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1.
Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

10.
The influence of grinding geometry and damage depth on the fracture strength of 100 mm diameter (1 1 1) p-type silicon wafers has been studied. The fracture strengths were measured in a biaxial flexure test after the wafers were ground to 0.36 mm from 0.53 mm thick, in a grinding apparatus that produces a swath of swirls on the silicon wafer surfaces. Analysis of orientations of the swirl geometries and fracture probability was used to deduce the fracture strength relative to the crystallographic orientation of the wafers. Optical and scanning electron microscopy of bevelled, and cleaved and etched samples was used to measure the damage depths from selected locations on the wafers. The depth of damage and fracture strengths were correlated to the geometry of the backgrind swirl pattern and the relative position of the orientation flat. The damage depth was smaller when the swirl path was parallel or at 45° to the orientation flat as compared to the swirl paths at 90° and 135° orientations. As a result, the wafers ground in the former orientations had a higher fracture strength than those of the latter orientations (136 and 124 MPa versus 100 and 103 MPa, for the four orientations, respectively). This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

13.
回顾了国内外Zn1-xCdxO合金带隙研究的发展历程,总结和归纳了近10年来关于Zn1-xCdxO合金中Cd原子分数x与Eg(eV)关系的数据及理论等研究成果.在此基础上,以近10年来文献中的试验数据作为分析样本,考虑多种情况对其进行回归拟合,并对不同拟合方法及Cd含量对Eg的影响进行了深入的分析讨论,建立了Cd含量x与Eg的经验关系式(x-Eg关系式).与试验值相比,使用新xEg关系式预测得到的Eg值与其符合得较好,表明所建立的关系式能比较准确地反映Zn1-x CdxO合金中Cd含量x与Eg之间的关系.  相似文献   

14.
Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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Abstracts are not published in this journal This revised version was published online in November 2006 with corrections to the Cover Date.  相似文献   

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