Efficient design of parity preserving logic in quantum-dot cellular automata targeting enhanced scalability in testing

Design of parity preserving logic based on emerging nanotechnology is very limited due to present technological limitation in tackling its high error rate. In this work, Quantum-dot cellular automata (QCA), a potential alternative to CMOS, is investigated for designing easily testable logic circuit. A novel self-testable logic structure referred to as the testable-QCA (t-QCA), using parity preserving logic, is proposed. Design flexibility of t-QCA then evaluated through synthesis of standard functions. The programmability feature of t-QCA is utilized to implement an ALU, realizing six important functions. Although the parity preservation property of t-QCA enables concurrent detection of permanent as well as the transient faults, an augmented test logic circuit (TC) using QCA primitives has been introduced to cover the cell defects in nanotechnology. Experimental results establish the efficiency of the proposed design that outperforms the existing technologies in terms of design cost and test overhead. The achievement of 100% stuck-at fault coverage and the 100% fault coverage for single missing/additional cell defects in QCA layout of the t-QCA gate, address the reliability issues of QCA nano-circuit design.     

Modular Design of testable reversible ALU by QCA multiplexer with increase in programmability

The quantum-dot cellular automata have emerged as one of the potential computational fabrics for the emerging nanocomputing systems due to their ultra-high speed and integration density. On the other hand, reversible computing promises low power consuming circuits by nullifying the energy dissipation during the computation. This work targets the design of a reversible arithmetic logic unit (RALU) in the quantum-dot cellular automata (QCA) framework. The design is based on the reversible multiplexer (RM) synthesized by compact 2:1 QCA multiplexers introduced in this paper. The proposed reversible multiplexer is able to achieve 100% fault tolerance in the presence of single missing or additional cell defects in QCA layout. Furthermore, the advantage of modular design of reversible multiplexer is shown by its application in synthesizing the RALU with separate reversible arithmetic unit (RAU) and reversible logic unit (RLU). The RALU circuit can be tested for classical unidirectional stuck-at faults using the constant variable used in this design. The experimentation establishes that the proposed RALU outperforms the conventional reversible ALU in terms of programming flexibility and testability.     

Improving Line-Based QCA Memory Cell Design Through Dual Phase Clocking

This paper describes a line-based, quantum-dot cellular automata (QCA) memory cell design that is synchronized by a dual-phase clocking scheme. In line-based QCA memory cells, data bits are stored oscillating along QCA lines. The best known line-based memory cell implementation requires three new clocking zones in addition to the four clocking zones defined by the conventional QCA clocking scheme and utilizes three parallel clocking zones per cell. The proposed memory cell requires only two new clocking zones and utilizes two parallel clock zones per memory cell; permitting less CMOS circuity for clock design and denser QCA system implementations. Furthermore, read throughput is improved to one operation per clock cycle (from one read per two clock cycles). Simulations with the $hbox{tt QCADesigner}$ simulator are performed to verify the functionality of the proposed QCA memory cell.      

Design and evaluation of an ultra-area-efficient fault-tolerant QCA full adder

Quantum-dot cellular automata (QCA) has been studied extensively as a promising switching technology at nanoscale level. Despite several potential advantages of QCA-based designs over conventional CMOS logic, some deposition defects are probable to occur in QCA-based systems which have necessitated fault-tolerant structures. Whereas binary adders are among the most frequently-used components in digital systems, this work targets designing a highly-optimized robust full adder in a QCA framework. Results demonstrate the superiority of the proposed full adder in terms of latency, complexity and area with respect to previous full adder designs. Further, the functionality and the defect tolerance of the proposed full adder in the presence of QCA deposition faults are studied. The functionality and correctness of our design is confirmed using high-level synthesis, which is followed by delineating its normal and faulty behavior using a Probabilistic Transfer Matrix (PTM) method. The related waveforms which verify the robustness of the proposed designs are discussed via generation using the QCADesigner simulation tool.     

