Monitoring the Channel Formation in Organic Field‐Effect Transistors via Photoinduced Charge Transfer

Conducting channel formation in organic field‐effect transistors (OFETs) is considered to happen in the organic semiconductor layer very close to the interface with the gate dielectric. In the gradual channel approximation, the local density of accumulated charge carriers varies as a result of applied gate bias, with the majority of the charge carriers being localized in the first few semiconductor monolayers close to the dielectric interface. In this report, a new concept is employed which enables the accumulation of charge carriers in the channel by photoinduced charge transfer. An OFET employing C₆₀ as a semiconductor and divinyltetramethyldisiloxane‐bis(benzocyclobutene) as the gate dielectric is modified by a very thin noncontinuous layer of zinc‐phthalocyanine (ZnPc) at the semiconductor/dielectric interface. With this device geometry, it is possible to excite the phthalocyanine selectively and photogenerate charges directly at the semiconductor/dielectric interface via photoinduced electron transfer from ZnPc onto C₆₀. Thus the formation of a gate induced and a photoinduced channel in the same device can be correlated.     

Novel Approach for Alternating Current (AC)‐Driven Organic Light‐Emitting Devices

A novel approach for alternating current (AC)‐driven organic light‐emitting devices is reported, which uses the concept of molecular doping in organic semiconductors. Doped organic charge‐transport layers are used to generate charge carriers within the device, hence eliminating the need for injecting charge carriers from external electrodes. Bright luminance of up to 1000 cd m^?2 is observed when the device is driven with an AC bias. The luminance observed is attributed to charge‐carrier generation and recombination, leading to the formation of excitons within the device, without injection of charge carriers through external electrodes. A mechanism for internal charge‐carrier generation and the device operation is proposed.     

Porous Organic Field‐Effect Transistors for Enhanced Chemical Sensing Performances

The thin‐film structures of chemical sensors based on conventional organic field‐effect transistors (OFETs) can limit the sensitivity of the devices toward chemical vapors, because charge carriers in OFETs are usually concentrated within a few molecular layers at the bottom of the organic semiconductor (OSC) film near the dielectric/semiconductor interface. Chemical vapor molecules have to diffuse through the OSC films before they can interact with charge carriers in the OFET conduction channel. It has been demonstrated that OFET ammonia sensors with porous OSC films can be fabricated by a simple vacuum freeze‐drying template method. The resulted devices can have ammonia sensitivity not only much higher than the pristine OFETs with thin‐film structure but also better than any previously reported OFET sensors, to the best of our knowledge. The porous OFETs show a relative sensitivity as high as 340% ppm^?1 upon exposure to 10 parts per billion (ppb) NH₃. In addition, the devices also exhibit decent selectivity and stability. This general and simple strategy can be applied to a wide range of OFET chemical sensors to improve the device sensitivity.     

Air Effect on the Ideality of p‐Type Organic Field‐Effect Transistors: A Double‐Edged Sword

Organic field‐effect transistors (OFETs) often deviate from ideal behaviors in air, which masks their intrinsic properties and thus significantly impedes their practical applications. A key issue of how the presence of air affects the ideality of OFETs has not yet been fully understood. It is revealed that air atmosphere may exert a double‐edged sword effect on the active semiconductor layer when determining the ideality of OFETs fabricated from p‐type crystalline organic semiconductors. Upon exposing the as‐fabricated device to air, water and oxygen mainly function as efficient p‐type dopants for the active layer in the contact regions, enhancing charge carrier injection and consequently improving device ideality. Nevertheless, as the exposure time increases, the trapping centers for the injected minority charge carriers appear in the channel region, leading to degradation of device ideality. Inspired by the double‐edged sword behavior of air, a near‐ideal OFET is achieved by ingeniously utilizing the doping/positive effect and eliminating the trapping/negative effect. The effect of air on the ideality of p‐type OFETs is clarified, which not only illuminates some common observations of OFETs in air but also offers useful guidance for the construction of high‐performance ideal OFETs.     

