Polymeric semiconducting carbon from fullerene by pulsed laser ablation

The polymeric semiconducting carbon films are grown on silicon and quartz substrates by excimer (XeCl) pulsed laser deposition (PLD) technique using fullerene C₆₀ precursor. The substrate temperature is varied up to 300 °C. The structure and optical properties of the films strongly depend on the substrate temperature. The grain size is increased and uniform polymeric film with improved morphology at higher temperature is observed. The Tauc gap is about 1.35 eV for the film deposited at 100°C and with temperature the gap is decreased upto 1.1 eV for the film deposited at 250 °C and increased to about 1.4 eV for the film deposited at 300 °C. The optical absorption properties are improved with substrate temperature. Raman spectra show the presence of both G peak and D peak and are peaked at about 1590 cm^− 1 and 1360 cm^− 1, respectively for the film deposited at 100 °C. The G peak position remains almost unchanged while D peak has changed only a little with temperature might be due to its better crystalline structure compared to the typical amorphous carbon films and might show interesting in device such as, optoelectronic applications.     

Changes in chemical bonding of diamond-like carbon films by atomic-hydrogen exposure

We have deposited unhydrogenated diamond-like carbon (DLC) films on Si substrate by pulsed laser deposition using KrF excimer laser, and investigated the effects of atomic-hydrogen exposure on the structure and chemical bonding of the DLC films by photoelectron spectroscopy (PES) using synchrotron radiation and Raman spectroscopy. The fraction of sp³ bonds at the film surface, as evaluated from C1s spectra, increased at a substrate temperature of 400 °C by atomic-hydrogen exposure, whereas the sp³ fraction decreased at 700 °C with increasing exposure time. It was found that the sp³ fraction was higher at the surfaces than the subsurfaces of the films exposed to atomic hydrogen at both the temperatures. The Raman spectrum of the film exposed to atomic hydrogen at 400 °C showed that the clustering of sp² carbon atoms progressed inside the film near the surface even at such a low temperature as 400 °C.     

The effects of substrate temperature and laser wavelength on the formation of carbon thin films by pulsed laser deposition

Amorphous carbon films and diamond-like carbon films were grown by pulsed laser deposition (PLD) using different laser wavelengths (λ=193, 532 and 1064 nm) and substrate temperatures (ranging from room temperature to 500 °C). The morphology of the film surface was observed using atomic force microscopy (AFM) and scanning electron microscopy (SEM). The mechanisms of film growth using laser wavelengths of 1064, 532 and 193 nm are explained qualitatively to be surface growth, subsurface growth accompanied with migration of the penetrating species to the film surface, and subsurface growth, respectively, using the subplantation model.     

Preparation of diamond like carbon thin films above room temperature and their properties

Diamond like carbon (DLC) thin films were deposited on p-type silicon (p-Si), quartz and ITO substrates by microwave (MW) surface-wave plasma (SWP) chemical vapor deposition (CVD) at different substrate temperatures (RT ∼ 300 °C). Argon (Ar: 200 sccm) was used as carrier gas while acetylene (C₂H₂: 20 sccm) and nitrogen (N: 5 sccm) were used as plasma source. Analytical methods such as X-ray photoelectron spectroscopy (XPS), FT-IR and UV–visible spectroscopy were employed to investigate the structural and optical properties of the DLC thin films respectively. FT-IR spectra show the structural modification of the DLC thin films with substrate temperatures showing the distinct peak around 3350 cm^− 1 wave number; which may corresponds to the sp² C–H bond. Tauc optical gap and film thickness both decreased with increasing substrate temperature. The peaks of XPS core level C 1 s spectra of the DLC thin films shifted towards lower binding energy with substrate temperature. We also got the small photoconductivity action of the film deposited at 300 °C on ITO substrate.     

