Anomalous elastic response of amorphous alloys suggesting collective motions of many atoms

The dynamic Young’s modulus, E, of amorphous (a-) Zr₆₀Cu₃₀Al₁₀ (numbers indicate at.%) alloy was measured as a function of frequency, f, with a strain amplitude, _t, of 10⁻⁶, E(10⁻⁶,f), and also as a function of _t for f near 10² Hz, E(_t,10² Hz), by means of the vibrating reed methods. The elasticity study under the passing of electric current (PEC) was carried out too. E(10⁻⁶,f) is lower than E₀ for f between 10 and 10⁴ Hz showing local minima near 5×10, 5×10² and 5×10³ Hz, which are indicative of the resonant collective motion of many atoms, where E₀ is the static Young’s modulus. E(_t,10² Hz) increases showing saturation with increasing _t. Qualitatively, the outlines of E(10⁻⁶,f) and E(_t,10² Hz) observed for a-Zr₆₀Cu₃₀Al₁₀ are similar to those reported for various a-alloys. Quantitatively, a change in E(_t,10² Hz) for a-Zr₆₀Cu₃₀Al₁₀ is smallest among that reported for various a-alloys, presumably reflecting that the crystallization volume, (ΔV/V)_x, is smallest for a-Zr₆₀Cu₃₀Al₁₀. The effective charge number, Z^*, estimated from the change in E(10⁻⁶,10² Hz) due to PEC is 3.0×10⁵, which is comparable with Z^* reported for various a-alloys. We surmise that the number of atoms in the collective motions excited near 10² Hz is similar among various a-alloys. The E(10⁻⁶,f) data suggest that the spatial sizes of the density fluctuations may show a distribution.     

D.c. properties of ZnO thin films prepared by r.f. magnetron sputtering

In the development of ZnO-based varistors the electrical properties of ZnO/Bi₂O₃ junctions and of the two individual oxides are being investigated. Following our recent work on a.c. conductivity in Al---ZnO---Al sandwich structures we currently report d.c. measurements. The structures were prepared by r.f. magnetron sputtering in an argon/oxygen mixture in the ratio 4:1. Capacitance-voltage data confirm that the Al/ZnO interface does not form a Schottky barrier and measurements of the dependence of capacitance on film thickness indicate that the relative permittivity of the films is approximately 9.7. With increasing voltage the current density changed from an ohmic to a power-law dependence with exponent n≈3. Furthermore measurements of current density as a function of reciprocal temperature showed a linear dependence above about 240 K, with a very low activation energy below this temperature consistent with a hopping process. The higher temperature results may be explained assuming a room-temperature electron concentration n₀ and space-charge-limited conductivity, dominated by traps exponentially distributed with energy E below the conduction band edge according to N = N₀exp(−E/kT_t), where k is Boltzmann's constant. Typical derived values of these parameters are: n₀ = 7.2 × 10¹⁶ m⁻³, N₀ = 1.31 × 10⁴⁵ J⁻¹ m⁻³ and T_t = 623 K. The total trap concentration and the electron mobility were estimated to be 1.13 × 10²⁵ m⁻³ and (5.7−13.1) ×10⁻³m²V⁻¹s⁻¹ respectively.     

Highly conducting indium tin oxide (ITO) thin films deposited by pulsed laser ablation

Highly conducting and transparent indium tin oxide (ITO) thin films were prepared on SiO₂ glass and silicon substrates by pulsed laser ablation (PLA) from a 90 wt.% In₂O₃-10 wt.% SnO₂ sintered ceramic target. The growths of ITO films under different oxygen pressures (P_O2) ranging from 1×10⁻⁴–5×10⁻² Torr at low substrate temperatures (T_s) between room temperature (RT) and 200°C were investigated. The opto-electrical properties of the films were found to be strongly dependent on the P_O2 during the film deposition. Under a P_O2 of 1×10⁻² Torr, ITO films with low resistivity of 5.35×10⁻⁴ and 1.75×10⁻⁴ Ω cm were obtained at RT (25°C) and 200°C, respectively. The films exhibited high carrier density and reasonably high Hall mobility at the optimal P_O2 region of 1×10⁻² to 1.5×10⁻² Torr. Optical transmittance in excess of 87% in the visible region of the solar spectrum was displayed by the films deposited at Po₂≥1×10⁻² Torr and it was significantly reduced as the P_O2 decreases.     

