微波功率器件测量不确定度评定

本文针对微波功率器件特殊的封装形式，分析了测量夹具引入误差的不可忽略性，进而对测量夹具的误差校准及整个测量系统的校准进行了介绍。文章以微波功率器件测量系统为对象，对整个测量系统的误差来源进行了分析，并以S21为例对测量结果进行了不确定度评定，通过试验数据说明测量夹具误差去除前后对测量结果的影响，对微波功率器件的测量具有可参考的价值。     

固态功率器件测试技术研究

深入探究和分析固态微波功率器件测试中的影响因素及注意事项,并给出解决问题的措施;采用负载牵引技术及TRL校准技术实现测试系统的阻抗匹配和测试夹具的校准,搭建测试平台,对某款Si C功率晶体管进行测试,测试结果满足技术指标要求,证明测试系统可以有效提取被测器件的真实参数。     

固态微波功率器件静态参数定值装置研制

固态微波功率器件是电子设备的核心器件,文章针对固态微波功率器件静态参数的测量结果差异较大问题,研制了栅极双极性电压源、专用测试夹具等模块,开发了定值软件,研建了固态微波功率器件静态参数定值装置,并开展了试验验证,为器件栅源夹断电压、漏极饱和电流、跨导等静态参数测量结果的准确可靠提供了技术支撑。     

表贴微波器件S参数测量系统

介绍了一种表贴微波器件S参数测量系统。该系统主要由矢量网络分析仪、测试夹具及相应校准件、精密位移控制系统、被测件供电及控制器和测量软件组成。该系统基于直接测量方法完成测试夹具系统误差的修正,保证测量结果的准确性。同时,基于LabVIEW编写的测量软件可以自动完成数据采集、被测件状态切换、合格判断和报告生成,大幅提高了测量效率。文中给出了该系统测量微波可变衰减器的典型测量结果,并分析了测量结果的不确定度。     

高频和微波小功率晶体管计量标准中测试夹具误差模型的建立及误差？…

介绍在建立刘频和微波小功率晶体管计量标准的过程中，测试夹具误差模型的建立，并使用ＴＲＬ校准技术对测试夹具进行误差修正的理论方法和应用的研究。     

高频和微波小功率晶体管计量标准中测试夹具误差模型的建立及误差修正理论和方法的应用

：介绍在建立高频和微波小功率晶体管计量标准的过程中，测试夹具误差模型的建立，并使用ＴＲＬ校准技术对测试夹具进行误差修正的理论方法和应用的研究。     

FBAR板上测试技术综述

随着对薄膜体声波谐振器(FBAR)器件性能要求的增高,FBAR器件参数的精确测试变得十分关键,该文从测试夹具结构以及对测试夹具的去嵌入校准这两个FBAR参数测试精度要素考虑,综述FBAR板上测试技术的研究现状,讨论测试夹具结构设计过程中的寄生效应、阻抗匹配以及夹结构设计等问题,并分析去嵌入校准的原理、误差模型以及各校准方法的优缺点。通过降低寄生效应、优化阻抗匹配、改善校准方法、优化误差模型可提高FBAR板上测试的准确性,并以此给出一套板上测试夹具设计及测试流程。     

非标器件S参数去嵌入测试方法研究

非标器件的S参数测试,需要重点考虑夹具效应对测试结果带来的影响。本文介绍了一种通过去嵌入的方式测试非标微波器件S参数的测试方法,通过与传统测试方法得到测试结果的比对,以及对该测试方法进行的不确定度分析,表明了该方法测试结果的准确度较高,且相比传统的测试方法,这种去嵌入化的测试方案对于测试夹具的加工精度要求不高,更具实用性,可应用于非标器件S参数测试中。     

一种微波器件计量系统的设计

微波器件计量系统采用功率比法对各种微波衰减器和微波高频电缆的衰减量进行测试,克服了传统的用极化式标准衰减器进行测试时,电缆的移动和弯曲影响测量结果的问题;应用无线电高度表专用电缆箱中电缆特性和高精度的晶振测频技术,研制了等效高度测试仪,该测试仪与频率计共同组成等效高度测量系统.该计量系统的研制解决了微波器件计量保障中的难题.     