Efficient Charge Injection in Organic Field‐Effect Transistors Enabled by Low‐Temperature Atomic Layer Deposition of Ultrathin VOx Interlayer

Charge injection at metal/organic interface is a critical issue for organic electronic devices in general as poor charge injection would cause high contact resistance and severely limit the performance of organic devices. In this work, a new approach is presented to enhance the charge injection by using atomic layer deposition (ALD) to prepare an ultrathin vanadium oxide (VO_x) layer as an efficient hole injection interlayer for organic field‐effect transistors (OFETs). Since organic materials are generally delicate, a gentle low‐temperature ALD process is necessary for compatibility. Therefore, a new low‐temperature ALD process is developed for VO_x at 50 °C using a highly volatile vanadium precursor of tetrakis(dimethylamino)vanadium and non‐oxidizing water as the oxygen source. The process is able to prepare highly smooth, uniform, and conformal VO_x thin films with precise control of film thickness. With this ALD process, it is further demonstrated that the ALD VO_x interlayer is able to remarkably reduce the interface contact resistance, and, therefore, significantly enhance the device performance of OFETs. Multiple combinations of the metal/VO_x/organic interface (i.e., Cu/VO_x/pentacene, Au/VO_x/pentacene, and Au/VO_x/BOPAnt) are examined, and the results uniformly show the effectiveness of reducing the contact resistance in all cases, which, therefore, highlights the broad promise of this ALD approach for organic devices applications in general.     

Inkjet‐Printed Organic Electrodes for Bottom‐Contact Organic Field‐Effect Transistors

A graphite thin film was investigated as the drain and source electrodes for bottom‐contact organic field‐effect transistors (BC OFETs). Highly conducting electrodes (10² S cm^?1) at room temperature were obtained from pyrolyzed poly(l,3,4‐oxadiazole) (PPOD) thin films that were prepatterned with a low‐cost inkjet printing method. Compared to the devices with traditional Au electrodes, the BC OFETs showed rather high performances when using these source/drain electrodes without any further modification. Being based on a graphite‐like material these electrodes possess excellent compatibility and proper energy matching with both p‐ and n‐type organic semiconductors, which results in an improved electrode/organic‐layer contact and homogeneous morphology of the organic semiconductors in the conducting channel, and finally a significant reduction of the contact resistance and enhancement of the charge‐carrier mobility of the devices is displayed. This work demonstrates that with the advantages of low‐cost, high‐performance, and printability, PPOD could serve as an excellent electrode material for BC OFETs.     

Gradual Controlling the Work Function of Metal Electrodes by Solution‐Processed Mixed Interlayers for Ambipolar Polymer Field‐Effect Transistors and Circuits

In this paper, a technique using mixed transition‐metal oxides as contact interlayers to modulate both the electron‐ and hole‐injections in ambipolar organic field‐effect transistors (OFETs) is presented. The cesium carbonate (Cs₂CO₃) and vanadium pentoixide (V₂O₅) are found to greatly and independently improve the charge injection properties for electrons and holes in the ambipolar OFETs using organic semiconductor of diketopyrrolopyrrolethieno[3,2‐b]thiophene copolymer (DPPT‐TT) and contact electrodes of molybdenum (Mo). When Cs₂CO₃ and V₂O₅ are blended at various mixing ratios, they are observed to very finely and constantly regulate the Mo's work function from ?4.2 eV to ?4.8 eV, leading to high electron‐ and hole‐mobilities as high as 2.6 and 2.98 cm² V^?1 s^?1, respectively. The most remarkable finding is that the device characteristics and device performance can be gradually controlled by adjusting the composition of mixed‐oxide interlayers, which is highly desired for such applications as complementary circuitry that requires well matched n‐channel and p‐channel device operations. Therefore, such simple interface engineering in conjunction with utilization of ambipolar semiconductors can truly enable the promising low‐cost and soft organic electronics for extensive applications.     

Decoupling the Bias‐Stress‐Induced Charge Trapping in Semiconductors and Gate‐Dielectrics of Organic Transistors Using a Double Stretched‐Exponential Formula

A novel strategy for analyzing bias‐stress effects in organic field‐effect transistors (OFETs) based on a four‐parameter double stretched‐exponential formula is reported. The formula is obtained by modifying a traditional single stretched‐exponential expression comprising two parameters (a characteristic time and a stretched‐exponential factor) that describe the bias‐stress effects. The expression yields two characteristic times and two stretched‐exponential factors, thereby separating out the contributions due to charge trapping events in the semiconductor layer‐side of the interface and the gate‐dielectric layer‐side of the interface. The validity of this method was tested by designing two model systems in which the physical properties of the semiconductor layer and the gate‐dielectric layer were varied systematically. It was found that the gate‐dielectric layer, in general, plays a more critical role than the semiconductor layer in the bias‐stress effects, possibly due to the wider distribution of the activation energy for charge trapping. Furthermore, the presence of a self‐assembled monolayer further widens the distribution of the activation energy for charge trapping in gate‐dielectric layer‐side of the interface and causes the channel current to decay rapidly in the early stages. The novel analysis method presented here enhances our understanding of charge trapping and provides rational guidelines for developing efficient OFETs with high performance.     

