourier transformation approach. We present a comparison between both methods of temporal phase measurement in terms of precision and execution speed. We performed the analysis by using computer-simulated speckle interferograms, an approach that allowed us to know precisely the original phase distribution and also to determine the spatial rms phase error as a function of the phase change introduced between two consecutive speckle interferograms. The performance of both methods to process experimental data is also illustrated by use of the results from a high-speed speckle interferometry study of a carbon fiber panel.     

Phase shift selection for two-step generalized phase-shifting interferometry

A phase shift selection method is proposed to design algorithms immune against phase shift errors in two-step generalized phase-shifting interferometry. A general formula for wavefront reconstruction error is derived, and its specific expressions for two common errors are also given. Calculation results suggest that the proper range of phase shift for general application is about from 0.5 to 2.0 rad for both the fixed and linear phase shift errors. Computer simulations have demonstrated the effectiveness of this phase shift selection method by decreasing the wave reconstruction errors to one-fifth.     

High resolution speckle interferometry using virtual speckle pattern produced by information of deformation process

A high resolution new fringe analysis method for ESPI with only one camera is proposed by using features of speckle interferometry in a deformation process of a measured object. The profile of intensity of each speckle of the speckle patterns in the deformation process is analyzed by the Hilbert transform. A virtual speckle pattern for creating a carrier fringe image is produced artificially by using the information of profiles of intensities of speckles. The deformation map of the measured object can be detected by the virtual speckle pattern in an operation based on the spatial fringe analysis method. Experimental results show that the difference between the results by the new and the ordinary methods is 0.1 rad as standard deviation. From the results, it is confirmed that the high resolution measurement can be performed by this method the same as compared to the ordinary measurement method which needs to employ three speckle patterns.     

Determination of the 3D fields of displacements by the method of phase-shifting speckle interferometry

For 3D speckle interferometers, we propose a simplified procedure aimed at recording and processing speckle interferograms with single phase shift, which requires the minimum number of images. The results of experiments are presented to confirm the efficiency of the proposed procedure.     

Least-squares phase estimation with multiple parameters in phase-shifting electronic speckle pattern interferometry

We have developed an accurate and robust phase-estimation method in phase-shifting electronic speckle pattern interferometry. Unlike other methods that assume a constant phase within a fitting window, our method treats the phase variation with a gradient. A cost function that can utilize the information of pixel positions is formulated on the basis of a least-squares criterion. Powell's iteration method is applied to it to derive the phase and its gradient. An automatic consistency-checking routine and an algorithm that improves the initial guess of the iteration are developed for severe situations with large noise and steep phase variations.     

Surface profiling of a transparent object by use of phase-shifting Talbot interferometry

Talbot interferometry is used to study the surface profile of a transparent object. Periodic patterns are produced by illuminating a grating with a collimated laser beam. The object is placed on the self-image plane of the grating. The deformed grating image, which interferes with another grating, results in the Talbot interferometric fringes. The fringe pattern is recorded on a CCD camera for subsequent analysis, and the phase variation is achieved by a linear translation stage. In this application two specimens are tested to demonstrate the validity of the method; one is a transparent object with a spherical shape with a height of less than 350 microm, and the other is a transparent object with an uneven surface of 50-microm average height. The experimental results are compared with the test results obtained with the mechanical stylus method.     

Measurement of a fiber-end surface profile by use of phase-shifting laser interferometry

We describe a laser interferometric system in which two objectives are used to measure surface profile on a connectorized fiber-end surface. By the use of the proposed illumination design a He-Ne laser as a point light source is transformed to an extended light source, which is beneficial to localize interference fringe pattern near the test surface. To obtain an optimal contrast of the interference fringe pattern, the flat mirror with an adjustable reflection ratio is used to suit different test surfaces. A piezoelectric transducer attached on the reference mirror can move precisely along the optical axis of the objective and permits implementation of four-step phase-shifting interferometry without changing the relative position between the CCD sensor and the test surface. Therefore, an absolutely constant optical magnification can be accurately kept to capture the interference fringe patterns resulting from a combination of light reflected from both the reference flat mirror and the test surface. The experimental result shows that surface profile on a fiber-end with surface features such as a small fiber diameter of 125 microm and a low reflection ratio of less than 4% are measurable. Measurements on a standard calibration ball show that the accuracy of the proposed setup is comparable with that of existing white-light interferometers and stylus profilometers.     

Improved white-light interferometry on rough surfaces by statistically independent speckle patterns

White-light interferometry (WLI) on rough surfaces is based on interference from individual speckles. The measurement uncertainty of WLI is limited by a random shift of these individual interference patterns. The statistical error in each measurement point depends on the brightness of the corresponding speckle: a dark speckle yields a larger error than a bright speckle. In this paper, a novel method is presented to reduce the measurement uncertainty significantly: by sequentially switching the direction of the illumination, the camera sees several independent speckle patterns in sequence. From each pattern, the brightest speckles are selected to eventually calculate an accurate height map. This height map displays no outliers, and the measured surface roughness is close to the stylus measurements.     

Phase recovering without phase unwrapping in phase-shifting interferometry by cubic and average interpolation

A simple phase estimation employing cubic and average interpolations to solve the oversampling problem in smooth modulated phase images is described. In the context of a general phase-shifting process, without phase-unwrapping, the modulated phase images are employed to recover wavefront shapes with high fringe density. The problem of the phase reconstruction by line integration of its gradient requires a form appropriate to the calculation of partial derivatives, especially when the phase to recover has higher-order aberration values. This is achieved by oversampling the modulated phase images, and many interpolations can be implemented. Here an oversampling procedure based on the analysis of a quadratic cost functional for phase recovery, in a particular case, is proposed.     

Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the +/-1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2pi/30.     

Phase extraction from electronic speckle pattern interferometry addition fringes

Addition fringes are obtained in real time from electronic speckle pattern interferometry (ESPI) by use of a twin-pulsed laser when two pulses are fired during a single field of a CCD camera. This enables object deformations to be studied in harsh environmental conditions. However, the fringe patterns have poor visibility because optical noise is additive. To our knowledge automatic phase extraction from addition fringes has not previously been achieved: Low-pass filtering to suppress random speckle noise also eliminates the fringes because of their low visibility. Two phase-stepping algorithms that calculate phase from ESPI fringes without the need for a preprocessing filter are presented. In the first ESPI subtraction fringes are considered, for which an improvement in accuracy is seen, and in the second ESPI addition fringes are considered, which, we believe, has enabled the phase to be extracted for the first time. The algorithms are demonstrated with theoretical data and with experimental ESPI fringepatterns recorded with a cw laser. As presented, they form the first step toward a procedure that can beused with twin-pulsed ESPI.