EBSD coupled to SEM in situ annealing for assessing recrystallization and grain growth mechanisms in pure tantalum

An in situ annealing stage has been developed in‐house and integrated in the chamber of a Scanning Electron Microscope equipped with an Electron BackScattered Diffraction system. Based on the Joule effect, this device can reach the temperature of 1200°C at heating rates up to 100°C/s, avoiding microstructural evolutions during heating. A high‐purity tantalum deformed sample has been annealed at variable temperature in the range 750°C–1030°C, and classical mechanisms of microstructural evolutions such as recrystallization and grain coarsening phenomena have been observed. Quantitative measurements of grain growth rates provide an estimate of the mean grain boundary mobility, which is consistent with the value estimated from physical parameters reported for that material. In situ annealing therefore appears to be suited for complementing bulk measurements at relatively high temperatures, in the context of recrystallization and grain growth in such a single‐phase material.     

The application of a hot deformation SEM stage, backscattered electron imaging and EBSD to the study of thermomechanical processing

The technique of combining in situ hot‐deformation and high resolution electron backscattered diffraction (EBSD) has been applied to study the mechanisms operating during the thermomechanical processing of metals. A simple hot tensile‐straining stage is installed in a field emission gun scanning electron microscope equipped with an EBSD system and has been used successfully for a number of preliminary investigations. These investigations include substructure formation, dynamic subgrain and grain growth, superplastic deformation in aluminium alloys, and dynamic recrystallization in copper. Despite the surface topography, which inevitably increases during plastic deformation, channelling contrast backscattered electron micrographs have been successfully obtained after strains of up to ～50%. Good quality EBSD maps have been obtained after strains of up to 100%. Most observations and measurements from the in situ experiments are consistent with what is known about the mechanisms occurring in the bulk. The microstructures revealed in the centre of the in situ samples after later repolishing are generally similar to those at the surface.     

Visualization of grain subdivision by analysing the misorientations within a grain using electron backscatter diffraction

The misorientation relative to the average orientation of a grain and the point-to-point relative misorientation along a line across a moderately cold deformed grain, calculated from an electron backscatter diffraction (EBSD) dataset, are analysed in detail by visualizing both the misorientation angle and the misorientation axis. The significance of monitoring the misorientation axis is illustrated by an example of a grain subdivided into a misorientation band structure. A new technique to visualize the subdivision structure by assigning colours to misorientations in such a way that the contrast is maximized within a grain is introduced and discussed. Furthermore, some methods for grain boundary reconstruction from EBSD datasets are compared with the map of the confidence index in order to provide a validation of the accuracy of these methods.     

High-throughput determination of grain size distributions by EBSD with low-discrepancy sampling

Because microstructure plays an important role in the mechanical properties of structural materials, developing the capability to quantify microstructures rapidly is important to enabling high-throughput screening of structural materials. Electron backscatter diffraction (EBSD) is a common method for studying microstructures and extracting information such as grain size distributions (GSDs), but is not particularly fast and thus could be a bottleneck in high-throughput systems. One approach to accelerating EBSD is to reduce the number of points that must be scanned. In this work, we describe an iterative method for reducing the number of scan points needed to measure GSDs using incremental low-discrepancy sampling, including on-the-fly grain size calculations and a convergence test for the resulting GSD based on the Kolmogorov–Smirnov test. We demonstrate this method on five real EBSD maps collected from magnesium AZ31B specimens and compare the effectiveness of sampling according to two different low discrepancy sequences, the Sobol and R₂ sequences, and random sampling. We find that R₂ sampling is able to produce GSDs that are statistically very similar to the GSDs of the full density grids using, on average, only 52% of the total scan points. For EBSD maps that contained monodisperse GSDs and over 1000 grains, R₂ sampling only required an average of 39% of the total EBSD points.     