Vertical Organic Field‐Effect Transistors

Field‐effect transistors are the fundamental building blocks for electronic circuits and processors. Compared with inorganic transistors, organic field‐effect transistors (OFETs), featuring low cost, low weight, and easy fabrication, are attractive for large‐area flexible electronic devices. At present, OFETs with planar structures are widely investigated device structures in organic electronics and optoelectronics; however, they face enormous challenges in realizing large current density, fast operation speed, and outstanding mechanical flexibility for advancing their potential commercialized applications. In this context, vertical organic field‐effect transistors (VOFETs), composed of vertically stacked source/drain electrodes, could provide an effective approach for solving these questions due to their inherent small channel length and unique working principles. Since the first report of VOFETs in 2004, impressive progress has been witnessed in this field with the improvement of device performance. The aim of this review is to give a systematical summary of VOFETs with a special focus on device structure optimization for improved performance and potential applications demonstrated by VOFETs. An overview of the development of VOFETs along with current challenges and perspectives is also discussed. It is hoped that this review is timely and valuable for the next step in the rapid development of VOFETs and their related research fields.     

Contact Resistance in Organic Field‐Effect Transistors: Conquering the Barrier

Organic semiconductors have sparked interest as flexible, solution processable, and chemically tunable electronic materials. Improvements in charge carrier mobility put organic semiconductors in a competitive position for incorporation in a variety of (opto‐)electronic applications. One example is the organic field‐effect transistor (OFET), which is the fundamental building block of many applications based on organic semiconductors. While the semiconductor performance improvements opened up the possibilities for applying organic materials as active components in fast switching electrical devices, the ability to make good electrical contact hinders further development of deployable electronics. Additionally, inefficient contacts represent serious bottlenecks in identifying new electronic materials by inhibiting access to their intrinsic properties or providing misleading information. Recent work focused on the relationships of contact resistance with device architecture, applied voltage, metal and dielectric interfaces, has led to a steady reduction in contact resistance in OFETs. While impressive progress was made, contact resistance is still above the limits necessary to drive devices at the speed required for many active electronic components. Here, the origins of contact resistance and recent improvement in organic transistors are presented, with emphasis on the electric field and geometric considerations of charge injection in OFETs.     

Cover Picture: n‐Channel,Ambipolar, and p‐Channel Organic Heterojunction Transistors Fabricated with Various Film Morphologies (Adv. Funct. Mater. 3/2007)

Simultaneous introduction of short‐range repulsive interactions between dissimilar colloidal particles and attractive interactions between like particles provides a general new route to fabricating self‐organizing bipolar devices. By identifying combinations of conductive device materials between which short‐range repulsive forces exist in the presence of an intervening liquid, electrochemical junctions can be self‐formed, as reported by Chiang and co‐workers on p. 379. The relationship between the performance characteristics of organic field‐effect transistors (OFETs) with 2,5‐bis(4‐biphenylyl)bithiophene/copper hexadecafluorophthalocyanine (BP2T/F₁₆CuPc) heterojunctions and the thickness of the BP2T bottom layer is investigated. Three operating modes (n‐channel, ambipolar, and p‐channel) are obtained by varying the thickness of the organic semiconductor layer. The changes in operating mode are attributable to the morphology of the film and the heterojunction effect, which also leads to an evolution of the field‐effect mobility with increasing film thickness. In BP2T/F₁₆CuPc heterojunctions the mobile charge carriers accumulate at both sides of the heterojunction interface, with an accumulation layer thickness of ca. 10 nm. High field‐effect mobility values can be achieved in continuous and flat films that exhibit the heterojunction effect.     

Digital‐Inverter Amine Sensing via Synergistic Responses by n and p Organic Semiconductors

Chemiresistors and sensitive organic field‐effect transistors (OFETs) have been substantially developed as cheap, scalable, and versatile sensing platforms. While new materials are expanding OFET sensing capabilities, the device architectures have changed little. Higher order logic circuits utilizing OFETs sensitive to amine vapors are presented. The circuits depend on the synergistic responses of paired p‐ and n‐channel organic semiconductors, including a rare analyte‐induced current increase by the n‐channel semiconductor. This is the first step towards ‘intelligent sensors’ that utilize analog signal changes in sensitive OFETs to produce direct digital readouts suitable for further logic operations.     

