共查询到20条相似文献,搜索用时 15 毫秒
1.
2.
The authors present the design of a dynamic built-in current (BIC) monitor for a new on-chip analogue self-test methodology. This methodology uses dynamic power supply current monitoring, and takes advantage of a redundancy in the structure of fully balanced circuits. The dynamic BIC monitor is based on a second generation current conveyor CCII+, and offers accurate measurement of supply current with minimal degradation in power supply voltage 相似文献
3.
瞬态电流(IDDT)测试经常被看作是静态电流(IDDQ)测试的替代或补充,特别在深亚微米技术中,受到越来越多的关注。根据一种基于电荷的瞬态电流片外电流传感器电路,并在其基础上进行改进并对两阶多米诺加法器电路进行仿真实验,实验结果表明,改进后的电路能有效读取集成电路中的瞬态电流,从而实现瞬态电流的测试。 相似文献
4.
文中提出了一款简单的直流电流采样、隔离电路,利用抗浪涌电路(热插拔电路)MOSFET的导通电阻作为采样电阻,经过单电源运放组成的信号放大电路,和555时钟芯片组成的幅-频转换器转变为脉冲信号,通过光耦隔离,送入后级的监控电路。实验验证了其可行性。 相似文献
5.
We present a new method for testing digital CMOS integrated circuits. The new method is based on the following premise: monitor the switching behavior of a circuit as opposed to the output logic state. We use the transient power supply current as a window of observability into the circuit switching behavior. A method for isolating normal switching transients from those which result from defects is introduced. The feasibility of this new testing approach is investigated by conducting several experiments involving the design of integrated circuits with built-in defects, fabrication, and physical testing. The results of these experiments show this new test method to be a promising one for detecting defects that can escape stuck-at testing andI
DDQ
testing. 相似文献
6.
In this paper, we propose a method for testing CMOS domino circuits using the transient power supply current. The method is based on monitoring and processing the transient current. We evaluate the effectiveness of this testing method through simulations of various domino circuits of different sizes. Moreover, we propose a normalising technique to mask the process variations effect associated with current testing. Furthermore, we present a test vector generation algorithm for testing large domino circuits, and develop and implement a clustering technique to improve the fault coverage of the test method when used with large circuits. The clustering algorithm divides the circuit into different clusters where each cluster is fed by a different power supply branch. 相似文献
7.
基于电流环的高楼供水水位远程自动监测系统的研制 总被引:1,自引:0,他引:1
介绍一种采用20mA电流环驱动方式的高楼供水水位远程自动监测系统,此系统能进行远距离、高速度通信,并且有较强的现场抗干扰和噪声抑制能力,通过无线数据传输的方式向中心发送水位信息,实现了水位监测的实时性. 相似文献
8.
Jeongjin Roh 《Circuits and Systems II: Express Briefs, IEEE Transactions on》2005,52(9):591-595
A new error amplifier is presented for fast transient response of dc-dc converters. The amplifier has low quiescent current to achieve high power conversion efficiency, but it can supply sufficient current during large-signal operation. Two comparators detect large-signal variations, and turn on extra current supplier if necessary. The amount of extra current is well controlled, so that the system stability can be guaranteed in various operating conditions. The simulation results show that the new error amplifier achieves significant improvement in transient response than the conventional one. 相似文献
9.
《Industrial Electronics, IEEE Transactions on》2009,56(7):2522-2529
10.
An on-chip low-power circuit for both quiescent current I ddq and transient current I ddt monitoring is presented. The current monitor performs faster and is significantly smaller than those reported previously. The monitor is designed for low-voltage digital CMOS circuits (1.5V). The same design can be used in the testing of analogue and mixed signal circuits. The effect on the circuit under test performance is negligible. Testing speeds of up to 25MHz can be achieved (including the 4-bit A/D converter, 100MHz without the converter). The monitor has been implemented in 0.5μm and 0.35μm CMOS technology and tested successfully on parallel chains of inverters as circuit under test. Two types of fault (an open fault and a short fault) have been observed. Simulation and experimental results are included and analysed. 相似文献
11.
