Interfacial reaction between Sn-0.7Cu (-Ni) solder and Cu substrate

The interfacial reaction between Sn-0.7mass%Cu-(Ni) solders and a Cu substrate was investigated to reveal the effect of the addition of Ni to Sn-Cu solder on the formation of intermetallic compounds (IMCs). Sn-0.7Cu-xNi solders (x=0, 0.05, 0.1, 0.2 mass%) were prepared. For the reflow process, specimens were heated in a radiation furnace at 523 K for 60 sec, 300 sec, and 720 sec to estimate the interfacial reaction between the molten solder and Cu substrate. Then, for the aging process, some specimens were heat-treated in an oil bath at 423 K for 168 h and 504 h. The cross sections of soldered specimens were observed to measure the dissolution thickness of the Cu substrate and the thickness of the IMC and to investigate the microstructures of IMC. The results showed that, just after the reflow process, the dissolution thickness of the Cu substrate increased with the increase of Ni content in the Sn-0.7Cu-xNi solder and the thickness of the IMC between the solder and Cu substrate was the minimum in the Sn-0.7Cu-0.05Ni solder. After the aging process, the IMC grew with the increase of aging time. In the case of 0.05% Ni, the IMC thickness was the thinnest regardless of aging time. It is clear that 0.05% Ni addition to Sn-0.7Cu solder very effectively inhibits the formation and growth of the IMC between solder and Cu substrate. Electron probe microanalysis of the IMC showed that the IMC layer in the Sn-0.7Cu-Ni solder contained Ni, and the IMC was expressed as (Cu_1−y ,Ni _y )₆Sn₅.     

Interfacial reaction between Sn-Bi alloy and Ni substrate

Interfacial reactions between Sn-Bi alloys of different compositions and Ni substrates at 423 K for different durations were investigated. Only one interfacial phase, Ni₃Sn₄, was detected despite the existence of several other intermetallic compounds (IMCs) in Ni-Sn and Ni-Bi binary systems. This observation (only Ni₃Sn₄ was formed at the interface) was explained as a combination of the driving force for formation of the IMC and diffusion of Ni. The change of Ni₃Sn₄ layer thickness as a function of annealing time, which obeys a parabolic rule, was further confirmed. The thickness of Ni₃Sn₄ was also found to decrease with increasing Bi content in the Sn-Bi alloy.     

Effect of Bi on the Interfacial Reaction between Sn-3.7Ag-xBi Solders and Cu

It was reported in previous studies that the addition of Bi could improve the wettability and reduce the melting temperature of Sn-Ag solders. This work investigates the effect of Bi on the interfacial reaction between Sn-Ag-xBi solders and the Cu substrate reflowed at 250°C for different times and thermally aged at 150°C for different durations. Five types of Sn-Ag-based solders, Sn-3.7Ag-xBi (x = 0 wt.% to 4 wt.%), were used in this study. The microstructure of the interfacial Cu-Sn intermetallic compound (IMC) layers between the solders and the Cu substrate was studied, and the thickness of the Cu-Sn IMCs in different solder/Cu systems has been measured. It was found that the thickness of the Cu-Sn IMC layer decreased with increasing amount of Bi in both the reflow and thermally aged condition. The effect of Bi addition on the interfacial reaction between the solder and the Cu substrate was discussed based on the experimental results.     

Intermetallic compounds formed during interfacial reactions between liquid Sn-8Zn-3Bi solders and Ni substrates

The morphology and growth kinetics of intermetallic compounds (IMCs) formed at the interfaces between liquid Sn-8Zn-3Bi solders and nickel substrates in the temperature range from 225°C to 400°C are investigated for the applications in bonding recycled sputtering targets to their backing plates. The results show that a continuous single layer of Ni₅Zn₂₁ IMC appears at temperatures below 325°C, while a double layer containing Ni₅Zn₂₁ and Ni₃₅Zn₂₂Sn₄₃ IMCs is formed at temperatures above 325°C. In both cases, the growth kinetics of IMCs is interface-controlled. During the growth of IMCs, their reaction fronts migrate in the direction of the solder much more rapidly than toward the nickel substrate, and erosion of the Ni substrate is quite slight.     