Single-bit digital comparator circuit design using quantum-dot cellular automata nanotechnology

The large amount of secondary effects in complementary metal–oxide–semiconductor technology limits its application in the ultra-nanoscale region. Circuit designers explore a new technology for the ultra-nanoscale region, which is the quantum-dot cellular automata (QCA). Low-energy dissipation, high speed, and area efficiency are the key features of the QCA technology. This research proposes a novel, low-complexity, QCA-based one-bit digital comparator circuit for the ultra-nanoscale region. The performance of the proposed comparator circuit is presented in detail in this paper and compared with that of existing designs. The proposed QCA structure for the comparator circuit only consists of 19 QCA cells with two clock phases. QCA Designer-E and QCA Pro tools are applied to estimate the total energy dissipation. The proposed comparator saves 24.00% QCA cells, 25.00% cell area, 37.50% layout cost, and 78.11% energy dissipation compared with the best reported similar design.     

Design and comparison of new fault-tolerant majority gate based on quantum-dot cellular automata

Quantum-dot cellular automata (QCA) is increasingly valued by researchers because of its nanoscale size and very low power consumption.However,in the manufacture of nanoscale devices prone to various forms of defects,which will affect the subsequent circuits design.Therefore,fault-tolerant QCA architectures have become a new research direction.The purpose of this paper is to build a novel fault-tolerant three-input majority gate based on normal cells.Compared with the previous structures,the majority gate shows high fault tolerance under single-cell and double-cell omission defects.In order to examine the functionality of the proposed structure,some physical proofs under single cell missing defects are provided.Besides,two new fault-tolerant decoders are constructed based on the proposed majority gate.In order to fully demonstrate the performance of the proposed decoder,the previous decoders were thoroughly compared in terms of fault tolerance,area and delay.The result shows that the proposed design has a good fault tolerance characteristic,while the performance in other aspects is also quite good.     

Design metal-dot based QCA circuits using SPICE model

This paper proposes a SPICE model development methodology for quantum-dot cellular automata (QCA) cells and presents a SPICE model for QCA cells. The model is validated by simulating the basic logic gates such as inverter and majority voter. The proposed model makes it possible to design and simulate QCA combinational circuits and hybrid circuits of QCA and other NANO devices using SPICE. In the second half part of the paper, SET and QCA co-design methodology is proposed and SET is used as a readout interface of the QCA cell array. The SET and QCA hybrid circuit is a promising nano-scale solution.     

Analysis of missing and additional cell defects in sequential quantum-dot cellular automata

The defect characterization of sequential devices and circuits, implemented by molecular quantum-dot cellular automata (QCA), is analyzed in this paper. A RS-type flip–flop is first introduced; this flip–flop takes into account the timing issues associated with the adiabatic switching of this technology and its requirements. It is then shown that a D-type flip–flop can be constructed with an embedded QCA wire which extends over multiple clocking zones. The logic-level characterization of both flip–flop devices is provided. A single additional and missing cell defect model is assumed for molecular implementation. For sequential circuits, defect characterization is pursued. It is shown that defects affect the functionality of basic QCA devices, resulting mostly in unwanted inversion and majority voter acting as a wire at logic level. In this paper, it is shown that a device-level characterization of the defects and faults can be consistently extended to a circuit-level analysis.     

On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire

Among emerging technologies, Quantum-dot Cellular Automata (QCA) relies on innovative computational paradigms. For nano-scale implementation, the so-called processing-by-wire (PBW) paradigm in QCA is very effective as processing takes place, while signal communication is accomplished. This paper analyzes the defect tolerance properties of PBW for manufacturing tiles by molecular QCA cells. Based on a 3?×?3 grid and various input/output arrangements in QCA cells, different tiles are analyzed and simulated using a coherence vector engine. The functional characterization and polarization level of these tiles for undeposited cell defects are reported and detailed profiles are provided. It is shown that novel features of PBW are possible due to the spatial redundancy of the cells in the tiles that permits to retain at high probability the fault free function in the presence of defects. Moreover, it is shown that QCA tiles are robust and inherently tolerant to cell defects (by logic equivalence, also additional cell defects can be accommodated).     

