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1.
[1]D.J.Chronister, S.W.Scott and D.R.Stickle: JOM.,1986, 38(9), 51. [2]J.W.Sears: JOM., 1990, 42(3), 17. [3]H.B.Bomberger and F.H.Froes: JOM., 1984, 36(12),39. [4]B.C.Weber, W.M.Thompson and H.O.Bielstein: J. Am. Cer. Soc., 1957, 40(11), 363. [5]G.H.Chippereit: JOM., 1961, 13(2), 140.  相似文献   

2.
标准号标准名称采标程度施日期B68IB68IB68lB68lY50lB691B68W04JW04儿1儿1 Jll JllG25H62D20E3bG21Q61G63G63 J80H62 J33 J04儿5 J31H58G63G32M30H21H21H21 H26 G23 G12G54 G50 H71 H71GB 142—1995GB/T 143.1-1995GB/T 143.2—1995GB/T 144—1995GB/T 149—1995GB/T 153—1995GB/T 155—1995GB 250—1995GB 251—1995GB/T 299—1995GB/T 300—1 995GB/T 301—1995GB/T 307.2-1995GB 434—1995GB/T 469—1995GB 482—1995GB/T 503—1995GB 535-1995GB/T539—1995GB/T 667—1995 GB/T 694—1 995GB/…  相似文献   

3.
GeneralAdministrationofQualitySupervisionInspectionandQuarantineandStandardizationAdministrationofChinaapprovedthefollowing83nationalstandardsand33referencematerialsandpublicizenow.NOStandardNumberTitleReplacedStandardUpdateDateExecuteDate1GB/T230.1-2004MetallicRockwellhardnesstest-Part1:Testmethod(scalesA、B、C、D、E、F、G、H、K、N、T)GB/T230-1991GB/T1818-19942004-05-092004-10-012GB/T1593.4-2004Agriculturalwheeledtractors-RearmountedThree-pointlinkage-Part4:category0GB/T15…  相似文献   

4.
目的:测定正大青春宝药业有限公司(A)、德国拜耳公司(B)、天津市中央制药厂(C)、丽珠集团丽珠制药厂(D),上海信谊药厂(E),广东省制药工业公司华南制药厂(F)、上海世康特制药有限公司(G)、海南省普利制药厂(H)生产尼莫地平片/胶囊溶出度。方法:按部颁标准【WSI-(X—100)-2005Z】(以15%乙醇为溶出介质)测定尼莫地平溶出度。结果:各药厂产品的体外溶出百分率与时间关系均符合威布尔分布函数方程,其中A、B、C、D4厂家生产尼莫地平片溶出均符合部颁标准规定的溶出限度。将国内7个厂家的产品与德国拜耳公司生产的尼莫通片体外溶出参数分别进行t检验分析:C、D,E3厂与B厂产品的T50-Td之间无显著性差异(P〉0.05)。A、F、G、H4厂与B厂产品的T50、Td有极显著性差异(P〈0.01),其中A厂产品释药明显较B厂快,而F、G、H3厂产品的释药明显比B厂慢。结论:正大青春宝药业有限公司的尼莫地平片体外溶出度已达到国内先进水平。  相似文献   

