基于线偏振片和液晶可调滤光片的斯托克斯参量测量系统

为了快速获得无抖动偏振图像,本文提出了一种实时测量斯托克斯参量的新方法,即在固定不动的液晶可调滤光片（LCTF）前加一块可旋转的偏振片,使入射光依次经过线偏振片和LCTF到达CCD,然后通过计算接收到的光强得出斯托克斯参量,确定光束的偏振态,得到偏振图像。通过计算发现,当LCTF透光轴与系统X轴的夹角为π／8,偏振片透光轴与系统X轴夹角分别为0、π／4、π／2和3π／4时,偏振参数的获得就比较简单。偏振片的旋转代替了LCTF的旋转,测量的偏振图像无抖动,偏振度和偏振角图像精确。该系统可以获得较高的帧频,在目标识别和反伪装领域具有重要的应用价值。     

基于光谱干涉技术的波片相位延迟量测量方法

作为波片最重要的技术参数，波片相位延迟量的精确度会直接影响整个偏振光学系统的性能，在有些情况下，使用前需要对其进行精确测量。根据偏振干涉光谱曲线分布特性提出了一种测量波片相位延迟量的方法。此方法是将待测波片置于起偏镜和检偏镜之间，利用分光光度计测量一定范围内光谱透射率曲线，通过精确提取曲线上定值透射率对应波长，利用公式可同时获得待测波片的绝对相位延迟量、有效相位延迟量、波片级次、波片厚度等多个光学参数。理论分析和实验结果表明，该方法适用于具有任意延迟量的晶体零级或多级波片，具有测量精度高、对起偏镜与检偏镜透振方向和待测波片快轴方向调节无严格要求、操作简单的优势。     

电控矢量涡旋光的偏振测试研究

为了研究电控相位延迟对矢量涡旋光偏振态的影响规律, 采用半波液晶可变延迟器和液晶q波片搭建了电控矢量涡旋光的全斯托克斯偏振测试实验装置, 进行了电控矢量涡旋光的斯托克斯参量传输特性的Muller矩阵分析和实验验证。通过对输入偏振光进行连续相位调控, 获得了其通过调谐q波片后的输出光束偏振态演变规律。结果表明, 电控相位延迟会改变角向和径向偏振光的局域偏振椭偏度, 且随电压变化呈线性关系, 同时偏振态演变会影响矢量涡旋光的输出光强。此研究对于探索电控矢量涡旋光的偏振转换有着重要的意义。     

旋转波片法成像斯托克斯偏振仪误差标定和补偿

旋转波片法成像斯托克斯偏振仪由可旋转的1/4波片、固定的检偏器、成像光学器件和光电探测器构成,1/4波片的快轴方位角误差和相位延迟量误差是旋转波片法成像斯托克斯偏振仪的主要误差源,对其进行误差标定和补偿,可有效提高测量精度。为此,通过研究旋转波片测量法和傅里叶分析法,推导出入射光束斯托克斯参量与1/4波片参数误差之间的关系式,从而提出一种误差标定新方法,该方法以水平线偏振光作为标准参考光,对标准参考光进行测量,计算得到1/4波片的参数误差,并将其代入相应理论公式中,从而实现误差补偿。实验结果表明,通过误差标定和补偿,成像斯托克斯偏振仪的平均测量精度由原来的5.12%提高至1.78%,验证了该方法的有效性。     

斯托克斯光偏振态测量系统的优化

为了满足光偏振态分振幅测量模块（DOAP）对分光棱镜复杂且严格的加工要求,采用在经典DOAP透射光路及反射光路各引入一块波片的方法,组成改进后的光偏振态测量模块。推导了新的仪器矩阵表达式,通过分析波片参量对仪器矩阵条件数的影响,得到了最佳波片的参量及其关系。结果表明,优化后的斯托克斯椭偏仪测量薄膜样品的厚度和折射率的标准差分别为0.1nm和0.001。通过选择波片的最佳方位角或相位延迟量可以实现斯托克斯椭偏仪仪器矩阵的优化,从而提高系统的测量稳定性及可靠性。     

