Study on the behavior of oxygen atoms in swift heavy ion irradiated CeO2 by means of synchrotron radiation X-ray photoelectron spectroscopy

To study the effects of swift heavy ion irradiation on cerium dioxide (CeO₂), CeO₂ sintered pellets were irradiated with 200 MeV Xe ions at room temperature. For irradiated and unirradiated samples, the spectra of X-ray photoelectron spectroscopy (XPS) were measured. XPS spectra for the irradiated samples show that the valence state of Ce atoms partly changes from +4 to +3. The amount of Ce³⁺ state was quantitatively obtained as a function of ion-fluence. The relative amount of oxygen atom displacements, which are accompanied by the decrease in Ce valence state, is 3-5%. This value is too large to be explained in terms of elastic interactions between CeO₂ and 200 MeV ions. The experimental result suggests the contribution of 200 MeV Xe induced electronic excitation to the displacements of oxygen atoms.     

Irradiation effects in an HfO2/MgO/HfO2 tri-layer structure induced by 10 MeV Au ions

In this report, we present radiation damage effects in a thin film, tri-layer structure, HfO₂/MgO/HfO₂. Irradiations were performed with 10 MeV Au ions in a recently developed medium energy ion irradiation facility at Los Alamos National Laboratory, which is described in this paper. Energy deposition by 10 MeV Au ions corresponds to a mixed regime, wherein electronic and nuclear stopping contribute to radiation damage. In this study, we investigated modifications of both surface and bulk properties in order to assess the structural stability of our oxide tri-layers under the severe irradiation conditions employed here. The most dramatic structural changes were observed to occur on the surfaces of the tri-layer samples. Surface features consisted of large craters and spires. The dimensions of these craters and spires exceed those of the individual ion tracks by almost three orders of magnitude. As for the bulk tri-layer structure, our conclusions are that this structure is stable in terms of: (i) resistance to amorphization; (ii) resistance to compositional mixing and (iii) resistance to pronounced nucleation and growth of extended defects. The main effect observed in the tri-layer structure was the transformation of the first HfO₂ layer from a monoclinic to either a tetragonal or cubic form of HfO₂.     

Radiation damage in ZnO ion implanted at 15 K

Commercial O-face (0 0 0 1) ZnO single crystals were implanted with 200 keV Ar ions. The ion fluences applied cover a wide range from 5 × 10¹¹ to 7 × 10¹⁶ cm⁻². The implantation and the subsequent damage analysis by Rutherford backscattering spectrometry (RBS) in channelling geometry were performed in a special target chamber at 15 K without changing the target temperature of the sample. To analyse the measured channelling spectra the computer code DICADA was used to calculate the relative concentration of displaced lattice atoms.Four stages of the damage evolution can be identified. At low ion fluences up to about 2 × 10¹³ cm⁻² the defect concentration increases nearly linearly with rising fluence (stage I). There are strong indications that only point defects are produced, the absolute concentration of which is reasonably given by SRIM calculations using displacement energies of E_d(Zn) = 65 eV and E_d(O) = 50 eV. In a second stage the defect concentration remains almost constant at a value of about 0.02, which can be interpreted by a balance between production and recombination of point defects. For ion fluences around 5 × 10¹⁵ cm⁻² a second significant increase of the defect concentration is observed (stage III). Within stage IV at fluences above 10¹⁶ cm⁻² the defect concentration tends again to saturate at a level of about 0.5 which is well below amorphisation. Within stages III and IV the damage formation is strongly governed by the implanted ions and it is appropriate to conclude that the damage consists of a mixture of point defects and dislocation loops.     

10 MeV Au ion irradiation effects in an MgO-HfO2 ceramic-ceramic (CERCER) composite

Room temperature ion irradiation damage studies were performed on a ceramic composite intended to emulate a dispersion nuclear fuel. The composite is composed of 90-mole% MgO and 10-mole% HfO₂. The as-synthesized composite was found to consist of Mg₂Hf₅O₁₂ (and some residual HfO₂) particles embedded in an MgO matrix. X-ray diffraction revealed that nearly all of the initial HfO₂ reacted with some MgO to form Mg₂Hf₅O₁₂. Ion irradiations were performed using 10 MeV Au³⁺ ions at room temperature over a fluence range of 5 × 10¹⁶-5 × 10²⁰ Au/m². Irradiated samples were characterized using both grazing incidence X-ray diffraction (GIXRD) and transmission electron microscopy (TEM), the latter using both selected-area electron diffraction (SAED) and micro-diffraction (μD) on samples prepared in cross-sectional geometry. Both GIXRD and TEM electron diffraction measurements on a specimen irradiated to a fluence of 5 × 10²⁰ Au/cm², revealed that the initial rhombohedral Mg₂Hf₅O₁₂ phase was transformed into a cubic-Mg₂Hf₅O₁₂ phase. Finally, it is important to note that at the highest ion fluence used in this investigation (5 × 10²⁰ Au/m²), both the MgO matrix and the Mg₂Hf₅O₁₂ second phase remained crystalline.     