5.
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6.
[1]T.S.Shelvin: J. Amer. Ceram. Soc., 1957, 37, 140. [2]D.T.Rankin. J.J.Stiglich, D.R.Petrak and R.Ruh: J.Amer. Ceram. Soc., 1971, 54, 277. [3]M.Nawa, T.Sekino and K.Niihara: J. Mater. Sci.,1994, 29, 3185. [4]M.S.Newkirk, A.W.Urquhart and H.R.Zwicker: J.Mater. Res., 1986, 1, 81. [5]Y.Naerheimx: Powder Metall. Inter., 1986, 18, 158. [6]W.H.Tuan and R.J.Brook: J. Eur. Ceram. Soc., 1990,6, 31. [7]W.H.Tuan and R.J.Brook: J. Eur. Ceram. Soc., 1992,10, 95. [8]X.Sun and J.A.Yeomans: J. Mater. Sci., 1996, 31,875. [9]J.Wang, C.B.Ponton and P.M.Marquis: Br. Ceram.Trans., 1993, 92, 67. [10]W.B.Chou and W.H.Tuan: J. Eur. Ceram. Soc., 1995,15, 291. [11]A.Trusty and J.A.Yeomans: J. Eur. Ceram. Soc.,1997, 17, 495. [12]M.M.EI-Sayed Seleman, F.Zhang, X.Sun and L.Zuo:in Proc. of the ICCE/7, ed. D.Hui, Denver, Colorado,2000, 783. [13]B.Budiansky, J.C.Amazigo and A.G.Evans: J. Mech.Phys. Solids, 1988, 36, 167. [14]P.A.Mataga: Acta Metall., 1989, 37, 3349. [15]M.F.Ashby, F.G.Blunt and M.Bannister: Acta Metall., 1989, 37, 1847. [16]P. Hing and G.W.Grove: J. Mater. Sci., 1972, 7, 427. [17]L.S.Sigl and H.F.Fishmeister: Acta Metall., 1988, 36,887. [18]L.S.Xiao, Y.S.Kim, R.Abbaschian and R.J.Hecht:Mater. Sci Eng., 1991, 144A, 277. [19]A.K.Khaund, V.D.Krstic and P.S.Nicholson: J. Mater.Sci., 1977, 12, 2269. [20]V.V.Krstic, P.S.Nicholson and R.G.Hoagland: J.Amer. Ceram. Soc., 1981, 64, 499. [21]S.Buljian, S.Pasto and H.J.Kim: J. Amer. Ceram.Soc., 1989, 68, 378. [22]K.T.Faber and A.G.Evans: Acta Metall., 1983, 31,565. [23]K.T.Faber and A.G.Evans: Acta Metall., 1983, 31,577. [24]P.Chantikul, G.R. Anstis, B.R.Lawn and D.B.Marshall: J. Amer. Ceram. Soc., 1981, 64,539. [25]E.A.Brandes: Smithells Metals Reference Book, 6th Ed., London, 1983. [26]R.Kolhe, C.Y.Hui, E.Ustundag and S.L.Sass: Acta Mater., 1996, 44, 279. [27]T.Sekino, T.Nakajima, S.Ueda and K.Niihara: J.Amer. Ceram. Soc., 1997, 80, 1139. [28]M.Bannister and M.F.Ashby: Acta Metall., 1991, 39,2575. [29]B.D.Flinn, M.Ruhle and A.G.Evans: Acta Metall.,1989, 37, 3001. [30]D.S.Clark and W.R.Varney: Physical Metallurgy for Engineers, D. Van Nostrand Company, Inc. Press, NewJersey, 1957, 58. [31]X.Sun: Ph.D. Thesis, University of Surrey, UK, 1993. [32]X.Sun and J.A.Yeomans: J. Amer. Ceram. Soc., 1996,79, 562. [33]R.Morrel; Handbook of Properties of Technical and Engineering Ceramics, part 1, London, 1985, 95.  相似文献   

7.
[1]S.P.Murarka: Mater. Sci. Eng., 1987, R19, 87. [2]J.S.Kwak, H.K.Baik, J.H.Kim and S.M.Lee: J. Appl.Phys., 1999, 85, 6898. [3]M.Kaneko, K.Aratai and M.Ohta: Jpn. J. Appl.Phys., 1992, 31, 568. [4]MB.Stearns, C.H.Chang and D.G.Stearns: J. Appl.Phys., 1992, 71, 187. [5]N.Kaiser: Proc. SPIE, 1994, 2253, 722. [6]M.L.Wu, W.D.Qian, Y.W.Chung, Y.Y.Wang,M.S.Wong and W.D.Sproul; Thin Solid Films, 1997,308, 113. [7]M.Kardar, G.Parisi and Z.C.Yhang: Phys. Rev. B,1986, 36, 889. [8]A.Vandar, Drift: Philips Res. Rep., 1967, 22, 267. [9]G.S.Bales and A.Zangwill; J. Vac. Sci. Technol., 1991,A9, 145. [10]Hitoshi Dohnomae: Jpn. J. Appl. Phys., 1994, 33,1499. [11]C.Kim, S.B.Qadri, S.R.Scanlon, M.R.Scanlon and R.C.Cammarata: Thin Solid Film, 1994, 240, 52. [12]T.B.Massalski, H.Okamoto, P.R.Subramanian and L.Kacprzak: Binary Alloy Phase Diagrams, 2nd ed.ASM International, Materials Park, Ohio, 1990, 2,1785. [13]R.Miedema, P.F.de Chatel and F.R.de Boer: Physica 100B, 1980, 1. [14]R.W.Bene: J. Appl. Phys., 1987, 61, 1826. [15]M.C.Inman and H.R.Tipler: Metall. Rev., 1963, 8,105. [16]F.Spaepen: Acta Metall., 1975, 23, 729.  相似文献   

