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1.
Delayed failure and creep behavior of high-purity Si3N4 sintered without additives with a mean grain size of 1 μm has been measured at 1400°C. Lifetime under 300 MPa was >240 h, which showed good agreement with the value predicted in our previous report. Creep strain rate ranged from 1 × 10−5 to 3 × 10−5 h−1 between 200 and 360 MPa. These values demonstrate the excellent potential of high-purity Si3N4 materials for structural application up to 1400°C.  相似文献   

2.
The compressive creep behavior and oxidation resistance of an Si3N4/Y2Si2O7 material (0.85Si3N4+0.10SiO2+0.05Y2O3) were determined at 1400°C. Creep re sistance was superior to that of other Si3N4 materials and was significantly in creased by a preoxidation treatment (1600°C /120 h). An apparent parabolic rate constant of 4.2 × 10−11 kg2·m-4·s−1 indicates excellent oxidation resistance.  相似文献   

3.
The electrical conductivity of polycrystalline Y2O3 has been studied as a function of the partial pressure of oxygen (10–14 to 105 Pa) at 900° to 1500°C in atmospheres saturated with water vapor at 12°C or dried with P2O5. Yttria is a p -conductor at high oxygen activities. The p -conductivity increases with increasing P O2 and decreases with increasing PH2O. At low oxygen activities the oxide is a mixed ionic/electronic conductor. The ionic conductivity is approximately independent of P O2 and increases with increasing P H2O. In the Y2O3 samples, excesses of lower-valent cation impurities (in the 10 to 100 mol-ppm range) are the dominating negatively charged defects, and in the presence of water vapor they are compensated by interstitial protons. At high P H2O levels additional protons are probably compensated by interstitial oxygen ions. At high temperatures (±1100°C) and for high P O2 and low P H2O, the protons are no longer dominant, and the lower-valent cations are mainly compensated by electron holes. The electrical conductivity exhibits hysteresis-like effects which are interpreted in terms of segregation/desegregation of impurities at grain boundaries. The mobility of electron holes in yttria at 1500°C is estimated to be of the order of magnitude of 0.05 cm2. s–1. V–1  相似文献   

4.
A new method for preparing high bending strength porous silicon nitride (Si3N4) ceramics with controlled porosity has been developed by using pressureless sintering techniques and phosphoric acid (H3PO4) as the pore-forming agent. The fabrication process is described in detail and the sintering mechanism of porous ceramics is analyzed by the X-ray diffraction method and thermal analysis. The microstructure and mechanical properties of the porous Si3N4 ceramics are investigated, as a function of the content of H3PO4. The resultant high porous Si3N4 ceramics sintered at 1000°–1200°C show a fine porous structure and a relative high bending strength. The porous structure is caused mainly by the volatilization of the H3PO4 and by the continous reaction of SiP2O7 binder, which could bond on to the Si3N4 grains. Porous Si3N4 ceramics with a porosity of 42%–63%, the bending strength of 50–120 MPa are obtained.  相似文献   

5.
The mechanical behavior of MoSi2 reinforced–Si3N4 matrix composites was investigated as a function of MoSi2 phase content, MoSi2 phase size, and amount of MgO densification aid for the Si3N4 phase. Coarse-phase MoSi2-Si3N4 composites exhibited higher room-temperature fracture toughness than fine-phase composites, reaching values >8 MP·am1/2. Composite fracture toughness levels increased at elevated temperature. Fine-phase composites were stronger and more creep resistant than coarse phase composites. Room-temperature strengths >1000 MPa and impression creep rates of ∼10−8 s−1 at 1200°C were observed. Increased MgO levels generally were deleterious to MoSi2-Si3N4 mechanical properties. Internal stresses due to MoSi2 and Si3N4 thermal expansion coefficient mismatch appeared to contribute to fracture toughening in MoSi2-Si3N4 composites.  相似文献   

