Ion induced high energy electron emission from copper

We present measurements of secondary electron emission from Cu induced by low energy bombardment (1-5 keV) of noble gas (He⁺, Ne⁺ and Ar⁺) and Li⁺ ions. We identify different potential and kinetic mechanisms and find the presence of high energetic secondary electrons for a couple of ion-target combinations. In order to understand the presence of these fast electrons we need to consider the Fermi shuttle mechanism and the different ion neutralization efficiencies.     

Electron emission from tungsten induced by slow, fusion-relevant ions

Tungsten has recently been introduced as a new wall material for fusion, because it exhibits favourably low sputtering yields and a very low tritium retention as compared to the commonly used graphite wall and divertor tiles. We measure total electron emission yields due to impact of slow singly and multiply charged ions (deuterium, helium and carbon) on sputter-cleaned polycrystalline tungsten surfaces by using a current method in combination with a retarding grid. Results are presented in the eV to keV impact energy region as typical for fusion edge plasma conditions and discussed in terms of potential and kinetic electron emission.     

Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

The total secondary electron emission yields, γ_T, induced by impact of the fast ions Ne^q+ (q = 2-8) and Ar^q+ (q = 3-12) on Si and Ne^q+ (q = 2-8) on W targets have been measured. It was observed that for a given impact energy, γ_T increases with the charge of projectile ion. By plotting γ_T as a function of the total potential energy of the respective ion, true kinetic and potential electron yields have been obtained. Potential electron yield was proportional to the total potential energy of the projectile ion. However, decrease in potential electron yield with increasing kinetic energy of Ne^q+ impact on Si and W was observed. This decrease in potential electron yield with kinetic energy of the ion was more pronounced for the projectile ions having higher charge states. Moreover, kinetic electron yield to energy-loss ratio for various ion-target combinations was calculated and results were in good agreement with semi-empirical model for kinetic electron emission.     

Measurement of K-L radiative vacancy transfer probabilities in selected rare earth elements bombarded with 3-4 MeV protons

K-shell X-ray intensity ratios for selected rare earth elements were measured following irradiation with proton beams having energies between 3 and 4 MeV. Using the X-ray intensity ratios, the radiative vacancy transfer probabilities from the shell K to the L sub-shells were determined. The experimental data were compared to theoretical predictions for X-ray line intensities and radiative vacancy transfer probabilities. The results showed a good agreement between theory and experiment.     

AODO: Secondary ion emission and surface modification

In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe¹⁴⁺ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL).     

Sputtering induced by cluster impact on metal targets: Influenceof electronic stopping

The effect of electronic stopping on the sputtering of metals by cluster impact is discussed. We focus on the specific case of Au₁₃ impact on a Au surface. Using molecular-dynamics simulation, we study several strategies to include electronic stopping. Electronic stopping influences both the magnitude of the sputter yield and the duration of the sputter process. In the usual procedure, electronic stopping only affects sufficiently fast atoms with kinetic energies above a threshold energy, which is of the order of the target cohesive energy. When assuming that electronic stopping holds down to thermal energies <1 eV, or even to 0 eV, the collision spike is rapidly quenched and the sputter yields become unrealistically small. Furthermore, we implement a scheme to include electronic stopping based on local (electron) density information readily available in a simulation.     

Comparison of secondary electron emission in helium ion microscope with gallium ion and electron microscopes

To evaluate secondary electron (SE) image characteristics in helium ion microscope, Si surfaces with a rod and step structures is scanned by 30 keV He and Ga ion beams and 1 keV electron beam. The topographic sensitivity of He ions is in principle higher than that for scanning electron microscope (SEM) because of the stronger dependency of SE yield versus incident angle for He ions. As shrinking to sub nm patterns, the pseudo-images constructed from line profile of SE intensity by the electron beam lose their sharpness, however, the images for the He and Ga ion beams keep clearness due to darkening the bottom corners of the pattern. Here, the sputter erosion for Ga ions must be considered. Furthermore, trajectories of emitted SEs are simulated for a rectangular Al surface scanned by the beams to study voltage contrast, where positive and negative voltages are applied to the small area of the sample. Both less high energy component in the energy distribution of SEs and dominant contribution of direct SE excitation by a projectile He ion keep a high voltage contrast down to a sub nm sized area positively biased against the zero-potential surroundings.     

Kinetic excitation of solids induced by energetic particle bombardment: Influence of impact angle

The kinetic excitation of a solid surface under bombardment with energetic particles is studied via internal electron emission in a metal-insulator-metal junction. In particular, the dependence of the measured tunneling yield on the projectile impact angle is studied. The resulting impact angle distribution is compared with predictions of the total excitation energy profile calculated using the SRIM 2006 Monte Carlo program package. While the calculated profiles fail to explain the experimental data, it is shown that a simple calculation of impact angle dependent projectile backscattering qualitatively reproduces the observed trends.     