Very hard ZrC thin films grown by pulsed laser deposition

Thin ZrC films were grown on (1 0 0) Si substrates at temperatures from 30 to 500 °C by the pulsed laser deposition technique. Auger electron spectroscopy investigations found that films contained oxygen concentration below 2.0 at%, while X-ray photoelectron spectroscopy investigations showed that oxygen is bonded in an oxy-carbide type of compound. The films’ mass densities, estimated from X-ray reflectivity curve simulations, and crystallinity improved with the increase of the substrate temperature. Williamson–Hall plots and residual-stress measurements using the modified sin² ψ method for grazing incidence X-ray diffraction showed that the deposited films are nanostructured, with crystallite sizes from 6 to 20 nm, under high micro-stress and compressive residual stress. Nanoindentation investigations found hardness values above 40 GPa for the ZrC films deposited at substrate temperatures higher than 300 °C. The high density of the deposited films and the nm-size crystallites are the key factors for achieving such high hardness values.     

Properties of DLC films deposited by an oxyacetylene flame

Diamond-like carbon (DLC) films were obtained by spinning a tungsten carbide substrate at a high speed using an oxyacetylene flame. The films deposited at a typical experimental condition of substrate temperature of 810°C, rotation of 600 rpm and 3 h deposition time, exhibited an uniform, very smooth, hard and glassy surface covering the entire exposed face of the substrate. These films were identified as DLC by their characteristic broad Raman spectra centered at 1554 cm⁻¹ and micro-Vicker's hardness >3400 kg mm⁻². For substrate temperatures <800°C the film started losing the uniform glassy surface and the hardness deteriorated. For temperatures >950°C the film was still hard and shiny, but black in color. DLC films were also obtained in a wide range of speeds of rotation (300–750 rpm), as long as the temperature remained close to 850°C.     

Synthesis of diamond at sub 300 °C substrate temperature

Sulfur-assisted hot-filament chemical vapor deposition (HFCVD) was employed to grow nanocrystalline diamond at low substrate temperature, ∼ 300 °C, on molybdenum (Mo), and ∼ 250 °C, on polyimide film. The polyimide films remained flexible and strong after the deposition, clearly indicating that they did not experience temperatures near or above the glass transition temperature at ∼ 360 °C. The relative intensity of the diamond peak in the Raman spectra increases when the substrate temperature is decreased from ∼ 500 to ∼ 300 °C, a result that is inverted with respect to HFCVD without sulfur. This behavior was employed to obtain microcrystalline diamond on Mo at ∼ 270 °C. Profound changes induced to the gas phase chemistry and surface reactions when a trace amount of H₂S is added to the HFCVD process seem to enable these results.     

Microstructure-related piezoelectric properties of a ZnO film grown on a Si substrate

We investigated the effect of grain size on the piezoelectric properties of ZnO using films of different grain sizes and a fixed thickness of 800 nm deposited on a Si substrate by pulsed laser ablation in the temperature range of 300–700 °C. All of the deposited films have a crystal structure with a c-axis orientation. The grain size of the grown films, characterized by transmission electron microscopy (TEM), increases with the deposition temperature. In contrast, their piezoelectric efficiency (PE, d₃₃), characterized by piezoelectric force microscopy (PFM), was found to initially increase with the deposition temperature up to 500 °C, after which it decreased with further increases in temperature. The maximum PE value is observed for the film deposited at 500 °C with a grain size of approximately 60 nm. The peculiar PE behavior observed was theoretically explained by a competition between the contribution of the c-axis orientation favoring a larger d₃₃ value due to the enhanced static asymmetry and the strong grain size effect that influences the piezoelectric polarization as a result of domain motion.     

