金属板热红外偏振的方向特性研究

热红外偏振探测有利于从背景中识别金属目标.通过分析热红外偏振探测方法,根据现有条件研制了一种热红外成像偏振探测仪.利用该系统,研究了金属板热红外偏振度和观测角之间的关系.实验中采用的金属板分别为铝质和钢质,表面都进行了抛光处理.实验结果表明,金属目标板热红外偏振度和其自身的热辐射亮温值没有直接的关系.在观测角大于20°时,随着观测角度的增大,金属目标板热红外偏振度的数值也增大.但在观测角小于20°时测量,金属目标板热红外偏振度和观测角之间的关系并不遵循上述原则.     

Effect of surface roughness and complex indices of refraction on polarized thermal emission

We present a series of measurements characterizing the dependence of polarized thermal emission on surface roughness. In particular, we measure the spectrally resolved degree of linear polarization (DOLP) for a series of roughened borosilicate (Pyrex) glass substrates as a function of the roughness parameter Ra, the root-mean-square slope distribution, and observation angle theta. Also measured are a series of smooth glass substrates coated with two particular polymers of interest, i.e., a common commercially available Krylon paint and a chemical-agent-resistant coating paint. The DOLP is measured over a 4-13 microm wave band by using a modified Fourier transform IR spectrometer in which a wire-grid polarizer and a quarter-wave Fresnel rhomb are used in conjunction to measure all four Stokes parameters. In addition, we show an enhanced DOLP due to anomalous dispersion exhibited by the surface material.     

Measurement of surface roughness profile by a triangulation method

Some aspects of measuring surface roughness parameters using a laser triangulation method are considered. A connection is established between surface roughness and scattering indicatrices with probing radiation polarization parameters of a semiconductor laser. A marked effect is noted of the form and position of the polarization plane on the measurement error for linear values. __________ Translated from Metrologiya, No. 6. pp. 21–27, June, 2008.     

Polarization of specular reflection and near-specular scattering by a rough surface

Polarization of specular reflection and near-specular scattering (NSS) by a randomly rough surface is investigated by the use of a Mueller matrix formulation. The collective effect by a rough surface on the average specular field results in reflectance loss and polarization, which can be explained by an effective medium theory. Effects of random NSS can be represented by a scattering matrix that is partially coherent and polarized. The incoherent and unpolarized part of scattering causes depolarization, and the coherent and polarized parts of scattering change the apparent polarization properties of specular reflection. Results of a simulation and least-squares fit of ellipsometric data to the models including the NSS effect, for a black anodized aluminum sample, are presented. Simultaneous least-squares fits for both ellipsometric data and reflectance data at multiple angles of incidence at three different wavelengths gave approximately the same rms roughness, which agrees with the profilometric values reported previously.     

High-order perturbation theory for light scattering from a rough metal surface.

The angular distribution of the mean diffuse intensity scattered from a metal surface with one-dimensional roughness is studied with perturbation theory. From an approach based on the reduced Rayleigh equations in p polarization, exact perturbation terms up to eighth order in the height parameter are developed for surface roughness consistent with a stationary Gaussian process. The theory is evaluated for a number of cases in which surface plasmon polariton excitation is significant and produces effects such as backscattering enhancement. For surface roughness having a wide Gaussian power spectrum, it is found that the high-order terms lead to roughness-induced broadening of the backscattering peak. For rectangular spectra, two cases are studied in which backscattering effects are due to sixth- and eighth-order terms; both cases provide good comparisons with previously unexplained experimental results. Further, because of an eighth-order term, the diffuse intensity is shown to contain a specular peak that also relies on polariton excitation. This new effect is studied in detail and is found to arise from the constructive interference of contributions produced by multiple-scattering processes, although the time-reversed paths that produce backscattering enhancement are not essential to the specular effect.     

Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries

The theory of the influence of surface roughness on the ellipsometric parameters j and of simple randomly rough surface is developed in the framework of the Kirchhoff theory of diffraction. This theory is also extended to the following systems: rough surface—isotropic homogeneous identical film (both ambient-film and film substrate boundaries are geometrically identical; and rough surface—isotropic homogeneous general film (both boundaries are geometrically, and therefore also statistically, independent). Also the numerical analysis of the theoretical results is performed and the most important aspects of dependencies of j and on surface roughness (characterized by slopes of the height irregularities) and of the angle of incidence are found which enable us to determine the values of these slopes. The correctness of the theory is demonstrated on a system formed by the rough surface of a silicon single crystal covered with natural surface film, with the character of an identical film. It is shown that we can distinguish fairly well between the influence of surface roughness and that of a thin surface film on j and at certain conditions.     