Amorphisation of ZnAl2O4 spinel under heavy ion irradiation

ZnAl₂O₄ spinels have been irradiated with several ions (Ne, S, Kr and Xe) at the IRRSUD beamline of the GANIL facility, in order to determine irradiation conditions (stopping power, fluence) for amorphisation. We observed by transmission electron microscopy (TEM) that with Xe ions at 92 MeV, individual ion tracks are still crystalline, whereas an amorphisation starts below a fluence of 5 × 10¹² cm⁻² up to a total amorphisation between 1 × 10¹³ and 1 × 10¹⁴ cm⁻². The coexistence of amorphous and crystalline domains in the same pristine grain is clearly visible in the TEM images. All the crystalline domains remain close to the same orientation as the original grain. According to TEM and X-ray Diffraction (XRD) results, the stopping power threshold for amorphisation is between 9 and 12 keV nm⁻¹.     

Photoconduction investigations in 75 MeV oxygen ion irradiated kapton-H polyimide

Photoconduction behaviour of 75 MeV oxygen ion irradiated (Fluences: 1.8 × 10¹¹, 1.8 × 10¹² and 1.8 × 10¹³ ions/cm²) kapton-H polyimide film in the visible region has been investigated at different temperatures ranging 400-2500 °C and at various electric fields ranging 40-600 kV/cm. A photoinduced exciton formation is the major source for providing charge carriers through thermolization and field-assisted dissociation processes. An attempt has been made to fit the field dependence of the steady state photocurrent to one of the several possible conduction mechanisms. In the high and low fluence (1.8 × 10¹³ and 1.8 × 10¹¹ ions/cm²) irradiated samples there exists a possibility of Poole-Frankel type of photoconduction mechanism, whereas at intermediate fluence (1.8 × 10¹² ions/cm²) a Schottky type photoconduction mechanism may be operative. The log I_ps versus 1/T plots consist of two straight lines with a knee point around 800-1000 °C. The activation energy estimated from the slope of these lines is field dependent varying from 0.40 to 0.73 eV and 0.18 to 0.23 eV above and below the knee point, respectively. This indicates the presence of more than one type of trapping levels in irradiated kapton-H polyimide.     

Swift heavy ion induced structural modifications in zircon and scheelite phases of ThGeO4

Structural modifications in the zircon and scheelite phases of ThGeO₄ induced by swift heavy ions (93 MeV Ni⁷⁺) at different fluences as well as pressure quenching effects are reported. X-ray diffraction and Raman measurements at room temperature on the irradiated zircon phase of ThGeO₄ indicate the occurrence of stresses that lead to a reduction of the cell volume up to 2% followed by its transformation to a mixture of nano-crystalline and amorphous scheelite phases. Irradiation of the zircon phase at liquid nitrogen temperature induces amorphization at a lower fluence (7.5 × 10¹⁶ ions/m²), as compared to that at room temperature (6 × 10¹⁷ ions/m²). Scheelite type ThGeO₄ irradiated at room temperature undergoes complete amorphization at a lower fluence of 7.5 × 10¹⁶ ions/m² without any volume reduction. The track radii deduced from X-ray diffraction measurements on room temperature irradiated zircon, scheelite and low temperature irradiated zircon phases of ThGeO₄ are, 3.9, 3.5 and 4.5 nm, respectively. X-ray structural investigations on the zircon phase of ThGeO₄ recovered after pressurization to about 3.5 and 9 GPa at ambient temperature show the coexistence of zircon and disordered scheelite phases with a larger fraction of scheelite phase occurring at 9 GPa. On the other hand, the scheelite phase quenched from 9 GPa shows crystalline scheelite phase pattern.     

Initial stage of etching through pores in PET films irradiated by Ar ions

Changes in the diameters and depths of pores were studied in the process of etching polyethyleneterephthalate (PET) films irradiated by Ar ions having an energy of 1 MeV/n. Information about the pore diameters and lengths was obtained with JSM-840 and TEM-125 electron microscopes. The solutions of NaOH (0.5 mol/dm³ and 2 mol/dm³) were used as etchants. Etching was performed at 55 °C and 70 °C. Two methods of sensitization were used: the first one by UV illumination and treatment in dimethylformamide (DMF), the second method just by UV illumination. It was found that the diameters and the depths of pores are larger in films treated according to the first sensitization method. Etching duration (breakthrough time), which leads to through-going pores of the minimal radius, was established. After sensitization according to the first method the track etch rate grows quicker than the transverse etch rate. This gives a possibility to obtain through pores with diameters ranging from 50 nm to several micrometers.     