Intermetallic reactions in a Sn-20In-2.8Ag solder ball-grid-array package with Au/Ni/Cu pads

The intermetallic compounds formed during the reflow and aging of Sn-20In-2.8Ag ball-grid-array (BGA) packages are investigated. After reflow, a large number of cubic-shaped AuIn₂ intermetallics accompanied by Ag₂In precipitates appear in the solder matrix, while a Ni(Sn_0.72Ni_0.28)₂ intermetallic layer is formed at the solder/pad interface. With further aging at 100°C, many voids can be observed in the solder matrix and at the solder/pad interface. The continuous distribution of voids at the interface of specimens after prolonged aging at 100°C causes their bonding strength to decrease from 5.03 N (as reflowed) to about 3.50 N. Aging at 150°C induces many column-shaped (Cu_0.74Ni_0.26)₆(Sn_0.92In_0.08)₅ intermetallic compounds to grow rapidly and expand from the solder/pad interface into the solder matrix. The high microhardness of these intermetallic columns causes the bonding strength of the Sn-20In-2.8Ag BGA solder joints to increase to 5.68 N after aging at 150°C for 500 h.     

Depressing effect of 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

The formation and growth of intermetallic compounds (IMCs) in lead-free solder joints, during soldering or subsequent aging, have a significant effect on the thermal and mechanical behavior of solder joints. In this study, the effects of a 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu (SAC) lead-free solder alloys on the growth of IMCs with Cu substrates during soldering and subsequent isothermal aging were investigated. During soldering, it was found that a 0.2wt.%Zn addition did not contribute to forming the IMC, which was verified as the same phase structure as the IMC for Sn-3.0Ag-0.5Cu/Cu. However, during solid-state isothermal aging, the IMC growth was remarkably depressed by the 0.2 wt.% Zn addition in the SAC solder matrix, and this effect tended to be more prominent at higher aging temperature. The activation energy for the overall IMC growth was determined as 61.460 and 106.903 kJ/mol for Sn-Ag-Cu/Cu and Sn-Ag-Cu-0.2Zn/Cu, respectively. The reduced diffusion coefficient was confirmed for the 0.2Zn-containing solder/Cu system. Also, thermodynamic analysis showed the reduced driving force for the Cu₆Sn₅ IMC with the addition of Zn. These may provide the evidence to demonstrate the depressing effect of IMC growth due to the 0.2wt.%Zn addition in the Sn-Ag-Cu solder matrix.     

Effect of cooling rate on microstructure and shear strength of pure Sn,Sn-0.7Cu,Sn-3.5Ag,and Sn-37Pb solders

The microstructure and shear strength characteristics of pure Sn and the eutectic compositions of Sn-37Pb, Sn-0.7Cu, and Sn-3.5Ag prepared under identical reflow conditions but subjected to two different cooling conditions were evaluated at room temperature. For the four solders, the ultimate shear strength increased with increasing strain rate from 10⁻⁵ s⁻¹ to 10⁻¹ s⁻¹. Decreasing the cooling rate tended to decrease the ultimate shear strength for both the Sn-0.7Cu and Sn-3.5Ag solders. The effects of work hardening resulting from increased strain rate were more prevalent in quench-cooled (QC) samples.     

Interfacial reaction between multicomponent lead-free solders and Ag,Cu, Ni,and Pd substrates

The interfacial reaction between two prototype multicomponent lead-free solders, Sn-3.4Ag-1Bi-0.7Cu-4In and Sn-3.4Ag-3Bi-0.7Cu-4In (mass%), and Ag, Cu, Ni, and Pd substrates are studied at 250°C and 150°C. The microstructural characterization of the solder bumps is carried out by scanning electron microscopy (SEM) coupled with energy dispersive x-ray analysis. Ambient temperature, isotropic elastic properties (bulk, shear, and Young’s moduli and Poisson’s ratio) of these solders along with eutectic Sn-Ag, Sn-Bi, and Sn-Zn solders are measured. The isotropic elastic moduli of multicomponent solders are very similar to the eutectic Sn-Ag solder. The measured solubility of the base metal in liquid solders at 250°C agrees very well with the solubility limits reported in assessed Sn-X (X=Ag, Cu, Ni, Pd) phase diagrams. The measured contact angles were generally less than 15° on Cu and Pd substrates, while they were between 25° and 30° on Ag and Ni substrates. The observed intermediate phases in Ag/solder couples were Ag₃Sn after reflow at 250°C and Ag₃Sn and ζ (Ag-Sn) after solid-state aging at 150°C. In Cu/solder and Ni/solder couples, the interfacial phases were Cu₆Sn₅ and (Cu,Ni)₆Sn₅, respectively. In Pd/solder couples, only PdSn₄ after 60-sec reflow, while both PdSn₄ and PdSn₃ after 300-sec reflow, were observed.     

