共查询到19条相似文献,搜索用时 109 毫秒
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用分子束外延方法在GaAs(100)衬底上生长了高质量的ZnSe/ZnSxSe1-x(x=0.12)超晶格结构,通过X射线衍射谱和光致发光谱,对其结构特性和光学特性进行了研究。结果表明:在4.4K温度下,超晶格样品显示较强的蓝光发射,主发光峰对应于阱层ZnSe的基态电子到重空穴基态的自由激子跃迁,而且其峰位相对于ZnSe薄膜的自由激子峰有明显蓝移。从理论上分析计算了由变就和量子限制效应引起的自由激妇峰位移动,理论和实验结果相吻合。 相似文献
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通过光致发光 (PL)和拉曼 (Raman)光谱研究了分子束外延 (MBE)生长的 Zn Mg Se/ Zn Cd Se多量子阱的光学性质。在 80 K到 3 0 0 K温度范围内 ,观测到了 PL光谱中来自量子阱的自由激子发光 ,通过发光强度与温度的变化关系 ,计算了激子束缚能。结果表明在 Zn Mg Se/ Zn Cd Se多量子阱 (MQWs)势垒层中 ,Mg的引进增强了量子阱的限制效应 ,导致激子具有较好的二维特性。在室温下的 Raman光谱中观测到了多级纵光学声子(LO)和横光学声子 (TO)的限制模 ,表明多层结构具有较高的质量 相似文献
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Mg_xZn_(1-x)O单晶薄膜和MgZnO/ZnO异质结构的光学性质 总被引:1,自引:0,他引:1
报道了利用等离子辅助分子束外延技术,在蓝宝石c平面上外延生长的Mgx Zn1 - x O单晶薄膜以及Mg Zn O/Zn O异质结构的光学性质.室温下随着Mg浓度增加,合金薄膜样品的发光峰与吸收边均向高能侧移动.研究了样品紫外发光的起因,将Mgx Zn1 - x O合金薄膜的发光归结为束缚激子的复合.在Mg0 .0 8Zn0 .92 O/ Zn O样品中,观察到了分别来自于Zn O层和Mg Zn O盖层的发光和吸收,并将其归因于来自Zn O层的自由激子和Mg Zn O盖层的束缚激子发射 相似文献
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利用低压金属有机物气相沉积 (L P- MOCVD)技术 ,采用两步生长法 ,在 (0 0 0 1 )蓝宝石衬底上获得了纤锌矿结构的 Zn1 - x Mgx O合金单晶薄膜 .实验发现随着 Mg原子的增多 ,Zn Mg O的晶格常数逐渐减小 .X射线衍射谱中未出现除 (0 0 0 2 )峰之外的其他峰位 ,表明该合金薄膜具有很强的择优取向和较好的晶体质量 .室温透射谱与光致发光谱显示 ,其吸收边或带边发光峰随 Mg原子浓度的增加首先出现红移然后出现蓝移 .该反常现象与 Zn Mg O薄膜中产生的杂质缺陷的行为有关 .研究表明在 MOCVD生长 Zn Mg O合金薄膜过程中 ,必须优化与控制反应条件 ,以抑制杂质缺 相似文献
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ZnSe薄膜的激子光谱 总被引:5,自引:2,他引:3
采用分子束外延 (MBE)技术 ,在 Ga As(1 0 0 )衬底上生长了厚度从 0 .0 4 5到 1 .4μm的 Zn Se薄膜 .X射线衍射谱证实 ,随着薄膜厚度的增加 ,应变逐步弛豫 .测量了低温下样品的反射谱和光致发光谱 ,观察到轻重空穴的能级在不同应变下的分裂、移动和反转 ,以及激子极化激元 (Po-lariton)对反射谱的影响 .也观察到束缚激子发光随着薄膜厚度的变化规律 :束缚在中性受主杂质上的束缚激子发光 (I1峰 )随着薄膜厚度的增加逐渐变弱直至消失 ,而束缚在中性施主杂质上的束缚激子发光 (I2 峰 )则随着厚度增加逐渐增强 . 相似文献
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用分子束外延方法在GaAS(100)衬底上成功生长了高质量的Zn1-xMnxSe/Znse(x=0.16,x=0.14)超晶格结构.用X射线衍射和喇曼散射对其结构、应变分布以及光散射性能进行了研究.当超晶格的总厚度大于其临界厚度时,超晶格将完全弛豫至一个新的平衡晶格常数.此时,在(100)平面内,ZnSe阱层受到张应变,而Zn1-xMnxSe垒层受到压应变,从而,导致其喇曼光谱中,ZnSe阱和Zn1-xMnxSe垒的LO声子峰分别向低频方向和高频方向移动.当超晶格总厚度小于其临界厚度时,超晶格不再弛豫而是保持过渡层Znse的晶格常数,此时,ZnSe阶层不再受到应变,而Zn1-xMn 相似文献
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本文用半经验紧束缚法计算了ZnSe/GaAs(001)超晶格的能带结构,研究了其能隙与有效质量随层厚的变化.计算了(ZnSe)_5/(GaAs)_5超晶格中与杂质有关的芯态激子,其结果能说明相应异质结中束缚在Ga上的激子峰.本文还提出了该材料中导带底存在界面态. 相似文献
