A 2.2-V 2.9-ppm/℃BiCMOS bandgap voltage reference with full temperature-range curvature-compensation

A high precision high-order curvature-compensated bandgap reference compatible with the standard Bi-CMOS process,which uses a simple structure to realize a novel exponential curvature compensation in lower temperature ranges,and a piecewise curvature correction in higher temperature ranges,is presented.Experiment results of the proposed bandgap reference implemented with a 0.6-μm BCD process demonstrate that a temperature coefficient of 2.9 ppm/℃is realized at a 3.6-V power supply,a power supply rejectio...     

A 0.19 ppm/°C bandgap reference circuit with high-PSRR

A high-order curvature-compensated CMOS bandgap reference (BGR) topology with a low temperature coefficient (TC) over a wide temperature range and a high power supply reject ratio (PSRR) is presented. High-order correction is realized by incorporating a nonlinear current I_NL, which is generated by ∆V_GS across resistor into current generated by a conventional first-order current-mode BGR circuit. In order to achieve a high PSRR over a broad frequency range, a voltage pre-regulating technique is applied. The circuit was implemented in CSMC 0.5 μm 600 V BCD process. The experimental results indicate that the proposed topology achieves TC of 0.19 ppm/°C over the temperature range of 165 °C (−40 to 125 °C), PSRR of −123 dB @ DC and −56 dB @ 100 kHz. In addition, it achieves a line regulation performance of 0.017%/V in the supply range of 2.8–20 V.     

A 2.87 ppm/°C 65 nm CMOS bandgap reference with nonlinearity compensation

Based on the review and analysis of two recently reported low temperature coefficient (TC) bandgap voltage references (BGRs), a new temperature compensation technique is presented. With the double-end piecewise nonlinearity correction method, the logarithm cancellation technique and the mixed-mode output topology, a BGR with high-temperature stability is realised based on 65?nm CMOS low-leakage process. The post-simulation results using Spectre show that this BGR produces an output voltage of about 953?mV with 2.5?V supply voltage, and the output voltage varies by only 0.16?mV from ?40°C to 125°C. This low TC BGR has been used in a 65?nm CMOS touch screen controller, and the measurement shows that the output voltage of this BGR is about 949?mV varying by 0.44?mV from ?40°C to 125°C. The TC of this BGR is about 2.87?ppm/°C, meeting the requirement of high-precision SoC application.     

A 1.3 ppm/°C BiCMOS bandgap voltage reference using piecewise-exponential compensation technique

A high-order curvature-compensated BiCMOS bandgap voltage reference using piecewise-exponential compensation technique is presented in this paper. The circuit utilizes a variable gain current mirror to realize exponential compensation as well as a common emitter amplifier with local feedback to achieve a second correction. Implemented in 0.5-μm BCD process, the proposed voltage reference consumes a supply current of 17.5 μA at 2.5 V. A temperature coefficient(TC) of 1.3 ppm/°C, PSRR of more than 76 dB at low frequencies and a line regulation of 160 ppm/V from 2.5 to 5 V are easily achieved, which make it applied widely in portable equipments.     

A 3 V 110 μW 3.1 ppm/°C curvature-compensated CMOS bandgap reference

This paper presents design of a high-precision curvature-compensated bandgap reference (BGR) circuit implemented in a 0.35 μm CMOS technology. The circuit delivers an output voltage of 1.09 V and achieves the lowest reported temperature coefficient of ~3.1 ppm/°C over a wide temperature range of [?20°C/+100°C] after trimming, a power supply rejection ratio of ?80 dB at 1 kHz and an output noise level of 1.43 μV $ \sqrt {\text{Hz}} $ at 1 kHz. The BGR circuit consumes a very low current of 37 μA at 3 V and works for a power supply down to 1.5 V. The BGR circuit has a die size of 980 μm × 830 μm.     