Inkjet‐Printed Single‐Droplet Organic Transistors Based on Semiconductor Nanowires Embedded in Insulating Polymers

Fabrication of organic field‐effect transistors (OFETs) using a high‐throughput printing process has garnered tremendous interest for realizing low‐cost and large‐area flexible electronic devices. Printing of organic semiconductors for active layer of transistor is one of the most critical steps for achieving this goal. The charge carrier transport behavior in this layer, dictated by the crystalline microstructure and molecular orientations of the organic semiconductor, determines the transistor performance. Here, it is demonstrated that an inkjet‐printed single‐droplet of a semiconducting/insulating polymer blend holds substantial promise as a means for implementing direct‐write fabrication of organic transistors. Control of the solubility of the semiconducting component in a blend solution can yield an inkjet‐printed single‐droplet blend film characterized by a semiconductor nanowire network embedded in an insulating polymer matrix. The inkjet‐printed blend films having this unique structure provide effective pathways for charge carrier transport through semiconductor nanowires, as well as significantly improve the on‐off current ratio and the environmental stability of the printed transistors.     

Air‐ and Active Hydrogen‐Induced Electron Trapping and Operational Instability in n‐Type Polymer Field‐Effect Transistors

Organic field‐effect transistors (OFETs) have attracted much attention for the next‐generation electronics. Despite of the rapid developments of OFETs, operational stability is a big challenge for their commercial applications. Moreover, the actual mechanism behind the degradation of electron transport is still poorly understood. Here, the electrical characteristics of poly{[N,N‐9‐bis(2‐octyldodecyl)‐naphthalene‐1,4,5,8‐bis(dicarboximide)‐2,6‐diyl]‐alt‐5,59‐(2,29‐bithiophene)} (P(NDI2OD‐T2)) thin‐film transistors (TFTs) as a function of semiconductor/dielectric interfacial property and environment are systematically investigated, in particular, how the copresence of water, oxygen, and active hydrogen on the surface of dielectric leads to a sharp drop‐off in threshold voltage. Evidence is found that an acid–base neutralization reaction occurring at the interface, as a combined effect of the chemical instability of dielectrics and the electrochemical instability of organic semiconductors, contributes to the significant electron trapping on the interface of P(NDI2OD‐T2) TFTs. Two strategies, increasing the intrinsic electrochemical stability of semiconductor and decreasing the chemical reactivity of gate dielectric, are demonstrated to effectively suppress the reaction and thus improve the operational stability of n‐type OFETs. The results provide an alternative degradation pathway to better understand the charge transport instability in n‐type OFETs, which is advantageous to construct high‐performance OFETs with long‐term stability.     

Anodization for Simplified Processing and Efficient Charge Transport in Vertical Organic Field‐Effect Transistors

Vertical organic transistors are an attractive alternative to realize short channel transistors, which are required for powerful electronic devices and flexible electronic circuits operating at high frequencies. Unfortunately, the vertical device architecture comes along with an increased device fabrication complexity, limiting the potential of this technology for application. A new design of vertical organic field‐effect transistors (VOFETs) with superior electrical performance and simplified processing is reported. By using electrochemical oxidized aluminum oxide (AlO_x) as a pseudo self‐aligned charge‐blocking structure in vertical organic transistors, direct leakage current between the source and drain can be effectively suppressed, enabling VOFETs with very low off‐current levels despite the short channel length. The anodization technique is easy to apply and can be surprisingly used on both n‐type and p‐type organic semiconductor thin films with significant signs of degradation. Hence, the anodization technique enables a simplified process of high‐performance p‐type and n‐type VOFETs, paving the road toward complementary circuits made of vertical transistors.     

