模拟电路之美

模拟电路以其面向实际应用、电路形式多样化、非线性有源器件的引入等特点,成为电子技术一个重要的分支,几乎所有的电子产品设计中都蕴含着模拟电路的相关知识.本文拟从建模、对偶、对称、精巧、功能和均衡等方面讨论模拟电路之美.力图通过深入挖掘模拟电路之美,充分展示其魅力.     

在系统可编程模拟电路的原理与应用

从分析在系统可编程模拟电路中的基本单元PAC块出发,阐述了在系统可编程模拟电路的原理、特点及应用。     

模拟电路中三极管和运放的软故障诊断

基于文献[1]中的斜率故障模型,提出了一种诊断模拟电路中晶体三极管和集成运算放大器软故障的字典法.在含有三极管和运放的电路中,通过对三极管和运放进行等效模型替代,对替代之后的等效电路,利用电路中的两节点电压增量计算出的斜率作为统一故障特征,建立故障字典,实现原电路中三极管和运放的软故障诊断.给出了三极管和运放的等效模型分析和诊断步骤,并用仿真实例证明了诊断方法的有效性.     

音响电路中的运算放大器

本文介绍了运算放大器在音响电路中的使用时,参数选择的原则,提出了一些对实际工作有用的建议。     

基于跨导运算放大器的可重构模拟电路及应用设计

常规的粗粒度可重构模拟电路灵活性不高,而且可重构模拟单元(CAB)结构较为复杂。针对此类问题,该文改进并设计了一种新的基于OTA的可重构模拟电路。该电路设计方案降低了CAB的复杂度,提高了CAB的使用效率。该文方法的有效性通过3个模拟设计实例(二阶低通滤波器、高通滤波器和三阶巴特沃思低通滤波器)的设计加以验证。实验结果表明,所提出的方法正确有效,可以较好地兼顾CAB资源与所要求功能的平衡。     

Multi-VDD Testing for Analog Circuits

We present industrial results of a quiescent current testing technique suitable for RF testing. The operational method consists of ramping the power supply and of observing the corresponding quiescent current signatures. When the power supply is swept, all transistors are forced into various regions of operation. This has as advantage that the detection of faults is done for multiple supply voltages and corresponding quiescent currents, enhancing in this form the detectability of faults. We found that this method of structural testing yields fault coverage results comparable to functional RF tests making it a potential and attractive technique for production wafer testing due to its low cost, low testing times and low frequency requirements.José Pineda de Gyvez received the Ph.D. degree from the Eindhoven University of Technology. He is currently a principal scientist at Philips Research Laboratories, The Netherlands. Dr. Pineda was Associate Editor in IEEE Transactions on Circuits and Systems Part I and also Associate Editor for Technology in IEEE Transactions on Semiconductor Manufacturing. His research interests are in the general areas of design for manufacturability and analog signal processing.Guido Gronthoud received the electrical engineering degree from the Delft University in 1975. From 1976 to 1980 he worked at the Delft University on the design of Microwave systems. From 1980 he works with Philips. He has been working in the fields of circuit simulation and modelling for IC designs, CAD development for PCB design and electronic circuits and systems reliability. Since 1998 he is working on test innovation of digital and mixed-signal circuits. His interests are Defect Oriented Test, fault modeling and Process Related Test. He has authored and co-authored technical papers.     

模拟集成电路的发展动态

本文介绍了Ａ／Ｄ与Ｄ／Ａ转换器、超高速ＳＯＩ器件及电路、超高速双极电路、ＧｅＳｉ／Ｓｉ异质结器件和电路、智能功率等模拟集成电路的发展概况。     

Analog Computation Using Single-Electron Circuits

Analog computation is a processing method that solves a given problem by utilizing an analogy of a physical system to the problem. An idea is presented here for relating the behavior of single-electron circuits to analog computation. As an instance, a method is proposed for solving a combinatorial problem, the three-colorability problem, by using the properties of single-electron circuits. In problem solving, a single-electron circuit is constructed that is analogous to a given problem; then, through an annealing procedure, the circuit is made to settle down to its minimun energy state. The correct solution to the problem can be obtained by checking the final arrangement of electrons in the circuit. Analog computation is a promising architecture for single-electron computing systems.     

模拟/数字电路的协调设计

设备厂家正在应付有关模拟性在设备设计中发挥作用,这就是模 模拟性质的故障指的是电路中质的各种问题:为了抑制噪声而支 拟/ 数字电路协调设计—对于噪声模拟性质的行为所引发的电磁辐射付的元器件费用激增;购买的集成引发的故障等防患于未然。而且, 噪声、信号完整性、电源的抖动等电路达不到技术规格标明的性能避免芯片“黑盒子”化并发挥其性问题。在很短的开发周期内,设计等。在这当中,新型的设备设计工 能,削减开发成本又缩短开发周工程师要利用有限的成本制定出解程师正在成为模拟技术和数字技术…     

双门选超声波收发模拟电路的设计

针对现有模拟板中存在冗余的电容导致建波信号拖尾较长,致使超声信号经模拟板处理后分辨率低的问题,提出了一种以差分接收、双门选回波处理硬件电路设计。在检波放大之前设计一个门选电路,直接从全波信号中选取缺陷信号,避免了界面波经过检波放大电路后,形成拖尾淹没缺陷信号,提高了接收电路信号的可靠性。文中从硬件方面介绍了接收电路的调整。实验表明,电路性能稳定、精度高、成本低,并具有良好的应用前景。     

模拟电路的振荡测试技术

集成电路设计和制造技术的发展给电路测试带来了巨大的挑战,其中模拟电路的测试是电路测试的难点.目前在这一领域有许多致力于降低测试难度,节约测试成本的研究.介绍了一种称为"振荡测试"的模拟电路测试技术,从振荡电路的构造、测试响应的测量和分析等方面综述了振荡测试技术的研究现状,同时总结了振荡测试技术的优点,分析了当前存在的局限性,并对将来的发展进行了展望.     

Analog Integrated Circuits and Signal Processing

Analog Integrated Circuits and Signal Processing -