Recrystallization phenomena in an IF steel observed by in situ EBSD experiments

In situ electron backscatter diffraction microstructural analysis of recrystallizing interstitial free steels deformed to strains of 0.75 and 1.6 has been carried out in a FEG‐SEM. The experimental procedures are discussed, and it is shown that there is no degradation of the electron backscatter diffraction patterns at temperatures up to 800°C. Analysis of the surface and interior microstructures of annealed samples shows only minor difference, which suggests that in situ annealing experiments are of value. In addition, it is shown that in situ measurements allow a detailed comparison between the same areas before and after annealing, thereby providing information about the recrystallization mechanisms. Sequential recrystallization phenomena, such as initiation and growth of new grains, are observed at temperatures over 740°C, and depending on the deformation histories, different recrystallization behaviour is observed. It is found that {111}〈123〉 recrystallized grains are preferentially formed in the highly deformed material, whereas no strong recrystallization texture is formed in the lower strained material.     

The use of combined cathodoluminescence and EBSD analysis: a case study investigating grain boundary migration mechanisms in quartz

Grain boundary migration is an important mechanism of microstructural modification both in rocks and in metals. Combining detailed cathodoluminescence (CL) and electron backscatter diffraction (EBSD) analysis offers the opportunity to relate directly changes in crystallographic orientation to migrating boundaries. We observe the following features in naturally heated quartz grains from the thermal aureole of the Ballachulish Igneous Complex (Scotland, U.K.): (a) propagation of substructures and twin boundaries in swept areas both parallel and at an angle to the growth direction, (b) development of slightly different crystallographic orientations and new twin boundaries at both the growth interfaces and within the swept area and (c) a gradual change in crystallographic orientation in the direction of growth. All these features are compatible with a growth mechanism in which single atoms are attached and detached both at random and at preferential sites, i.e. crystallographically controlled sites or kinks in boundary ledges. Additionally, strain fields caused by defects and/or trace element incorporation may facilitate nucleation sites for new crystallographic orientations at distinct growth interfaces but also at continuously migrating boundaries. This study illustrates the usefulness of combined CL and EBSD in microprocess analysis. Further work in this direction may provide detailed insight into both the mechanism of static grain growth and the energies and mobilities of boundaries in terms of misorientation and grain boundary plane orientation.     

Three-dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co–Ni films

Electrodeposited nanocrystalline materials are expected to have a homogeneous grain size and a narrow grain size distribution. In Co–Ni electrodeposited films, however, under certain conditions an undesired columnar grain structure is formed. Fully automated three‐dimensional (3D) orientation microscopy, consisting of a combination of precise material removal by focussed ion beam and subsequent electron backscatter diffraction (EBSD) analysis, was applied to fully characterize the grain boundaries of these columnar grains in order to gain further understanding on their formation mechanisms. Two‐dimensional orientation microscopy on these films indicated that the development of columnar grains could be related to the formation of low‐energy triple junctions. 3D EBSD allowed us to verify this suggestion and to determine the boundary planes of these triples. The triplets are formed by grain boundaries of different quality, a coherent twin on the {} plane, an incoherent twin and a large‐angle grain boundary. These three boundaries are related to each other by a rotation about the 〈〉 direction. A second particularity of the columnar grains is the occurrence of characteristic orientation gradients created by regular defects in the grain. Transmission electron microscopy was applied to investigate the character of the defects. For this purpose, a sample was prepared with the focussed ion beam from the last slice of the 3D EBSD investigation. From the TEM and 3D EBSD observations, a growth mechanism of the columnar grains is proposed.     

High-temperature electron backscatter diffraction and scanning electron microscopy imaging techniques: in-situ investigations of dynamic processes

In-situ heating experiments have been conducted at temperatures of approximately 1200 K utilising a new design of scanning electron microscope, the CamScan X500. The X500 has been designed to optimise the potential for electron backscatter diffraction (EBSD) analysis with concomitant in-situ heating experimentation. Features of the new design include an inclined field emission gun (FEG) column, which affords the EBSD geometrical requirement of a high (typically 160 degrees) angle between the incoming electron beam and specimen surface, but avoids complications in heating-stage design and operation by maintaining it in a horizontal orientation. Our studies have found that secondary electron and orientation contrast imaging has been possible for a variety of specimen materials up to a temperature of at least 900 degrees C, without significant degradation of imaging quality. Electron backscatter diffraction patterns have been acquired at temperatures of at least 900 degrees C and are of sufficient quality to allow automated data collection. Automated EBSD maps have been produced at temperatures between 200 degrees C and 700 degrees C in aluminium, brass, nickel, steel, quartz, and calcite, and even at temperatures >890 degrees C in pure titanium. The combination of scanning electron microscope imaging techniques and EBSD analysis with high-temperature in-situ experiments is a powerful tool for the observation of dynamic crystallographic and microstructural processes in metals, semiconductor materials, and ceramics.     