Optimisation of cutting parameters for minimizing carbon emission and maximising cutting quality in turning process

Modern manufacturing systems are faced with the challenge of reducing the carbon emission related to manufacturing technologies. Machining centres consume large amounts of energy and as a consequence; carbon emissions are generated owing to this consumption. This paper presents a design of experiment work related to the optimisation of machining factors in the turning process of aluminium alloys. Carbon emission and surface quality were concurrently optimised. A set of experimental scenarios was set using a Box–Behnken design and the response surface methodology was applied to get the regression model for the carbon emission and surface roughness during turning process. The relationship between factors and the responses (carbon emission and surface quality) was investigated using surface plots. Furthermore, the desirability function method using the Response Optimizer tool in MINITAB and goal programming methodology was used to obtain the values of the parameters that achieved minimum surface roughness and a minimum quantity of carbon emission.     

Determining surface orientations of transparent objects based on polarization degrees in visible and infrared wavelengths

Techniques for modeling an object through observation are very important in object recognition and virtual reality. A wide variety of techniques have been developed for modeling objects with opaque surfaces, whereas less attention has been paid to objects with transparent surfaces. A transparent surface has only surface reflection; it has little body reflection. We present a new method for obtaining surface orientations of transparent surfaces through analysis of the degree of polarization in surface reflection and emission in visible and far-infrared wavelengths, respectively. This parameter, the polarization degree of reflected light at the visible wavelengths, is used for determining the surface orientation at a surface point. The polarization degree at visible wavelengths provides two possible solutions, and the proposed method uses the polarization degree at far-infrared wavelengths to resolve this ambiguity.     

Polarized light scattering by microroughness and small defects in dielectric layers

The polarization of light scattered by the surface of a material contains information that can be used to identify the sources of that scatter. Theories for light scattering from interfacial roughness of a dielectric layer and from defects in that dielectric layer are reviewed. Methods for calculating the Mueller matrix or the Stokes vector for scatter from multiple sources and for decomposing a Stokes vector into contributions from two nondepolarizing scattering sources are derived. The theories are evaluated for a specific sample and geometry. Results show that some incident polarizations are more effective than others at discriminating among scattering sources, with s-polarized light being least effective. The polarization of light scattered from interfacial roughness depends upon the relative roughness of the two interfaces and the degree of correlation between the two interfaces. The scattering from defects in the film depends on the depth of the defect and differs from that from any one of the cases of interfacial roughness. The scattering from defects randomly distributed in the film and for small dielectric permittivity variations in the film is also calculated. Experimental results are presented for a 52-nm SiO2 film thermally grown on microrough silicon.     

Light diffraction from rough gratings

Two holographic diffraction gratings with very similar parameters, designed for maximum performance inTM polarization, are investigated, their diffraction efficiency measured, an electron microscopic picture of their surface observed, and numerical simulation of light diffraction done with the surface roughness taken into account. It is demonstrated numerically that a small-scale roughness imposed on the grating surface could increase significantly both scattering and absorption from the surface, this influence being greater in the TM case. A very good coincidence between the numerical and experimental data is obtained in TE polarization, whereas in TM polarization only a qualitative agreement exists.     

Far-ultraviolet reflectance measurements and optical constants of unoxidized aluminum films

The far-UV reflectance of thin unoxidized aluminum films prepared and maintained in ultra-highvacuum conditions was measured versus the angle of incidence, and the complex refractive index was obtained from those measurements on several wavelengths from 82.6 to 113.5 nm. Measurements were made on two perpendicular planes of incidence to deal with the unknown of the polarization state of the radiation beam. The surface roughness was characterized by atomic force microscopy. The refractive index is obtained for the first time, to our knowledge, from direct optical measurements in this spectral range. Current results match well the former values in the literature that were calculated through the Kramers-Kronig analysis by using in the above interval reflectances estimated from electron-energy-loss spectra and from optical measurements on surfaces of unstated roughness.     

