标准铂电阻温度计为什么要采用电阻比计算温度?

答:自1927年通过国际实用温标至1968年,国际实用温标都规定采用电阻比计算温度,这是因为用标准电阻温度计测量时,用电阻比计算温度要比用电阻绝对计算温度更准确,其理由如下: 1.实验结果证明:铂电阻温度计在零度时电阻值R_0,在放置条件下的自然变化或受热后的变化有三种情况:(1)逐渐升高;(2)逐渐下降;(3)经过充分退火后,R_0趋于稳定。电阻比虽然也同样有逐渐升高或下降的趋势,但要比电阻绝对值的变化稳定得多。 2.温度计电阻值是由测温电桥或电位差计测定的,为此至少也需要使用一个(或几个)标准电阻作标准,因此在电阻值的传递过程中,     

铂丝位错特性对标准铂电阻温度计稳定性影响的研究

铂丝的位错是影响标准铂电阻温度计性能稳定性的重要因素之一。从微观角度出发,借助X射线衍射(XRD)分析方法,开展了退火时间对铂丝位错密度影响的研究,并利用标准铂电阻温度计退火实验数据进行了验证。结果表明:实际用于标准铂电阻温度计直径为0.07mm的新制铂丝(纯度99.999%)平均位错密度随着退火时间呈指数减小,经过100h退火后位错密度从1012cm^-2下降到1011cm^-2,300h后其位错密度基本保持稳定;新制标准铂电阻温度计在退火前300h其水三相点电阻值明显减小,退火300h后水三相点值变化量小于3mK并趋于平稳,此结果从热处理时间上与铂丝位错实验结果基本吻合。研究结果为标准铂电阻温度计制作工艺的提升及计量检定规程的修订提供技术支撑     

小型斯特林制冷机回热器理论模型与分析

对小型斯特林制冷机回热器建立理论模型,通过对控制方程进行无量纲化处理及合理简化,推导出表征小型斯特林制冷机回热器不可逆性的熵流方程。     

白炭黑和炭黑含量对导电硅橡胶拉敏特性影响的研究

分别研究了炭黑和白炭黑填充剂对导电硅橡胶拉敏特性的影响，通过对两者实验结果的比较，发现白炭黑可使导电硅橡胶的电阻弛豫时间明显减少，并确定了最佳的炭黑填充量。同时对其电阻值的弛豫过程及其电阻随拉力的变化关系等实验结果作出比较合理的理论模型解释。     

基于MSET和SPRT的内燃机气阀机构振动监测

提出了一种基于多元状态估计(Multivariate State Estimation Techniques,MSET)和序贯概率比检验(Sequential Probability Ratio Test,SPRT)的内燃机气阀机构振动监测方法.在该方法中,首先建立正常工况下各监测参数之间的关联模型;然后根据系统当前观测特征向量与各建模样本特征向量之间的相似性程度,使用MSET对当前观测特征向量进行估计,得到与观测特征向量相对应的估计残差;最后使用SPRT对观测特征向量的估计残差进行均值和方差检验,确定系统的工作状态.试验中,通过设置不同的气阀间隙大小来模拟内燃机气阀机构不同程度的异常工况,以整周期缸盖振动信号幅值域特征作为系统工况监测参数.试验结果表明,MSET可有效增强故障状态下的信号特征呈现,而SPRT可在较少的周期内实现内燃机气阀机构异常工况的识别,MSET和SPRT的结合有效地实现了对内燃机气阀机构异常工况的早期监测.     

不连续[NiFe/Ag]_n多层薄膜低场巨磁阻研究

用直流磁控溅射和快速真空磁场退火工艺在玻璃基片上制备了 [NiFe/Ag]n不连续多层膜。从理论上分析了不连续膜低响应、高磁电阻值的机制 ,不连续膜模型介于多层膜模型及颗粒膜模型之间。研究了工艺条件 ,即退火温度、退火时间及空间层Ag厚度对不连续膜巨磁电阻特性的影响 ,并对工艺条件进行了优化 ,在常温下获得巨磁电阻值 13% ,饱和场Hs<80 0A/m ,磁场灵敏度 1 3% / 80Am-1的优质薄膜材料。     