Space-charge-limited conductivity in evaporated cadmium selenide thin films

We have studied the basic d.c. electrical properties of evaporated CdSe films in the context of the development of inexpensive solar cells. Earlier measurements have shown significant variations, which depend on the preparation and previous treatment of the films. In the present work Al---CdSe---Al sandwich structures were studied, with the CdSe thickness in the range 0.1–1.0 (μm. D.c. capacitance varied inversely with film thickness, yielding a permittivity of 7.82 × 10⁻¹¹ F m⁻¹ (relative permittivity 8.83). Current density was proportional to applied voltage at low voltage levels, but followed a power law at higher voltages with exponent typically 2.5; the transitional voltage was directly proportional to the square of the film thickness. The results were interpreted as ohmic conduction at low voltages and space-charge-limited conductivity (SCLC) dominated by an exponential trap distribution, at higher voltage levels. Measurements of current density as a function of inverse temperature for different applied voltages in the SCLC region enabled the derivation of typical mobilities in the range of ( 7.65–10.15) × 10⁻⁵ m² V⁻¹ s⁻¹ using the results of our existing theory. This value of mobility and the derived trapping parameters were in general agreement with some earlier measurements.     

Light emitting devices from organic charge transfer adduct thin films

For the first time, thin film devices of charge transfer adducts of tetrathiafulvalene (TTF) have been fabricated. A luminance of 5 cd m⁻² has been achieved for a device structure ITO/poly(aniline)/TTF(NO₃)_0.55/Al whose EL spectrum has a broad peak at 645 nm. The devices were fabricated by spin coating from solutions of the adducts. A luminous efficiency of 5×10⁻⁴ lm W⁻¹ has been obtained for these devices which is comparable to that of ITO/poly(aniline)/Alq₃/Al (5.2×10⁻⁴ lm W⁻¹) under same fabrication conditions. The single layer, mixed layer and double layer devices fabricated in this study fit the space charge limited model. Devices fabricated from the adduct [TTF–Alq₃] emit white light (40 cd m⁻²) with a luminous efficiency of 6.6×10⁻⁴ lm W⁻¹. The colour of light emitted appears to depend on the effective oxidation state of TTF in the adducts.     

A comparative study of low dielectric constant barrier layer, etch stop and hardmask films of hydrogenated amorphous Si-(C, O, N)

New barrier layer, etch stop and hardmask films, including hydrogenated amorphous a-SiC_x:H (SiC), a-SiC_xO_y:H (SiCO), and a-SiC_xN_y:H (SiCN) films with a dielectric constant (k) approximately 4.3, are produced using the plasma-enhanced chemical vapor deposition technique. The chemical and structural nature, and mechanical properties of these films are characterized using X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and nano-indentation. The leakage current density and breakdown electric field are investigated by a mercury probe on a metal-insulator-semiconductor structure. The properties of the studied films indicate that they are potential candidates as barrier layer, etch stop and hardmask films for the advanced interconnect technology. The SiC film shows a high leakage current density (1.3×10⁻⁷ A/cm² at 1.0 MV/cm) and low breakdown field (1.2 MV/cm at 1.0×10⁻⁶ A/cm²). Considering the mechanical and electrical properties requirements of the interconnect process, SiCN might be a good choice, but the N content may result in via poison problem. The low leakage current (1.2×10⁻⁹ A/cm² at 1.0 MV/cm), high breakdown field (3.1 MV/cm at 1.0×10⁻⁶ A/cm²), and relative high hardness (5.7 GPa) of the SiCO film indicates a good candidate as a barrier layer, etch stop, or hardmask.     

Excited-state absorption at 1.57 μm in U:CaF2 and Co:ZnSe saturable absorbers

Appreciable excited-state absorption (ESA) in U²⁺:CaF₂ and Co²⁺:ZnSe saturable absorbers was measured at λ=1.573 μm by optical transmission versus light fluence curves of 30–40 ns long pulses. The ground- and excited-state absorption cross-sections obtained were (9.15±0.3)×10⁻²⁰ and (3.6±0.2)×10⁻²⁰ cm², respectively, for U²⁺:CaF₂, and (57±4)×10⁻²⁰ and (12.5±1)×10⁻²⁰ cm² for Co²⁺:ZnSe. Thus, ESA is not negligible in U²⁺:CaF₂ and Co²⁺:ZnSe, as previously estimated.     

