A 16-bit cascaded sigma-delta pipeline A/D converter

A low-noise cascaded multi-bit sigma-delta pipeline analog-to-digital converter (ADC) with a low oversampling rate is presented. The architecture is composed of a 2-order 5-bit sigma-delta modulator and a cascaded 4-stage 12-bit pipelined ADC, and operates at a low 8X oversampling rate, The static and dynamic performances of the whole ADC can be improved by using dynamic element matching technique. The ADC operates at a 4 MHz clock rate and dissipates 300 mW at a 5 V/3 V analog/digital power supply. It is developed in a 0.35 μm CMOS process and achieves an SNR of 82 dB.     

A 16-bit cascaded sigma-delta pipeline A/D converter

A low-noise cascaded multi-bit sigma-delta pipeline analog-to-digital converter （ADC） with a low over-sampling rate is presented. The architecture is composed of a 2-order 5-bit sigma-delta modulator and a cascaded 4-stage 12-bit pipelined ADC, and operates at a low 8X oversampling rate. The static and dynamic performances of the whole ADC can be improved by using dynamic element matching technique. The ADC operates at a 4 MHz clock rate and dissipates 300 mW at a 5 V/3 V analog/digital power supply. It is developed in a 0.35μm CMOS process and achieves an SNR of 82 dB.     

A low-voltage low-power sigma-delta modulator for broadband analog-to-digital conversion

A cascade of sigma-delta modulator stages that employ a feedforward architecture to reduce the signal ranges required at the integrator inputs and outputs has been used to implement a broadband, high-resolution oversampling CMOS analog-to-digital converter capable of operating from low-supply voltages. An experimental prototype of the proposed architecture has been integrated in a 0.25-/spl mu/m CMOS technology and operates from an analog supply of only 1.2 V. At a sampling rate of 40 MSamples/sec, it achieves a dynamic range of 96 dB for a 1.25-MHz signal bandwidth. The analog power dissipation is 44 mW.     

A 150-MS/s 8-b 71-mW CMOS time-interleaved ADC

A pipelined analog-to-digital converter (ADC) architecture suitable for high-speed (150 MHz), Nyquist-rate A/D conversion is presented. At the input of the converter, two parallel track-and-hold circuits are used to separately drive the sub-ADC of a 2.8-b first pipeline stage and the input to two time-interleaved residue generation paths. Beyond the first pipeline stage, each residue path includes a cascade of two 1.5-b pipeline stages followed by a 4-b "backend" folding ADC. The full-scale residue range at the output of the pipeline stages is half that of the converter input range in order to conserve power in the operational amplifiers used in each residue path. An experimental prototype of the proposed ADC has been integrated in a 0.18-/spl mu/m CMOS technology and operates from a 1.8-V supply. At a sampling rate of 150 MSample/s, it achieves a peak SNDR of 45.4 dB for an input frequency of 80 MHz. The power dissipation is 71 mW.     

A two-path bandpass sigma-delta modulator with extended noiseshaping

A three-stage bandpass sigma-delta (ΣΔ) analog-to-digital converter has been designed specifically for operation at low oversampling ratios. In the proposed architecture, the center frequency of the third stage is shifted slightly from that of the first two stages to achieve more efficient noise shaping across the signal band. An experimental modulator based on the proposed topology has been integrated in a 0.25-μm CMOS technology and achieves a dynamic range of 75 dB with a maximum signal-to-noise-plus-distortion ratio (SNDR) of 70 dB when digitizing a 2-MHz signal band centered at 16 MHz. This circuit implements an f_s/4 bandpass architecture and thus operates at 64-MHz clock rate. It dissipates 110 mW from a 2.5-V supply, and its active area is 4 mm²     