Five-parameter grain boundary analysis of a grain boundary–engineered austenitic stainless steel

Two different grain boundary engineering processing routes for type 304 austenitic stainless steel have been compared. The processing routes involve the application of a small level of strain (5%) through either cold rolling or uni-axial tensile straining followed by high-temperature annealing. Electron backscatter diffraction and orientation mapping have been used to measure the proportions of Σ3ⁿ boundary types (in coincidence site lattice notation) and degree of random boundary break-up, in order to gain a measure of the success of the two types of grain boundary engineering treatments. The distribution of grain boundary plane crystallography has also been measured and analyzed in detail using the five-parameter stereological method. There were significant differences between the grain boundary population profiles depending on the type of deformation applied.     

Morphological analyses of minute crystals by using stereo-photogrammetric scanning electron microscopy and electron back-scattered diffraction

We present a new method for the morphological analyses of minute faceted crystals by combining stereo-photogrammetric analysis of scanning electron microscope images and electron back-scattered diffraction. Two scanning electron microscope images of the same crystal, recorded at different tilt angles of the specimen stage, are used to determine the orientations of crystal edges in a specimen-fixed coordinate system. The edge orientations are converted to the indices [ uvw ] in the crystal system using the crystal orientation determined by electron back-scattered diffraction analysis. The Miller indices of crystal facets are derived from the indices of the edges surrounding the facets. The method is applicable to very small crystal facets. The angular error, as derived from tests using a calcite crystal of known morphology, is a few degrees.
To demonstrate the applicability of the method, the morphology of boehmite (γ-AlOOH) precipitated from solution during the dissolution of anorthite was analyzed. The micrometre-sized boehmite crystals are surrounded by two {010} basal facets and eight equivalent side facets that can be indexed equally well as {323}, {434} or {545}. We suggest that these side facets are in fact {111}, the morphology having been modified slightly (by a few degrees) by a small extension associated with opening along (010) microcleavage planes. Tiny {140} facets are also commonly observed.     

采用电子背散射衍射技术研究变形温度对压缩后1235铝合金织构的影响

采用电子背散射衍射技术对经不同温度热压缩后1235铝合金的织构进行了研究,分析了在50%变形量、0.1s-1应变速率下,变形温度对该合金晶粒取向、晶界特征及织构组分的影响。结果表明:随着变形温度的升高,织构的取向聚集性弱化,织构相对体积总含量降低,晶粒内小角度晶界更稀疏,大角度晶界更加平直且连通性好,再结晶晶粒长大更充分。     

The role of misorientation and phosphorus content on grain growth and intergranular fracture in iron–carbon–phosphorus alloys

The relationship between the crystallography of intergranular fracture and phosphorus segregation has been investigated in a Fe?0.06wt%P?0.002wt%C alloy aged for 1 h at temperatures between 600 °C and 1000 °C. Two novel techniques were devised for the investigation: first, electron back‐scatter diffraction (EBSD) across the reconstructed fracture surface and, second, a combination of Auger electron spectroscopy, stereophotogrammetry and microscopy to measure phosphorus and carbon on fracture facets combined with EBSD measurements direct from the fracture surface. In total, 700 misorientations were measured from across the reconstructed fracture surface and in ‘control’ areas away from the fracture. It was found that Σ 3s were in general more resistant to brittle fracture than were random boundaries, and it was suggested that alloys of this type could be grain boundary engineered to improve fracture resistance by a short anneal in the austenite region to increase the final proportion of Σ 3s. Sixteen fracture facets yielded combined Auger/EBSD data. The combined Auger/EBSD methodology to acquire joint crystallographic and segregation information from facets was shown to be feasible, although laborious. There were significantly more {110} planes than any other type in the sample population of facets from which combined segregation/crystallography data had been collected. The data suggested that there was on average lower phosphorus segregation on fracture facets that were near {110} than on other intergranular fracture facets.     