Influence of the solid dielectric surface structure on the electric field at an air-barrier boundary

The distribution of electric field in air near a solid dielectric plate has been calculated using a model that takes into account the degree of roughness of the dielectric surface. Calculations performed for pyroceram show that the electric field strength at the vertices of juts on the dielectric surface can be 2.5ÌæÌ3.5 times (depending on the degree of surface roughness) greater than the values in the air gap. At the same time, the field strength in hollows is about ten times weaker than that at the juts. The obtained results agree with experimentally observed [1] changes in the intensity of discharge processes at a dielectric surface with increasing degree of roughness.     

Optical characterization of polyethylene films by refractometry

Refractometrical measurements of polyethylene films have been obtained using a modified Abbe's refractometer that includes polarized and monochromatic light. The ordinary and extraordinary refractive index values have been obtained considering an anisotropic uniaxic model. These values are analysed in relation to the previously known degree of crystallinity in the samples of this material. The specular reflectance is derived from the Fresnel formulae and an evaluation of diffused reflectance has been made. We find that the diffuse reflectance values increase with average roughness of the polyethylene films. This question is of particular interest for the surface characterization of these materials.     

Polarization sensing with visual detection

We describe a new approach to fluorescence sensing which relies on visual determination the polarization. The sensing device consists of a fluorescent probe, which changes intensity in responses to the analyte, and an oriented fluorescent film, which is not affected by the analyte. An emission filter is selected to observe the emission from both the film and the sensing fluorophore. Changes in the probe intensity result in changes in the polarization of the combined emission from the sensor and reference. The degree of polarization can be detected visually using a dual polarizer with adjacent sections oriented orthogonally to each other. The emission passing through the dual polarizer is viewed with a second analyzing polarizer. This analyzer is rotated manually to yield equal intensities from both sides of the dual polarizer. This approach was used to measure the concentration of RhB in intralipid and to measure pH using 6-carboxyfluorescein. The analyzer angle is typically accurate to 1 degree, providing pH values accurate to +/- 0.1 pH unit at the midpoint of the titration curve. We also describe a method of visual polarization sensing that does not require an oriented film and that can use the same fluorophore for the sample and reference. These approaches to visual sensing are generic and can be applied to a wide variety of analytes for which fluorescent probes are available. Importantly, the devices are simple, with the only electronic component being the light source.     

基于模糊神经网络与主成分分析的磨削表面粗糙度在线预测

基于声发射和振动信号提出了一种模糊神经网络和主成分分析的表面粗糙度预测方法,以提高磨削过程中工件表面粗糙度识别的准确性。首先,采集磨削程中声发射与振动信号,提取相关时域特征、频域特征和小波包特征参数,利用主成分分析对特征量进行降维优化;然后,构建表面粗糙度模糊神经网络预测模型,将信号特征量与表面粗糙度作为模糊神经网络的输入和输出;最后,对模型进行训练,并对表面粗糙度预测精度进行验证。实验结果表明:通过主成分分析(PCA)方法对声发射和振动信号特征量进行降维得到5个主成分,以此建立的模糊神经网络表面粗糙度预测模型的效果精度可达到91%以上,与局部线性嵌入和多维标度法降维方法相比,PCA方法降维后的特征所含信息更优,预测准确度更高。     

Degree of linear polarization in spectral radiances from water-viewing infrared radiometers

Infrared radiances from water become partially polarized at oblique viewing angles through both emission and reflection. I describe computer simulations that show how the state of polarization for water varies with environmental conditions over a wavelength range of 3-15 mum with 0.05-mum resolution. Polarization at wavelengths longer than approximately 4 mum generally is negative (p, or vertical) and increases with incidence angle up to approximately 75 degrees , beyond which the horizontally polarized reflected atmospheric radiance begins to dominate the surface emission. The highest p polarization (~4-10%) is found in the atmospheric window regions of approximately 4-5 and 8-14 mum. In the 3-5-mum spectral band, especially between 3 and 4 mum, reflected atmospheric radiance usually is greater than surface emission, resulting in a net s polarization (horizontal). The results of these simulations agree well with broadband measurements of the degree of polarization for a water surface viewed at nadir angles of 0-75 degrees .     