This article presents a correlation between dynamic power supply current and pattern sensitive faults in SRAMs. It is shown that the dynamic power supply current provides a window for observing the internal switching behavior of the memory cells. Switching of the logic state of a memory cell results in a transient current pulse in the power supply rails. A new current-testable SRAM structure is presented which can be used to isolate normal current transients from those resulting from pattern sensitivity. The new structure differs from traditional SRAM structures only in the way that power is distributed to the cells. The new structure allows for very high coverages of disturb-type pattern sensitivity using a simple algorithm of length 5n where n is the number of cells. 相似文献
12.
13.
This paper describes work in progress towards the development, evaluation and validation of a structural, cost effective and quantifiable analog and mixed-signal test methodology, applicable in a production test environment and based on the application of supply current testing. To enable and support the measurements at first an analog supply current monitor was realised. The monitor offers a measurement range of 50 mA, a bandwidth of 1.5 MHz and a resolution better than 1 A. Subsequently the monitor was used to carry out measurements on a mixed-signal Asynchronous Digital Subscriber Line (ADSL) ASIC, to evaluate the feasibility of the methodology. As these initial measurements provided very interesting results, the experiments towards the validation and quantification of the test methodology are now being repeated on a larger scale. The results gathered so far show the potential of the approach to enhance test quality combined with test cost reduction. 相似文献
14.
15.
介绍了PS48240/20通信电源系统交、直流电源配电故障的诊断、处理与维修。阐述了系统紧急故障的应急处理原则,特别说明了配电部分、监控系统和模块的应急处理方法。 相似文献
16.
17.
设计了一种0.13μm BiCMOS低压差线性稳压器(LDO),包括BiCMOS误差放大器、带软启动的BiCMOS带隙基准源、"套筒式"共源-共栅补偿电路等。为了改善线性瞬态响应性能,在BiCMOS误差放大器的前级设置了动态电流偏置电路。由于所设计的BiCMOS带隙基准源对温度的敏感性较小,故能为LDO提供高精度的基准电压。对所设计的LDO进行了工艺流片。流片测试结果表明,该LDO可提供60 mA的输出电流且最小压差只有100 mV。测试同时验证了所设计LDO的负载和瞬态响应都得到改善:负载调整率为0.054 mV/mA,线性调整率为0.014%,而芯片面积约为0.094 mm2,因此特别适用于高精度、便携式片上电源系统。 相似文献
18.
19.
以煤矿供电网越级跳闸现象为研究对象,在分析电流纵联差动保护、级联闭锁工作原理和防越级跳闸保护逻辑的基础上,介绍了一种煤矿供电网防越级跳闸保护装置的研制过程。保护装置以32位ARM处理器MB9BF618S为控制核心,可以实时检测供电网输电线路的工作状态,对输电线路故障进行有效的保护。文中主要叙述了保护装置的总体结构,给出了电流/电压输入模块、开关量输入/输出模块和通信模块的设计方案。该保护装置具有结构简单、操作方便、可靠性高等特点,能够满足煤矿供电网防越级跳闸保护的要求,具有较高的应用价值。 相似文献
20.
Hanxiao Du Xinquan Lai Yuan Chi 《Analog Integrated Circuits and Signal Processing》2014,80(2):233-241
A high voltage, low-dropout regulator (LDO) with dynamic compensation network is implemented in Nuvoton 0.6 μm BCD technology. The proposed HVLDO makes use of high voltage tolerance DMOS transistors to take most of the voltage press in each path, thus satisfying the requirement for wide input range. Besides, the proposed dynamic compensation network can achieve a great stability performance for the HVLDO structure under different load and input supply conditions. In addition, different output voltage is also implemented in this work and the transient response in each situation is also improved. Experimental result verifies that the proposed LDO is stable for a capacitive load of 1 μF and with a load capability of 30 mA. Moreover, the load transient measurements show that the maximum overshoot and undershoot voltage under a relative low supply are smaller than 83 and 103 mV, respectively; while the line transient measurements show that the output variation are within 50 mV among all circumstances. Besides, the measured quiescent current is only 8 μA under a 4 V supply. 相似文献