共查询到20条相似文献,搜索用时 93 毫秒
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研究以贵金属Pd作为掺杂剂的ZnO纳米线敏感元件的乙醇气敏性能。采用水热法在叉指电极上直接制备出具有c轴取向的ZnO多晶纳米线。用SEM,XRD和EDS分析手段观测了材料的微观结构,并对其乙醇气敏性能进行了测试。实验结果表明:对于体积分数为200×10-6的乙醇气体,Pd掺杂的ZnO纳米线在灵敏度(8.17)、工作温度(325℃)和响应恢复时间(15,8s)上优于纯的ZnO纳米线。最后,对Pd掺杂的气敏机理进行了讨论。 相似文献
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在采用溅射方法制备的ZnO、SnO2/CeO2纳米平面气敏薄膜实验基础上,总结了气敏薄膜响应时间和恢复时间τc的宏观测量的特征时间次方规律.显微物理化学特性对研究气敏薄膜是十分必要却难以由微观直接测量获得,我们通过上述实验结果与气敏表面反应和表面吸附理论相结合,间接测量了气敏表面吸附结合能Ea这一微观特性,从而表明可以用宏观测量方法研究气敏薄膜的一些微观特性. 相似文献
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Chang Hsing-Cheng Hsu Yu-Liang Lin Shyan-Lung Chen Ya-Hui Guo Tai-Jiun Cheng Fan-Wei 《Microsystem Technologies》2021,27(4):1445-1455
Microsystem Technologies - Hollow nanofiber multiple-gas microsensors containing a ceramic package in parallel were developed via doping metal oxides in tin oxide (SnO2) and electrospinning and... 相似文献
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Daniel den Engelsen 《Journal of the Society for Information Display》2003,11(3):473-479
Abstract— A new theory is presented on the emission degradation or slump of oxide cathodes at current drawing and on the beneficial effect of doping the emitting layer with rare‐earth oxides. It was shown that during its lifetime, a gradual voltage difference is built up in the oxide layer, which eventually leads to the decomposition of BaO and O2 during current drawing. This causes an emission slump in life‐tested cathodes. Doping with rare‐earth oxides prevents this build up due to the electron donating capability of these materials. 相似文献
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《Sensors and actuators. B, Chemical》2003,88(3):329-333
The conductivity of phthalocyanine (Pc) is affected upon exposure to an atmosphere containing oxidizing molecules like oxygen, ozone, nitrogen oxides or chlorine. This phenomenon finds application in the use of thin phthalocyanine films as resistive gas sensors. Such sensors have shown that the sensitivity to oxygen is orders of magnitudes lower than that for the other oxidizing species. We explain this fact by quantifying the oxygen uptake and doping density of copper-, zinc-, manganese- and free base phthalocyanine films. The oxygen inside the film is found in molecular form as O2. Only the metal phthalocyanines acquire significant doping levels upon exposure to oxygen. The number of charge carriers is four orders of magnitude lower than the uptake of molecular oxygen in the material. It explains the observation that resistive phthalocyanine gas sensors have low sensitivity for the detection of oxygen. 相似文献
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Devin A. Mourey Mitchell S. Burberry Dalong A. Zhao Yuanyuan V. Li Shelby F. Nelson Lee Tutt Thomas D. Pawlik David H. Levy Thomas N. Jackson 《Journal of the Society for Information Display》2010,18(10):753-761
Abstract— The impact of passivation processes on ZnO thin‐film transistors is reported. In general, passivation processes result in back‐channel doping, which corresponds to shifts in threshold voltage and changes in subthreshold slope. It was determined that ALD‐based passivation results in considerably smaller undesirable shifts than those observed with plasma‐based processes. Two approaches, one a bulk doping with ammonia and the other a surface treatment with hydrogen peroxide, to further mitigate the detrimental effects of the passivation process are described. After proper passivation, ZnO devices show negligible hysteresis, have excellent stability to bias stress, and maintain or improve the good transport properties of as‐deposited devices. Although the existence of grain boundaries has been assumed to be a point of concern for device stability in polycrystalline metal oxides, no evidence was found to suggest that the grain boundaries present in these ZnO thin‐film transistors have affected the device stability. 相似文献
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With the goal of facilitating the development of surface micromachined polysilicon MEMS with postprocessed on-chip circuitry, we have evaluated the Impart of a 1200°C 16-h anneal upon chemical-vapor-deposited (CVD) polysilicon under a variety of processing conditions. The results show that undoped polysilicon has a final stress of +10-20 MPa even when the films are vastly different as deposited and that phosphorus doping introduces a compressive trend that is evident only after the long anneal. X-ray diffraction, transmission-electron-microscopy (TEM), and atomic-force-microscopy (AFM) studies of the polysilicon are used to analyze the grain orientations, grain sizes, and surface roughness of the material. The effect of the long anneal on residual stress in wet thermal and CVD oxides is also presented. Overall, the results indicate that the thermal budgets of conservative circuit processes can be accommodated within the fabrication sequence of surface-micromachined polysilicon microstructures 相似文献
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In2O3 nanofibers with diameters of around 60 nm have been fabricated by electrospinning with a solution containing both poly (vinyl pyrrolidone) (PVP) and indium nitrate, followed by calcination in air at 700 °C. Without further adding catalysts or doping other metal oxides, the sensor based on the as-prepared indium oxide (In2O3) nanofibers showed high response and selectivity, fast response and recovery time towards ethanol gas. The simple preparation and excellent properties significantly advance the viability of electrospun gas sensors. 相似文献
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R. Könenkamp A. Nadarajah R. C. Word J. Meiss R. Engelhardt 《Journal of the Society for Information Display》2008,16(5):609-613
Abstract— The use of ZnO nanostructures in various display applications is reported. Single‐crystalline vertically oriented nanowires with typical diameters of 100 nm and a length of 1–2 μm were grown at deposition temperatures below 100°C. Homogeneous growth over areas up to 50 cm2 on Si as well as on various metallic, transparent, and flexible substrates were obtained. Visible electroluminescence in the region between 400 and 900 nm and narrow‐line near‐ultraviolet (UV) electroluminescence is demonstrated. The physical conditions leading to single‐crystalline growth at low temperature, the role of defects, and the possibility of doping are discussed. These issues present the main challenges on the road towards high emission rates in LED operation. Under certain conditions, sharply tipped wires can be grown that hold promise for field‐emission applications. 相似文献