使用三氧化钨薄膜之苯气体传感器

本文利用微机电(Micro-Electro-Mechanical Systems,MEMS)制程制作成三氧化钨薄膜苯气体传感器,其结构包含三氧化钨(WO3)感测层、白金(Pt)指叉式电极(包括加热及感测两部分).利用RF溅渡方式沉积出三氧化钨薄膜,再由退火处理来得到较多的孔洞结构来提升传感器的灵敏度,并使用蒸镀(E-beam)方式制作白金指叉式电极.再将微型传感器置于气体检测箱在200℃、250℃及300℃不同操作温度下观察苯浓度与感测层电阻值间的变化关系.     

Al_(0.26)Ga_(0.74)As/GaAs(001)表面形貌的热力学分析

采用分子束外延(MBE)技术在GaAs衬底上生长Al_(0.26)Ga_(0.74)As外延层,并在相同的退火条件下,分别退火0,10,20,40 min。利用扫描隧道显微镜对不同退火时间下Al_(0.26)Ga_(0.74)As/GaAs样品表面进行了扫描,得出不同退火时间Al_(0.26)Ga_(0.74)As/GaAs表面形貌特点。在40 min的热退火后,Al_(0.26)Ga_(0.74)As/GaAs表面完全熟化。本文采用基于热力学理论的半平台扩散理论模型估测获得平坦Al_(0.26)Ga_(0.74)As/GaAs薄膜表面所需退火时间,根据理论模型计算得到Al_(0.26)Ga_(0.74)As/GaAs平坦表面的退火时间和实验获得平坦表面所需退火时间一致。     

高温退火对高饱和磁感应强度Fe-Co合金磁性能的影响

对具有高饱和磁感应强度的1J22型Fe-Co软磁合金进行高温退火实验,并研究了其质量、磁性能随退火温度及时间的变化.结果表明,合金在500℃以下退火时,质量无明显增加且磁体磁性能并无降低;而当合金在500℃以上退火后,合金增重速率增加,且磁性能明显下降.当合金在600℃退火后,合金饱和磁感应强度Bs降至2178mT,矫顽力Hc增至76.1A/m.微观结构研究表明,高温退火后合金晶粒尺寸及形貌无明显变化,而合金表面完全生成Fe3O4.合金磁性能的降低是由氧化物的增多及杂质的引入造成的.     

退火工艺对FeCuNbSiB非晶带材压磁效应的影响

研究了退火工艺对非晶FeCuNbSiB带材压磁性能的影响情况.结果表明,当退火温度为300℃时,FeCuNbSiB非晶带材开始慢慢晶化,当温度上升到500℃时,带材内部结构已由非晶态完全转变成晶态.当退火温度＜300℃时,退火能够消除部分内应力,使阻抗变化的灵敏度提高;退火温度高于300℃,随着退火温度的升高,压磁效应减弱.退火时间高于1h,带材的压磁性能变化不显著.非晶FeCuNbSiB带材经过100℃×2h退火,压力为2.7MPa时,阻抗变化最高可达40Ω.     

退火对标准铂电阻温度计性能影响的研究

退火是消除铂电阻温度计内部由于机械振动等因素带来应力的最有效手段,同时也可能改变铂电阻温度计内部铂丝的氧化状态。选用不同国家生产的4支标准铂电阻温度计,分别在600 ℃、500 ℃、450 ℃、420 ℃、350 ℃进行退火,研究铂电阻温度计退火后在室温下随时间的变化规律。结果表明,不同的退火温度对铂电阻温度计阻值产生不同影响,对应温度变化量可达1 mK,退火后在室温下0~6 h内变化显著,保持同一个热状态可有效提高铂电阻温度计的测量水平。     

Calculating SPRT Interpolation Error

Interpolation error is a major source of uncertainty in the calibration of standard platinum resistance thermometer (SPRT) in the subranges of the International Temperature Scale of 1990 (ITS-90). This interpolation error arises because the interpolation equations prescribed by the ITS-90 cannot perfectly accommodate all the SPRTs natural variations in the resistance–temperature behavior, and generates different forms of non-uniqueness. This paper investigates the type 3 non-uniqueness for fourteen SPRTs of five different manufacturers calibrated over the water–zinc subrange and demonstrates the use of the method of divided differences for calculating the interpolation error. The calculated maximum standard deviation of 0.25 mK (near \(100\,^{\circ }\hbox {C}\)) is similar to that observed in previous studies.     