First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite

The structures of boundaries in a deformed and dynamically recovered and recrystallized quartz polycrystal (mylonite) were characterized by transmission electron microscopy, after the misorientation angles across the same grain boundaries had been analysed using electron backscatter diffraction in a scanning electron microscope. In this new approach, a specific sample area is mapped with electron backscatter diffraction, and the mapped area is then attached to a foil, and by the ion beam thinned for transmission electron microscopy analysis. Dislocations in grain boundaries were recognized as periodic and parallel fringes. The fringes associated with dislocations are observed in boundaries with misorientations less than 9°, whereas such fringes cannot be seen in the boundaries with misorientations larger than 17°. Some boundaries with misorientations between 9° and 17° generally have no structures associated with dislocation. One segment of a boundary with a misorientation of 13.5° has structures associated with dislocations. It is likely that the transition from low‐angle to high‐angle boundaries occurs at misorientations ranging from approximately 9° to 14°. Change in the grain boundary structure presumably influences the mobility of the boundaries. In the studied deformed quartz vein, a relative dearth of boundaries between misorientation angles of θ = 2° and θ = 15° has previously been reported, and high‐angle boundaries form cusps where they intersect low‐angle boundaries, suggesting substantial mobility of high‐angle boundaries.     

Crystallographic preferred orientation (CPO) of gypsum measured by electron backscatter diffraction (EBSD)

An investigation by electron backscatter diffraction on gypsum shows that this technique can be used to study the microstructures and crystallographic preferred orientation of gypsum. Presented here are the methods, verification tests and data obtained from a naturally deformed sample of gypsum‐rich rock. The electron backscatter diffraction data show the sample has a strong crystallographic preferred orientation.     

Study of the surfactant role in latex–aerogel systems by scanning transmission electron microscopy on aqueous suspensions

For insulation applications, boards thinner than 2 cm are under design with specific thermal conductivities lower than 15 mW m^?1 K^?1. This requires binding slightly hydrophobic aerogels which are highly nanoporous granular materials. To reach this step and ensure insulation board durability at the building scale, it is compulsory to design, characterise and analyse the microstructure at the nanoscale. It is indeed necessary to understand how the solid material is formed from a liquid suspension. This issue is addressed in this paper through wet‐STEM experiments carried out in an Environmental Scanning Electron Microscope (ESEM). Latex–surfactant binary blends and latex–surfactant–aerogel ternary systems are studied, with two different surfactants of very different chemical structures. Image analysis is used to distinguish the different components and get quantitative morphological parameters which describe the sample architecture. The evolution of such morphological parameters during water evaporation permits a good understanding of the role of the surfactant.     

What environmental transmission electron microscopy measures and how this links to diffusivity: thermodynamics versus kinetics

Environmental or in situ electron microscopy means the observation of material in its native environment, which can be gaseous or liquid, as compared to more traditional post‐mortem electron microscopy carried out under (ultra) high vacuum conditions. Experiments can be performed on bulk samples in scanning electron microscopes or on thinned samples in transmission (scanning) electron microscopes. In the latter, the movement, in real time and in situ, of nanoparticles, clusters or even single atoms on the surfaces of thinned material or within a liquid can be observed. It is argued here that due to the changes that a specimen typically undergoes during in situ observation, electron irradiation effects are difficult to evaluate and so thermodynamic parameters, such as activation energies for diffusion and segregation, which are governed by movements of only a minority of atoms in the specimen, cannot be reliably determined because of the potentially high energy transfer by the irradiating electron beam to some atoms in the sample. In order to measure diffusivities reliably, radiation effects and surface diffusion need to be excluded or kept minimal so as not to disturb the measurements, which can be checked by repeating experiments and comparing results as function of time and dose for the same position, at different positions or for different specimen thicknesses. Kinetic measurements of nucleation and growth phenomena, such as Ostwald ripening, are possibly influenced to a far lesser degree by irradiation effects, as a majority of atoms actively participate in these processes and if a small fraction of them will get extra energy from the irradiation process then their influence on the overall kinetics may be rather minor.     