Cross-Interaction of Interfacial Reactions in Ni (Au/Ni/Cu)-SnAg-Cu Solder Joints during Reflow Soldering and Thermal Aging

Interfacial reactions in Ni-SnAg-Cu and Au/Ni/Cu-SnAg-Cu solder joints were investigated to understand the coupling effect between different pads during soldering and thermal aging processes. Scanning electron microscopy (SEM) was used to characterize the microstructures and phases. The element distributions in the joints were identified using the x-ray mapping technique. The thickness variation of intermetallic compounds (IMCs) with aging time was also measured. The results showed that interfacial reactions were not only affected by the compositions of solders and the local metallizations but the remote pads as well. The Au surface finish had an effect on the growth of IMCs at the interfaces. No redeposition of (Au, Ni)Sn₄ was found in the Au/Ni/Cu-SnAg-Cu solder joint. The effect of Cu on the formation of IMCs and redeposition of (Au, Ni)Sn₄ was also discussed. An erratum to this article can be found at     

Interfacial Reactions between Eutectic SnZn Solder and Bulk or Thin-Film Cu Substrates

Interfacial reactions between eutectic SnZn solder and bulk or thin-film Cu substrates are investigated and compared. The thicknesses of bulk and thin-film Cu substrates are 0.5 mm and 4,000 ?, respectively. Different dominant reaction products and interfacial microstructures are observed in these two types of interfacial reactions. In the bulk Cu type, the Cu₅Zn₈ phase is the dominant reaction product under reflow and solid-state annealing. However, the CuZn₅ phase becomes the dominant reaction product in the thin-film Cu type. The Cu₅Zn₈ phase in the bulk Cu type remains as a uniform microstructure after reflow. After solid-state annealing, however, the Cu₅Zn₈ phase fractures and the Cu₆Sn₅ and Cu₃Sn phases are formed at the Cu₅Zn₈/Cu interface. The CuZn₅ phase in the thin-film Cu type ripens after reflow and the phase morphology is transformed from a uniform layer into separated scallops. In situ observation of the interfacial microstructure after solid-state annealing reveals that prominent deformation occurs in the solder region close to the interface in the bulk Cu type. While in the thin-film Cu type, the CuZn₅ grain is extruded out of the interface.     

Interfacial reaction study on a solder joint with Sn-4Ag-0.5Cu solder ball and Sn-7Zn-Al (30 ppm) solder paste in a lead-free wafer level chip scale package

The interfacial reactions of solder joints between the Sn-4Ag-0.5Cu solder ball and the Sn-7Zn-Al (30 ppm) presoldered paste were investigated in a wafer level chip scale package (WLCSP). After appropriate surface mount technology (SMT) reflow process on the printed circuit board (PCB) with organic solderability preservative (Cu/OSP) and Cu/Ni/Au surface finish, samples were subjected to 150°C high-temperature storage (HTS), 1,000 h aging. Sequentially, the cross-sectional analysis is scrutinized using a scanning electron microscope (SEM)/energy-dispersive spectrometer (EDS) and energy probe microanalysis (EPMA) to observe the metallurgical evolution in the interface and solder buck itself. It was found that Zn-enriched intermetallic compounds (IMCs) without Sn were formed and migrated from the presolder paste region into the solder after reflow and 150°C HTS test.     

Intermetallic reactions in Sn-8Zn-20In solder ball grid array packages with Au/Ni/Cu and Ag/Cu pads

During the reflow process of Sn-8Zn-20In solder joints in the ball grid array (BGA) packages with Au/Ni/Cu and Ag/Cu pads, the Au and Ag thin films react with liquid solder to form γ₃-AuZn₄/γ-Au₇Zn₁₈ and ε-AgZn₆ intermetallics, respectively. The γ₃/γ intermetallic layer is prone to floating away from the solder/Ni interface, and the appearance of any interfacial intermetallics cannot be observed in the Au/Ni surface finished Sn-8Zn-20In packages during further aging treatments at 75°C and 115°C. In contrast, ε-CuZn₅/γ-Cu₅Zn₈ intermetallics are formed at the aged Sn-8Zn-20In/Cu interface of the immersion Ag BGA packages. Bonding strengths of 3.8N and 4.0N are found in the reflowed Sn-8Zn-20In solder joints with Au/Ni/Cu and Ag/Cu pads, respectively. Aging at 75°C and 115°C gives slight increases of ball shear strength for both cases.     