A 1.8-V ΔΣ modulator interface for an electretmicrophone with on-chip reference

The design of a delta-sigma (ΔΣ) analog-to-digital converter (ADC) for direct voltage readout of an electret microphone is presented. The ADC is integrated on the same chip with a bandgap voltage reference and is designed to be packaged together with an electret microphone. Having a power consumption of 1.7 mW from a supply voltage of 1.8 V, the circuit is well suited for use in mobile applications. The single-loop, single-bit, fourth-order ΔΣ ADC operates at 64 times oversampling for a signal bandwidth of 11 kHz. The measured dynamic range is 80 dB and the peak signal-to-(noise+distortion) ratio is 62 dB. The harmonic distortion is minimized by using an integrator with an instrumentation amplifier-like input which directly integrates the 125-mV peak single-ended voltage generated by the microphone. A combined continuous-time/switched-capacitor design is used to minimize power consumption     

A 14-bit, 10-Msamples/s D/A converter using multibit /spl Sigma//spl Delta/ modulation

A 14-bit digital-to-analog converter based on a fourth-order multibit sigma-delta modulator is described. The digital modulator is pipelined to minimize both its power dissipation and design complexity. The 6-bit output of this modulator is converted to analog using 64 current-steering cells that are continuously calibrated to a reference current. This converter achieves 85-dB dynamic range at 5-MHz signal bandwidth, with an oversampling ratio of 12. The chip was fabricated in a 0.5-/spl mu/m CMOS technology and operates from a single 2.5-V supply.     

Improved low-distortion sigma-delta ADC with DWA for WLAN standards

An improved low distortion sigma-delta ADC (analog-to-digital converter) for wireless local area network standards is presented. A feed-forward MASH 2-2 multi-bit cascaded sigma-delta ADC is adopted; however, this work shows a much better performance than the ADCs which have been presented to date by adding a feedback factor in the second stage to improve the performance of the in-band SNDR (signal to noise and distortion ratio), using 4-bit ADCs in both stages to minimize the quantization noise. Data weighted averaging technology is therefore used to decrease the mismatch noise induced by the 4-bit DACs, which improves the SFDR (spurious free dynamic range) of the ADC.The modulator has been implemented by a 0.18μm CMOS process and operates at a single 1.8 V supply voltage.Experimental results show that for a 1.25 MHz @ -6 dBFS input signal at 160 MHz sampling frequency, the improved ADC with all non-idealities considered achieves a peak SNDR of 80.9 dB and an SFDR of 87 dB, and the effective number of bits is 13.15 bits.     

A 50-MHz multibit sigma-delta modulator for 12-b 2-MHz A/Dconversion

The authors examine the application of oversampling techniques to analog-to-digital conversion at rates exceeding 1 MHz. A cascaded multibit sigma-delta (ΣΔ) modulator that substantially reduces the oversampling ratio required for 12-b conversion while avoiding stringent component matching requirements is introduced. Issues concerning the design and implementation of the modulator are presented. At a sampling rate of 50 MHz and an oversampling ratio of 24, an implementation of the modulator in a 1-μm CMOS technology achieves a dynamic range of 74 dB at a Nyquist conversion rate of 2.1 MHz. The experimental modulator is a fully differential circuit that operates from a single 5-V power supply and does not require calibration or component trimming     

A 64-MHz clock-rate /spl Sigma//spl Delta/ ADC with 88-dB SNDR and -105-dB IM3 distortion at a 1.5-MHz signal frequency

A 64-MHz clock rate sigma-delta (/spl Sigma//spl Delta/) analog-to-digital converter (ADC) with -105-dB intermodulation distortion (IMD) at a 1.5-MHz signal frequency is reported. A linear replica bridge sampling network enables the ADC to achieve high linearity for high signal frequencies. Operating at an oversampling ratio of 29, a 2-1-1 cascade with a 2-b quantizer in the last stage reduces the quantization noise level well below that of the thermal noise. The measured signal-to-noise and distortion ratio (SNDR) in 1.1-MHz bandwidth is 88 dB, and the spurious-free-dynamic-range (SFDR) is 106 dB. The modulator and reference buffers occupy a 2.6-mm/sup 2/ die area and have been implemented with thick oxide devices, with minimum channel length of 0.35 /spl mu/m, in a dual-gate 0.18-/spl mu/m 1.8-V single-poly five-metal (SP5M) digital CMOS process. The power consumed by the ADC is 230 mW, including the decimation filters.     