Polarizationally Non-sensitive Pseudo-holographic Computer Reconstruction of Random Rough Surface

Abstract

The function, describing a profile of a random rough surface (RRS) is expanded in a Fourier series, i.e. the surface is considered as a composition of sinusoidal gratings. The total diffracted optical field from this RRS is a sum of the fields due to all harmonic gratings, since Kirchhoff's condition for ‘locally flat surface’ is realized for each harmonic grating at a given light wavelength and at an appropriate choice of the basic grating period. The registered s and p components of the diffracted (+1 diffraction orders of each harmonic gratings), incident and mixed optic fields are separated with an optical analyser. These fields are experimentally measured and from these values the phase and the amplitude of each grating are determined. The profile of the surface is reconstructed for s and p polarization of the light scattered field, when the electric vector of the incident light concludes an arbitrary angle with the incidence plane. The mean roughness is determined in both cases. It is shown, that both reconstructions of the profile and the determination of the mean roughness are not dependent on the polarization of the incident light. The separation of the s and p components is of great importance at the two-dimensional reconstruction, when independent of incident light polarization (s or p), the scattered optical field is always depolarized. In this case the profile of the two-dimensional surface can be easily reconstructed with s or p component of the mixing and diffracted fields.     

A Study of the Polarization of Fluorescence of Ordered Systems With Application to Ordered Liquid Crystals

The fluorescence polarization of uniaxial molecules dissolved in an ordered medium is studied. A theoretical model is developed which relates the polarization of the fluorescence emission to molecular structure, orientation of absorption and emission dipole oscillators and the degree of ordering. This theory was tested experimentally using all trans 1,6-diphenyl-1,3,5-hexatriene dissolved in an ordered liquid crystal.     

The effect of fibre surface roughness on the mechanical behaviour of ceramic matrix composites

The interface between the matrix and the fibre plays an important role in controlling the strength and toughness of ceramic matrix composites. It has been found experimentally that depending on manufacturing process, the interface may show substantial surface roughness, which has been modelled analytically with certain degree of success. The analytical models, however, do not take into account the interface geometry. Instead, only the magnitude of the surface undulation is included. In this paper, a direct simulation of fibre–matrix interface roughness by the finite element method is performed on an axisymmetric unit cell with a fully debonded interface. The simulation is employed to account for the three dimensional stress state, surface roughness and interface friction, which are normally simplified or idealised in theoretical studies. The model gives the highly non-uniform interface shear and pressure, which have direct implications on the interface damage and composite behaviour. Under the approximation made in the model, the positive transverse strains does not show up in the simulation despite the fact that two different surface roughness are used.     

Measurement and Modeling of the Emittance of Silicon Wafers with Anisotropic Roughness

The unpolished surface of crystalline silicon wafers often exhibits non-Gaussian and anisotropic roughness characteristics, as evidenced by the side peaks in the slope distribution. This work investigates the effect of anisotropy on the emittance. The directional-hemispherical reflectance of slightly and strongly anisotropic silicon wafers was measured at room temperature using a center-mount integrating sphere. A monochromator with a lamp was used for near-normal incidence in the wavelength region from 400–1000 nm, and a continuous-wave diode laser at the wavelength of 635 nm was used for measurements at zenith angles up to 60°. The directional emittance was deduced from the measured reflectance based on Kirchhoff’s law. The geometric-optics-based Monte Carlo model that incorporates the measured surface topography is in good agreement with the experiment. Both the experimental and modeling results suggest that anisotropic roughness increases multiple scattering, thereby enhancing the emittance. On the other hand, if the wafer with strongly anisotropic roughness were modeled as a Gaussian surface with the same roughness parameters, the predicted emittance near the normal direction would be lower by approximately 0.05, or up to 10% at a wavelength of 400 nm. Comparisons also suggest that the Gaussian surface assumption is questionable in calculating the emittance at large emission angles with s polarization, even for the slightly anisotropic wafer. This work demonstrates that anisotropy plays a significant role in the emittance enhancement of rough surfaces. Hence, it is imperative to obtain precise surface microstructure information in order to accurately predict the emittance, a critical parameter for non-contact temperature measurements and radiative transfer analysis.