非同轴射频器件校准件参数仿真技术的研究

随着射频器件的快速发展,要求对射频器件S参数测试技术越来越严苛,一般设计相应的测试夹具,而非同轴射频测试夹具引入的误差较大,不容忽视,有必要对非同轴射频测试夹具引入的误差进行消除。文章通过Synthesize综合,算出微带线的宽度为1. 6mm,拟设计覆盖100MHz～12. 5GHz的频率,确定SOLT校准件和TRL校准件物理尺寸。采用ADS软件分别对SOLT校准件的直通校准件仿真、短路校准件仿真、开路校准件仿真、负载校准件仿真,得出设计的SOLT校准件性能良好。类似的采用ADS软件对TRL校准件进行仿真,得出设计的TRL校准件能覆盖100MHz～12. 5GHz的频率,且传输性能良好。     

Calibrating an Arbitrary Test Fixture for a Symmetric Device by Three Measurements

In this paper, a general solution of calibrating a microwave test fixture for a symmetric device is deduced from the cascading network relation, and it exposes the probability and condition of calibrating an arbitrary test fixture for a symmetric device by three measurements, which is less than the times of measurements in the thru-reflect-line (TRL) method. The scattering parameters of the test fixture and the embedded symmetric device can be determined by measurements of a thru, a line, and the symmetric device. Furthermore, the method is analyzed and verified by simulation and measurement. The analysis indicates that the presented method is suitable for determining the calibrated $S$-parameters of a symmetric device under test (DUT).      

射频功率器件宽带多层TRL校准算法研究

多层TRL校准是微波毫米波大功率器件测试中常用的一种校准方法。针对经典TRL校准方法在大功率器件测试中易出现的误差系数相位跳变问题,提出了一种结合先验知识和动态最小化误差逼近的宽带TRL校准优化算法。基于国产AV3672矢量网络分析仪和负载牵引测试系统在3.8GHz及三次谐波对该算法的有效性进行了验证。实验结果证明,该算法有效地修正了误差系数相位跳变的问题,对器件大信号工作状态最优阻抗点的分析更为准确,并且算法复杂度没有大幅增加,可以应用为经典TRL算法的后续修正步骤,具备极强的实用性和通用性。     

3700-4200-MHz Computer-Operated Measurement System for Loss, Phase, Delay, and Reflection

A computer-operated transmission measurement set intended to support development work on microwave components for FM radio systems in the 3700-4200-MHz range is described. The instrument is capable of measuring the complete S-parameter set of the device under test, over a range from 20-dB gain to 70-dB loss. Accuracies of transmission parameters for small loss are ±0.002 dB, ±0.01°, and ±0.1 ns. The basic measurement technique is that of "IF substitution," combined with rapid cyclic comparison (30-Hz rate) of the parameters of the unknown with those of a stable microwave reference. The comparison feature eliminates errors from circuit drift, thus allowing attainment of the high accuracies sought. The test set design, the control of error sources, and the validation of accuracy are discussed.     

低温液位传感器校准装置几何误差辨识方法的研究

针对低温液位传感器校准装置的夹具端空间姿态问题,提出了一种基于多边法原理的误差辨识方法。利用激光跟踪仪测距精度高的特点,采用多边法原理对校准装置夹具端的运动轨迹进行标定,以重力加速度方向为Z轴反方向建立虚拟坐标系,利用刚体中两点位置始终不变的特性,获得被测点6项误差的冗余数据,实现校准装置几何误差的辨识。仿真结果表明,所提出的方法具有一定的可行性,采用遗传算法与信赖域法、Guass-Ne叭加法相结合的方法,在一定程度上避免因初值难以确定造成的数据不收敛问题。     

Dynamic error in registering the position of an object by means of radiometric relays

Summary The maximum dynamic error in registering the position of the object by means of radiometric relays is attained in a device with a low integrator time constant.However, a low integrator time constant leads to statistical errors of measurement which can only be decreased by raising the activity of the emitter. In the cases when it is possible to displace the measuring device with respect to the reference plane it is better to use a relay with a large integrator time constant; naturally, the statistical error of measurement is then decreased.The above analysis can be used for computing the dynamic accuracy and devices for a continuous measurement of levels.     