Up-conversion dynamics in GdAlO3:Er single crystal fibre

Green fluorescence has been obtained under continuous laser excitation in the 780–860 nm range in GdAlO₃:Er³⁺. With the help of the Judd-Ofelt treatment we built a model based on population rate equations to describe its time evolution. We found the intensity parameters to be Ω₂ = 2.045 × 10⁻²⁰ cm², Ω₄ = 1.356 × 10⁻²⁰ cm² Ω₆ = 1. 125 × 10⁻²⁰ cm². Even if a two-photon absorption and a looping mechanism are necessary to well describe the dynamics, the main process responsible for up-conversion is energy transfer between erbium ions.     

Underlying mechanisms for unique elastic properties of nanocrystalline Au

In order to get an insight into the grain boundaries (GBs) in nanocrystalline (n-) metal, we prepared the high-density n-Au with ρ/ρ₀>99% by the gas-deposition method and carried out the vibrating reed measurements, where ρ/ρ₀ is the relative density referring to the bulk density. The strain amplitude dependence (SAMD) of the resonant frequency (f) and the internal friction (Q⁻¹) was measured for the strain () amplitude between 10⁻⁶ and 2×10⁻³ and for temperature between 5 and 300 K. No plastic deformations are detected for the present strain range, where f decreases for up to 10⁻⁴ and then turns to increase, showing saturation for between 10⁻⁴ and 2×10⁻³. The low temperature irradiation by 2 MeV electrons or 20 MeV protons causes an increase in the Young’s modulus at 6 K, which is surmised to reflect a modification of the anelastic process in the GB regions. In contrast, the SAMD of f is hardly modified by irradiation, suggesting that it is indicative of a collective motion of atoms in n-Au.     

Deep levels in GaInAs grown by molecular beam epitaxy and their concentration reduction with annealing treatment

X-ray diffraction (XRD), current–voltage (IV), capacitance–voltage (CV), deep-level transient Fourier spectroscopy (DLTFS) and isothermal transient spectroscopy (ITS) techniques are used to investigate the thermal annealing behaviour of three deep levels in Ga_0.986In_0.014As heavily doped with Si (6.8 × 10¹⁷ cm⁻³) grown by molecular beam epitaxy (MBE). The thermal annealing was performed at 625 °C, 650 °C, 675 °C, 700 °C and 750 °C for 5 min. XRD study shows good structural quality of the samples and yields an In composition of 1.4%. Two main electron traps are detected by DLTFS and ITS around 280 K, with activation energies of 0.58 eV and 0.57 eV, capture cross sections of 9 × 10⁻¹⁵ cm² and 8.6 × 10⁻¹⁴ cm² and densities of 2.8 × 10¹⁶ cm⁻³ and 9.6 × 10¹⁵ cm⁻³, respectively. They appear overlapped and as a single peak, which divides into two smaller peaks after annealing at 625 °C for 5 min.

Annealing at higher temperatures further reduces the trap concentrations. A secondary electron trap is found at 150 K with an activation energy of 0.274 eV, a capture cross section of 8.64 × 10⁻¹⁵ cm² and a density of 1.38 × 10¹⁵ cm⁻³. The concentration of this trap level is also decreased by thermal annealing.     

Control of Al-implantation doping in 4H–SiC

We report results of high-dose Al-ion implantation in 4H–SiC. Using multiple energy implantation techniques, box profiles were realized with targeted concentrations: 3.33×10¹⁸ to 10²¹ cm⁻³. The depths were 190 and 420 nm. The implantation energies ranged from 30 to 200 keV. The implantation and annealing temperatures were 650 and 1670°C, respectively. First, infrared investigations were done to assess the surface quality of the samples before and after annealing. Next, the conduction mechanism was investigated. Performing Hall measurements, we found that the room temperature free hole concentration varies like p_H=C_t/105 (cm⁻³), where C_t is the targeted Al-concentration, with a high level of electronic mobility. For the targeted concentration 10²¹ cm⁻³, this resulted in an active layer with 95 mΩ cm resistivity and, at room temperature, a free hole concentration of 10¹⁹ cm⁻³.     

Depolarization of UCN stored in material traps

Depolarization of ultra-cold neutrons (UCN) stored in material traps was first observed. The probability of UCN spin flip per reflection depends on the trap material and varies from 7×10⁻⁶ (beryllium) to 10⁻⁴ (glass).     

A kinetic model for the degradation of benzothiazole by Fe3+-photo-assisted Fenton process in a completely mixed batch reactor

The degradation of benzothiazole in aqueous solution by a photo-assisted Fenton reaction has been studied in a batch reactor in the pH range 2.0–3.2 and for H₂O₂ and Fe(III) concentrations respectively between 1.0×10⁻³–1.5×10⁻¹ and 1.0×10⁻⁶–4.0×10⁻⁶ M.

