添加0.05％(La+Ce)对SnXCuNi焊料与Cu基板间界面组织的影响

在Sn-4.1X-1.5Cu-Ni焊料合金中添加0.05％(质量分数,下同)(La+Ce),对焊料/Cu焊点等温时效后其界面组织的变化规律以及界面金属间化合物的形成和生长行为进行分析研究,结果表明:随着等温时效时间的延长,Sn-4.1X-1.5Cu-Ni/Cu和Sn-4.1X-1.5Cu-Ni-0.05(La+Ce)/...     

回流次数对无铅焊点组织演变及可靠性的影响

目的研究不同回流次数对焊点形貌以及组织演变的影响,并通过力学性能来表征不同回流次数下焊点的可靠性。方法利用置球法将Sn3Ag0.5Cu小球置于Cu基板表面,随后在回流焊机中形成焊点,并进行不同次数回流焊接得到所需焊点,横截镶样打磨腐蚀后,利用光学显微镜、扫描电子显微镜进行显微组织观察,并用推拉试验机进行剪切测试。结果在焊点反应过程中,由于熔融焊料中析出的过饱和Cu和Sn会在焊料部分形成中空的Cu6Sn5管状物和片状的Sn基体,但随着反应的持续,这些物质逐渐消失。在IMC层的形成过程中,伴随着大量Cu6Sn5颗粒的产生,随着反应的持续,颗粒数量逐渐减少,IMC层厚度逐渐增加,但增加速度减缓。结论在IMC层的生长过程中,大块IMC会吞噬Cu6Sn5小颗粒来增加自身体积,从而抑制小颗粒的产生,最终减缓自身的生长。此外随着回流次数的增加,焊点由韧性断裂逐渐转变为韧脆性混合断裂,对焊点可靠性的降低具有一定影响。     

SnAgCu-xBi/Cu焊点界面反应及微观组织演化

本工作在Sn-3.0Ag-0.5Cu焊料中添加不同含量的Bi(0.1%,0.5%,1.0%(质量分数)),以此来研究Bi含量对Sn-3.0Ag-0.5Cu/Cu焊点的界面反应及金属间化合物微观组织演化的影响。结果发现:回流反应之后,焊点界面形成扇贝状的Cu_6Sn_5,对焊点进行时效处理后发现,在Cu_6Sn_5层与Cu基板之间又出现了一层Cu_3Sn,并且Cu_6Sn_5层的上表面及焊料中出现了颗粒状的Ag_3Sn,Ag_3Sn颗粒的数量随着时效时间的延长而增多;5d的时效处理之后,在Cu基板的上表面和Cu_3Sn层中发现了柯肯达尔孔洞,同时在大多数焊点界面的Cu_6Sn_5层的上表面和Cu_6Sn_5层中出现了裂纹,推测裂纹是由于热膨胀系数差导致的残余应力而形成的。时效过程中,焊点界面金属间化合物(IMC)层的厚度不断增加,并且IMC的平均厚度与时效时间的平方根呈线性关系。对比未添加Bi元素的Sn-3.0Ag-0.5Cu/Cu焊点发现,添加微量的Bi元素对IMC层生长有抑制作用,当Bi含量为1.0%时,抑制作用最为明显,而Bi含量为0.5%时,抑制作用最弱。Cu_6Sn_5晶粒的平均直径随着时效时间的延长而增加,且Cu_6Sn_5晶粒的平均直径与时效时间的立方根呈线性关系。     

等温时效对新型Sn-Ag基复合钎料显微组织和力学性能的影响

研究了等温时效对Sn-3.5Ag共晶钎料及其复合钎料的力学性能和显微组织变化的影响。为了弥补传统复合钎料制备和服役中强化颗粒容易粗化的问题, 制备了不同种类最佳配比的具有纳米结构的有机无机笼型硅氧烷齐聚物(POSS)颗粒增强的Sn-Ag基复合钎料。对钎焊接头在不同温度（125、150、175℃）下进行时效,通过SEM和EDAX分析了钎料与基板间金属间化合物层(IMC)的生长情况。结果表明, 经过不同温度时效,复合钎料钎焊接头界面处金属间化合物的生长速率比Sn3.5Ag共晶钎料慢, 复合钎料的IMC生长的激活能分别为80、97和77kJ/mol,均高于Sn3.5Ag共晶钎料。经过150℃时效1000h后,复合钎料钎焊接头的剪切强度分别下降了22%、13%和18%,下降幅度相当或明显小于Sn-3.5Ag钎料钎焊接头。      