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The photoluminescence of ZnSe doped with the isoelectronic substituent Mg with a simple diffusion procedure has been studied. It was found that Mg easily enters substitutionally on Zn-site to form MgxZn1-xSe. The diffused samples therefore show a graded bandgap due to a composition gradient in the surface region. In contrast to ZnSe the photoluminescence spectrum of MgxZn1-xSe is dominated by a near bandgap emission at all temperatures between 1.5 and 300 K. The bandgap shift compared with “pure” ZnSe is estimated from photoluminescence excitation spectra. The luminous efficiency of MgxZn1-xSe makes the material promising for future applications as light emitting diodes with a well defined narrow emission band at a wavelength determined by the Mg content x. 相似文献
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I. V. Sedova O. G. Lyublinskaya S. V. Sorokin A. A. Sitnikova A. A. Toropov F. Donatini Si Le Dang S. V. Ivanov 《Semiconductors》2007,41(11):1345-1350
A procedure for formation of CdSe quantum dots (QDs) in a ZnSe matrix is suggested. The procedure is based on the introduction of a CdTe submonolayer stressor deposited on the matrix surface just before deposition of the material of the QDs. (For CdTe/ZnSe structure, the relative lattice mismatch is Δa/a ≈ 14%.) The stressor forms small strained islands at the ZnSe surface, thus producing local fields of high elastic stresses controlling the process of the self-assembling of the QDs. According to the data of transmission electron microscopy, this procedure allows a considerable increase in the surface density of QDs, with a certain decrease in their lateral dimensions (down to 4.5 ± 1.5 nm). In the photoluminescence spectra, a noticeable (~150 meV) shift of the peak to longer wavelengths from the position of the reference CdSe/ZnSe QD structure is observed. The shift is due to some transformation of the morphology of the QDs and an increase in the Cd content in the QDs. Comprehensive studies of the nanostructures by recording and analyzing the excitation spectra of photoluminescence, the time-resolved photoluminescence spectra, and the cathodoluminescence spectra show that the emission spectra involve two types of optical transitions, namely, the type-I transitions in the CdSeTe/ZnSe QDs and the type-II transitions caused mainly by the low cadmium content (Zn,Cd)(Se,Te)/ZnSe layer formed between the QDs. 相似文献
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采用水相法制备了颗粒尺寸为3.75nm的硒化锌(ZnSe)量子点,采用表面活性剂将ZnSe量子点转移到有机相聚(2-甲氧基-5-辛氧基)对苯乙炔(MO-PPV)中,获得了MO-PPV/ZnSe复合材料。通过对MO-PPV和ZnSe量子点的吸收光谱(ABS)和光致发光(PL)光谱的研究发现,随着ZnSe量子点掺杂浓度的提高,复合材料的发光强度明显增强,发光峰位置出现了蓝移。当ZnSe∶MO-PPV的质量比为1∶0.181时,发光峰位置蓝移10nm。结果表明,MO-PPV与ZnSe量子点之间存在着能量传递,这是导致MO-PPV/ZnSe量子点复合材料具有PL增强的重要原因。 相似文献
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采用基于LMTO-ASA的平均结合能计算方法,研究了在ZnSxSe1-x衬底上沿(001)方向外延生长的应变层异质结ZnS/ZnSe的价带带阶值。研究表明,应变的结果使价带带阶随衬底组分(x)的变化呈非线性且单调的关系;与其他理论计算和实验结果比较,本文的计算结果比较理想。 相似文献