Electrical and optical properties of diamond-like carbon films deposited by pulsed laser ablation

Pulsed laser ablation of a graphite target was carried out by ArF excimer laser deposition at a laser wavelength of 193 nm and fluences of 10 and 20 J/cm² to produce diamond-like carbon (DLC) films. DLC films were deposited on silicon and quartz substrates under 1 × 10^? 6 Torr pressure at different temperatures from room temperature to 250 °C. The effect of temperature on the electrical and optical properties of the DLC films was studied. Laser Raman Spectroscopy (LRS) showed that the DLC band showed a slight increase to higher frequency with increasing film deposition temperature. Spectroscopic ellipsometry (SE) and ultraviolet–visible absorption spectroscopy showed that the optical band gap of the DLC films was 0.8–2 eV and decreased with increasing substrate temperature. These results were consistent with the electrical resistivity results, which gave values for the films in the range 1.0 × 10⁴–2.8 × 10⁵ Ω cm and which also decreased with deposition temperature. We conclude that at higher substrate deposition temperatures, DLC films show increasing graphitic characteristics yielding lower electrical resistivity and a smaller optical band gap.     

The microstructure and properties of energetically deposited carbon nitride films

The intrinsic stress, film density and nitrogen content of carbon nitride (CN_x) films deposited from a filtered cathodic vacuum arc were determined as a function of substrate bias, substrate temperature and nitrogen process pressure. Contour plots of the measurements show the deposition conditions required to produce the main structural forms of CN_x including N-doped tetrahedral amorphous carbon (ta-C:N) and a variety of nitrogen containing graphitic carbons. The film with maximum nitrogen content (~ 30%) was deposited at room temperature with 1.0 mTorr N₂ pressure and using an intermediate bias of − 400 V. Higher nitrogen pressure, higher bias and/or higher temperature promoted layering with substitutional nitrogen bonded into graphite-like sheets. As the deposition temperature exceeded 500 °C, the nitrogen content diminished regardless of nitrogen pressure, showing the meta-stability of the carbon–nitrogen bonding in the films. Hardness and ductility measurements revealed a diverse range of mechanical properties in the films, varying from hard ta-C:N (~ 50 GPa) to softer and highly ductile CN_x which contained tangled graphite-like sheets. Through-film current–voltage characteristics showed that the conductance of the carbon nitride films increased with nitrogen content and substrate bias, consistent with the transition to more graphite-like films.     

Characterization of Cu(In,Ga)Se2 thin films prepared by RF magnetron sputtering using a single target without selenization

Cu(In_1?xGa_x)Se₂ (CIGS) thin films were prepared using a single quaternary target by RF magnetron sputtering. The effects of deposition parameters on the structural, compositional and electrical properties of the films were examined in order to develop the deposition process without post-deposition selenization. From X-ray diffraction analysis, as the substrate temperature and Ar pressure increased and RF power decreased, the crystallinity of the films improved. The scanning electron microscopy revealed that the grains became uniform and circular shape with columnar structure with increasing the substrate temperature and Ar pressure, and decreasing the RF power. The carrier concentration of CIGS films deposited at the substrate temperature of 500 °C was 2.1 × 10¹⁷ cm^?3 and the resistivity was 27 Ω cm. At the substrate temperature above 500 °C, In and Se contents in CIGS films decreased due to the evaporation and it led to the deterioration of crystallinity. It was confirmed that CIGS thin films deposited at optimal condition had similar atomic ratio to the target value even without post-deposition selenization process.     

Effect of substrate temperature on structural and electrical properties of BaZr0.2Ti0.8O3 lead-free thin films by pulsed laser deposition

Barium zirconate titanate (BaZr_0.2Ti_0.8O₃, BZT) 250 nm thick thin films were fabricated by pulsed laser deposition and the influence of the substrate temperature on their preferred orientation, microstructure, morphology and dielectric properties was investigated. Dielectric measurements indicated the (1 1 0)-oriented BZT thin films deposited at 750 °C to show good dielectric properties with high dielectric constant (~500 at 100 kHz), low loss tangent (<0.01 at 100 kHz), and superior tunability (>70% at 400 kV/cm), while the largest figure of merit was 78.8. The possible microstructural background responsible for the high dielectric constant and tenability is discussed. In addition, thin films deposited at 750 °C with device quality factor of 8738 and dielectric nonlinearity coefficient of 1.66×10⁻¹⁰ J/C⁴m⁵ were demonstrated.     

