粉末样品的原子力显微镜研究方法

本文提出了用纯净水对粉末样品充分湿润以后,把粉末样品置于空气中,待其自然蒸发到样品表面只有分子结合水以后再进行AFM扫描成像的粉末样品原子力显微镜研究方法。通过分析实验过程发现,原始粉末样品颗粒表面大量的过剩电荷被分子结合水层中和,解决了扫描过程中颗粒易于粘到针尖上的问题;颗粒间存在的分子结合水与毛细管水,使颗粒之间结合牢固,解决了扫描过程不稳定的问题。实验结果表明,该法获得的粉末样品形貌图清晰真实,且具有简单易行,适用范围广的特点。另外,该方法提出了一种针尖在大气中振动．而被扫描样品在液体中的复合扫描环境,具有进一步深入研究和推广的价值。     

自聚焦共焦光纤传感系统的相干传递函数

在弱物体近似下，运用傅立叶光学，从成像系统角度对自聚焦共焦传感技术进行了理论研究。首重分析了该技术测量样品纵深结构时图像的成像机理。由于光纤具有本征场的模式，对光的振幅和相位的响应是相干的，从而可用相干传递函数（CTF）描述系统性能。结果表明，系统相当于一复振幅线平移不变系统，具有低通特性和层析特性。     

声像分析在系统级封装和多芯片模块检测中的应用

用反射模式的超声波显微镜对系统级封装SIP和多芯片MCM封装模块的品质进行了研究。探测封装内部的分层、裂纹和气泡等间隙类缺陷。用超声探测转换器把脉冲超声波送入样品,同一个转换器把接收到的回声转换成像点。最大的反射振幅是从固体与气体间的界面产生的。在固体材料内部,分层、孔洞及裂纹会造成最大振幅的回声并可以成像。超声波显微镜可发现SIP和MCM样品内间隙类的缺陷分层裂纹和气泡。     

振动与扫描速率综合影响SPM图像的实验研究

探讨了外界激振对扫描探针显微镜(SPM)图像的影响。针对DI扫描探针显微镜MultiMode^TM SPM，以Tektronix任意波形发生器AWG202l驱动PC扬声器作为激振源，以SIOS微型激光干涉测振仪SP—S为测振系统，研究了0～7kHz频带内SPM机体的简谐迫振对扫描图像的影响。实验表明，针尖-样品副所受激振影响不同于SPM机体；0～1kHz频带内的激振影响显著，再高频段则影响甚微；外界激振与SPM扫描的综合作用影响成像的结果；针尖-样品副的粘弹性模型是SPM振动影响研究的指导理论。     

接收式SNOM中的光纤探针的传输特性分析

扫描近场光学显微镜(SNOM)是新近发展起来的新型高分辨率光学显微镜,它可以对样品中纳米尺度区域的各种光学信息进行成像,将在生命科学、材料科学及信息产业有重要应用。接收式SNOM的光纤探针探测近场光信号的原理是:当针尖浸入样品表面的隐失场时,由偶极子组成的介质针尖受激产生辐射,从而将隐失波转变成传导波,由光纤探针传播到远处。因此,近场光学图像实际上是接收探针引入后形成的电磁场,对探针顶端作用而产生的散射光,通过光纤探针传输得到的光信号。因此,光纤探针的传输特性对近场光学显微镜的最终图像质量具有重要影响,研究光纤…     

利用I-Z曲线的STM"接触"模式的电学测量和表面改性研究

利用STM对金属有机络合物电双稳材料Ag—TCNQ薄膜进行电学性质的表征与改性，在针尖强电场的作用下，当电压达到某一阈值后薄膜从高阻态跃迁至低阻态，这两种高低阻态分别定义为一个存储单元的“0”与“1”状态。本文考虑到在STM的常规恒流工作模式下，针尖与样品之间的隧道结对于电学性质的表征与改性具有影响。为此测量隧道电流I对隧道结宽度Z的依赖关系，I-Z曲线，从而确定针尖刚好接触样品的接触点，利用STM进行了针尖与样品“接触式”的电学测量和表面电学改性研究，并与常规工作模式进行了比较。     

高速调制光束的互泵浦相位共轭器的研究

利用光折变晶体中高速振幅调制光束的简并四波混频（ＤＦＶＶＭ）理论和互泵浦相位共轭器（ＭＰＰＣ）的两作用区模型，对高速振幅调制光束的ＭＰＰＣ进行研究，给出了ＭＰＰＣ的共轭反射率、透过率以及作用区中光扇开系数的表示式及数值结果．实验上所得到的互泵浦相位共轭光的规律与理论相吻合．     