8.
[1]J.A.Warren and J.S.Langer: Phys Rev. A, 1990, 42,3518. [2]J.D.Hunt and S.Z.Lu: Metall. Mater. Trans. A.,1996, 27, 611. [3]J.D.Hunt and S.Z.Lu: Mater. Sci. Eng. A., 1993,173, 79. [4]W.D.Huang, X.G.Geng and Y.H.Zhou: J. Crys. Growth., 1993, 134, 105. [5]W.Kurz, B.Gioranola and R.Trivedi: Acta Metell.,1986, 34, 823. [6]M.Gremaud, M.Carrard and W.Kurz: Acta Metall.,1989, 37, 3305. [7]A.Schievenbusch, G.Zimmermann and X.L.Lu: Z. Metallkd., 1995, 86, 614.  相似文献   

9.
1 构成如图 1所示 ,通用计数器芯片 5 G72 1 6 B构成一频率计电路。测量范围为 1 0~ 5 0 0 Hz,测量不确定度为 0 .1 %。1 )工作电源电压选用 5 V;图  1   2 )直接选用 1 0 MHz晶体构成稳定时钟振荡 ;3)管脚 3~ 6位输出直接驱动 L C5 0 1 2 -1 1显示器的位 (D) ;4)管脚 1 5~ 1 7、1 9~ 2 3、输出直接驱动L C5 0 1 2 -1 1显示器的段 ;5 )频率计数选用闸门时间为 1 0 s;6 )管脚 1、2 7之间的联接完成保持功能 ;7)管脚 1 2为“复位”控制输入端 ;8) 5 G72 1 6 B设有外小数点选控功能 ,因此用位输出驱动显示器 ,用晶体管的集电极驱…  相似文献   

10.
《计测技术》2004,(6):i004-i005
1.规程部分现行规程号规 程 名 称被 替 代 规 程 号定价JJG2 2 - 2 0 0 3内径千分尺检定规程 JJG2 2 - 199115 .0 0JJG2 4 - 2 0 0 3深度千分尺检定规程 JJG2 4 - 1986 14 .0 0JJG5 1- 2 0 0 3带平衡液柱活塞式压力真空计检定规程 JJG5 1- 198315 .0 0JJG6 7- 2 0 0 3工作用全辐射温度计检定规程 JJG6 7- 1985 16 .0 0JJG10 0 - 2 0 0 3全站型电子速测仪 JJG10 0 - 1994 2 0 .0 0JJG111- 2 0 0 3玻璃体温计检定规程 JJG111- 198915 .0 0JJG112 - 2 0 0 3金属洛氏硬度计 (A,B,C,D,E,F,G,H,K,N,T标尺 )检定规程…  相似文献   

11.
R ecently,the inaugural m eeting of the C hina N ational M etrological M easuring Experts C onsulting C om m itteew as held in B eijing.The C om m ittee is attached to the C hina M etrological M easuring Institute,and consists of7academ icians andm etrologicalm easuring experts and professors.W ang Q inping,V ice D irectorofA Q SIQ(the G eneralA dm inistrationofQ uality Supervision,Inspection and Q uarantine ofthe People’s R epublic ofC hina)is appointed D irectorC om m is-sioner.…  相似文献   

12.
[1]W.S.Lan and S.J.Fonash: J. Elec. Mat., 1987, 141,16. [2]Abhai Mansingh and C.V.R.Vasant Kumar: Thin Solid Films, 1988, 167, Lll. [3]T.Karasawa and Y.Miyata: Thin Solid Films, 1993,223, 135. [4]Bi-Shiou Chiou and Shu-Ta Hsieh: Thin Solid Films,1993, 229, 146. [5]A.Mukhejee: Vacuum, 1989, 39(6), 537. [6]T.L.Yang, D.H.Zhang, J.Ma, Y.Chen and H.L.Ma:Thin Solid Films, 1998, 326, 60. [7]B.Cullity: Elements of X-ray Diffraction, AddisonWesley, London, 1959, 99. [8]D.H.Zhang and D.E.Brodie: Thin Solid Films, 1992,213, 109. [9]H.L.Ma, D.H.Zhang, P. Ma, S.Z.Win and S.Y.Li: Thin Solid Films, 1995, 263, 105. [10]H.L.Ma, D.H.Zhang, S.Z.Win, S.Y.Li and Y.P.Chen:Solar Energy Materials and Solar Cells, 1996, 40, 371. [11]D.H.Zhang and H.L.Ma: Appl. Phys. A, 1996, 62,487.  相似文献   