The Influence of Film Morphology in High‐Mobility Small‐Molecule:Polymer Blend Organic Transistors

Organic field‐effect transistors (OFETs) based upon blends of small molecular semiconductors and polymers show promise for high performance organic electronics applications. Here the charge transport characteristics of high mobility p‐channel organic transistors based on 2,8‐difluoro‐5,11‐bis(triethylsilylethynyl) anthradithiophene:poly(triarylamine) blend films are investigated. By simple alteration of the film processing conditions two distinct film microstructures can be obtained: one characterized by small spherulitic grains (SG) and one by large grains (LG). Charge transport measurements reveal thermally activated hole transport in both SG and LG film microstructures with two distinct temperature regimes. For temperatures >115 K, gate voltage dependent activation energies (E_A) in the range of 25–60 meV are derived. At temperatures <115 K, the activation energies are smaller and typically in the range 5–30 meV. For both film microstructures hole transport appears to be dominated by trapping at the grain boundaries. Estimates of the trap densities suggests that LG films with fewer grain boundaries are characterized by a reduced number of traps that are less energetically disordered but deeper in energy than for small SG films. The effects of source and drain electrode treatment with self‐assembled monolayers (SAMs) on current injection is also investigated. Fluorinated thiol SAMs were found to alter the work function of gold electrodes by up to ～1 eV leading to a lower contact resistance. However, charge transport analysis suggests that electrode work function is not the only parameter to consider for efficient charge injection.     

Electrical Double‐Slope Nonideality in Organic Field‐Effect Transistors

The field effect transistor (FET) is arguably one of the most important circuit elements in modern electronics. Recently, a need has developed for flexible electronics in a variety of emerging applications. Examples include form‐fitting healthcare‐monitoring devices, flexible displays, and flexible radio frequency identification tags. Organic FETs (OFETs) are viable candidates for producing such flexible devices because they incorporate semiconducting π‐conjugated materials, including small molecules and conjugated polymers, which are intrinsically soft and mechanically compatible with flexible substrates. For OFETs to be industrially viable, however, they must achieve not only high charge carrier mobility, but also ideal and comprehensible electrical characteristics. Most recently, nonideal double‐slope characteristics in the transfer curves of OFETs (i.e., high slope at low gate voltage and low slope at high gate voltage), have stirred debate, which has led to different mechanistic rationales in the literature. This review focuses on the general observations, mechanistic understanding, and possible solutions associated with phenomena that result in FETs with double‐slope characteristics. By surveying and systematically summarizing in a single source relevant literature that deals with the issue of double slope, the experimental framework and theoretical basis for interpreting and avoiding this electrical nonideality in OFETs is provided.     

Bias‐Stress‐Induced Charge Trapping at Polymer Chain Ends of Polymer Gate‐Dielectrics in Organic Transistors

Herein is demonstrated that the polymer chain ends of polymer gate‐ dielectrics (PGDs) in organic field‐effect transistors (OFETs) can trap charges; the bias‐stress stability is reduced without changes in the mobilities of the transistor devices as well as the morphologies of the organic semiconductors. The bias‐stress stabilities of OFETs using PGD with various molecular weights (MWs) are investigated. Under bias stress in ambient air, the drain current decay and the threshold voltage shift are found to increase as the MW of the PGD decreases (MW effect). This MW effect is caused by the variation in the density of polymer chain ends in the PGDs with MW: the free volumes at the polymer chain ends act as charge‐trap sites, resulting in drain current decay during bias stress. The free volumes at polymer chain ends are sufficiently large to allow the residence of water molecules, the presence of which significantly increases the density of charge‐trap sites. In contrast, polymer chain ends without trapped water molecules do not allow charge trapping and so bias‐stress stability is independent of the MW of the PGD. It is also found that the hydrophilicity/hydrophobicity of the chain ends of the PGD can affect bias‐stress stability; carboxyl‐terminated polystyrene exhibits a much higher trap density and lower bias‐stress stability than hydrogen‐terminated polystyrene when these devices are exposed to humid nitrogen.     

Hot Electrons and Hot Spins at Metal–Organic Interfaces

A model is developed to describe the electron transport properties of hot electron devices based on organic semiconductors. For the first time, the simulations cover all the different processes the carriers experience in the device, which allows disentangling various effects on the transport characteristics. The model is compared to experimental measurements and excellent agreement is found. In addition, the model includes the electron spin and is thus able to describe a hot spin transistor. In this device, a spatial variation of the spin diffusion length is found, which scales inversely proportional to the variation of the electron density. The spin current can be increased by increasing the hot electron energy and by decreasing the image charge barrier without changing the spin diffusion length. Unprecedented insight into the effect of interfacial disorder at the metal–organic interface on charge and spin transport is provided. Finally, conditions are established, where majority and minority spin carriers propagate in opposite directions, increasing the spin current relative to the charge current and the occurrence of pure spin currents is analyzed.