6.
TiN-coated Si3N4 particles were prepared by depositing TiO2 on the Si3N4 surfaces from Ti(O- i -C3H7)4 solution, the TiO2 being formed by controlled hydrolysis, then subsequently nitrided with NH3 gas. A homogeneous TiO2 coating was achieved by heating a Si3N4 suspension containing 1.0 vol% H2O with the precursor at 40°C. Nitridation successfully produced Si3N4 particles coated with 10–20 nm TiN particles. Spark plasma sintering of these TiN/Si3N4 particles at 1600°C yielded composite ceramics with a relative density of 96% at 25 vol% TiN and an electrical resistivity of 10−3Ω·cm in compositions of 17.5 and 25 vol% TiN/Si3N4, making these ceramics suitable for electric discharge machining.  相似文献   

7.
The tribological behavior of Mo5Si3-particle-reinforced silicon nitride (Si3N4) composites was investigated by pin-on-plate wear testing under dry conditions. The friction coefficient of the Mo5Si3–Si3N4 composites and Si3N4 essentially decreased slowly with the sliding distance, but showed sudden increase for several times during the wear testing. The average friction coefficient of the Si3N4 decreased with the incorporation of submicrometer-sized Mo5Si3 particles and also as the content of Mo5Si3 particles increased. When the Mo5Si3–Si3N4 composites were oxidized at 700°C in air, solid-lubricant MoO3 particles were generated on the surface layer. Oxidized Mo5Si3–Si3N4 composites showed self-lubricating behavior, and the average friction coefficient and wear rate of the oxidized 2.8 wt% Mo5Si3–Si3N4 composite were 0.43 and 0.72 × 10−5 mm3 (N·m)−1, respectively. Both values were ∼30% lower than those for the Si3N4 tested in an identical manner.  相似文献   

8.
The results of two-step oxidation experiments on chemically-vapor-deposited Si3N4 and SiC at 1350°C show that a correlation exists between the presence of a Si2N2O interphase and the strong oxidation resistance of Si3N4. During normal oxidation, k p for SiC was 15 times higher than that for Si3N4, and the oxide scale on Si3N4 was found by SEM and TEM to contain a prominent Si2N2O inner layer. However, when oxidized samples are annealed in Ar for 1.5 h at 1500°C and reoxidized at 1350°C as before, three things happen: the oxidation k p increases over 55-fold for Si3N4, and 3.5-fold for SiC; the Si3N4 and SiC oxidize with nearly equal k p's; and, most significant, the oxide scale on Si3N4 is found to be lacking an inner Si2N2O layer. The implications of this correlation for the competing models of Si3N4 oxidation are discussed.  相似文献   

9.
Tin(IV) oxide (SnO2) crystallizes at room temperature by adding hydrazine monohydrate ((NH2)2· H2O) to a hydrochloric acid solution of tin, followed by washing and drying. Well-densified SnO2 ceramics (99.8% of theoretical) with an average grain size of 0.9 μm have been fabricated by hot isostatic pressing for 2 h at 900°C and 196 MPa. Their Vickers hardness and bending strength are 14.4 GPa and 200 MPa, respectively. They exhibit an electrical conductivity of 2 × 10−3−9 × 10−3 S·cm−1 at room temperature.  相似文献   

10.
Si3N4/MoSi2 and Si3N4/WSi2 composites were prepared by reaction-bonding processes using as starting materials powder mixtures of Si-Mo and Si-W, respectively. A presintering step in an At-base atmosphere was used before nitriding for the formation of MoSi2 and WSi2; the nitridation in a N2-base atmosphere was followed after presintering with the total stepwise cycle of 1350°C × 20 h +1400°C × 20 h +1450°C × 2 h. The final phases obtained in the two different composites were Si3N4 and MoSi2 or WSi2; no free elemental Si and Mo or W were detected by X-ray diffraction.  相似文献   

11.
A thermo gravimetric study of the oxidation behavior of chemically vapor-deposited amorphous and crystalline Si3N4 (CVD Si3N4) was made in dry oxygen (0.1 MPa) at 1550° to 1650°C. The specimens were prepared under various deposition conditions using a mixture of SiCl4, NH3, and H2 gases. The crystalline CVD Si3N4 indicated a parabolic oxidation kinetics over the whole temperature range, whereas the amorphous CVD Si3N4 changed from a parabolic to a linear law with increased temperature. The oxidation mechanism is discussed in terms of the activation energy for the oxidation and the microstructure of the formed oxide films.  相似文献   