200℃等温时效下SAC305/Co-5％P焊点的界面组织及断裂模式演变

目的研究BGA封装的SAC305/Co-5%P焊点在200℃等温时效下的界面反应。方法制备SAC305/Co-5%P的BGA焊点,200℃等温时效0, 200, 400, 600, 1000 h,采用场发射扫描电镜(配EDS)观察不同时效时间下SAC305/Co-5%P焊点界面的IMC形貌与断口特征,采用焊点接合强度测试仪测试相应的剪切强度变化。结果时效1000 h时,在钎料/Co Sn3的IMC层界面处生成(Cu, Co)_6Sn_5,界面CoSn3的IMC之间的通道得到填充,界面形貌变得平整。随着时效时间的增加,焊点的剪切强度先增后降,位于Sn层断口的断裂模式由韧性断裂向韧脆混合型断裂转变。结论随着时效时间的增加,界面IMC层厚度不断增加,界面IMC形貌发生改变。     

热循环对SnAgCu(纳米Al)/Cu焊点界面与性能影响

研究了纳米0.1%(质量分数)Al颗粒对SnAgCu无铅钎料与铜基板之间界面反应的影响,研究两种无铅钎料界面在-55~125℃热循环过程中的生长行为及其焊点力学性能变化。结果表明:随着热循环次数的增加,界面层金属间化合物的厚度明显增加,焊后界面层金属间化合物为Cu6Sn5相,在热循环过程中在Cu6Sn5和Cu基板之间出现Cu3Sn相。发现纳米Al颗粒的添加,界面层金属间化合物的厚度明显减少,纳米颗粒对界面层的生长具有明显的抑制作用。同时对焊点在热循环过程中的可靠性进行分析,发现焊点的拉伸力随着循环次数的增加逐渐降低,含纳米Al颗粒的焊点具有明显的优越性,在焊点服役期间,焊点失效路径为Cu6Sn5/Cu3Sn的界面处。     

时效对无铅焊料Ni-P/Cu焊点的影响

研究了150℃等温时效为62Sn36Bp2Ag/Ni-P/Cu及共晶SnAg/Ni-P/Cu表面贴装焊点微结构及塑切强度的影响,结果表明,在钎料与Ni-P间的界面存在Ni3Sn4金属间化合物层,其厚度随时效时间增加,Ni-P层的厚度减小,时效后,SnPbAg,SnAg焊点的剪切强度下降,对于SnAg焊点,时效250h后其剪切强度剧烈下降,断裂发生在Ni-P/Cu界面上,在长时间时效后焊点一侧的Ni-P层中P的含量较主可能是Ni-P/Cu结合强度变差的主要原因,SnPbAg焊点保持着较高的剪切强度。     

稀土Ce对SnAgCu合金显微组织及剪切强度的影响

研究了稀土Ce对Sn-3.0Ag-0.5Cu合金显微组织及焊点剪切强度的影响规律.利用扫描电镜对铸态合金及焊点显微组织和断口形貌进行了观察和分析,利用能谱仪对铸态合金组分进行测试,采用力学试验机测试焊点的剪切强度.研究表明:当Ce添加量为0.25%时,铸态合金显微组织中β-Sn相与Ag3Sn相明显细化,出现了少量的Sn-Ce相及Ce的偏聚区;采用气雾化粉末所配制的焊膏进行回流焊,添加Ce后,焊点基体组织比未添加时明显优化;经过气雾化制粉,Ce向粉末表面富集并极易氧化,导致焊粉氧含量升高,使得回流焊接后焊料/Cu界面IMC层附近孔洞增加,焊点剪切强度降低.     