A kinetic model has been developed to predict the decay of benzothiazole at varying reaction conditions. The use of kinetic constants from the literature in the model allows to simulate the system behavior by taking into account the influence of pH, hydrogen peroxide, Fe(III) and sulfate concentrations and the ionic strength.     

The optical and electrical properties of copper indium di-selenide thin films

Thin films of copper indium di-selenide (CIS) with a wide range of compositions near stoichiometry have been formed on glass substrates in vacuum by the stacked elemental layer (SEL) deposition technique. The compositional and optical properties of the films have been measured by proton-induced X-ray emission (PIXE) and spectrophotometry (photon wavelength range of 300–2500 nm), respectively. Electrical conductivity (σ), charge-carrier concentration (n), and Hall mobility (μ_H) were measured at temperatures ranging from 143 to 400 K. It was found that more indium-rich films have higher energy gaps than less indium-rich ones while more Cu-rich films have lower energy gaps than less Cu-rich films. The sub-bandgap absorption of photons is minimum in the samples having Cu/In ≈ 1 and it again decreases, as Cu/In ratio becomes less than 0.60. Indium-rich films show n-type conductivities while near-stoichiometric and copper-rich films have p-type conductivities. At 300 K σ, n and μ_H of the films vary from 2.15 × 10⁻³ to 1.60 × 10⁻¹ (Ω cm)⁻¹, 2.28 × 10¹⁵ to 5.74 × 10¹⁷ cm⁻³ and 1.74 to 5.88 cm² (V s)⁻¹, respectively, and are dependent on the composition of the films. All the films were found to be non-degenerate. The ionization energies for acceptors and donors vary between 12 and 24, and 3 and 8 meV, respectively, and they are correlated well with the Cu/In ratios. The crystallites of the films were found to be partially depleted in charge carriers.     

Effect of Al2O3 particles on mechanical properties of directionally solidified intermetallic Ti–46Al–2W–0.5Si alloy

The effect of Al₂O₃ particles on microhardness and room-temperature compression properties of directionally solidified (DS) intermetallic Ti–46Al–2W–0.5Si (at.%) alloy was studied. The ingots with various volume fractions of Al₂O₃ particles and mean ₂–₂ interlamellar spacings were prepared by directional solidification at constant growth rates ranging from 2.78×10⁻⁶ to 1.18×10⁻⁴ ms⁻¹ in alumina moulds. The ingots with constant volume fraction of Al₂O₃ particles and various mean interlamellar spacings were prepared by directional solidification at a growth rate of 1.18×10⁻⁴ ms⁻¹ and subsequent solution annealing followed by cooling at constant rates varying between 0.078 and 1.889 K s⁻¹. The mean ₂–₂ interlamellar spacing λ for both DS and heat-treated (HT) ingots decreased with increasing cooling rate according to the relationship λ∝ ^−0.46. In DS ingots, microhardness, ultimate compression strength, yield strength and plastic deformation to fracture increased with increasing cooling rate. In HT ingots, microhardness and yield strength increased and ultimate compression strength and plastic deformation to fracture decreased with increasing cooling rate. The yield stress increased with decreasing interlamellar spacing and increasing volume fraction of Al₂O₃ particles. A linear relationship between the Vickers microhardness and yield stress was found for both DS and HT ingots. A simple model including the effect of interlamellar spacing and increasing volume fraction of Al₂O₃ particles was proposed for the prediction of the yield stress.     

Thermal conductivity of BaWO4 single crystal

Barium tungstate (BaWO₄) single crystal has been grown using Czochralski technique. It belongs to the scheelite structure, forming the space group I4₁/a at room temperature and the primitive cell contains two formular units. The thermal expansion, specific heat and thermal diffusivity were measured, and then the thermal conductivity was calculated. These results show that BaWO₄ possesses large anisotropic thermal expansion and its thermal expansion coefficients are _a = 1.10 × 10⁻⁵/K, _b = 1.08 × 10⁻⁵/K, and _c = 3.51 × 10⁻⁵/K in the temperature range from 303 to 1423 K. However, its thermal conductivity shows small anisotropic in the temperature range from 297 to 563 K and even displays isotropic at about 428 K. The calculated thermal conductivities are 2.59 and 2.73 W m⁻¹ K⁻¹ at room temperature, along [1 0 0] and [0 0 1] directions, respectively.     