12.
The fracture energies of the tape-cast silicon nitride with and without 3 wt% rod-like β-Si3N4 seed addition were investigated by a chevron-notched-beam technique. The material was doped with Lu2O3–SiO2 as sintering additives for giving rigid grain boundaries and good heat resistance. The seeded and tape-cast silicon nitride has anisotropic microstructure, where the fibrous grains grown from seeds were preferentially aligned parallel to the casting direction. When a stress was applied parallel to the fibrous grain alignment direction, the strength measured at 1500°C was 738 MPa, which was almost the same as room temperature strength 739 MPa. The fracture energy of the tape-cast Si3N4 without seed addition was 109 and 454 J/m2 at room temperature and 1500°C, respectively. On the contrary, the fracture energy of the seeded and tape-cast Si3N4 was 301 and 781 J/m2 at room temperature and 1500°C, respectively, when a stress was applied parallel to the fibrous gain alignment. The large fracture energies were attributable primarily to the unidirectional alignment fibrous Si3N4 grains.  相似文献   

13.
Studies of the oxidation of Gd and Dy at P O2's from 10−0.3 to 10−14.5 atm and temperatures from 727° to 1327°C indicate both semiconducting and ionic-conducting domains in the sesquioxides formed. At higher temperatures, where dense coarsegrained oxide layers developed, the rate of oxidation in the high- P 02 semiconducting domain yielded oxygen diffusion coefficients in Dy2O3 in excellent agreement with literature values derived from oxidation of partially reduced oxide single crystals. Under the same conditions, the oxidation of Gd yielded oxygen diffusion coefficients in cubic Gd2O3 which are considerably below literature values for monoclinic single-crystal Gd2O3. At lower temperatures, porous scales were formed, and apparent diffusion coefficients derived from oxidation rates show a smaller temperature dependence than the high-temperature data. At low P O2, the oxides behave as ionic conductors, and metal oxidation rates result in estimates of the electronic contribution to the electrical conductivity of the order of 10−6 to 10−7Ω−1 cm−1.  相似文献   

14.
Composites containing 30 vol%β-Si3N4 whiskers in a Si3N4 matrix were fabricated by hot-pressing. The composites exhibited fracture toughness values between 7.6 and 8.6 MPa · m1/2, compared to 4.0 MPa · m1/2 for unreinforced polycrystalline Si3N4. The improvements in fracture toughness were attributed to crack wake effects, i.e., whisker bridging and pullout mechanisms.  相似文献   

15.
Si3N4 powders with the concurrent addition of Yb2O3 and MgSiN2 were sintered at 1900°C for 2–48 h under 0.9 MPa nitrogen pressure. Microstructure, lattice oxygen content, and thermal conductivity of the sintered specimens were evaluated and compared with Si3N4, Yb2O3, and MgO addition. MgSiN2 addition was effective for improving the thermal conductivity of Si3N4 ceramics, and a material with high thermal conductivity over 140 W·(m·K)−1 could be obtained. For both specimens, lattice oxygen content was decreased with sintering time. However, the thermal conductivity of the MgSiN2-doped specimen was slightly higher than the MgO-doped specimen with the same oxygen content.  相似文献   

16.
Dense, ZrO2-dispersed Si3N4 composites without additives were fabricated at 180 MPa and ∼1850° to 1900°C for l h by hot isostatic pressing using a glass-encapsulation method; the densities reached >96% of theoretical. The dispersion of 20 wt% of 2.5YZrO2 (2.5 mol% Y2O3) in Si3N4 was advantageous to increase the room-temperature fracture toughness (∼7.5 MPa˙m1/2) without degradation of hardness (∼15 GPa) because of the high retention of tetragonal ZrO2. The dependence of fracture toughness of Si3N4–2.5YZrO2 on ZrO2 content can be related to the formation of zirconium oxynitride because of the reaction between ZrO2 and Si3N4 matrix in hot isostatic pressing.  相似文献   