A 12-bit 20-Msample/s pipelined analog-to-digital converter with nested digital background calibration

A 12-bit 20-Msample/s pipelined analog-to-digital converter (ADC) is calibrated in the background using an algorithmic ADC, which is itself calibrated in the foreground. The overall calibration architecture is nested. The calibration overcomes the circuit nonidealities caused by capacitor mismatch and finite operational amplifier (opamp) gain both in the pipelined ADC and the algorithmic ADC. With a 58-kHz sinusoidal input, test results show that the pipelined ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 70.8 dB, a peak spurious-free dynamic range (SFDR) of 93.3 dB, a total harmonic distortion (THD) of -92.9 dB, and a peak integral nonlinearity (INL) of 0.47 least significant bit (LSB). The total power dissipation is 254 mW from 3.3 V. The active area is 7.5 mm/sup 2/ in 0.35-/spl mu/m CMOS.     

Analog to digital converter for high density neural signal recording front-end in 90 nm

High-fidelity recording of neural signals requires varying levels of signal gain to capture low-amplitude single-unit activity in the presence of high-amplitude population activity. A floating-point approach has been used to widen the dynamic range of analog-to-digital converters (ADC) designed for this application. In this paper we present an ADC, designed for multi-channel, portable neural signal recording systems. To achieve low power consumption, small die area and wide dynamic range, an ADC based on a time-based algorithm, combined with a floating-point pipelined structure has been designed and simulated. A conventional variable-gain amplifier (VGA) stage has been eliminated in favor of a reference-current in a time-based ADC architecture. The 12-b pipelined time-based floating-point ADC has been designed with a 7-b mantissa and an exponent that provides an additional 5 bits of dynamic range. The mantissa is determined by a uniform 7-b pipelined time-based analog to digital converter. The ADC chip was designed and simulated in a 90 nm CMOS process, which occupies an active area of 360 μm × 550 μm, and consumes 7.8 μW at 1.2 V in full-scale conversion.     

A 10-bit 50-MS/s subsampling pipelined ADC based on SMDAC and opamp sharing

This paper describes a 10-bit,50-MS/s pipelined A/D converter(ADC) with proposed area- and power-efficient architecture.The conventional dedicated sample-hold-amplifier(SHA) is eliminated and the matching requirement between the first multiplying digital-to-analog converter(MDAC) and sub-ADC is also avoided by using the SHA merged with the first MDAC(SMDAC) architecture,which features low power and stabilization.Further reduction of power and area is achieved by sharing an opamp between two successive pi...     

A 10-b 40-Msample/s BiCMOS A/D converter

A fully-differential, 10-b, 40-Msample/s pipelined analog-to-digital converter (ADC) has been developed and tested. The converter exhibits a signal-to-(noise+distortion) ratio (SNDR) of 57.1 dB and consumes <400 mW of power from a single 5 V supply. The converter can digitize not only a fully-differential but also a single-ended input signal over a wide input range with little variation in converter performance. In addition, a full-power bandwidth (FPBW) of >250 MHz is made possible with the open-loop sampling scheme     

A 1.5 V 10-b 30-MS/s CMOS pipelined analog-to-digital converter

A 1.5 V 10-b 30MS/s CMOS pipelined analog-to-digital converter (ADC) is described. Low-voltage techniques are proposed for pipelined analog-to-digital converter that avoids the use of low-threshold voltage process, on-chip clock voltage doubler, bootstrapped switch, or switched-opamp technique. At the front-end, a low-voltage S/H circuit with cross-coupled input sampling switch is employed to eliminate the input signal feedthrough and enhance the dynamic performance of the pipelined ADC. Multiplying digital-to-analog converter (MDAC) with cross-coupled configuration also provides an effective common-mode feedback to overcome the problem of common-mode accumulation. The prototype chips have been fabricated and experimental results confirm the feasibility of this new technique.     