A 0.52 ppm/°C high-order temperature-compensated voltage reference

This paper proposed a new high-order curvature compensation technique for a new bandgap voltage reference structure using the temperature characteristics of current gain β and emitter bandgap narrowing factor ΔE _G of a lateral NPN bipolar transistor. The new structure can produce two voltage references, which are 1.209 and 2.418 V, respectively. The simulation results show that the temperature coefficients of the two output voltage are 0.52 ppm/°C, the PSRR is more than 60 dB for frequencies at 10 kHz, and the circuit dissipates 0.18 mW with 5-V supply.     

A novel 0.84 ppm/°C CMOS curvature-compensated bandgap with 1.2 V supply voltage

This paper proposes a novel CMOS curvature-compensated bandgap reference (BGR) by using a new full compensation technique. The theory behind the proposed full compensation technique is analyzed. The proposed BGR is designed and implemented using 0.15 μm standard CMOS process. Simulation results show that the proposed BGR achieves a temperature coefficient (TC) of 0.84 ppm/°C over the temperature range from −40 °C to 120 °C with a 1.2 V supply voltage. The current consumption of proposed BGR is 51 μA at 27 °C. The line regulation of proposed BGR is 0.023%/V over the supply voltage range from 1.2 V to 1.8 V at 27 °C. In addition, the PSRRs of proposed BGR are −91 dB, −81 dB, −61 dB and −29 dB at DC or 10 Hz, 1 kHz, 10 kHz, and 100 kHz, respectively.     

A curvature calibrated bandgap reference with base-emitter current compensating in a 0.13μm CMOS process

In bandgap references,the effect caused by the input offset of the operational amplifier can be effectively reduced by the utilization of cascade bipolar junction transistors(BJTs).But in modern CMOS logic processes,due to the small value ofβ,the base-emitter path of BJTs has a significant streaming effect on the collector current,which leads to a large temperature drift for the reference voltage.To solve this problem,a base-emitter current compensating technique is proposed in a cascade BJT bandgap refe...     

A broadband Low Noise Amplifier with built-in linearizer in 0.13-µm CMOS process

A linearized ultra-wideband (UWB) CMOS Low Noise Amplifier (LNA) is presented in this paper. The linearity performance is enhanced by exploiting PMOS–NMOS common-gate (CG) inverter as a built-in linearizer which leads to cancel out both the second- and third-order distortions. Two inductors are placed at the drain terminals of CG transistors in the built-in linearizer to adjust the phase and magnitude of the third-order distortion. A second-order band-pass Chebyshev filter is utilized in the input port of common-source (CS) configuration to provide broadband input matching at 3.1–10.6 GHz frequency range to a 50-Ω antenna. Series and shunt peaking techniques are employed to extend the bandwidth (BW) and to flatten the gain response. Simulated in 0.13 µm CMOS technology, the CMOS LNA exhibits state of the art performance consuming 17.92 mW of dc power. The CMOS LNA features a maximum gain of 10.24 dB, 0.9–4.1 dB noise figure (NF), and a third-order input intercept point (IIP3) of 6.8 dBm at 6.3 GHz.     

A 16 MHz, 59.2 ppm/°C CMOS DLL-Assisted VCO with Improved Frequency Stability Towards Single Chip Wireless IOT

A 16 MHz, highly stable voltage controlled oscillator (VCO) is reported in this paper. The proposed VCO consists of three cross-coupled RC stages, and is fully compatible with standard CMOS process. A positively biased PN junction with negative temperature coefficient is incorporated in the design to compensate frequency drift. In addition, a delay locked loop (DLL) directly following the VCO is utilized to further improve the output stability caused by temperature variations. The designed circuit was implemented using CMOS 0.18 μm technology, and was validated through experiments. Measurement results show that the DLL-assisted VCO output variation across the 25~120 °C temperature range is less than 0.56 %, corresponding to 59.2 ppm/°C. It also shows that the output standard deviation of the DLL-assisted VCO is only 6.816 KHz, ~ 16.6 % better compared with the same VCO without DLL’s assistance.     