Temperature effect on bonding structures of amorphous carbon containing more than 30at.% silicon

Bonding evolution of amorphous carbon incorporated with Si or a-C(Si) in a thermal process has not been studied. Unhydrogenated a-C(Si) films were deposited by magnetron sputtering to undergo two different thermal processes: i) sputter deposition at substrate temperatures from 100 to 500 °C; ii) room temperature deposition followed by annealing at 200 to 1000 °C. The hardness of the films deposited at high temperature exhibits a monotonic decrease whereas the films deposited at room temperature maintained their hardness until 600 °C. X-ray photoelectron spectroscopy and Raman spectroscopy were used to analyze the composition and bonding structures. It was established that the change in the mechanical property is closely related to the atomic bonding structures, their relative fractions and the evolution (conversion from C–C sp³ → CC sp² or CC sp² → C–Si sp³) as well as clustering of sp² structures.     

The effects of deposition temperature on structure and dielectric properties of Ba0.6Sr0.4TiO3 thin films produced by pulsed laser deposition

The effects of deposition temperature on orientation, surface morphology and dielectric properties of the thin films for Ba_0.6Sr_0.4TiO₃ thin films deposited on Pt/Ti/SiO₂/Si substrates by pulsed laser deposition were investigated. X-ray diffraction patterns revealed a (2 1 0) preferred orientation for all the films. With rising substrate temperature from 650 °C to 700 °C, the crystallinity and crystal grain size of the films increase, the relative dielectric constant increases, but the dielectric losses have not obvious difference. The film deposited at 350 °C and annealed at 700 °C has strongly improved roughness and dielectric permittivity compared with the film only deposited directly at 700 °C. Three distinct relaxation processes within tan(δ) were found for the Ba_xSr_1?xTiO₃ film: a broadened process of the film relaxation, an intermediate peak which originates from Maxwell–Wagner–Sillars polarization, and an extremely slow process ascribed to leak current. The complex dielectric permittivity and loss can be fitted by an improved Cole–Cole model corresponding to a stretched relaxation function.     

Low temperature deposition of titanium oxide containing thin films in trench features from titanium diisopropoxide bis(dipivaloylmethanate) in supercritical CO2

We studied supercritical carbon dioxide fluid deposition of titanium oxide (TiO₂) in trench features on Si substrates using a flow-type deposition apparatus from titanium diisopropoxide bis(dipivaloylmethanate), aiming at fabricating conformal films at a relatively low temperature. We investigated the deposition rate and step coverage under a fluid temperature from 40 to 60 °C, a pressure from 8.0 to 10.0 MPa, and a substrate temperature from 80 to 120 °C. They were dependent on the fluid density, indicating that the solubility difference between the bulk fluid and the neighborhood of the substrate surface plays a decisive role for the deposition. An excellent conformal filling of the trench features was achieved from the fluid of 60 °C under 8 MPa on the substrate kept at 80–100 °C. The XPS spectra of the deposited film suggested partial formation of TiO₂, and the XRD spectra showed the existence of some crystalline TiO₂ (anatase).     

Preparation and oxidation of composite TiN–AlN films from alkoxide solutions by plasma-enhanced CVD

Composite and compositionally graded (CGed) TiN–AlN films were deposited on Si wafers at 600 °C from Ti- and Al-alkoxide solutions by N₂ plasma-enhanced chemical vapor deposition (CVD). The films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and Vickers micro-hardness. In the composite TiN–AlN films, the Ti and Al contents varied linearly and complementarily with solution composition, the N content ranging from 35 to 40 at.%. In the CGed films, the Al component decreased complementarily with increasing Ti toward the substrate. Cross-sectional SEM observation showed both films to be about 1 μm thick with a columnar structure. Oxidation of the composite and CGed films was performed at 500, 700, and 900 °C in air for 1 h. The improvement of oxidation resistance in both composite and CGed films is discussed on the basis of the XRD and SEM observations, and the XPS analysis of the oxidized films.     