Interfacial Reactions of Sn-8wt.%Zn-3wt.%Bi Solder with Cu,Ag, and Ni Substrates

Sn-Zn-Bi alloys are promising Pb-free solders. Interfacial reactions between the Sn-8wt.%Zn-3wt.%Bi (Sn-13.80at.%Zn-1.62at.%Bi) alloy and the Cu, Ag, and Ni substrates are examined. Two different kinds of substrates, the bulk plate and the electroplating layer, are used, and the reactions are carried out at 250°C and 220°C. Although the Zn content is only 13.8 at.%, two Zn-Cu compounds, γ-Cu₅Zn₈ and ε-CuZn₅ phases, are formed in the Sn-13.80at.%Zn-1.62at.%Bi/Cu couples. The ε-CuZn₅ phase is scallop shaped, and the γ-Cu₅Zn₈ phase is planar. In the Sn-13.80at.%Zn-1.62at.%Bi/Ag couples, three Zn-Ag compounds are observed, and they are ε-AgZn₃, γ-Ag₅Zn₈, and ζ-AgZn phases. In the Sn-13.80at.%Zn-1.62at.%Bi/Ni couples, a Zn-Ni compound, γ-Ni₅Zn₂₁ phase, is formed. Similar results are found in the couples prepared with an electroplating layer: the reaction phases are the same, but the growth rates are different.     

Intermetallic compounds and adhesion strength between the Sn-9Zn-1.5Ag-0.5Bi lead-free solder and unfluxed Cu substrate

The intermetallic compounds (IMCs) formed at the interface between the Sn-9Zn-1.5Ag-0.5Bi lead-free solder alloy and unfluxed Cu substrate have been investigated by x-ray diffraction, optical microscopy, scanning electron microscopy (SEM), and energy-dispersive spectrometry (EDS). The melting point and melting range of the Sn-9Zn-1.5Ag-0.5Bi solder alloy are determined as 195.9°C and 10°C, respectively, by differential scanning calorimetry (DSC). Cu₆Sn₅ and Cu₅Zn₈ IMCs are formed between the Sn-9Zn-1.5Ag-0.5Bi/unfluxed Cu substrate wetted at 250°C for 10 sec. The interfacial adhesion strength changes from 10.27±0.68 MPa to 8.58±0.59 MPa when soldering time varies from 10 sec to 30 sec at 250°C.     

Metallurgical reaction of the Sn-3.5Ag solder and Sn-37Pb solder with Ni/Cu under-bump metallization in a flip-chip package

Several international legislations recently banned the use of Pb because of environmental concerns. The eutectic Sn-Ag solder is one of the promising candidates to replace the conventional Sn-Pb solder primarily because of its excellent mechanical properties. In this study, interfacial reaction of the eutectic Sn-Ag and Sn-Pb solders with Ni/Cu under-bump metallization (UBM) was investigated with a joint assembly of solder/Ni/Cu/Ti/Si₃N₄/Si multilayer structures. After reflows, only one (Ni,Cu)₃Sn₄ intermetallic compound (IMC) with faceted and particlelike grain feature was found between the solder and Ni. The thickness and grain size of the IMC increased with reflow times. Another (Cu,Ni)₆Sn₅ IMC with a rod-type grain formed on (Ni,Cu)₃Sn₄ in the interface between the Sn-Pb solder and the Ni/Cu UBM after more than three reflow times. The thickness of the (Ni,Cu)₃Sn₄ layer formed in the Sn-Pb system remained almost identical despite the numbers of reflow; however, the amounts of (Cu,Ni)₆Sn₅ IMC increased with reflow times. Correlations between the IMC morphologies, Cu diffusion behavior, and IMC transformation in these two solder systems will be investigated with respect to the microstructural evolution between the solders and the Ni/Cu UBM. The morphologies and grain-size distributions of the (Ni,Cu)₃Sn₄ IMC formed in the initial stage of reflow are crucial for the subsequent phase transformation of the other IMC.     

Cyclic softening of the Sn-3.8Ag-0.7Cu lead-free solder alloy with equiaxed grain structure

Low-cycle fatigue behavior of the Sn-Ag-Cu ternary-eutectic alloy was investigated under a fully reversed loading condition. The solder alloy exhibited cyclic softening early in the fatigue life and continued to soften as the number of fatigue cycles increased. Following cyclic loading, numerous microcracks were found in the microstructure. Most of the microcracks were located along the grain boundaries in the areas with finer grains. The areal density of the microcracks increased with both strain amplitude and cycle number. By combining percolation theory with microcracking analysis, the cycle-dependent softening behavior was shown to result from accumulation of microcrack density with fatigue cycles.     