17.
Polycrystalline bulk samples of Ti3SiC2 were fabricated by reactively hot-pressing Ti, graphite, and SiC powders at 40 MPa and 1600°C for 4 h. This compound has remarkable properties. Its compressive strength, measured at room temperature, was 600 MPa, and dropped to 260 MPa at 1300°C in air. Although the room-temperature failure was brittle, the high-temperature load-displacement curve shows significant plastic behavior. The oxidation is parabolic and at 1000° and 1400°C the parabolic rate constants were, respectively, 2 × 10−8 and 2 × 10−5 kg2-m−4.s−1. The activation energy for oxidation is thus =300 kJ/mol. The room-temperature electrical conductivity is 4.5 × 106Ω−1.m−1, roughly twice that of pure Ti. The thermal expansion coefficient in the temperature range 25° to 1000°C, the room-temperature thermal conductivity, and the heat capacity are respectively, 10 × 10−6°C−1, 43 W/(m.K), and 588 J/(kgK). With a hardness of 4 GPa and a Young's modulus of 320 GPa, it is relatively soft, but reasonably stiff. Furthermore, Ti3SiC2 does not appear to be susceptible to thermal shock; quenching from 1400°C into water does not affect the postquench bend strength. As significantly, this compound is as readily machinable as graphite. Scanning electron microscopy of polished and fractured surfaces leaves little doubt as to its layered nature.  相似文献   

18.
The reactions of a sintered α-SiC with 5% H2/H2O/Ar at 1300°C were studied. Thermomchemical modeling indicates that three reaction regions are expected, depending on the initial water vapor or equivalently oxygen content of the gas stream. A high oxygen content ( P (O2) > 10−22 atm) leads to a SiO2 formation. This generally forms as a protective film and limits consumption of the SiC (passive oxidation). An intermediate oxygen content (10−22 atm > P (O2) > 10−26 atm) leads to SiO and CO formation. These gaseous products can lead to rapid consumption of the SiC (active oxidation). Thermogravimetric studies in this intermediate region gave reaction rates which appear to be controlled by H2O gas-phase transport to the sample and reacted microstructures showed extensive grain-boundary attack in this region. Finally, a very low oxygen content ( P (O2) < 10−26 atm) is thermochemically predicted to lead to selective removal of carbon and formation of free silicon. Experimentally low weight losses and iron silicides are observed in this region. The iron silicides are attributed to reaction of free silicon and iron impurities in the system.  相似文献   

19.
Phase relationships in the Si3N4–SiO2–Lu2O3 system were investigated at 1850°C in 1 MPa N2. Only J-phase, Lu4Si2O7N2 (monoclinic, space group P 21/ c , a = 0.74235(8) nm, b = 1.02649(10) nm, c = 1.06595(12) nm, and β= 109.793(6)°) exists as a lutetium silicon oxynitride phase in the Si3N4–SiO2–Lu2O3 system. The Si3N4/Lu2O3 ratio is 1, corresponding to the M-phase composition, resulted in a mixture of Lu–J-phase, β-Si3N4, and a new phase of Lu3Si5ON9, having orthorhombic symmetry, space group Pbcm (No. 57), with a = 0.49361(5) nm, b = 1.60622(16) nm, and c = 1.05143(11) nm. The new phase is best represented in the new Si3N4–LuN–Lu2O3 system. The phase diagram suggests that Lu4Si2O7N2 is an excellent grain-boundary phase of silicon nitride ceramics for high-temperature applications.  相似文献   

20.
Steady-state creep experiments were performed on hot-pressed polycrystalline MgO doped with Fe. Dead-load 4-point bend creep tests were conducted at stresses of 26 to 270 kg/cm2, at temperatures of 1250° to 1450°C, in O2 partial pressures of 1 to 10−9 atm, on specimens with grain sizes of 10 to 65 μm. Viscous steady-state creep was always observed when the grain size was stable. Experiments at variable P O2's and temperatures were used to identify regimes of high (117 ± 10 kcal/mol) and low (81 ± 5 kcal/mol) activation energy. In the latter, creep rates were nearly independent of Fe dopant concentration and P O2, whereas in the former creep rates were enhanced by increasing P O2's and Fe dopant levels. The high- and low-activation-energy regimes were interpreted as diffusional creep controlled primarily by Mg lattice diffusion and O grain-boundary diffusion, respectively.  相似文献   

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