Investigating the Inconsistency of ITS-90 for SPRTs in the Subrange 0 °C to 419.527 °C

The subrange inconsistency is a significant factor to uncertainty in the standard platinum resistance thermometer (SPRT) subranges of the International Temperature Scale of 1990 (ITS-90). This paper investigated the subrange inconsistency between the water–zinc and water–aluminum subranges. The calibration data for 60 SPRTs from four manufacturers were analyzed, and the result confirms that the coefficient c in the interpolation of ITS-90 is available to determine the subrange inconsistency in this temperature range again. The inconsistency, Δt, can be simply equal to 59.83c.     

水三相点容器的浸没特性及套管对浸没特性的影响

采用步进电机控制器和Labview编程控制,建立了水三相点容器浸没特性的自动测量装置。该装置通过步进电机精确控制温度计在水三相点容器温度计阱内的升降高度,用准确度为0.02×10-6的交流比较仪电桥测量标准铂电阻温度计在计阱内不同高度的电阻值;通过线性拟合,获得水三相点容器的静压修正系数;此外,研究了套管对浸没特性的影响。实验结果表明:温度计阱内径分别为16 mm和18 mm的水三相点容器的静压修正系数实验值与理论值非常接近,差值小于0.4 μK/cm;套管对静压修正系数的影响小于0.5 μK/cm。     

Considerations Relating to Type 1 and Type 3 Non-uniqueness in SPRT Interpolations of the ITS-90

It is well known that different allowed interpolations using a given standard platinum resistance thermometer (SPRT) in overlapping subranges of the ITS-90 do not lead to identical results. This is termed Type 1 non-uniqueness, or subrange inconsistency (SRI), and it arises because of small incompatibilities in the SPRT characteristic \(W(T_{90})\) with respect to the ITS-90 reference function \(W_{r}(T_{90})\), such that the alternative low-order interpolations, fitted to the deviations \(W(T_{90})\) – \(W_{r}(T_{90})\) at different sets of fixed points, are not in general identical. To some extent SRI may be ‘scale-intrinsic,’ i.e., caused by incompatibilities between the resistance ratios, \(W_{r}(T_{90})\), specified at the fixed points of the ITS-90, and hence the same for all SPRTs. However, it has been found that the SRI varies strongly between different SPRTs, and that variability of \(W(T_{90})\) is much the dominant cause. This raises the question of how SRI is linked to Type 3 non-uniqueness between SPRTs in each separate subrange, which is entirely due to differences in SPRT characteristics. This paper explores the connection between them and concludes that they are of similar magnitude and consequently, being different manifestations of the same effects, it is argued that non-uniqueness should be covered by a single component of uncertainty. Following the stated rationale of the ITS-90, it is further suggested that this uncertainty should be estimated only within each subrange, i.e., that shorter subranges should not be deemed subject to potential effects caused by out-of-range data.     

SPRT Calibration Uncertainties and Internal Quality Control at a Commercial SPRT Calibration Facility

The Hart Scientific Division of the Fluke Corporation operates two accredited standard platinum resistance thermometer (SPRT) calibration facilities, one at the Hart Scientific factory in Utah, USA, and the other at a service facility in Norwich, UK. The US facility is accredited through National Voluntary Laboratory Accreditation Program (NVLAP), and the UK facility is accredited through UKAS. Both provide SPRT calibrations using similar equipment and procedures, and at similar levels of uncertainty. These uncertainties are among the lowest available commercially. To achieve and maintain low uncertainties, it is required that the calibration procedures be thorough and optimized. However, to minimize customer downtime, it is also important that the instruments be calibrated in a timely manner and returned to the customer. Consequently, subjecting the instrument to repeated calibrations or extensive repeated measurements is not a viable approach. Additionally, these laboratories provide SPRT calibration services involving a wide variety of SPRT designs. These designs behave differently, yet predictably, when subjected to calibration measurements. To this end, an evaluation strategy involving both statistical process control and internal consistency measures is utilized to provide confidence in both the instrument calibration and the calibration process. This article describes the calibration facilities, procedure, uncertainty analysis, and internal quality assurance measures employed in the calibration of SPRTs. Data will be reviewed and generalities will be presented. Finally, challenges and considerations for future improvements will be discussed.     