13.
原标准 GB1 591 - 1 988《低合金结构钢》标准中牌号表示方法是按 GB2 2 1 - 1 979标准规定 ,采用阿拉伯数字和元素符号相结合来表示的。如常用钢1 6Mn,其中 1 6为平均含碳量的质量分数为万分之十六 (即 0 .1 6% ) ,Mn含量低于 1 .5%后面不加标注。不等效采用国际标准 ISO4 950和 ISO4 951修订的 GB/T1 591 - 1 994《低合金高强度结构钢》标准 ,其牌号表示方法类同碳素结构钢牌号表示方法 ,共有五种牌号 ,如 Q34 5等。质量等级为 A,B,C,D和 E五级 ,P和 S含量分别由 A级的≤ 0 .0 4 5%过渡到≤ 0 .0 2 5%。其中 E级钢要作 - 4 0°…  相似文献   

14.
商情快报     
《照相机》2004,(7)
锐意相机( 1 9 9 3 ~2 0 0 4 年)各式专业摄材 敬请来电垂询佳能 价格(元) 7 7 m m 镜头盖 90 ET78 Ⅱ 347 100-300/4.5-5.6U 2077 S1 IS 38171 V 10989 ET83 Ⅱ 347 100-400L IS 防震 11940 PRO 1 78171VHS 13097 B M - E 2 3…  相似文献   

15.
[1]J.J.Wang, M.F.Lu, D.Q.Zou and S.Liu: IEEE-CPMT(B), 1998, 21, 79. [2]Y.H.Pao, E.Jih and V.Siddapureddy: J. of Electronic Packaging, 1996, 118, 235. [3]H.U.Akay, N.H.Paydar and A.Bilgic: J. of Electronic Packaging, 1997, 119, 228. [4]D.J.Xie, Y.C.Chan and J.K.Lai: IEEE-CPMT(B),1996, 19, 669.  相似文献   

16.
2005N o.7(totalN o.81)G eneral A dm inistration of Q uality Supervision,Inspection and Q uarantine of P.R.C hina and StandardizationA dm inistration ofC hina have approved the follow ing108nationalstandards and publicize now.2005-06-30N o Standard N um ber Title Replaced Standard Issue D ate Imt ipolnemD eanteta-1G B/T718-2005Foundry pig iron G B/T718-19822005-05-132005-10-012G B/T1412-2005Pig iron used forspheroidalgraphite castiron G B/T1412-19852005-05-132005-10-013G B/T1569-…  相似文献   

17.
[1]H.G.Fan, S.J.Na and Y.W.Shi: J. Phys. D: Appl. Phys., 1997, 30, 94. [2]Y.P.Lei and Y.W.Shi: Numerical Heat Transfer B,1994, 26, 455. [3]R.T.C.Choo, J.Szekely and R.C.Westhoff: Metall. Trans. B, 1992, 23B, 357.  相似文献   

18.
一、概况中国大酒店座落在广州市,位于越秀公园西侧,中国出口商品交易会附近,是一座综合性的现代化豪华酒店。总建筑面积为16万8千平方米;总层数为地上18层,地下1层;总高度为62米。整座建筑分为A、B、C、D、E、F、G、H、J等九个单元(图1),其中A、B、E、F、G、H座是高级酒店,C座是出租商业大厦,D座和J座是高级公寓;J座的6层以下为汽车库,可停400辆汽车。酒店楼的A、B、F、H座的四层以上为客房,客房总间数为1200间,包括豪  相似文献   

19.
品 牌型 号主要性能指标参考价格 (元 )佳 能EOS -1DS 3 5 8× 2 3 8mm  111万像素 660 0 0~ 680 0 0佳 能EOS -1D 2 8 7× 19 1mm  415万像素 45 0 0 0~ 470 0 0佳 能EOS -10D 63 0万像素 ,CF存储卡 14 0 0 0~ 160 0 0佳 能EOSkissD 63 0万像素 ,CF存储卡 85 0 0~ 92 0 0佳 能EOS -3 0 0D 63 0万像素 ,CF存储卡 85 0 0~ 92 0 0尼 康D1X 5 47万像素 3 5 0 0 0~ 3 80 0 0尼 康D1H 2 74万像素 ,CF存储卡 2 80 0 0~ 3 0 0 0 0尼 康D10 0 617万像素 ,CF存储卡 14 0 0 0~ 165 0 0尼 康D12 3 7× 15 6mm…  相似文献   

20.
2005N o.8(totalN o.82)G eneral A dm inistration of Q uality Supervision,Inspection and Q uarantine of P.R.C hina and StandardizationA dm inistration ofC hina have approved the follow ing106nationalstandards and publicize now.2005-08-03N o Standard N um ber Title Replaced Standard Issue D ate Imt ipolne mD eanteta-1G B/T321-2005Preferred num bers-Seriesofpreferred num bers G B/T321-19802005-05-162005-12-012G B/T514-2005pSeptercoilfeiucmat iopnro dfuorct sli quid-in-glass therm om e…  相似文献   

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