高熵合金中间层对TiNi/TC4电子束焊接头组织及性能影响

目的 解决TiNi/TC4异种金属的焊接问题,扩大此2种金属的结合应用.方法 选用3 mm×40 mm×0.5 mm的FeCoCrNiMn高熵合金薄片作为中间层,采用电子束焊接方法焊接TiNi/TC4.对形成的接头进行宏观分析,采用电子显微镜以及X射线衍射仪对其微观组织进行表征;通过拉伸和硬度测试,分析该接头的力学性能.结果 接头宏观成形存在裂纹缺陷,观察微观组织发现,在焊接接头中只形成了AlTi3相和Ni0.35Al0.30Ti0.35相,没有形成Ti2Ni相.接头的抗拉强度为81.8 MPa,伸长率为4.38％,平均显微硬度为HV661,断口呈脆性断裂特征.结论 将高熵合金作为中间层焊接TiNi/TC4是一种有效的方法,可以成功实现异种金属的焊接,中间层的存在可以有效调控焊缝中的析出相种类.     

Bi对Sn-0.7Cu无铅焊料微观组织和性能的影响

研究了Bi对Sn-0.7Cu焊料合金的微观组织、物理性能、润湿性能以及力学性能的影响.结果表明,在Sn-0.7Cu焊料合金中添加适量Bi后,合金的微观组织和性能有较明显的变化,Bi的加入能够降低焊料合金的熔点,提高润湿性能,同时对合金的力学性能也有很大影响,Bi能显著提高合金的抗拉强度,但合金的塑性会有所降低.     

时效Sn-9Zn-3Bi/Cu钎焊接头的电子探针分析

用EPMA-1600型电子探针波谱分析了Sn-9Zn-3Bi／Cu钎焊接头在170℃时效1000h后的界面组织及其成分。结果表明，界面处存在三层化合物层。从基体铜侧起，依次为Cu-Sn化合物层、Cu-Zn化合物层和Sn-Cu化合物层。电子探针能够有效分析微观组织、成分的变化和扩散现象。     

固溶和时效工艺对接触线用Cu-Ag-Cr 合金组织与性能的影响

利用硬度计、导电仪和透射电子显微镜等手段,分析了固溶温度、时效及时效前冷变形量对Cu-0.1%Ag-0.1%Cr合金的组织和性能的影响.结果表明,合金经形变时效处理后,硬化效应明显比直接时效所产生的作用大,经870℃固溶/40%～50%冷变形/480℃×1.5h时效处理后,合金可以取得较好的综合性能指标--硬度131HV以上,导电率92.82%IACS以上.     

Wetting Behavior and Interfacial Reactions in (Sn-9Zn)-2Cu/Ni Joints during Soldering and Isothermal Aging

The wetting property of (Sn-9Zn)-2Cu (wt pct) on Ni substrate and the evolution of interfacial microstructure in (Sn-9Zn)-2Cu/Ni joints during soldering as well as isothermal aging were studied.The wetting ability of eutectic Sn-9Zn solder on Ni substrate was markedly improved by adding 2 wt pct Cu into this solder alloy.Plate-like Cu5Zn8 intermetallic compounds (IMCs) were detected in (Sn-9Zn)-2Cu solder matrix.A continuous Ni5Zn21 IMC layer was formed at (Sn-9Zn)-2Cu/Ni interface after soldering.This IMC layer kept its type and integrality even after aging at 170℃ for up to 1000 h.At the early aging stage (before 500 h), the IMC layer grew fast and its thickness followed a linear relationship with the square root of aging time.Thereafter,however, the thickness increased very slowly with longer aging time.When the joints were aged for 1000 h,a new IMC phase, (Cu,Ni)5Zn8, was found in the matrix near the interface.The formation of (Cu,Ni)5Zn8phase can be attributed to the diffusion of Ni atoms into the solder matrix from the substrate.     

Nanoindentation characterization of intermetallic compounds formed between Sn–Cu (–Ni) ball grid arrays and Cu substrates

The formation of intermetallic compounds (IMCs) at the solder–substrate interface is essential in the manufacturing of solder joints. In this study, the effect of Ni addition into Sn–Cu lead-free solders on mechanical properties of the IMCs formed at the interface between solder ball grid arrays (BGAs) and Cu substrates, which experienced multiple reflows, were investigated. The results from nanoindentation tests showed that elastic modulus and hardness of (Cu,Ni)₆Sn₅ were higher than those of Cu₆Sn₅. The hardnesses of (Cu,Ni)₆Sn₅ were more scattered compared to those of Cu₆Sn₅, which may be attributed to the crystallographic characteristics such as growth texture of the IMCs.     