Interferences in electron emission from O2 by 30 MeV O impact

Interference structures in the ejected electron spectra for 30 MeV O^5,8+ + O₂ are investigated. The measured electron yields were studied for electron energies from 5 to 400 eV and observation angles of 30°, 60°, 90°, 120° and 150° with respect to the incident beam direction. Experimental molecular cross-sections were normalized to theoretical molecular one-center cross-sections revealing oscillatory structures suggestive of secondary interferences as evidenced by the independence on the observation angle. An oscillation interval for 30 MeV O^5,8+ + O₂ of Δk ∼ 4 a.u. is found, a value two times larger than that previously observed for 3 MeV H⁺ + N₂. No obvious evidence for primary Young-type interferences was seen.     

Multianalytical characterization of a blue pigment used in art-crafts from Central Mexico

We report a preliminary characterization of a blue pigment because its color has been associated to objects found from Aztec and Precolumbian times. The pigment was examined before and after its purification by a variety of techniques: Particle Induced X-ray emission (PIXE), electron paramagnetic resonance (EPR), X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR) and scanning electron microscopy coupled to energy dispersion spectroscopy (SEM-EDS). The relationship of the chemical composition, the spectroscopic signals and the color are discussed.     

Light ion induced L X-ray production cross-sections in Au and Pb

Experimental proton-induced L_α, L_β, L_γ, L_? and L_tot absolute X-ray production cross-sections for Au and Pb in the incident proton energy range between 1 and 2.5 MeV are presented. The experimental results for X-ray production cross-sections are compared to available data given in Sokhi and Crumpton [R.S. Sokhi, D. Crumpton, At. Data Nucl. Data Tables 30 (1984) 49], Jesus et al. [A.P. Jesus, J.S. Lopes, J.P. Ribeiro, J. Phys. B: At. Mol. Phys. 18 (1985) 2456; A.P. Jesus, T.M. Pinheiro, I.A. Nisa, J.P. Ribeiro, J.S. Lopes, Nucl. Instrum. Methods B15 (1986) 95] and Goudarzi et al. [M. Goudarzi, F. Shokouhi, M. Lamehi-Rachti, P.Olialiy, Nucl. Instrum. Methods Phys. Res. B247 (2006) 218]. The given data are also compared with the predictions of ECPSSR model [W. Brandt, G. Lapicki, Phys. Rev. A23 (1981) 1717].     

The influence of the charged back side on the transmission of highly charged ions through PC nanocapillaries

We have measured the fraction of the ions transmitted through nanocapillaries with their initial charge state for 200 keV Xe⁷⁺ ions impact on a polycarbonate (PC) foil with a thickness of 30 μm and a diameter of 150 nm. An Au film was evaporated on both the front and back side. It is found that more than 97% of the transmitted ions remain in their initial charge state. Then, the transmitted ion fraction and the characteristic tilt angle of 40 keV Xe⁷⁺ ions through this foil and another one with the same thickness and diameter, but evaporated by Au only on the front side, were measured. By comparing the results of these two foils, the influence of the ions deposited in the capillary exit region on the transmitted ion fraction and the characteristic tilt angle is studied. In comparison with the foil evaporated by Au on both sides, the maximum transmitted ion fraction of the foil evaporated by Au on the front side only is nearly 4 times smaller. Also, the characteristic tilt angle is slightly decreased. These results are discussed within the models for the guiding effect.     

Development of secondary ion mass spectroscopy using medium energy C60 ion impact

In this paper, we report time-of-flight (TOF) secondary ion mass spectroscopy using primary C₆₀ ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C₆₀ (120 keV and 540 keV ) impacts than those for low energy C₆₀ (30 keV ) impacts. This finding demonstrates that medium energy C₆₀ ion impacts are useful for highly sensitive characterization of amino acids.     

Optical emission from Be, Cu and CuBe targets during ion beam sputtering

A spectral structure of the radiation (190-590 nm) emitted during sputtering of polycrystalline Cu, Be and CuBe targets by Kr⁺ ions with 5 keV have been presented. Evolution of surface composition during ion beam sputtering is investigated. Several time scales are distinguished, corresponding to different processes: the elimination of surface contaminants, the removal of the corroded layer. The implications for the use of ion beam optical spectroscopy in surface analysis are discussed. In the case of Be and Cu98 Be2, a molecular structure appears between 492 nm and 502 nm. It is similar for both samples and is ascribed to de-excitation of BeH.     