Correlation Between Immersion Profile and Measured Value of Fixed-Point Temperature

Assessment of thermal immersion effects in the melting and freezing points defined by the International Temperature Scale of 1990 is one of the vital issues of modern thermometry. In documents of the Consultative Committee for Thermometry, the deviation of the experimental immersion profile from the theoretical value of the hydrostatic effect at a height of about 3 cm to 5 cm from the thermometer well bottom is used for the estimation of the uncertainty due to unwanted thermal effects. This estimation assumes the occurrence of solely the hydrostatic effect all along the height of the well inner wall. Real distortions of the temperature gradient at the bottom and at the top part of the well caused by the change of heat-exchange conditions are not taken into account. To define more precisely the temperature gradient along the height of the well, a miniature PRT with a 30 mm sensitive element and a sheath length and diameter of about 60 mm and 6 mm, respectively, were used. Also, the measurements of fixed-points temperature at noticeably different slopes of immersion profiles due to variations of the thermometer heat exchange and phase transition realization conditions were produced by means of a standard platinum resistance thermometer (SPRT). The measurements were carried out at the tin and zinc freezing points. The immersion curves measured with a miniature thermometer demonstrated an increase of the temperature during its lifting in the first 1 cm to 3 cm above the bottom of the well. The measurement results at the zinc freezing point by means of the SPRT have not confirmed the correlation between the immersion curves, the received value of the Zn freezing temperature, and the estimation of its uncertainty.     

Sapphire Whispering Gallery Thermometer

An innovative sapphire whispering gallery thermometer (SWGT) is being explored at the National Institute of Standards and Technology (NIST) as a potential replacement for a standard platinum resistance thermometer (SPRT) for industrial applications that require measurement uncertainties of ≤ 10 mK. The NIST SWGT uses a synthetic sapphire monocrystalline disk configured as a uniaxial, dielectric resonator with whispering gallery modes between 14 GHz and 20 GHz and with Q-factors as large as 90,000. The prototype SWGT stability at the ice melting point (0°C) is ≤ 1 mK with a frequency resolution equivalent to 0.05 mK. The prototype SWGT measurement uncertainty (k= 1) is 10 mK from 0°C to 100°C for all five resonance modes studied. These results for the SWGT approach the capabilities of industrial resistance thermometers. The SWGT promises greatly increased resistance to mechanical shock relative to SPRTs, over the range from −196°C to 500°C while retaining the low uncertainties needed by secondary calibration laboratories. The temperature sensitivity of the SWGT depends upon a well-defined property (the refractive index at microwave frequencies) and the thermal expansion of a pure material. Therefore, it is expected that SWGTs can be calibrated over a wide temperature range using a reference function, along with deviations measured at a few fixed points. This article reports the prototype SWGT stability, resolution, repeatability, and the temperature dependence of five whispering gallery resonance frequencies in the range from 0°C to 100°C. Certain commercial equipments, instruments or materials are identified in this article in order to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the NIST.     

标准铂电阻温度计自热效应对测量结果的影响

为了研究自热效应对标准铂电阻温度计测量结果的影响,分别从定点法和比较法两方面开展研究。针对定点法,统计中国计量科学研究院近3年检定的标准铂电阻温度计数据,计算不同温区的铂电阻温度计自热效应修正前后的测量结果并进行对比,结果表明,在溯源标准铂电阻温度计时自热效应修正与否对测量结果的影响达到了1.5mK以上,最大达到了6mK。针对比较法,设计了基于恒温槽的自热测量方案并进行实验,对修正自热前后温度测量结果进行对比,结果表明,自热修正与否带来的误差依然达到了1.5mK。因此,在标准铂电阻温度计量值溯源和精密温度测量中,对测量结果进行自热修正是必要的。