The reactions between electroless Ni-Cu-P Deposit and 63Sn-37Pb flip chip solder bumps during reflow

This study investigates the interfacial reactions between electroless Ni-Cu-P deposit and 63Sn-37Pb solder bumps under various reflow conditions. The morphology of the intermetallic compounds formed at the Ni-Cu-P/Sn-Pb interface changes with respect to reflow cycle, reflow temperature, and reflow time. The (Ni,Cu)₃Sn₄ compounds with three different morphologies of fine grain, whisker, and polygonal grain form at the Ni-Cu-P/Sn-Pb interface after reflow at 220°C for 15 s. The whisker-shape and polygonal grains detach from the Ni-Cu-P deposit into the Sn-Pb solder during multiple reflows. The (Ni,Cu)₃Sn₄ compound grows rapidly when the reflow temperature is above the Ni-Sn eutectic temperature, 231°C. A continuous (Ni,Cu)₃Sn₄ layer forms after reflow at 220°C for 10 min. A 4.5 μm Ni-Cu-P deposit prevents the interdiffusion of Sn and Al atoms across the Ni-Cu-P deposit after 10 reflow cycles at 220°C for 15 s and after reflow at 220°C for 10 min.     

Influence of Au addition on the phase equilibria of near-eutectic Sn-3.8Ag-0.7Cu Pb-free solder alloy

This paper illustrates the influence of Au addition on the phase equilibria of Sn-Ag-Cu (SAC) near-eutectic alloys and on the interface reaction with the Cu substrate. From the thermal and microstructural characterization of Sn-3.8Ag-0.7Cu alloys containing various amounts of Au, it is found that the Au promotes the formation of a quaternary-eutectic reaction at 204.5°C ± 0.3°C. The equilibrium phases in the quaternary-eutectic microstructure are found to be AuSn₄, Ag₃Sn, βSn, and Cu₆Sn₅. While the addition of Au to Sn-3.8Ag-0.7Cu alloys is also found to increase liquidus temperature and the temperature ranges of the phase equilibria field for primary phases, such influences from Au are found to be less pronounced when the alloys were reacted with the Cu substrate. Because of the formation of the Au-Cu-Sn-ternary interface intermetallic, it is found that a majority of Au added to the solder is drained from the melt. The drainage of Au reduces the impact of Au on the phase equilibria of the solder alloys in the joint. It is further found that the involvement of Au in the interface reaction results in a change of the interface phase morphology from the conventional scallop structure to a compositelike structure consisting of (AuCu)₆Sn₅ grains and finely dispersed, βSn islands.     

Intermetallic reactions in Sn-3.5Ag solder ball grid array packages with Ag/Cu and Au/Ni/Cu pads

During the reflow process of Sn-3.5Ag solder ball grid array (BGA) packages with Ag/Cu and Au/Ni/Cu pads, Ag and Au thin films dissolve rapidly into the liquid solder, and the Cu and Ni layers react with the Sn-3.5Ag solder to form Cu₆Sn₅ and Ni₃Sn₄ intermetallic compounds at the solder/pad interfaces, respectively. The Cu₆Sn₅ intermetallic compounds also appear as clusters in the solder matrix of Ag surface-finished packages accompanied by Ag₃Sn dispersions. In the solder matrix of Au/Ni surface-finished specimens, Ag₃Sn and AuSn₄ intermetallics can be observed, and their coarsening coincides progressively with the aging process. The interfacial Cu₆Sn₅ and Ni₃Sn₄ intermetallic layers grow by a diffusion-controlled mechanism after aging at 100 and 150°C. Ball shear strengths of the reflowed Sn-3.5Ag packages with both surface finishes are similar, displaying the same degradation tendencies as a result of the aging effect.     

时效对Sn3.0Cu0.15Ni/Cu界面组织的影响

研究了150℃时效0,200,500h对Sn3.0Cu0.15Ni/Cu界面组织结构的影响.结果表明:界面金属间化合物层由Cu6Sn5层和Cu3Sn层组成,质量分数为0.15％的Ni的加入会使IMC层最初变厚,但在时效过程中,热稳定性强的界面化合物(Cu,Ni)6Sn5的生成,会抑制Cu3Sn化合物层的生长;同时Ni的加入会降低Cu6Sn5颗粒的长大速度,并且随着时效时间的延长,Cu6Sn5颗粒的形貌呈多面体结构.