Experimental study of the residual activity induced by 950 MeV/u uranium ions in stainless steel and copper

As a preparatory work for constructing the FAIR facility at GSI, samples of stainless steel and copper were irradiated by 950 MeV/u ²³⁸U ions and depth-profiles of residual activity were measured by gamma-ray spectroscopy. The isotopes with dominating contribution to the residual activity were identified and their contributions were quantified. In contrast to the previous study performed at lower energies, the activities could no longer be determined from the full-assembly target measurements. Depth-profiling of residual activity of all identified isotopes had to be completed by measurements of individual target foils. The activity contributions were then obtained by integration of the depth-profiles.     

Enhanced susceptibility of CaF2(1 1 1) to adsorption due to ion irradiation

We have investigated morphological changes of freshly cleaved CaF₂(1 1 1) single crystal surfaces before and after ion irradiation. We show that with or without irradiation the surface undergoes serious changes within minutes after the cleavage if the samples are exposed to ambient conditions. This is most likely due to the adsorption of water and could be avoided only if working under clean ultra-high-vacuum conditions. Ion-induced modifications on this surface seem to act as centers for an increased rate of adsorption so that any quantitative numbers obtained by atomic force microscopy in such experiments have to be treated with caution.     

Existence states of deuterium irradiated into LiAlO2

The existence states of deuterium in LiAlO₂ were analyzed by in situ IR absorption spectroscopy during irradiation with 3 keV at room temperature. Multiple IR absorption peaks that were related to O-D stretching vibrations were observed, mainly at 2650 cm⁻¹ (O-D_α), 2600 cm⁻¹ (O-D_β), and 2500 cm⁻¹ (O-D_γ). The O-D_α was assigned to the surface O-D. The O-D_β and O-D_γ were interpreted as two distinct O-D states for three candidates: O-D of substitutional D⁺ for Li⁺; O-D of substitutional D⁺ for Al³⁺; and O-D of interstitial D⁺. O-D_β was the dominant O-D state for deuterium irradiated into LiAlO₂, and had higher stability than O-D_γ. Heating after ion irradiation led to the desorption of D₂ and an increase in the intensity of O-D_β, which implies that some of the deuterium irradiated into LiAlO₂ exists in non-O-D states, such as D⁻ captured by F centers.     

Effects of 0.28-2.80 MeV proton irradiation on GaInP/GaAs/Ge triple-junction solar cells for space use

GaInP/GaAs/Ge triple-junction solar cells were irradiated with 0.28, 0.62 and 2.80 MeV protons with fluences ranging from 1 × 10¹⁰ cm⁻² to 1 × 10¹³ cm⁻². Their performance degradation is analyzed using current-voltage characteristics and spectral response measurements. The degradation rates of the short circuit current, open circuit voltage, and maximum power output increase with fluence, but decrease with increasing proton energy. It was also observed that the spectral response of the GaAs middle cell degrades more significantly than that of the GaInP top cell.     

Formation of planar waveguide in BiB3O6 crystal by MeV carbon implantation

Non-leaky planar waveguide structure has been fabricated in x-cut BiB₃O₆ crystal by 6 MeV C³⁺ ion implantation at a dose of 1 × 10¹⁴ ions/cm². The effective refractive indices of the waveguide are measured at a wavelength of 632.8 nm. We perform a computer code based on the finite difference method to reconstruct the refractive index profiles of n_x and n_y of this waveguide. The beam propagation method is used to calculate the electric and magnetic field profiles in the waveguide region from the reconstructed refractive index profiles. Our simulated data show that the refractive index increased waveguide layer can confine the mode completely.     

Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5-7.9 MeV/amu energy range

We report on the secondary electron yields of Au and oxidized aluminum (Al₂O₃) by impact of heavy ions with energies ranging from 7.92 MeV/amu (¹²C₆) to 2.54 MeV/amu (¹⁰⁷Ag₄₇). The obtained results, the first in this energy range using medium-heavy ions, extend the validity of proposed scaling laws obtained with lighter ions. Measurements have been performed using the SIRAD irradiation facility at the 15 MV Tandem of the INFN Laboratory of Legnaro (Italy), to evaluate the performance of ion electron emission microscopy at SIRAD.     

Surface modifications and deuterium depth profiles in molybdenum irradiated with low-energy D ions

Depth profiles of deuterium trapped in single crystal Mo, polycrystalline Mo, and molybdenum trioxide film on polycrystalline Mo irradiated with 200 eV D ions have been measured up to a depth of 8 μm using the D(³He,p)⁴He nuclear reaction at a ³He energy varied from 0.69 to 4.0 MeV. For the D ion irradiation at 323 K to the highest ion fluence of 5 × 10²⁴ D/m², the D concentration decreases from several at.% in the near-surface layer to bulk values below 10⁻⁴ at.% for single crystal Mo and about 10⁻² at.% for polycrystalline Mo. The maximum D concentration in molybdenum trioxide film differs little in value from that for polycrystalline Mo. Blister formation at high fluences is observed for polycrystalline Mo and molybdenum trioxide film, but not for single crystal Mo. As the irradiation temperature increases from 323 to 493 K, the D retention in the polycrystalline Mo decreases from about 3 × 10²¹ down to about 2 × 10¹⁸ D/m².     