Study of density effect of large gas cluster impact by molecular dynamics simulations

Large gas cluster impacts cause unique surface modification effects because a large number of target atoms are moved simultaneously due to high-density particle collisions between cluster and surface atoms. Molecular dynamics (MD) simulations of large gas cluster impacts on solid targets were carried out in order to investigate the effect of high-density irradiation with a cluster ion beam from the viewpoint of crater formation and sputtering. An Ar cluster with the size of 2000 was accelerated with 20 keV (10 eV for each constituent atom) and irradiated on a Si(1 0 0) solid target consisting of 2 000 000 atoms. The radius of the Ar cluster was scaled by ranging from 2.3 nm (corresponding to the solid state of Ar) to 9.2 nm (64× lower density than solid state). When the Ar cluster was as dense as solid state, the incident cluster penetrated the target surface and generated crater-like damage. On the other hand, as the cluster radius increased and the irradiation particle density decreased, the depth of crater caused by cluster impact was reduced. MD results also revealed that crater depth was mainly dominated by the horizontal scaling rather than vertical scaling. A high sputtering yield of more than several tens of Si atoms per impact was observed with clusters of 4-20× lower volume density than solid state.     

Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon

Experimental bremsstrahlung yields for 2, 3 and 4 MeV protons on thin beryllium and carbon targets have been measured. The yields have been corrected for detector efficiency, self-absorption in the target and fitted to 9th order polynomials over the X-ray energy range 1-10 keV for easy comparison with theoretical calculations.     

Monte Carlo study of ion-induced backward and forward secondary electron emission from thin Al foil

A direct Monte Carlo program has been developed to calculate the backward (γ_b) and forward (γ_f) electron emission yields from 20 nm thick Al foil for impact of C⁺, Al⁺, Ar⁺, Cu⁺ and Kr⁺ ions having energies in the range of 0.1-10 keV/amu. The program incorporates the excitation of target electrons by projectile ions, recoiling target atoms and fast primary electrons. The program can be used to calculate the electron yields, distribution of electron excitation points in the target and other physical parameters of the emitted electrons. The calculated backward electron emission yield and the Meckbach factor R = γ_f/γ_b are compared with the available experimental data, and a good agreement is found. In addition, the effect of projectile energy and mass on the longitudinal and lateral distribution of the excitation points of the electrons emitted from front and back of Al target has been investigated.     

Ionization in symmetric and nearly symmetric low energy ion-surface collisions

Multiply charged ions are emitted following bombardment of Al(1 0 0) and Si(1 1 1) by low energy Si⁺ and P⁺ ions. The ion formation is attributed to inner-shell electron promotion during a hard collision between symmetric or nearly symmetric atomic species, followed by Auger decay outside the surface. The relative yield of triply charged Si ions for Si⁺ → Si(1 1 1) is much smaller than that of triply charged Al ions in direct recoil Si⁺ → Al(1 0 0) experiments. This difference can be explained by assuming that only one 2p hole is produced in a Si atom during the symmetric collision, whereas a double 2p hole is also produced in the Al atom following the nearly symmetric Si-Al collision. Further evidence is provided by the complimentary experiment P⁺ → Si(1 1 1), where Si³⁺ regains its intensity and Si⁴⁺ emerges as a result of a double 2p hole decay with shake-off.     

Analysis of the Auger neutralization of He at Cu surfaces in low energy ion scattering

Recently, strong crystal effects in P⁺ were observed for He⁺ and Cu in the Auger neutralization regime, with differences in the ion fraction by up to a factor of three non-equivalent Cu surfaces. In this contribution, it is shown that these findings can quantitatively be described within the jellium model assuming perpendicular velocity scaling of P⁺.     

Recent developments of ion beam induced luminescence at the external scanning microbeam facility of the LABEC laboratory in Florence

A new ionoluminescence (IL) apparatus has been successfully installed at the external scanning microbeam facility of the 3 MV Tandetron accelerator of the INFN LABEC in Firenze; the apparatus for photon detection has been fully integrated in the existing ion beam analysis (IBA) set-up, for the simultaneous acquisition of IL and PIXE/PIGE/BS spectra and maps.The potential of the new set-up is illustrated in this paper by some results extracted by the analysis of art objects and advanced semiconductor materials. In particular, the adequacy of the new IBA set-up in the field of cultural heritage is pointed out by the coupled PIXE/IL micro-analysis of a lapis lazuli stone; concerning applications in material science, IL spectra from a N doped diamond sample were acquired and compared with CL analyses to evaluate the relevant sensitivities and the effect of ion damage.