The characterization of low-angle boundaries by EBSD

A method of accurately measuring misorientations by electron backscatter diffraction (EBSD), which is an extension of that proposed by Wilkinson and based on the comparison of diffraction patterns, is described. The method has been applied to linescans, and found to improve the angular resolution by a factor of more than 30. The consequent improvement in determining misorientation axes is also analysed. Small changes of orientation very close to some low-angle boundaries were investigated and found to be artefacts of the analysis. Measurements of the area from which diffraction patterns are generated show this to be much larger than the effective spatial resolution of EBSD, and it is concluded that this may be a limiting factor in the use of EBSD for microstructural characterization.     

Back-scattered electron imaging combined with EBSD technique for characterization of pearlitic steels

Microstructure of pearlitic steels subjected different heat treatments were characterized combining the usage of back-scattered electron imaging and electron backscatter diffraction in a scanning electron microscope. The results indicated that the method used in current study enabled the acquisition of pearlite nodule, colony and interlamellar spacing of pearlite structure only through sample preparation of one time. Both the morphology of pearlite lamellae and the crystallographic orientation of ferrite matrix can be released in back-scattered electron imaging image and electron backscatter diffraction micrograph acquired at the same region. The definitions of pearlite colony and the low-angle boundaries existed in ferrite matrix were also discussed based on this method.     

Improving the quality of electron backscatter diffraction (EBSD) patterns from nanoparticles

In this study, we investigated the relative contributions of atomic number (Z) and density (ρ) to the degradation of the electron backscatter diffraction (EBSD) pattern quality for nanoparticles < 500 nm in diameter. This was accomplished by minimizing the diffuse scattering from the conventional thick mounting substrate through the design of a sample holder that can accommodate particles mounted on thin‐film TEM substrates. With this design, the contributions of incoherently scattered electrons that result in the diffuse background are minimized. Qualitative and quantitative comparisons were made of the EBSD pattern quality obtained from Al₂O₃ particles approximately 200 nm in diameter mounted on both thick‐ and thin‐film C substrates. For the quantitative comparison we developed a ‘quality’ factor for EBSD patterns that is based on the ratio of two Hough transforms derived from a given EBSD pattern image. The calculated quality factor is directly proportional to the signal‐to‐noise ratio for the EBSD pattern. In addition to the comparison of the thick and thin mounting substrates, we also estimated the effects of Z and ρ by comparing the EBSD pattern quality from the Al₂O₃ particles mounted on thin‐film substrates with the quality of patterns obtained from Fe–Co nanoparticles approximately 120 nm in diameter. The results indicate that the increased background generated in EBSD patterns by the electrons escaping through the bottom of the small particles is the dominant reason for the poor EBSD pattern quality from nanoparticles < 500 nm in size. This was supported by the fact that we were able to obtain usable EBSD patterns from Al₂O₃ particles as small as 130 nm using the thin‐film mounting method.     

'Five-parameter' analysis of grain boundary networks by electron backscatter diffraction

This paper describes state‐of‐the‐art analysis of grain boundary populations by EBSD, with particular emphasis on advanced, nonstandard analysis. Data processing based both on misorientation alone and customised additions which include the boundary planes are reviewed. Although commercial EBSD packages offer comprehensive data processing options for interfaces, it is clear that there is a wealth of more in‐depth data that can be gleaned from further analysis. In particular, determination of all five degrees of freedom of the boundary population provides an exciting opportunity to study grain boundaries by EBSD in a depth that was hitherto impossible. In this presentation we show ‘five‐parameter’ data from 50 000 boundary segments in grain boundary engineered brass. This is the first time that the distribution of boundary planes has been revealed in a grain boundary engineered material.