液晶光谱偏振系统选偏器方位误差研究

为了分析液晶光谱偏振系统的方位误差并降低测量误差,提出了选偏器方位误差的分析方法。该方法基于Stokes矢量及Mueller矩阵,将偏振角的方位误差转化为Stokes矢量传递误差,推导了误差的协方差矩阵,分析了权重系数与延迟相位的变化关系,并对不同偏振态入射光条件下的品质因数变化进行了计算仿真。方位误差依赖于入射光Stokes参数与延迟相位,不同偏振态的入射光品质因数随延迟相位成抛物线变化。当延迟相位位于[60°,120°]区间内,选偏器的方位误差较小,测量误差较小适宜测量。通过对液晶偏振光谱系统配准误差的研究,获得误差来源,为进一步提高系统测量精度奠定了理论基础。     

空间调制线偏振光谱测量的波片延迟误差校正

基于四分之一波片-复合双折射光楔-偏振片的空间偏振调制结构,提出了四光束校正方法,对四分之一波片延迟量误差进行校正,从而达到提高线偏振测量精度的目的;利用计算机仿真手段,研究了待测目标圆偏振参量变化时,线偏振参量测量结果的变化情况以及相应的测量精度水平。仿真结果表明:当待测目标的线偏振度、圆偏振度分别在0.1~0.2、0~0.2随机波动时,延迟校正后的斯托克斯参量Qi、Ui以及线偏振度的测量精度优于10-3,Ui以及线偏振度的测量精度比延迟校正前提高了约14倍。     

一种基于PEM和EOM联合调制的波片参量检测方法北大核心CSCD

波片作为一种能改变入射光偏振状态产生相位延迟的重要光学元件,它的准确快速测量一直是研究的热点,为了解决波片参量检测灵敏度不足、速度慢的问题,提出了一种基于弹光和电光联合调制同时测量波片相位延迟量和快轴方位角的简单方法。在该方法中一个参考光路用于监测PEM的相位延迟量实现相位的稳定控制,另一个光路在PEM保持稳定后实现待测波片参量的检测,基于FPGA与数字锁相技术提取探测信号的倍频分量和直流分量,并在片上可编程系统中实现数据处理,从而快速高精度完成对波片相位延迟量和快轴方位角的检测。实验结果显示在PEM相位延迟量稳定在2.405 rad时,该系统检测波片的相位延迟量和快轴方位角的平均相对偏差分别为0.27%和0.25%。测量过程简单快捷、测量精度较高。     

基于双波片的偏振调控和偏振测量技术

针对双波片偏振调控结构,基于Stokes-Mueller矩阵偏振算法,对双1/4波片和双1/2波片的偏振调控机理作了详尽的理论分析,得出调控偏振态与双波片快轴方向之间的关系,并追迹其在庞加莱球上的运动轨迹.基于双波片调控结构搭建偏振测量系统,根据入射和出射Stokes矢量构建了投影关系矩阵算法,完成了待测元件Mueller矩阵的测量,并分析了波片的快轴方向误差和位相延迟误差对Mueller矩阵测量结果以及对出射偏振态调控精度的影响.分析结果表明:波片的快轴方向误差控制在±2°内,位相延迟误差不大于λ/300时,Mueller矩阵的最大测量误差为0.040 2,波片自身误差对测量结果的影响可以忽略不计;波片自身误差所引起的方位角误差不大于0.16rad时,快轴方向误差引起的椭率角误差最大不超过0.032 rad,位相延迟误差导致的椭率角误差小于0.015 rad,且对偏振度无影响.     