Comparison of two post-calibration correction methods for complex permittivity measurement of biological tissues up to 50 GHz

Two correction methods are discussed in this paper to remove residual errors due to the lack of repeatability of coaxial-to-microstrip launchers as part of the TRL calibration procedure. These methods are applied for accurate insertion loss measurement of biological tissues embedded in a two-port microstrip test fixture, from which the tissues' complex permittivity values are extracted for frequencies between 15 and 50 GHz. In the first method, distilled water is used as a calibration standard as part of a two-port calibration procedure. The second method identifies an error transfer function using the difference between simulated and measured insertion loss for distilled water, and then applies it as a correction factor to the measurement results for biological tissues. Both methods are compared in terms of extracting the accurate complex permittivity of brain matter.     

Redundant Measurements in Microwave Research and Development

Capability and accuracy of microwave measuring methods and instruments can be substantially improved by the use of general-purpose digital computers. One of the fruitful applications is concerned with redundant measurements and their evaluation. In a redundant measurement more data are measured than would be necessary for a singular evaluation and the excess information is used to reduce measurement errors. Redundant measurements are advantageous for sophisticated microwave measurements where the final results can be determined only by tedious graphical or numerical transforms of measured data. Redundant measuring methods also can be used to verify network or device models and, to determine the parameters of these models. The evaluation of redundant measurements can be carried out in simple cases by averaging and generally by fitting the hypothetical parameters to the measured data (e.g., by least-square error method) or by using integral transform (e.g., Fourier transform) techniques. Digital computers enable one to make fast and accurate evaluations.     

The van der Pauw stress sensor

Piezoresistive sensors fabricated on (100) and (111) silicon surfaces are capable of measuring from four to all six components of the stress state at a point on the surface of an integrated circuit die. Such resistor-based sensors have been successfully designed and fabricated on these wafer planes and have been used successfully for measurement of die stresses in electronic packages by many research teams. In this paper, classical van der Pauw (VDP) structures, traditionally used for sheet resistance measurement, are shown to provide more than three times the sensitivity of standard resistor sensors. A single four-terminal VDP device replaces two resistor rosette elements and inherently utilizes the high-accuracy four-wire resistance measurement method. Theoretical expressions are developed for the change in resistance of the VDP device as a function of the individual stress components resolved in wafer coordinate systems on both the (100) and (111) silicon surfaces, and it is predicted theoretically that VDP devices will exhibit more than three times higher sensitivity to stress than standard resistor sensors. Design, fabrication, and experimental characterization of VDP and resistor test structures are presented for both silicon surfaces, and numerical simulation is used to help resolve discrepancies between theory and experiment. Sources of experimental error are identified, and the 3.16 times sensitivity enhancement of the VDP device is confirmed.     

一种数字投影式顶焦度测量仪

提出一种数字投影式顶焦度测量的技术方案。根据此方案设计的焦度测量仪,通过精密机械传动,嵌入以单片微型计算机为核心的硬件控制系统和软件处理系统,对眼镜镜片球镜顶焦度、球柱镜顶焦度及轴位角等进行了测量。它通过光学投影的方式进行对焦,测量活动标尺的平动量和转动量来计算相应参数,并利用液晶 LCD 显示结果。采用一种动态基准存储技术,通过预先存储的动态基准来计算顶焦度,可以有效消除系统误差,提高测量精度。对产品样机的试验结果表明,顶焦度的测量精度达到±0.03D。     

上海市火力发电行业能源计量现状分析

能源计量与节能监测、能源审计、能源统计、能源利用状况分析是用能单位能源管理和节能工作的基础。通过对本市部分火力发电企业的现场调研，针对性地提出改进建议，以期帮助用能单位增强能源计量在节能减排工作中的有效性。