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原生CVDZnSe、CVDZnS晶体内Zn-H络合物含量不同的机理分析 总被引:1,自引:0,他引:1
化学气相沉积ZnSe与ZnS晶体结构及物理性能近似,但原生ZnS在6.2μm处存在由Zn-H络合物引起的明显的吸收峰,其中的H来源于未分解的含H反应气体,而原生ZnSe则无此现象。比较分析它们的沉积条件(温度、压力)以及反应气性质后认为:ZnSe相对较高的沉积温度和反应气之一的H2Se低的分解温度是主要的原因,同时高温可减弱含H缺陷对ZnS光学性能的影响;其次,ZnSe沉积中压力低使反应物浓度降低且有利于未参与反应的H2Se气体返回主气流减少了ZnSe晶体中Zn-H络合物的含量。 相似文献
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The dynamics of strained (001) ZnSe/ZnS, ZnSe/ZnTe, and ZnS/ZnTe superlattices is calculated in terms of the Keating model, taking into account the long-range Coulomb force. The effect of a plane deformation on the phonon spectra of bulk materials and superlattices is studied. The dependence of a strain-induced shift of the studied modes on the number of monolayers and relative thickness of constituents is analyzed. 相似文献
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ZnSe/ZnS超晶格激子能级的计算及实验研究 总被引:2,自引:1,他引:1
从理论和实验上研究了ZnSe/ZnS超晶格的激子能级,采用LCAO理论和Kronig-Penney模型计算了超晶格中电子、空穴和激子能带随垒宽的变化,测量了垒宽为5.8nm超晶格的低温吸收光谱和发光光谱,实验结果与理论一致。 相似文献
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A. Raisanen L. J. Brillson A. Franciosi R. Nicolini L. Vanzetti L. Sorba 《Journal of Electronic Materials》1995,24(3):163-169
We performed 1—2 keVcathodoluminescence measurements and He-Ne and HeCd excited photoluminescence studies of ZnSe/GaAs( 100)
heterostructures grown by molecular beam epitaxy. Our goal was to investigate the deep level electronic structure and its
connection with the heterojunction band offsets. We observed novel deep level emission features at 0.8, 0.98, 1.14, and 1.3
eV which are characteristic of the ZnSe overlayer and independent in energy of overlayer thickness. The corresponding deep
levels lie far below those of the near-bandedge features commonly used to characterize the ZnSe crystal quality. The relative
intensity and spatial distribution of the deep level emission was found to be strongly affected by the Zn/Se atomic flux ratio
employed during ZnSe growth. The same flux ratio has been shown to influence both the quality of the ZnSe overlayer and the
band offset in ZnSe/GaAs heterojunctions. In heterostructures fabricated in Se-rich growth conditions, that minimize the valence
band offset and the concentration of Se vacancies, the dominant deep level emission is at 1.3 eV. For heterostructures fabricated
in Zn-rich growth conditions, emission by multiple levels at 0.88,0.98, and 1.14 eV dominates. The spectral energies and intensities
of deep level transitions reported here provide a characteristic indicator of ZnSe epilayer stoichiometry and near-interface
defect densities. 相似文献