基于量子元胞自动机的PLA故障分析和检测

量子元胞自动机(quantum-dot cellular automata,QCA)可编程逻辑阵列(programma-ble logic array,PLA)结构可用于实现大规模可编程逻辑电路。分析了4种故障类型发生在PLA单元的8个区域中的影响,得出了具体的影响效果。其中,直接或间接致使隐含线和与门发生逻辑错误的故障均会导致PLA中故障所在行整行失效,其他故障只会影响故障所在的PLA单元的逻辑功能和配置,而对PLA中的其他单元没有影响。此外,基于故障分析,提出了具体的PLA故障检测方法。     

Design of testable reversible latches by using a novel efficient implementation of Fredkin gate

ABSTRACT

Energy dissipation caused by information loss in irreversible computations will be an important limitation for the development of nano-scale circuits in the near future. Reductions in energy dissipation comprise one of the important goals of nanotechnology-based methods, including Quantum dot Cellular Automata (QCA), and so it is desirable to consider reversibility in the design of QCA circuits. In this research, a novel reversible Fredkin gate based on QCA is proposed, which is more efficient and less complex than the conventional Fredkin gate. Conservative reversible logic is parity preserving; hence, any permanent or transient fault can be caused a mismatch between the inputs and the outputs and can be concurrently detected if a reversible circuit is implemented with the conservative Fredkin gate. A single missing/additional cell defect is investigated in the proposed Fredkin gate and fault patterns are presented. To demonstrate the efficiency of the proposed design, some testable reversible sequential elements, such as D-latch, JK-latch, T-latch and SR-latch, are designed by using it. Our proposed concurrent testable designs greatly reduce the occupied area and maximise the circuit density in comparison with previously reported designs. The proposed designs are simulated and verified using QCA Designer ver.2.0.3 and HDLQ.     

A new quantum-dot cellular automata full-adder

A novel expandable five-input majority gate for quantum-dot cellular automata and a new full-adder cell are presented. Quantum-dot cellular automata (QCA) is an emerging technology and a possible alternative for semiconductor transistor based technologies. A novel QCA majority-logic gate is proposed. This component is suitable for designing QCA circuits. The gate is simple in structure and powerful in terms of implementing digital functions. By applying these kinds of gates, the hardware requirement for a QCA design can be reduced and circuits can be simpler in level, gate counts and clock phases. In order to verify the functionality of the proposed device, some physical proofs are provided. The proper functionality of the FA is checked by means of computer simulations using QCADesigner tool. Both simulation results and physical relations confirm our claims and its usefulness in designing every digital circuit.     

QCA电路的缺陷研究

针对量子元胞自动机电路中出现的元胞移位等元胞缺陷,介绍了基于QCADesigner的元胞缺陷分析,得出了特定结构的容错范围。对于制造过程出现的单电子故障,分析了不同输入时单电子故障对传输线和反相器的影响。对于制造过程中出现的漂移电荷缺陷,分析了这些缺陷对传输线的影响。通过改变元胞与传输线之间的距离,研究了QCA传输线之间的串扰问题,得出了其容错范围。最后对RS触发器中出现的元胞缺陷采用测试序列进行了分析研究,从而为进一步研究QCA电路的缺陷提供了依据和方向。     

量子元胞自动机器件和电路的研究进展

量子元胞自动机(QCA)是一种新颖的纳米技术,该技术不再通过电流或电压而是基于场相互作用进行信息的计算和传递。首先,综述了两种量子元胞自动机(EQCA和MQCA)器件的计算原理、基本逻辑门和时钟。指出了QCA元胞构成的不同线结构可在相同层交叉传递信号而不受影响。然后,进一步总结了制备QCA器件和功能阵列或电路的实验方法和材料,得出MQCA器件和分子EQCA器件的发展将使该器件逐步达到实际应用水平的结论。详细讨论了目前QCA器件和电路(尤其是存储单元结构)研究取得的重要进展以及面临的问题。提出了QCA器件未来理论和应用研究中的开放课题和方向。     

Design and Optimization of Full Comparator Based on Quantum‐Dot Cellular Automata

Quantum‐dot cellular automata (QCA) is one of the few alternative computing platforms that has the potential to be a promising technology because of higher speed, smaller size, and lower power consumption in comparison with CMOS technology. This letter proposes an optimized full comparator for implementation in QCA. The proposed design is compared with previous works in terms of complexity, area, and delay. In comparison with the best previous full comparator, our design has 64% and 85% improvement in cell count and area, respectively. Also, it is implemented with only one clock cycle. The obtained results show that our full comparator is more efficient in terms of cell count, complexity, area, and delay compared to the previous designs. Therefore, this structure can be simply used in designing QCA‐based circuits.     

Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates

Reversible logic design is a well-known paradigm in digital computation. In this paper, quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic in array systems. Testability of 1D arrays consisting of reversible QCA gates is investigated for multiple faulty modules. It has been shown that fault masking is possible in the presence of multiple faults without additional lines for controllability and observability. A technique for achieving C-testability of a 1D array is introduced by adding lines for observability. By adding lines for controllability, as well as observability, the array may be fully tested with a smaller number of test patterns. Different cases of arrays made of QCA reversible gates are presented to illustrate the applicability of the proposed testing method.

Single-Bit Comparator in Quantum-Dot Cellular Automata (QCA) Technology Using Novel QCA-XNOR Gates

To fill the continuous needs for faster processing elements with less power consumption causes large pressure on the complementary metal oxide semiconductor (CMOS) technology developers. The scaling scenario is not an option nowadays and other technologies need to be investigated. The quantum-dot cellular automata (QCA) technology is one of the important emerging nanotechnologies that have attracted much researchers’ attention in recent years. This technology has many interesting features, such as high speed, low power consumption, and small size. These features make it an appropriate alternative to the CMOS technique. This paper suggests three novel structures of XNOR gates in the QCA technology. The presented structures do not follow the conventional approaches to the logic gates design but depend on the inherent capabilities of the new technology. The proposed structures are used as the main building blocks for a single-bit comparator. The resulted circuits are simulated for the verification purpose and then compared with existing counterparts in the literature. The comparison results are encouraging to append the proposed structures to the library of QCA gates.     

Reversible Gates and Testability of One Dimensional Arrays of Molecular QCA

An extensive literature exists on the mathematical characterization of reversible logic. However, the possible technological basis of this computing paradigm still remains unsolved. In this paper, quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (referred to as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. Due to the expected high error rates in nano-scale manufacturing, testing of nano devices, including QCA, has received considerable attention. The focus of this paper is on the testability of a one-dimensional array made of QCA reversible gates, because the bijective nature of reversible gates significantly facilitates testing of arrays. The investigation of testability relies on a fault model for molecular QCA that is based on a single missing/additional cell assumption. It is shown that C-testability of a 1D reversible QCA gate array can be guaranteed for single fault. Theory and circuit examples show that error masking can occur when multiple faults are considered.     

Adder design using 5-input majority gate in a novel “Multilayer Gate Design Paradigm” for Quantum Dot Cellular Automata Circuits

This paper proposes a novel design paradigm for circuits designed in quantum dot cellular automata (QCA) technology. Previously reported QCA circuits in the literature have generally been designed in a single layer which is the main logical block in which the inverter and majority gate are on the base layer, except for the parts where multilayer wire crossing was used. In this paper the concept of multilayer wire crossing has been extended to design logic gates in multilayers. Using a 5-input majority gate in a multilayer, a 1-bit and 2-bit adder have been designed in the proposed multilayer gate design paradigm. A comparison has been made with some adders reported previously in the literature and it has been shown that circuits designed in the proposed design paradigm are much more efficient in terms of area, the requirement of QCA cells in the design and the input-output delay of the circuit. Over all, the availability of one additional spatial dimension makes the design process much more flexible and there is scope for the customizability of logic gate designs to make the circuit compact.     

基于QCA可编程逻辑阵列单元的元胞缺陷研究

介绍了一种量子元胞自动机(QCA)可编程逻辑阵列结构,该结构可用于实现量子元胞自动机大规模可编程逻辑电路,采用QCADesigner仿真软件研究了元胞缺失、移位缺陷和未对准缺陷对可编程逻辑阵列单元逻辑功能的影响。得出了特定结构下,每个元胞移位缺陷和未对准缺陷的最大错位距离,以及导线模式中存在特定位置的8个可缺失元胞。这为缺陷单元的应用提供了一个具体的参数标准,提高了PLA阵列的单元利用率。