A high PSRR CMOS voltage reference with 1.2 V operation

A high power supply rejection ratio (PSRR) CMOS band-gap reference (BGR) with 1.2 V operation is proposed in this paper. The reference features include an error amplifier with a trimming circuit and a trimming resistor array on the chip. Local positive feedback is used in the error amplifier to obtain high gain. By trimming the resistor array, the PSRR of the error amplifier is trimmed around one to obtain a high PSRR. The trimming resistor array is controlled externally. The post simulation results indicate that the PSRR is up to ?130 dB@DC and ?89 dB@10 kHz. The experimental results show that, under a supply voltage of 1.2 V the measured PSRR is ?103 dB@dc and ?74 dB@10 kHz.     

A 1.4-V 48-μW current-mode front-end circuit for analog hearing aids with frequency compensation

正A current-mode front-end circuit with low voltage and low power for analog hearing aids is presented. The circuit consists of a current-mode AGC(automatic gain control) and a current-mode adaptive filter.Compared with its conventional voltage-mode counterparts,the proposed front-end circuit has the identified features of frequency compensation based on the state space theory and continuous gain with an exponential characteristic.The frequency compensation which appears only in the DSP unit of the digital hearing aid can upgrade the performance of the analog hearing aid in the field of low-frequency hearing loss.The continuous gain should meet the requirement of any input amplitude level,while its exponential characteristic leads to a large input dynamic range in accordance with the dB SPL(sound pressure level).Furthermore,the front-end circuit also provides a discrete knee point and discrete compression ratio to allow for high calibration flexibility.These features can accommodate users whose ears have different pain thresholds.Taking advantage of the current-mode technique,the MOS transistors work in the subthreshold region so that the quiescent current is small.Moreover,the input current can be compressed to a low voltage signal for processing according to the compression principle from the current-domain to the voltage-domain.Therefore,the objective of low voltage and low power(48μW at 1.4 V) can be easily achieved in a high threshold-voltage CMOS process of 0.35μm(V_(TON) + |V_(TOP)|≈1.35 V).The THD is below -45 dB.The fabricated chip only occupies the area of 1×0.5 mm~2 and 1×1 mm~2.     

A 12-bit 250 MS/s pipeline ADC with 78 dB SFDR in 0.13-µm CMOS

A 12-bit 250 MS/s pipeline ADC is presented and implemented in 0.13 µm CMOS process. To reduce the load capacitance of each pipeline stage and save area, the inter-metal capacitors are adopted as input sampling capacitors of the comparators. A fully integrated reference buffer associated with a simulation scheme is proposed to improve the settling speed and PSRR of the differential reference voltage. To reduce the overall power a low cost foreground calibration for capacitor mismatches is employed. The single-stage telescopic with gain-boosting amplifiers and an improved bias is applied in each stage due to its high power efficiency. Additionally, the timing in the sampling phase is optimised to achieve high sampling linearity. Even harmonics induced by parasitic capacitance are analysed profoundly and mitigated at the level of layout. The measured SNDR and SFDR are 63 and 78 dB with 38.1 MHz input, respectively, and remain 63 and 77 dB with Nyquist input. The ADC core area is 1.6 mm² and consumes 165 mW (reference buffer included, LVDS excluded) at 250 MS/s under 1.3 V.     