Effects of reduction treatment on the photorefractive properties of Pb0.5Ba0.5Nb2O6

Lead barium niobate is a new photorefractive material of high interest for a variety of applications including holographic storage. Pb_0.5Ba_0.5Nb₂O₆ crystals have been grown by the Bridgman method, and the effects of heat treatments on their photorefractive properties were investigated using Ar ion laser at λ=514.5 nm. The color and absorption spectrum of the crystals varied depending on the oxygen partial pressure during heat treatment. The oxygen diffusivity was estimated to be in the order of 10⁻⁶ and 10⁻⁵ cm²/h at 425 and 550 °C, respectively. Reduction treatment at an oxygen pressure of 215 mTorr increased the effective density of photorefractive charges about three times from 8.0×10¹⁵ to 2.2×10¹⁶ cm⁻³ and made the charge transport more electron-dominant. As a result, the maximum gain coefficient improved from 5.5 to 13.8 cm⁻¹. A diffraction efficiency as high as 70% was achieved in a reduced crystal.     

Growth and spectroscopy of Dy doped in ZnWO4 crystal

Single-crystal ZnWO₄:Dy³⁺ was grown by Czochralski technique. The XRD, absorption spectra as well as fluorescence spectrum are investigated and the Judd–Ofelt intensity parameters Ω₂, Ω₄, Ω₆ are obtained to be 7.76 × 10⁻²⁰ cm², 0.57 × 10⁻²⁰ cm², 0.31 × 10⁻²⁰ cm², respectively. Calculated radiative transition rate, branching ratios and radiative lifetime for different transition levels of ZnWO₄:Dy³⁺ crystals are presented. Fluorescence lifetime of ⁴F_9/2 level is 158 μs and quantum efficiency is 66%.The most intense fluorescence line at 575 nm correlative with transition ⁴F_9/2 → ⁶H_13/2 is potentially for application of yellow lasers.     

Enhanced fluoride sorption by mechanochemically activated kaolinites

This study investigated the surface modification of photocatalyst and photodecomposition of formaldehyde from indoor pollution source. This study explored the feasibility of the application of the ultraviolet light emitting diode (UVLED) instead of the traditional ultraviolet (UV) lamp to treat the formaldehyde. The photocatalytic decomposition of formaldehyde at various initial concentrations was elucidated according to the Langmuir–Hinshelwood model. The reaction rate constant (k) and adsorption equilibrium constant (K_L) over 0.334 g silver titanium oxide photocatalyst (Ag/TiO₂) coated on glass sticks with 254 nm ultraviolet lamp (UVC), 365 nm ultraviolet lamp (UVA), and UVLED are 650 ppmv min⁻¹ and 2 × 10⁻⁴ ppmv⁻¹, 500 ppmv min⁻¹ and 1.04 × 10⁻⁴ ppmv⁻¹, and 600 ppmv min⁻¹ and 2.52 × 10⁻⁵ ppmv⁻¹, respectively. A comparison of the simulation results with the experimental data was also made, indicating good agreement. The magnitudes of energy effectiveness (E_e) are in the order of UVLED (0.6942 mg kW⁻¹ h⁻¹) > UVA (0.007 mg kW⁻¹ h⁻¹) > UVC (0.0053 mg kW⁻¹ h⁻¹). The E_e of UVLED is 131 times larger than that of UVC. The UVLED can save a lot of energy in comparison with the traditional UV lamps. Thus, this study showed the feasible and potential use of UVLED in photocatalysis.     

Surface and electrical studies of CuO:V2O5 thin films

Results from the studies of multicomponent CuO:V₂O₅ bulk material and thermally evaporated thin films of highly conducting bulk composition prepared at different substrate temperatures are thus compared and discussed. The electronic conductivity is enhanced on increase in the substrate temperature T_s and reaches a maximum value of 12.3 × 10⁻⁶Ω⁻¹ cm⁻¹ for T_s = 423 K. X-ray photoelectron spectroscopy studies indicate an increase in the reduced states of vanadium and copper ions in going from the bulk glass to the thin film. Dynamic secondary-ion mass spectroscopy studies on thin films over a depth of 3000 Å show a strong dependence of T_s on the Cu-to-V intensity ratio. Even though stoichiometric values for thin films are achievable by varying the T_s, the oxidation states of Cu in these films are predominantly monovalent. The electrical behaviors of these materials and their thin film counterparts are finally being discussed in relation to the surface analysis data.