基于显式动力学的焊点冲击失效分析

组件级高速剪切测试是用来研究芯片封装中Sn-Ag-Cu焊点冲击可靠性问题的一个重要手段。实验研究表明：随着冲击速度的增加,焊点封装结构的失效会由焊锡母材的韧性破坏向界面金属间化合物(IMC)的脆性断裂过渡;同时,其荷载-位移响应曲线形态也会发生显著的改变。为了能够更详细地了解封装结构的冲击失效行为,并进一步改进其结构设计,该文提出结合焊锡材料应变率相关的动态硬化特性,利用渐进损伤模型来模拟其动态损伤过程;同时,引进一种能够有效表征复合型裂纹扩展的内聚力模型来模拟IMC的脆性动态断裂。与实验结果的对比表明：该文提出的方法能够较为有效地表征焊点封装结构在不同冲击速度下的失效行为。     

表面贴装技术的工艺参数对共晶SnPb焊料与铜焊接界面的影响

采用扫描电镜与能谱分析方法,研究了表面贴装技术的工艺参数（包括恒温区保温时间、传送带速度、锡膏粘度和锡膏模板厚度等）对共晶SnPb焊料与铜焊接界面的影响.结果显示,表面贴装技术工艺参数并不明显影响焊接界面金属间化合物（IMCs）层的组成（IMCs层的主要成分为Cu6Sn5相）,但影响IMCs层的形貌,其中传送带速度会影响Cu6Sn5相的平均直径,而锡膏模板厚度与恒温区保温时间则对IMCs层的形态与厚度影响较大.     

Epitaxial growth of Cu6Sn5 formed at Sn-based lead-free solder/non-textured polycrystalline Cu plate interface

This study examines the epitaxial growth of the intermetallic compound (IMC) of Cu₆Sn₅ (or (Cu,Ni)₆Sn₅) that forms at the interface between molten Sn-based lead-free solders and non-textured polycrystalline Cu substrates. Sn, Sn–Cu, Sn–Cu–Ni and Sn–Ag–Cu solders were investigated. The dominant growing planes in a hexagonal structure of this IMC on Cu substrates are (101) and (102). Addition of trace Ni into Sn–Cu solders leads to an increase in (101) growth and a decrease in (102) growth. The presence of Ag in Sn–Ag–Cu solders facilitates (102) growth and suppresses (101) growth. Such an epitaxial growth should have a large influence on the mechanical and electrical characteristics of the Sn-based solder/Cu joints.     

Interaction Kinetics between Sn-Pb Solder Droplet and Au/Ni/Cu Pad

The interracial phenomena of the Sn-Pb solder droplet on and needle-like AuSn4 are formed at the interface after Au/Ni/Cu pad are investigated. A continuous AuSn2 the liquid state reaction （soldering）. The interracial reaction between the solder and Au layer continues during solid state aging with AuSn4 breaking off from the interface and felling into the solder. The kinetics of Au layer dissolution and diffusion into the solder during soldering and aging is analyzed to elucidate intermetallic formation mechanism at the solder/Au pad interface. The concentration of Au near the solder/pad interface is identified to increase and reach the solubility limit during the period of liquid state reaction. During solid state reaction, the thickening of Au-Sn compound is mainly controlled by element diffusion.     

Influence of Thermal Cycling on the Microstructure and Shear Strength of Sn3.5Ag0.75Cu and Sn63Pb37 Solder Joints on Au/Ni Metallization

The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu （SAC） and Sn63Pb37 （SnPb） solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 μm Au finished metallization, respectively. After 1000 thermal cycles between -40℃ and 125℃, a very thin intermetallic compound （IMC） layer containing Au, Sn, Ni, and Cu formed at the interface between SAC solder joints and underneath metallization with 0.1 μm Au finish, and （Au, Ni, Cu）Sn4 and a very thin AuSn-Ni-Cu IMC layer formed between SAC solder joints and underneath metallization with 0.9 μm Au finish. For SnPb solder joints with 0.1 μm Au finish, a thin （Ni, Cu, Au）3Sn4 IMC layer and a Pb-rich layer formed below and above the （Au, Ni）Sn4 IMC, respectively. Cu diffused through Ni layer and was involved into the IMC formation process. Similar interfacial microstructure was also found for SnPb solder joints with 0.9μm Au finish. The results of shear test show that the shear strength of SAC solder joints is consistently higher than that of SnPb eutectic solder joints during thermal cycling.