A 14-b 20-Msamples/s CMOS pipelined ADC

The capacitor error-averaging technique, updated with look-ahead decision and digital correction, is used to demonstrate a 14-b 20-Msamples/s pipelined analog-to digital converter (ADC) with no trimming or calibration. The prototype ADC exhibits a differential nonlinearity (DNL) of +0.23/-0.28 least significant bit (LSB), an integral nonlinearity (INL) of +0.95/-1.06 LSB, a spurious-free dynamic range (SFDR) of 91.6 dB, and a signal-to-noise ratio (SNR) of 74.2 dB with a 1-MHz input and a 20-MHz clock. The prototype in 0.5-μm CMOS occupies an area of 4.5×2.4 mm² and consumes 720 mW at 5 V     

A 13-b 40-MSamples/s CMOS pipelined folding ADC with backgroundoffset trimming

Two key concepts of pipelining and background offset trimming are applied to demonstrate a 13-b 40-MSamples/s CMOS analog-to-digital converter (ADC) based on the basic folding and interpolation architecture. Folding amplifier stages made of simple differential pairs are pipelined using distributed interstage track-and-holders. Background offset trimming implemented with a highly oversampling delta-sigma modulator enhances the resolution of the CMOS folders beyond 12 bits. The background offset trimming circuit continuously measures and adjusts the offsets of the folding amplifiers without interfering with the normal operation. The prototype system is further refined using subranging and digital correction, and exhibits a spurious-free dynamic range (SFDR) of 82 dB at 40 MSamples/s. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are about ±0.5 and ±2.0 LSB, respectively. The chip fabricated in 0.5-μm CMOS occupies 8.7 mm² and consumes 800 mW at 5 V     

A 3 V Wideband CMOS Switched-Current A/D-Converter Suitable for Time-Interleaved Operation

The simulated and measured performance of an experimental 10-b wideband CMOS A/D converter design is presented. Fully-differential first-generation switched-current circuits with common-mode feedforward were used to implement a 1.5-b/stage pipelined architecture in order to evaluate the switched-current technique for digital radio applications. With f _in = 1.83, the measured spurious-free dynamic range (SFDR) is 60.3 dB and the signal-to-noise-and-distortion ratio (SNDR) = 46.5dB at 3 MS/s. Although this 3 V design was fabricated in a standard digital 5 V, 0.8 m CMOS process, a high bandwidth was achieved. Since the ADC maintains an SNDR 40 dB for input frequencies of more than 20 MHz, it has the highest input bandwidth reported for any CMOS switched-current A/D-converter implementation. Its sample rate can be increased by parallel, time-interleaved, operation. Measurement results are compared with the measured performance of other wideband switched-current A/D converters and found to be competitive also with respect to area and power efficiency.     

A 12-bit 100 MS/s pipelined ADC with digital background calibration

This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter (ADC) with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog converter (MDAC) while the architecture of the MDAC remains unchanged. When sampled at 100 MS/s, it takes only 2.8 s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input. Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration. The chip is fabricated in a 0.18μm CMOS process, occupies an active area of 2.3×1.6 mm~2, and consumes 205 mW at 1.8 V.     

A high-resolution multibit ΣΔ ADC with digitalcorrection and relaxed amplifier requirements

A second-order multibit ΣΔ (sigma-delta) analog-to-digital converter (ADC) with a 4-b internal quantizer is described. It uses a simple and fast digital correction scheme. A correlated-double-sampling (CDS) fully differential integrator was used, in which the op amp needed only a low slew rate and moderate bandwidth for a sampling rate of 5.25 MHz. A second-order modulator was fabricated in the standard MOSIS p-well 2-μm CMOS process. The excellent measured linearity and high S/(N+D) ratio (95 dB with an oversampling ratio of only 128) of the corrected converter verified the practical advantages of the proposed architecture