X射线傅里叶关联成像中的康普顿散射噪声研究（特邀）

傅里叶变换关联成像(FGI)是利用光场的高阶关联特性提取样品傅里叶信息的成像方法,对光源空间相干性要求较低,从而为小型化高分辨X射线显微提供了新的技术途径。然而在实际应用中往往要求有限光通量以减小样品辐射损伤,同时X射线与样品发生相互作用时康普顿散射的存在也会降低信噪比。针对以上问题,模拟研究了光通量有限条件下的X射线FGI,结果表明在探测面光通量0.1 phs/pixel条件下仍然能够获得样品的振幅和相位信息,并且利用Geant4蒙特卡洛程序模拟分析了金单质、硅单质和血红蛋白三种样品所产生的康普顿散射噪声对FGI成像结果的影响,结果显示相比于传统的X射线衍射成像,计入康普顿散射噪声后的FGI仍具有良好的抗噪性。     

振动模式扫描极化力显微镜及其应用

振动模式扫描极化力显微镜采用一种新的扫描探针显微成像方式，它可以在极化力介导的非接触方式和轻敲方式之间自由切换。在极化力介导的非接触方式中，极化力叠加在范德华力上，克服了一般的原子力显微镜(AFM)非接触模式中因成像力程太短而不容易稳定的缺点；通过调节针尖的高度，从极化力介导的非接触方式进入到极化力介导的轻敲方式，又能部分消除AFM轻敲模式中毛细力的干扰，还可以用比AFM轻敲模式中最小稳定成像力更小的力进行成像。针尖的高度可以通过调节Asp(Amplitude setpoint)或插入扫描高度参数(lift scan height)来控制，这一方法简单易行。利用这一模式对肢体金颗粒和DNA的高度进行测量，在一定程度上证明了轻敲模式中针尖压力的确会造成柔软生物样品的变形。     

STM中样品与针尖控制接近的研究

研制出了一种在STM中起样品位置粗调作用的微位移爬行器。它由压电陶瓷板制成的伸缩部分以及硅片制成的吸定脚部分组成。计算并测量了爬行器的步长。观察了当爬行器载着样品向针尖接近时阶跃电压对放大反馈系统的影响。提出了避免样品和针尖相撞的接近方法。     

碳纳米管原子力显微镜针尖的研究

本文研究了制作碳纳米管原子力显微镜针尖的方法和过程。在光学显微镜下，通过两个微工作台操纵将纯化后的多壁碳纳米管粘结在传统的原子力显微镜的Si针尖上。运用电蚀的方法优化碳管针尖的长度使其达到高分辨率的要求。我们运用制作的碳纳米管针尖在敲击模式下时G型免疫球蛋白进行扫描成像，结果显示了其典型的Y形结构，这是传统AFM的Si针尖无法获得的。     

KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

Charge retention of Si nanocrystals elaborated by ultra-low energy ion implantation and thermal annealings into a thin SiO₂ layer is characterized by atomic force microscopy (AFM) and Kelvin force microscopy (KFM). Electrons and holes are injected under ambient conditions by applying different bias to a conductive AFM tip in contact with the grounded sample. A surface potential mapping of the sample by KFM is continuously carried out after charge injection. The temporal decay of injected charges and their corresponding lateral spreading are quantified. The results show that the presence of Si nanocrystals leads to a strong charge confinement.     

人舌鳞癌组织超薄切片的AFM成像和切割

利用一种基于电镜超薄切片法改进的制样方法，将人舌鳞状细胞癌病理组织以环氧树脂包埋并切片后，将薄片平整地贴附在云母上，用原子力显微镜(AFM)对切片表面进行研究，可以得到高分辨率的细胞超微结构图像，局部的亚细胞水平的形态结构可以与电镜下得到的图像相比拟。在此基础上，利用AFM针尖对肿瘤细胞核内特定区域进行切割和操纵，形成生物分子的堆积，从而为拾取(pjck—up)和进一步用分子生物学手段在亚细胞基因水平研究人舌鳞癌的病理学奠定了基础。     

Acquisition of high-precision images for non-contact atomic force microscopy

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The distance between cantilever tip and sample surface in non-contact AFM is a time-varying parameter even for a fixed sample height, and typically difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high-precision atomic-resolution images. For this, the microcantilever (which forms the basis for the operation of AFM) is modeled as a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Since in most practical applications only the microcantilever deflection is accessible, we will use merely this measurement to identify the sample height. In most non-contact AFMs, cantilevers with high-quality factors are employed essentially for acquiring high-resolution images. However, due to high-quality factor, the settling time is relatively large and the required time to achieve a periodic motion is long. As a result, identification methods based on amplitude and phase measurements cannot be efficiently utilized. The proposed method overcomes this shortfall by using a small fraction of the transient motion for parameter identification, so the scanning speed can be increased significantly. Furthermore, for acquiring atomic-scale images of atomically flat samples, the need for feedback loop to achieve setpoint amplitude is basically eliminated. On the other hand, for acquiring atomic-scale images of highly uneven samples, a simple PI controller is designed to track the desired constant sample height. Simulation results are provided to demonstrate the feasibility of the approach for both sample height identification and tracking the desired sample height.     