Low temperature and large area deposition of nanocrystalline diamond films with distributed antenna array microwave-plasma reactor

Diamond films grown at low temperature (< 400 °C) on large area of different substrates can open new applications based on the thermal, electrical and mechanical properties of diamond. In this paper, we present a new distributed antenna array PECVD system, with 16 microwave plasma sources arranged in a 2D matrix, which enables the growth of 4-inch nanocrystalline diamond films (NCD) at substrate temperature in the range of 300–500 °C. The effect of substrate temperature, gas pressure and CH₄ concentration in the total gas mixture of H₂/CH₄/CO₂ on the morphology and growth rate of the NCD films is reported. The total gas pressure is found to be a critical deposition parameter for which growth rates and crystalline quality both increasing with decreasing the pressure. Under optimized conditions, the process enables deposition of uniform (~ 10%) and high purity NCD films with very low surface roughness (5–10 nm), grain size of 10 to 20 nm at growth rates close to 40 nm/h. Nanotribology tests result in the friction coefficient of the NCD films close to that obtained for the standard tetrahedral amorphous carbon coatings (ta-C) indicating the suitability of this low-temperature diamond coating for mechanical applications such as bearing or micro-tools.     

A novel CO and C3H8 sensor made of CuSb2O6 nanoparticles

Trirutile-type CuSb₂O₆ nanoparticles were synthesized by a simple and economical route, starting from copper nitrate, antimony chloride, ethylenediamine, and ethyl alcohol as solvent. The latter was evaporated by microwave radiation at 140 W. The precursor material was calcined at 200, 300, 400, 500, and 600 °C, and analyzed by powder XRD. The oxide phase was obtained at the last calcination step (600 °C), whose powders were analyzed by field-emission scanning electron (FE-SEM) and transmission electron (TEM) microscopies. Microrods, hexagonal microplates, and nanoparticles with an average size of ~ 51.2 nm were observed. A forbidden bandwidth of 3.41 eV was detected for the direct transition with UV–vis. Tests were carried out on pellets made of the powders in carbon monoxide (CO) and propane (C₃H₈) atmospheres at different concentrations and operating temperatures, obtaining high response at 300 ppm of CO and 500 ppm of C₃H₈, both at 300 °C.     

Magnetotransport properties of undoped amorphous carbon films

Anomalous positive magnetoresistance (MR) up to 36% was observed at 2 K and 12 T in the undoped amorphous carbon (a-C) film deposited on glass substrate by pulsed laser deposition at 500 °C. There is no tendency of saturation of MR with increase of the magnetic field. The MR decreases as the measurement temperature increases from 2 to 80 K, and could hardly be observed above 80 K. As the deposition temperature grows from 300 to 600 °C, the disorder degree of the a-C film decreases, and the value of MR also decreases, indicating that the lower disorder degree results in a smaller MR. The mechanism of this MR could be ascribed to the wave function shrinkage. It could help to understand the MR phenomenon in amorphous material systems.     

Pulsed laser deposition BTS thin films: The role of substrate temperature

BaSn_0.15Ti_0.85O₃ (BTS) thin films were deposited on Pt/Ti/SiO₂/Si(1 0 0) substrate by pulsed laser deposition and the effects of substrate temperature on their structure, dielectric properties and leakage current density were investigated. The results indicate that the substrate temperature has a significant effect on the structural and dielectric properties of the BTS thin films which exhibit a polycrystalline perovskite structure if the substrate temperature ranges within 550–750 °C. The dielectric constant and loss tangent of the BTS thin films deposited at 650 °C are 341 and 0.009 at 1 MHz, respectively, the tunability is 72.1% at a dc bias field of 400 kV/cm, while the largest figure of merit (FOM) is 81.1. The effect of the substrate temperature on the leakage current of the BTS thin films is discussed.