气溶胶偏振探测仪偏振特性分析

为了确定非理想透镜组偏振效应和偏振片的透过轴角度误差对气溶胶偏振探测仪偏振测量精度的影响,首先,利用Jones矩阵描述透镜组的偏振效应,结合入射光相干矩阵推导了气溶胶偏振探测仪前置光学透镜组的起偏度;其次,利用Mueller矩阵方法推导了综合考虑入射光偏振态、透镜组起偏效应和偏振片透过轴方位角误差影响下的气溶胶偏振探测仪的偏振测量误差;最后,通过计算得到透镜组的起偏度和仪器的绝对偏振度测量误差。根据计算,0.67 μm通道透镜组最大起偏度和仪器最大绝对偏振测量误差分别是0.3143和0.2838;1.64 μm通道透镜组最大起偏度和仪器最大绝对偏振测量误差分别是0.3249和0.2937。结果显示,仪器的主要误差源是非理想透镜组的偏振效应,未经标定的气溶胶偏振测量仪存在严重的测量误差。     

Polarimetry of illumination for 193 nm immersion lithography

We have constructed a theory of polarimetry of illumination used in 193 nm lithography equipments, fabricated a polarimeter mask, and demonstrated it for a hyper-NA (numerical aperture) immersion lithography scanner. The polarimeter mask comprises newly developed thin polarizers and wide-view-angle quarter-wave (λ/4) plates. Although a light traveling through these polarization devices on the polarimeter mask reaches an image detector at the wafer level through a projection optics, Stokes parameters of the illumination light can be measured with no influence from polarization characteristics of the projection optics between the mask and the image detector.     

Longitudinal polarization-dependent coupling of light from anoptical fiber to a side-bonded planar proximity detector: application tointegrated azimuthally distributed multidetector photopolarimeters

An in-line integrated fiber-optic photopolarimeter (IFOP) is described for the complete measurement of the state of polarization (SOP) of light. The IFOP consists of four azimuthally distributed side-bonded planar proximity detectors (SBPPDs), each of which develops an electrical signal proportional to the polarization-dependent fraction of light that it absorbs from the fiber guide. The four outputs thus developed determine the four Stokes parameters of light in the fiber via an instrument matrix which is fixed by calibration, in much the same way as has been established for the four-detector polarimeter of unguided beams. Simpler IFOPs using only two detectors, of which at least one is a SBPPD, are also proposed for partial or complete measurement of the SOP     

空间调制型全偏振成像系统的角度误差优化

空间调制型全偏振成像系统利用 Savart偏光镜能够将被探测目标的4个 Stokes参数 S0~S3调制在同一幅干涉图像中,从而通过单次采集便可获得完整的偏振信息。在该系统中,半波片和检偏器的角度误差对 Stokes参数的测量精度有着不可忽略的影响。文中首先给出了包含上述两种角度误差的干涉强度调制方程,根据实际系统参数,在角度误差模型的基础上分析了当入射光为自然光、0/90线偏振光、45/135线偏振光和左/右旋圆偏振光时,角度误差对空间调制型全偏振成像系统的 Stokes参数测量精度的影响。利用这四种基态偏振光的偏振测量误差,给出了任意偏振态和偏振度的入射光偏振测量误差的表征方法,最后,文中以系统测量矩阵条件数为优化目标函数,经仿真计算得出当 Savart板厚度为 23 mm时系统测量矩阵条件取得最小值为 2.06,半波片和检偏器耦合角度误差对系统偏振测量精度的影响程度最小。     

气溶胶偏振探测仪检偏器方位角优化

非理想透镜组的偏振效应引起偏振测量系统的测量矩阵改变,导致系统最佳配置漂移.为了最大化气溶胶偏振探测仪的信噪比,利用Jones矩阵的方法计算前置光学透镜组的起偏度,并分别以系统分析矩阵的条件数和参数Tr(BBT)为优化参数对检偏器的放置角度进行优化.经过优化,得到检偏器的最佳方位角,在670 nm通道系统分析矩阵的条件数由1.836 0降为1.689 4,在1 641 nm通道系统分析矩阵的条件数由1.977 7降为1.771 4.结果表明,两种优化方法的结果基本一致,经过优化之后两个偏振测量通道的信噪比都提升10%左右.     