Model-based feedback controller design for dual actuated atomic force microscopy

In atomic force microscopy (AFM) the imaging speed is strongly limited by the bandwidth of the feedback loop that controls the interaction force between the measurement tip and the sample. A significant increase in closed-loop bandwidth without sacrificing positioning range can be achieved by combining a long-range, low-bandwidth actuator with a short-range, high-bandwidth actuator, forming a dual actuated system. This contribution discusses the design of a model-based feedback controller that controls the tip-sample force in dual actuated AFM. Special emphasis is given on guaranteeing robust stability of the feedback loop under influence of variations in the dynamical behavior of the system, and to prevent strong destructive interference between both actuators. To prevent instability of the feedback loop due to saturation of the short-range actuator, an anti-windup controller is presented that robustly stabilizes the system under all imaging conditions. The designed feedback controller is implemented on a prototype dual actuated AFM system, and demonstrates a disturbance rejection bandwidth of 20 kHz, which is about 20 times faster than the model-based controlled single actuated system. AFM images are obtained verifying a significant reduction of force variations between the tip and the sample while imaging. The faster control of the tip-sample force reduces the residual tracking error and, thus, reduces the chance of damage or wear of the tip and the sample, and allows for faster imaging.     

硅衬底上CdS纳米晶和纳米碳管极化特性的动态电场力显微术观察

在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。将AOT（bis(2-ethylhexyl)sulfosuccinate disodium)分子包覆的CdS纳米晶和Au纳米晶共同沉积在n型硅片表面,以分析导电探针对其诱导极化,同时研究了纳米碳管和碳纳米颗粒的不同极化特性,对样品的原位观察表明：其半导体和金属介电特性的差别,CdS,Au粒子呈现较大的极化反差,在同一纳米碳管不同位置也能观察到类似反差。通过比较在半导体和金属粒子上探针对外加交变电场的响应幅度,可以估计纳米半导体纳米粒子的介电常数。     

Sensitivity of V-shaped atomic force microscope cantilevers based on a modified couple stress theory

A relationship based on a modified couple stress theory is developed to investigate the flexural sensitivity of a V-shaped cantilever of an atomic force microscope (AFM) taking into account the normal interaction force between the cantilever tip and the sample surface. An approximate solution to the flexural vibration problem is obtained using the Rayleigh-Ritz method. The results show that the sensitivity of the V-shaped AFM cantilever using the modified couple stress theory is smaller than that using the classical beam theory for the lower contact stiffness. However, when the contact stiffness becomes higher, the situation is reversed. Furthermore, as the ratio of cantilever thickness to internal material length scale parameter decreases, the sensitivity of the cantilever decreases.     

AFM压电微悬臂振动影响测量图像的研究

在轻敲工作模式下,原子力显微镜(AFM)压电微悬臂以较大的振幅振动。以纳米管针尖为例建立了压电微悬臂振动的数学模型并描述了纳米管尖端的振动轨迹,从纳米管尖端的振动轨迹和仿真图形的关系,指出压电微悬臂振动影响测量精度的有关参数及减小由振动产生膨胀变形的方法。根据数学图形学膨胀理论仿真出纳米管尖端振动轨迹对标准线宽模型的影响,AFM测量线宽的试验验证了上述结果。     

基于原子力显微镜的细胞弹性测量及分析方法

原子力显微镜作为纳米压痕工具已被广泛应用于测量细胞等生物材料的力学性能.然而,由于研究目的实验方法和数据处理方法的不同,造成实验结果差异大,数据提取方式不准确,结果分析解释不清等问题.本文以细胞为例,对实验数据获取和处理方法的适用范围、优缺点、可靠性及结果的分析方法进行讨论,并与其他力学性能测量方法相比较,以期提高实验结果的可靠性,为细胞力学性能实验的开展提供参考.     

Some issues on atomic force microscopy based surface characterization

Influences of tip radius and sampling interval on applying atomic force microscopy (AFM) in quantitative surface evalua- tions are investigated by numerical simulations and experiments. Several evaluation parameters of surfaces ranging from amplitude to functional parameters are studied. Numerical and experimental results are in good agreements. The accuracy of estimating tip radius on random rough surface with Gaussian distribution of heights using a blind reconstruction method is also discussed theoretically. It is found that the accuracy is greatly depending on the ratio of actual tip radius to root- mean-square (rms) radius of curvature. To obtain an accurate estimation of tip radius under Gaussian rough surface, the ratio has to be larger than 3/2.