Modification of a shell model for the study of the radiation effects in BaTiO3

In order to study the radiation effects in BaTiO₃ ferroelectric crystal, a previously developed shell model is modified. The modifications include adding the ZBL universal potentials at short distances and distance-dependent spring constants for core-shell interactions. The phase transition sequences in BaTiO₃ were correctly reproduced using molecular dynamics simulations with this modified shell model. Also, the calculated Frenkel pair formation energies agree well with results obtained by first principles calculations, which suggests that this model is suitable for the simulation of the radiation effects in BaTiO₃. The dependence of polarization on the number of oxygen vacancies was also studied.     

Electrical properties of silicon diodes with pn junctions irradiated with Au swift heavy ions

Electrical properties of silicon diodes with p⁺n junctions irradiated with ¹⁹⁷Au⁺²⁶ swift heavy ions (energy E = 350 MeV, fluences of 10⁷ cm⁻² and 10⁸ cm⁻²) and silicon diodes irradiated with electrons (energy E = 3.5 MeV, fluences of 10¹⁵ cm⁻², 5 × 10¹⁵ cm⁻² and 10¹⁶ cm⁻²) have been investigated. Frequency dependences of the impedance, current-voltage characteristics and switching characteristics of these devices have been studied. Irradiation of the diodes with ¹⁹⁷Au⁺²⁶ ions at a fluence of 10⁸ cm⁻² leads to the formation of a quasi-continuous layer of irradiation-induced defects that enable a combination of characteristics such as a reverse resistance recovery time and direct voltage drop that are better than those for electron-irradiated diodes. Still, the irradiation of high-energy ions results in an increase in recombination currents that are larger than those obtained with electron irradiation, and causes more complicated frequency dispersion of the diode parameters.     

Analyzing the effect of displacement rate on radiation-induced segregation in 304 and 316 stainless steels by examining irradiated EBR-II components and samples irradiated with protons

Recent studies have indicated that, at temperatures relevant to fast reactors and light water reactors, void swelling in austenitic alloys progresses more rapidly when the radiation dose rate is lower. A similar dependency between radiation-induced segregation (RIS) and dose rate is theoretically predicted for pure materials and might also be true in complex engineering alloys. Radiation-induced segregation was measured on 304 and 316 stainless steel, irradiated in the EBR-II reactor at temperatures near 375 °C, to determine if the segregation is a strong function of damage rate. The data taken from samples irradiated in EBR-II is also compared to RIS data generated using proton radiation. Although the operational histories of the reactor irradiated samples are complex, making definitive conclusions difficult, the preponderance of the evidence indicates that radiation-induced segregation in 304 and 316 stainless steels is greater at lower displacement rate.     

Swelling and optical properties of Si3N4 films irradiated in the electronic regime

Silicon nitride layers of 140 nm thickness were deposited on silicon wafers by low pressure chemical vapour deposition (LPCVD) and irradiated at GANIL with Pb ions of 110 MeV up to a maximum fluence of 4 × 10¹³ cm⁻². As shown in a previous work these irradiation conditions, characterized by a predominant electronic slowing-down (S_e = 19.3 keV nm⁻¹), lead to damage creation and formation of etchable tracks in Si₃N₄. In the present study we investigated other radiation-induced effects like out of plane swelling and refractive index decrease. From profilometry, step heights as large as 50 nm were measured for samples irradiated at the highest fluences (>10¹³ cm⁻²). From optical spectroscopy, the minimum reflectivity of the target is shifted towards the high wavelengths at increasing fluences. These results evidence a concomitant decrease of density and refractive index in irradiated Si₃N₄. Additional measurements, performed by ellipsometry, are in full agreement with this interpretation.     

Change in magnetic properties of MgB2 thin films after irradiation by 200 MeV Au ion beam

The SHI irradiation induced effects on magnetic properties of MgB₂ thin films are reported. The films having thickness 300-400 nm, prepared by hybrid physical chemical vapor deposition (HPCVD) were irradiated by 200 MeV Au ion beam (S_e ∼ 23 keV/nm) at the fluence 1 × 10¹² ion/cm². Interestingly, increase in the transition temperature T_c from 35.1 K to 36 K resulted after irradiation. Substantial enhancement of critical current density after irradiation was also observed because of the pinning provided by the defects created due to irradiation. The change in surface morphology due to irradiation is also studied.