A 0.6V 44.6 ppm/ºC subthreshold CMOS voltage reference with wide temperature range and inherent leakage compensation

In this paper, a 0.6 V subthsheshold CMOS voltage reference (CVR) achieving wide temperature range and high power supply ripple rejection (PSRR) is presented. The proposed CVR structure can compensate the high temperature leakage and current mirror induced mismatches so as to increase the operating temperature range. The generated reference voltage of the proposed CVR circuit is the threshold voltage difference of two NMOS transistors, leading to relatively small variations. Moreover, the enhanced current source helps achieve high PSRR. The proposed CVR circuit is implemented in a standard 0.18-μm CMOS technology. Measurement results show that, with one single trimming, a mean output of 344 mV with standard deviation of only 2.89 mV and average TC of 44.6 ppm/°C over a wide temperature range from −40 °C to 125 °C is achieved. The measured PSRR is −68 dB, −52 dB and −52 dB at 10 Hz, 100 kHz and 10 MHz, respectively. The measured line sensitivity (LS) is 0.06%/V with a power supply from 0.6 V to 2 V while consuming 19.8  nW at 0.6 V supply. The active area is 0.019 mm².     

A 1-V 60-μW 85-dB dynamic range continuous-time third-order sigma-delta modulator

A 1-V third order one-bit continuous-time（CT） EA modulator is presented. Designed in the SMIC mixedsignal 0.13-μm CMOS process, the modulator utilizes active RC integrators to implement the loop filter. An efficient circuit design methodology for the CT ZA modulator is proposed and verified. Low power dissipation is achieved through the use of two-stage class A/AB amplifiers. The presented modulator achieves 81.4-dB SNDR and 85-dB dynamic range in a 20-kHz bandwidth with an over sampling ratio of 128. The total power consumption of the modulator is only 60 μW from a 1-V power supply and the prototype occupies an active area of 0.12 mm^2.     

A 1.9 GHz ADPLL with 130 reference cycles settling time in 0.18 μm CMOS technology

A fast-settling all-digital phase-locked loop (ADPLL) is presented in this paper. We propose two techniques for reducing the settling time of an ADPLL, i.e. the oscillator tuning word (OTW) presetting technique and counter-based mode switching controller (CB-MSC). In the first technique, the OTW is preset in process, voltage, and temperature (PVT) calibration mode (P-mode), which leads to the digitally controlled oscillator being initialized with a frequency closer to the target. In the second technique, the CB-MSC is used to shorten the mode switching time. A prototype 1.9 GHz ADPLL with a 13 MHz reference is implemented in 0.18 μm CMOS process. Measurements show that the proposed techniques reduce the settling time by about 33 %. The proposed ADPLL settles within 130 reference cycles and presents a phase noise of ?116 dBc/Hz@1 MHz.     

A 1.2-V, 84-dB Σ△ ADM in 0.18-μm digital CMOS technology

A low power and low voltage∑△analog-to-digital modulator is realized with digital CMOS technology, which is due to full compensated depletion mode capacitors.Compared with mixed signal technology,this type of modulator is more compatible for pure digital applications.A pseudo-two-stage class-AB OTA is used in switchedcapacitor integrators for low voltage and low power.The modulator is realized in standard SMIC 0.18μm 1P6M digital CMOS technology.Measured results show that with 1.2 V supply voltage and a 6 MHz sample clock,the dynamic range of the modulator is 84 dB and the total power dissipation is 2460μW.     

A 5.7–6.0 GHz CMOS PLL with low phase noise and −68 dBc reference spur

This paper presents a 5.7–6.0 GHz Phase-Locked Loop (PLL) design using a 130 nm 2P6M CMOS process. We propose to suppress reference spur through reducing the current mismatch in charge pump (CP), controlling the delay time in phase frequency detector (PFD), and using a smaller VCO gain (KVCO). With a reference frequency of 32.768 MHz, chip measurement results show that the frequency tuning range is 5.7–6.0 GHz, the reference spur is −68 dBc, the phase noise levels are −109 dBc/Hz and −135 dBc/Hz at 1 MHz and 10 MHz offset respectively for 5.835 GHz. Compared with existing designs in the literature, this work’s reference spur is improved by at least 17% and its phase noise is the lowest. Under a 1.5 V supply voltage, the power dissipation with an output buffer of the PLL is 12 mW.