暗电流对短波红外偏振测量精度的影响

探测器暗电流及其测量不确定度是影响短波红外偏振测量仪器测量精度的最重要因素。首先,结合红外探测器的工作原理,分析并建立了暗电流影响下的红外探测系统噪声模型。根据分析结果设计实验获得短波红外探测器G5853-21暗电流与温度和反向偏压关系。然后,以分孔径偏振探测系统为例,推导了斯托克斯参数误差模型和偏振度误差模型。最后,重点分析空间环境应用背景下,针对暗电流影响的改进措施,提出了探测器精确温控的暗电流影响改进方案,并给出了短波红外探测器工作温度指标要求。结果表明:通过对探测器进行精确的温度控制以降低暗电流数值,可以将包含暗电流测量不确定度和其他噪声引起的偏振度测量误差控制在0.42%(=0.3时)以内。     

Coherent frequency-selective polarimeter for polarization-mode dispersion monitoring

Frequency-selective polarimeters measure the state of polarization of the individual spectral components of a modulated optical signal. They can be used either as stand-alone measuring devices or as parts of adaptive polarization-mode dispersion (PMD) compensators. This paper presents a novel frequency-selective polarimeter based on coherent detection, which has superior accuracy compared to previously proposed direct detection-based counterparts. This is due to the high-frequency resolution and power sensitivity of coherent detection, features that minimize the systematic and random error, respectively, in the measurement of the state of polarization of the individual spectral components of the received optical signal. The accuracy of the measurement is independent of the received signal bit rate and modulation format. The proposed frequency-selective polarimeter is studied both theoretically and experimentally. The primary theoretical contribution of this paper is a unified formalism, which allows the modeling of both direct and coherent detection-based frequency-selective polarimeters. Analytical expressions for the output signal of both types of frequency-selective polarimeters are derived. Based on these expressions, a common algorithm is proposed for the evaluation of the Stokes parameters. In addition, an example error signal is used as a metric in order to test the agreement of the theoretical model with the experimental measurements. The successful operation of the coherent frequency-selective polarimeter is demonstrated experimentally for a 10-Gb/s intensity-modulated nonreturn-to-zero (NRZ) optical signal in the presence of first-order polarization-mode dispersion. There is an excellent agreement between theory and experiment.     

Integrated optical polarization-discriminating receiver in glass

We have successfully demonstrated an integrated optical TE-TM mode discriminator using waveguide polarizers and guided-wave photodetectors for use in polarimetric optical sensor and positioning systems. The photonic integrated circuit consists of a Y-branch waveguide splitter formed by potassium-sodium ion exchange in silicate glass. Hydrogenated amorphous silicon claddings were deposited on each branch of the splitter to act as polarizers. One output cladding was trimmed to a thickness which attenuated the TE polarization, while the other cladding was trimmed to attenuate light having TM polarization. The thickness trimming was accomplished using a process of localized plasma etching which allows in situ extinction optimization by monitoring transmitted light. Optical extinction ratios of up to 27 dB were demonstrated on Y-branch waveguides for polarizers with claddings 1.2 mm in length. The integrated receiver was completed with the deposition of metal-semiconductor-metal photodetectors on each of the output waveguide branches following the polarizers. Amorphous silicon claddings were contacted with chrome-gold interdigitated Schottky contacts to form the waveguide detectors     

杂波背景中雷达目标极化检测的比较研究

该文导出了高斯随机极化波的瞬态Stokes矢量的联合概率密度函数,由此导出了基于Stokes矢量的极化检测器及其检测概率、虚警概率的解析表达式,并给出了该检测器在不同杂波极化度条件下的检测性能理论曲线。对基于Stokes矢量和基于Jones矢量的极化检测器进行了比较研究,给出了大脉冲数条件下二者检测性能差异的解析表达式,证明了基于Stokes矢量的极化检测器是正交双极化接收、非相参积累条件下的最优检测器。      

Monitoring PMD-induced penalty and other system performance metrics via a high-speed spectral polarimeter

We developed and tested a nonintrusive technique for estimating polarization-mode-dispersion-induced system penalties based on spectral polarization measurements. Other system characteristics such as power fluctuations and carrier-frequency drift could also be monitored simultaneously. Our spectral polarimeter works in milliseconds, and can be scaled to monitor all channels in the C-band.